{"id":"https://openalex.org/W2734577201","doi":null,"title":"Material parameter determination using terahertz time-domain signal analysis = \ud14c\ub77c\ud5e4\ub974\uce20 \uc2dc\uac04 \uc601\uc5ed \uc2e0\ud638 \ubd84\uc11d\uc5d0 \uc758\ud55c \ubb3c\uc131 \uce21\uc815 \uc5f0\uad6c","display_name":"Material parameter determination using terahertz time-domain signal analysis = \ud14c\ub77c\ud5e4\ub974\uce20 \uc2dc\uac04 \uc601\uc5ed \uc2e0\ud638 \ubd84\uc11d\uc5d0 \uc758\ud55c \ubb3c\uc131 \uce21\uc815 \uc5f0\uad6c","publication_year":2016,"publication_date":"2016-01-01","ids":{"openalex":"https://openalex.org/W2734577201","mag":"2734577201"},"language":"ko","primary_location":{"id":"mag:2734577201","doi":null,"is_oa":false,"landing_page_url":"https://koasas.kaist.ac.kr/handle/10203/220562","pdf_url":null,"source":null,"license":null,"license_id":null,"version":null,"is_accepted":false,"is_published":false,"raw_source_name":null,"raw_type":null},"volume":null,"type":"dissertation","is_traditional":true,"indexed_in":[],"open_access":{"is_oa":false,"oa_status":"closed","oa_url":null,"any_repository_has_fulltext":false},"authorships":[{"author_position":"first","author":{"id":"https://openalex.org/A5027474840","display_name":"Jindoo Choi","orcid":"https://orcid.org/0000-0002-3157-4002","observed_orcids":["https://orcid.org/0000-0002-3157-4002"]},"institutions":[],"countries":[],"is_corresponding":false,"raw_author_name":"Jindoo Choi","raw_affiliation_strings":[],"raw_orcid":"https://orcid.org/0000-0002-3157-4002","affiliations":[]},{"author_position":"last","author":{"id":"https://openalex.org/A5041010717","display_name":"\ucd5c\uc9c4\ub450","orcid":null,"observed_orcids":[]},"institutions":[],"countries":[],"is_corresponding":false,"raw_author_name":"\ucd5c\uc9c4\ub450","raw_affiliation_strings":[],"raw_orcid":null,"affiliations":[]}],"institutions":[],"countries_distinct_count":0,"institutions_distinct_count":0,"corresponding_author_ids":[],"corresponding_institution_ids":[],"apc_list":null,"apc_paid":null,"fwci":null,"has_fulltext":false,"cited_by_count":0,"citation_normalized_percentile":null,"cited_by_percentile_year":null,"biblio":{"volume":null,"issue":null,"first_page":null,"last_page":null},"is_retracted":false,"is_paratext":false,"is_xpac":false,"primary_topic":{"id":"https://openalex.org/T10752","display_name":"Terahertz technology and applications","score":0.9976000189781189,"subfield":{"id":"https://openalex.org/subfields/2208","display_name":"Electrical and Electronic Engineering"},"field":{"id":"https://openalex.org/fields/22","display_name":"Engineering"},"domain":{"id":"https://openalex.org/domains/3","display_name":"Physical Sciences"}},"topics":[{"id":"https://openalex.org/T10752","display_name":"Terahertz technology and applications","score":0.9976000189781189,"subfield":{"id":"https://openalex.org/subfields/2208","display_name":"Electrical and Electronic Engineering"},"field":{"id":"https://openalex.org/fields/22","display_name":"Engineering"},"domain":{"id":"https://openalex.org/domains/3","display_name":"Physical Sciences"}},{"id":"https://openalex.org/T11607","display_name":"Microwave and Dielectric Measurement Techniques","score":0.000699999975040555,"subfield":{"id":"https://openalex.org/subfields/2208","display_name":"Electrical and Electronic Engineering"},"field":{"id":"https://openalex.org/fields/22","display_name":"Engineering"},"domain":{"id":"https://openalex.org/domains/3","display_name":"Physical Sciences"}},{"id":"https://openalex.org/T11856","display_name":"Thermography and Photoacoustic Techniques","score":0.0003000000142492354,"subfield":{"id":"https://openalex.org/subfields/2211","display_name":"Mechanics of Materials"},"field":{"id":"https://openalex.org/fields/22","display_name":"Engineering"},"domain":{"id":"https://openalex.org/domains/3","display_name":"Physical Sciences"}}],"keywords":[{"id":"https://openalex.org/keywords/terahertz-time-domain-spectroscopy","display_name":"terahertz time-domain spectroscopy","score":0.9369999766349792},{"id":"https://openalex.org/keywords/material-parameter-identification","display_name":"material parameter identification","score":0.949999988079071},{"id":"https://openalex.org/keywords/material-characterization","display_name":"material characterization","score":0.5989999771118164},{"id":"https://openalex.org/keywords/dielectric-properties","display_name":"dielectric properties","score":0.6539999842643738},{"id":"https://openalex.org/keywords/permittivity-measurement","display_name":"permittivity measurement","score":0.6290000081062317}],"concepts":[{"id":"https://openalex.org/C107816215","wikidata":"https://www.wikidata.org/wiki/Q647887","display_name":"Terahertz radiation","level":2,"score":0.7102786898612976},{"id":"https://openalex.org/C2779843651","wikidata":"https://www.wikidata.org/wiki/Q7390335","display_name":"SIGNAL (programming language)","level":2,"score":0.5651252865791321},{"id":"https://openalex.org/C103824480","wikidata":"https://www.wikidata.org/wiki/Q185889","display_name":"Time domain","level":2,"score":0.5334084033966064},{"id":"https://openalex.org/C104267543","wikidata":"https://www.wikidata.org/wiki/Q208163","display_name":"Signal processing","level":3,"score":0.416703462600708},{"id":"https://openalex.org/C121332964","wikidata":"https://www.wikidata.org/wiki/Q413","display_name":"Physics","level":0,"score":0.3870086669921875},{"id":"https://openalex.org/C41008148","wikidata":"https://www.wikidata.org/wiki/Q21198","display_name":"Computer science","level":0,"score":0.36968570947647095},{"id":"https://openalex.org/C192562407","wikidata":"https://www.wikidata.org/wiki/Q228736","display_name":"Materials science","level":0,"score":0.35965245962142944},{"id":"https://openalex.org/C24326235","wikidata":"https://www.wikidata.org/wiki/Q126095","display_name":"Electronic engineering","level":1,"score":0.32457399368286133},{"id":"https://openalex.org/C49040817","wikidata":"https://www.wikidata.org/wiki/Q193091","display_name":"Optoelectronics","level":1,"score":0.2901803255081177},{"id":"https://openalex.org/C127413603","wikidata":"https://www.wikidata.org/wiki/Q11023","display_name":"Engineering","level":0,"score":0.22734567523002625},{"id":"https://openalex.org/C84462506","wikidata":"https://www.wikidata.org/wiki/Q173142","display_name":"Digital signal processing","level":2,"score":0.13839295506477356},{"id":"https://openalex.org/C31972630","wikidata":"https://www.wikidata.org/wiki/Q844240","display_name":"Computer vision","level":1,"score":0.07695847749710083},{"id":"https://openalex.org/C199360897","wikidata":"https://www.wikidata.org/wiki/Q9143","display_name":"Programming language","level":1,"score":0.0}],"mesh":[],"locations_count":1,"locations":[{"id":"mag:2734577201","doi":null,"is_oa":false,"landing_page_url":"https://koasas.kaist.ac.kr/handle/10203/220562","pdf_url":null,"source":null,"license":null,"license_id":null,"version":null,"is_accepted":false,"is_published":false,"raw_source_name":null,"raw_type":null}],"best_oa_location":null,"sustainable_development_goals":[],"study_designs":[],"awards":[],"funders":[],"has_content":{"grobid_xml":false,"pdf":false},"content_urls":null,"referenced_works_count":0,"referenced_works":[],"related_works":["https://openalex.org/W2160397925","https://openalex.org/W2781842750","https://openalex.org/W2002241144","https://openalex.org/W2124824717","https://openalex.org/W6926581426","https://openalex.org/W3104475209","https://openalex.org/W2069610939","https://openalex.org/W1979838009","https://openalex.org/W2959503077","https://openalex.org/W2029937455"],"abstract_inverted_index":null,"counts_by_year":[],"updated_date":"2025-11-06T04:12:42.849631","created_date":"2017-07-21T00:00:00"}