{"id":"https://openalex.org/W2744588467","doi":"https://doi.org/10.1088/1674-1056/26/8/087308","title":"Progressive current degradation and breakdown behavior in GaN LEDs under high reverse bias stress","display_name":"Progressive current degradation and breakdown behavior in GaN LEDs under high reverse bias stress","publication_year":2017,"publication_date":"2017-08-01","ids":{"openalex":"https://openalex.org/W2744588467","doi":"https://doi.org/10.1088/1674-1056/26/8/087308","mag":"2744588467"},"language":"en","primary_location":{"id":"doi:10.1088/1674-1056/26/8/087308","doi":"https://doi.org/10.1088/1674-1056/26/8/087308","is_oa":false,"landing_page_url":"https://doi.org/10.1088/1674-1056/26/8/087308","pdf_url":null,"source":{"id":"https://openalex.org/S33442941","display_name":"Chinese Physics B","issn_l":"1674-1056","issn":["1674-1056","2058-3834"],"is_oa":false,"is_in_doaj":false,"is_core":true,"listed_in":["cwts-core","dongbi-d","jufo-1","ki-jl-1","norway-1","poland-40","russia-white-list-2"],"host_organization":"https://openalex.org/P4310320083","host_organization_name":"IOP Publishing","host_organization_lineage":["https://openalex.org/P4310320083","https://openalex.org/P4310311669"],"host_organization_lineage_names":["IOP Publishing","Institute of Physics"],"type":"journal"},"license":null,"license_id":null,"version":"publishedVersion","is_accepted":true,"is_published":true,"raw_source_name":"Chinese Physics B","raw_type":"journal-article"},"volume":null,"type":"article","is_traditional":true,"indexed_in":["crossref"],"open_access":{"is_oa":false,"oa_status":"closed","oa_url":null,"any_repository_has_fulltext":false},"authorships":[{"author_position":"first","author":{"id":"https://openalex.org/A5047109063","display_name":"Linna Zhao","orcid":"https://orcid.org/0000-0003-4386-9825","observed_orcids":["https://orcid.org/0000-0003-4386-9825"]},"institutions":[{"id":"https://openalex.org/I111599522","display_name":"Jiangnan University","ror":"https://ror.org/04mkzax54","country_code":"CN","type":"education","lineage":["https://openalex.org/I111599522"]}],"countries":["CN"],"is_corresponding":false,"raw_author_name":"Linna Zhao","raw_affiliation_strings":["Engineering Research Center of IoT Technology Applications (Ministry of Education), Department of Electronic Engineering, Jiangnan University, Wuxi 214122, China"],"raw_orcid":null,"affiliations":[{"raw_affiliation_string":"Engineering Research Center of IoT Technology Applications (Ministry of Education), Department of Electronic Engineering, Jiangnan University, Wuxi 214122, China","institution_ids":["https://openalex.org/I111599522"]}]},{"author_position":"middle","author":{"id":null,"display_name":"Peihong Yu","orcid":null,"observed_orcids":[]},"institutions":[{"id":"https://openalex.org/I111599522","display_name":"Jiangnan University","ror":"https://ror.org/04mkzax54","country_code":"CN","type":"education","lineage":["https://openalex.org/I111599522"]}],"countries":["CN"],"is_corresponding":false,"raw_author_name":"Peihong Yu","raw_affiliation_strings":["Engineering Research Center of IoT Technology Applications (Ministry of Education), Department of Electronic Engineering, Jiangnan University, Wuxi 214122, China"],"raw_orcid":null,"affiliations":[{"raw_affiliation_string":"Engineering Research Center of IoT Technology Applications (Ministry of Education), Department of Electronic Engineering, Jiangnan University, Wuxi 214122, China","institution_ids":["https://openalex.org/I111599522"]}]},{"author_position":"middle","author":{"id":"https://openalex.org/A5021880166","display_name":"Zixiang Guo","orcid":"https://orcid.org/0000-0002-8043-1454","observed_orcids":["https://orcid.org/0000-0002-8043-1454"]},"institutions":[{"id":"https://openalex.org/I126520041","display_name":"University of Science and Technology of China","ror":"https://ror.org/04c4dkn09","country_code":"CN","type":"education","lineage":["https://openalex.org/I126520041","https://openalex.org/I19820366"]}],"countries":["CN"],"is_corresponding":false,"raw_author_name":"Zixiang Guo","raw_affiliation_strings":["School of Earth and Space Sciences, University of Science and Technology of China, Hefei 230026, China"],"raw_orcid":null,"affiliations":[{"raw_affiliation_string":"School of Earth and Space Sciences, University of Science and Technology of China, Hefei 230026, China","institution_ids":["https://openalex.org/I126520041"]}]},{"author_position":"middle","author":{"id":"https://openalex.org/A5075015234","display_name":"Dawei Yan","orcid":"https://orcid.org/0000-0002-2457-4936","observed_orcids":["https://orcid.org/0000-0002-2457-4936"]},"institutions":[{"id":"https://openalex.org/I111599522","display_name":"Jiangnan University","ror":"https://ror.org/04mkzax54","country_code":"CN","type":"education","lineage":["https://openalex.org/I111599522"]}],"countries":["CN"],"is_corresponding":false,"raw_author_name":"Dawei Yan","raw_affiliation_strings":["Engineering Research Center of IoT Technology Applications (Ministry of Education), Department of Electronic Engineering, Jiangnan University, Wuxi 214122, China"],"raw_orcid":null,"affiliations":[{"raw_affiliation_string":"Engineering Research Center of IoT Technology Applications (Ministry of Education), Department of Electronic Engineering, Jiangnan University, Wuxi 214122, China","institution_ids":["https://openalex.org/I111599522"]}]},{"author_position":"middle","author":{"id":"https://openalex.org/A5044927398","display_name":"Hao Ran Zhou","orcid":"https://orcid.org/0000-0002-2546-5360","observed_orcids":["https://orcid.org/0000-0002-2546-5360"]},"institutions":[{"id":"https://openalex.org/I111599522","display_name":"Jiangnan University","ror":"https://ror.org/04mkzax54","country_code":"CN","type":"education","lineage":["https://openalex.org/I111599522"]}],"countries":["CN"],"is_corresponding":false,"raw_author_name":"Hao Zhou","raw_affiliation_strings":["Engineering Research Center of IoT Technology Applications (Ministry of Education), Department of Electronic Engineering, Jiangnan University, Wuxi 214122, China"],"raw_orcid":null,"affiliations":[{"raw_affiliation_string":"Engineering Research Center of IoT Technology Applications (Ministry of Education), Department of Electronic Engineering, Jiangnan University, Wuxi 214122, China","institution_ids":["https://openalex.org/I111599522"]}]},{"author_position":"middle","author":{"id":"https://openalex.org/A5049952568","display_name":"Jinbo Wu","orcid":"https://orcid.org/0000-0001-6572-768X","observed_orcids":["https://orcid.org/0000-0001-6572-768X"]},"institutions":[{"id":"https://openalex.org/I111599522","display_name":"Jiangnan University","ror":"https://ror.org/04mkzax54","country_code":"CN","type":"education","lineage":["https://openalex.org/I111599522"]}],"countries":["CN"],"is_corresponding":false,"raw_author_name":"Jinbo Wu","raw_affiliation_strings":["Engineering Research Center of IoT Technology Applications (Ministry of Education), Department of Electronic Engineering, Jiangnan University, Wuxi 214122, China"],"raw_orcid":null,"affiliations":[{"raw_affiliation_string":"Engineering Research Center of IoT Technology Applications (Ministry of Education), Department of Electronic Engineering, Jiangnan University, Wuxi 214122, China","institution_ids":["https://openalex.org/I111599522"]}]},{"author_position":"middle","author":{"id":"https://openalex.org/A5102276085","display_name":"Cui Zhiqiang","orcid":null,"observed_orcids":[]},"institutions":[{"id":"https://openalex.org/I111599522","display_name":"Jiangnan University","ror":"https://ror.org/04mkzax54","country_code":"CN","type":"education","lineage":["https://openalex.org/I111599522"]}],"countries":["CN"],"is_corresponding":false,"raw_author_name":"Zhiqiang Cui","raw_affiliation_strings":["Engineering Research Center of IoT Technology Applications (Ministry of Education), Department of Electronic Engineering, Jiangnan University, Wuxi 214122, China"],"raw_orcid":null,"affiliations":[{"raw_affiliation_string":"Engineering Research Center of IoT Technology Applications (Ministry of Education), Department of Electronic Engineering, Jiangnan University, Wuxi 214122, China","institution_ids":["https://openalex.org/I111599522"]}]},{"author_position":"middle","author":{"id":"https://openalex.org/A5001720978","display_name":"Huarui Sun","orcid":"https://orcid.org/0000-0003-1429-0611","observed_orcids":["https://orcid.org/0000-0003-1429-0611"]},"institutions":[{"id":"https://openalex.org/I204983213","display_name":"Harbin Institute of Technology","ror":"https://ror.org/01yqg2h08","country_code":"CN","type":"education","lineage":["https://openalex.org/I204983213"]}],"countries":["CN"],"is_corresponding":false,"raw_author_name":"Huarui Sun","raw_affiliation_strings":["School of Science, Harbin Institute of Technology (Shenzhen), Shenzhen 518055, China"],"raw_orcid":null,"affiliations":[{"raw_affiliation_string":"School of Science, Harbin Institute of Technology (Shenzhen), Shenzhen 518055, China","institution_ids":["https://openalex.org/I204983213"]}]},{"author_position":"last","author":{"id":"https://openalex.org/A5083393096","display_name":"Xiaofeng Gu","orcid":"https://orcid.org/0000-0001-8299-6451","observed_orcids":["https://orcid.org/0000-0001-8299-6451","https://orcid.org/0009-0001-3689-809X"]},"institutions":[{"id":"https://openalex.org/I111599522","display_name":"Jiangnan University","ror":"https://ror.org/04mkzax54","country_code":"CN","type":"education","lineage":["https://openalex.org/I111599522"]}],"countries":["CN"],"is_corresponding":false,"raw_author_name":"Xiaofeng Gu","raw_affiliation_strings":["Engineering Research Center of IoT Technology Applications (Ministry of Education), Department of Electronic Engineering, Jiangnan University, Wuxi 214122, China"],"raw_orcid":null,"affiliations":[{"raw_affiliation_string":"Engineering Research Center of IoT Technology Applications (Ministry of Education), Department of Electronic Engineering, Jiangnan University, Wuxi 214122, China","institution_ids":["https://openalex.org/I111599522"]}]}],"institutions":[],"countries_distinct_count":1,"institutions_distinct_count":3,"corresponding_author_ids":[],"corresponding_institution_ids":[],"apc_list":{"value":2500,"currency":"USD","value_usd":2500},"apc_paid":null,"fwci":0.1278,"has_fulltext":false,"cited_by_count":1,"citation_normalized_percentile":{"value":0.39369164,"is_in_top_1_percent":false,"is_in_top_10_percent":false},"cited_by_percentile_year":{"min":88,"max":93},"biblio":{"volume":"26","issue":"8","first_page":"087308","last_page":"087308"},"is_retracted":false,"is_paratext":false,"is_xpac":false,"primary_topic":{"id":"https://openalex.org/T10099","display_name":"GaN-based semiconductor devices and materials","score":0.9990000128746033,"subfield":{"id":"https://openalex.org/subfields/3104","display_name":"Condensed Matter Physics"},"field":{"id":"https://openalex.org/fields/31","display_name":"Physics and Astronomy"},"domain":{"id":"https://openalex.org/domains/3","display_name":"Physical Sciences"}},"topics":[{"id":"https://openalex.org/T10099","display_name":"GaN-based semiconductor devices and materials","score":0.9990000128746033,"subfield":{"id":"https://openalex.org/subfields/3104","display_name":"Condensed Matter Physics"},"field":{"id":"https://openalex.org/fields/31","display_name":"Physics and Astronomy"},"domain":{"id":"https://openalex.org/domains/3","display_name":"Physical Sciences"}},{"id":"https://openalex.org/T10361","display_name":"Silicon Carbide Semiconductor Technologies","score":0.000699999975040555,"subfield":{"id":"https://openalex.org/subfields/2208","display_name":"Electrical and Electronic Engineering"},"field":{"id":"https://openalex.org/fields/22","display_name":"Engineering"},"domain":{"id":"https://openalex.org/domains/3","display_name":"Physical Sciences"}},{"id":"https://openalex.org/T10472","display_name":"Semiconductor materials and devices","score":0.0,"subfield":{"id":"https://openalex.org/subfields/2208","display_name":"Electrical and Electronic Engineering"},"field":{"id":"https://openalex.org/fields/22","display_name":"Engineering"},"domain":{"id":"https://openalex.org/domains/3","display_name":"Physical Sciences"}}],"keywords":[{"id":"https://openalex.org/keywords/gan-based-light-emitting-diodes","display_name":"GaN light-emitting diodes","score":0.9440000057220459},{"id":"https://openalex.org/keywords/current-degradation","display_name":"current degradation","score":0.7730000019073486},{"id":"https://openalex.org/keywords/breakdown-behavior","display_name":"breakdown behavior","score":0.8579999804496765},{"id":"https://openalex.org/keywords/reverse-bias-stress","display_name":"reverse bias stress","score":0.9169999957084656},{"id":"https://openalex.org/keywords/device-reliability","display_name":"device reliability","score":0.4959999918937683}],"concepts":[{"id":"https://openalex.org/C192562407","wikidata":"https://www.wikidata.org/wiki/Q228736","display_name":"Materials science","level":0,"score":0.723953366279602},{"id":"https://openalex.org/C2779679103","wikidata":"https://www.wikidata.org/wiki/Q5251805","display_name":"Degradation (telecommunications)","level":2,"score":0.690757155418396},{"id":"https://openalex.org/C176666156","wikidata":"https://www.wikidata.org/wiki/Q25504","display_name":"Light-emitting diode","level":2,"score":0.6628348231315613},{"id":"https://openalex.org/C49040817","wikidata":"https://www.wikidata.org/wiki/Q193091","display_name":"Optoelectronics","level":1,"score":0.6017194986343384},{"id":"https://openalex.org/C148043351","wikidata":"https://www.wikidata.org/wiki/Q4456944","display_name":"Current (fluid)","level":2,"score":0.5993202328681946},{"id":"https://openalex.org/C21036866","wikidata":"https://www.wikidata.org/wiki/Q181767","display_name":"Stress (linguistics)","level":2,"score":0.531403660774231},{"id":"https://openalex.org/C61696701","wikidata":"https://www.wikidata.org/wiki/Q770766","display_name":"Engineering physics","level":1,"score":0.3215155601501465},{"id":"https://openalex.org/C41008148","wikidata":"https://www.wikidata.org/wiki/Q21198","display_name":"Computer science","level":0,"score":0.17972955107688904},{"id":"https://openalex.org/C119599485","wikidata":"https://www.wikidata.org/wiki/Q43035","display_name":"Electrical engineering","level":1,"score":0.16521918773651123},{"id":"https://openalex.org/C76155785","wikidata":"https://www.wikidata.org/wiki/Q418","display_name":"Telecommunications","level":1,"score":0.09761437773704529},{"id":"https://openalex.org/C121332964","wikidata":"https://www.wikidata.org/wiki/Q413","display_name":"Physics","level":0,"score":0.06917038559913635},{"id":"https://openalex.org/C138885662","wikidata":"https://www.wikidata.org/wiki/Q5891","display_name":"Philosophy","level":0,"score":0.0},{"id":"https://openalex.org/C41895202","wikidata":"https://www.wikidata.org/wiki/Q8162","display_name":"Linguistics","level":1,"score":0.0},{"id":"https://openalex.org/C127413603","wikidata":"https://www.wikidata.org/wiki/Q11023","display_name":"Engineering","level":0,"score":0.0}],"mesh":[],"locations_count":1,"locations":[{"id":"doi:10.1088/1674-1056/26/8/087308","doi":"https://doi.org/10.1088/1674-1056/26/8/087308","is_oa":false,"landing_page_url":"https://doi.org/10.1088/1674-1056/26/8/087308","pdf_url":null,"source":{"id":"https://openalex.org/S33442941","display_name":"Chinese Physics B","issn_l":"1674-1056","issn":["1674-1056","2058-3834"],"is_oa":false,"is_in_doaj":false,"is_core":true,"listed_in":["cwts-core","dongbi-d","jufo-1","ki-jl-1","norway-1","poland-40","russia-white-list-2"],"host_organization":"https://openalex.org/P4310320083","host_organization_name":"IOP Publishing","host_organization_lineage":["https://openalex.org/P4310320083","https://openalex.org/P4310311669"],"host_organization_lineage_names":["IOP Publishing","Institute of Physics"],"type":"journal"},"license":null,"license_id":null,"version":"publishedVersion","is_accepted":true,"is_published":true,"raw_source_name":"Chinese Physics B","raw_type":"journal-article"}],"best_oa_location":null,"sustainable_development_goals":[],"study_designs":[],"awards":[],"funders":[],"has_content":{"pdf":false,"grobid_xml":false},"content_urls":null,"referenced_works_count":9,"referenced_works":["https://openalex.org/W1986940086","https://openalex.org/W2011830738","https://openalex.org/W2015345420","https://openalex.org/W2098220974","https://openalex.org/W2121102653","https://openalex.org/W2144338876","https://openalex.org/W2171760424","https://openalex.org/W2313982416","https://openalex.org/W2519942273"],"related_works":["https://openalex.org/W3133397388","https://openalex.org/W2145367481","https://openalex.org/W2029933568","https://openalex.org/W2000690222","https://openalex.org/W7046137523","https://openalex.org/W2726946672","https://openalex.org/W1978637894","https://openalex.org/W2720072444","https://openalex.org/W7046322464","https://openalex.org/W2096656058"],"abstract_inverted_index":{"Progressive":[0],"current":[1],"degradation":[2],"and":[3],"breakdown":[4],"behavior":[5],"in":[6],"GaN":[7],"LEDs":[8],"under":[9],"high":[10],"reverse":[11],"bias":[12],"stress*":[13],",":[14],"Zhao,":[15],"Linna,":[16],"Yu,":[17],"Peihong,":[18],"Guo,":[19],"Zixiang,":[20],"Yan,":[21],"Dawei,":[22],"Zhou,":[23],"Hao,":[24],"Wu,":[25],"Jinbo,":[26],"Cui,":[27],"Zhiqiang,":[28],"Sun,":[29],"Huarui,":[30],"Gu,":[31],"Xiaofeng":[32]},"counts_by_year":[{"year":2019,"cited_by_count":1}],"updated_date":"2026-10-30T12:39:25.321706","created_date":"2017-08-17T00:00:00"}