{"id":"https://openalex.org/W2731398032","doi":"https://doi.org/10.1088/1681-7575/aa7cdd","title":"Measurement of the Boltzmann constant by Johnson noise thermometry using a superconducting integrated circuit","display_name":"Measurement of the Boltzmann constant by Johnson noise thermometry using a superconducting integrated circuit","publication_year":2017,"publication_date":"2017-06-30","ids":{"openalex":"https://openalex.org/W2731398032","doi":"https://doi.org/10.1088/1681-7575/aa7cdd","mag":"2731398032"},"language":"en","primary_location":{"id":"doi:10.1088/1681-7575/aa7cdd","doi":"https://doi.org/10.1088/1681-7575/aa7cdd","is_oa":true,"landing_page_url":"https://doi.org/10.1088/1681-7575/aa7cdd","pdf_url":"https://iopscience.iop.org/article/10.1088/1681-7575/aa7cdd/pdf","source":{"id":"https://openalex.org/S7291761","display_name":"Metrologia","issn_l":"0026-1394","issn":["0026-1394","1681-7575"],"is_oa":false,"is_in_doaj":false,"is_core":true,"listed_in":["anvur-scientific","cwts-core","dongbi-b","jufo-2","norway-1","poland-70","russia-white-list-2"],"host_organization":"https://openalex.org/P4310320083","host_organization_name":"IOP Publishing","host_organization_lineage":["https://openalex.org/P4310320083","https://openalex.org/P4310311669"],"host_organization_lineage_names":["IOP Publishing","Institute of Physics"],"type":"journal"},"license":"cc-by","license_id":"https://openalex.org/licenses/cc-by","version":"publishedVersion","is_accepted":true,"is_published":true,"raw_source_name":"Metrologia","raw_type":"journal-article"},"volume":null,"type":"article","indexed_in":["crossref"],"open_access":{"is_oa":true,"oa_status":"hybrid","oa_url":"https://iopscience.iop.org/article/10.1088/1681-7575/aa7cdd/pdf","any_repository_has_fulltext":false},"authorships":[{"author_position":"first","author":{"id":"https://openalex.org/A5011542345","display_name":"Chiharu Urano","orcid":"https://orcid.org/0000-0002-7581-2009","observed_orcids":["https://orcid.org/0000-0002-7581-2009"]},"institutions":[{"id":"https://openalex.org/I4405273829","display_name":"National Metrology Institute of Japan","ror":"https://ror.org/00j3eeb74","country_code":"JP","type":"government","lineage":["https://openalex.org/I4405273829","https://openalex.org/I73613424"]},{"id":"https://openalex.org/I73613424","display_name":"National Institute of Advanced Industrial Science and Technology","ror":"https://ror.org/01703db54","country_code":"JP","type":"government","lineage":["https://openalex.org/I73613424"]}],"countries":["JP"],"is_corresponding":true,"raw_author_name":"C Urano","raw_affiliation_strings":["National Metrology Institute of Japan, AIST, Umezono, Tsukuba, Ibaraki 305-8563, Japan"],"raw_orcid":null,"affiliations":[{"raw_affiliation_string":"National Metrology Institute of Japan, AIST, Umezono, Tsukuba, Ibaraki 305-8563, Japan","institution_ids":["https://openalex.org/I4405273829","https://openalex.org/I73613424"]}]},{"author_position":"middle","author":{"id":"https://openalex.org/A5002042394","display_name":"K. Yamazawa","orcid":"https://orcid.org/0000-0003-4005-8576","observed_orcids":["https://orcid.org/0000-0003-4005-8576"]},"institutions":[{"id":"https://openalex.org/I179759924","display_name":"National Institute of Technology and Evaluation","ror":"https://ror.org/044jdke57","country_code":"JP","type":"government","lineage":["https://openalex.org/I179759924"]},{"id":"https://openalex.org/I4405273829","display_name":"National Metrology Institute of Japan","ror":"https://ror.org/00j3eeb74","country_code":"JP","type":"government","lineage":["https://openalex.org/I4405273829","https://openalex.org/I73613424"]},{"id":"https://openalex.org/I73613424","display_name":"National Institute of Advanced Industrial Science and Technology","ror":"https://ror.org/01703db54","country_code":"JP","type":"government","lineage":["https://openalex.org/I73613424"]}],"countries":["JP"],"is_corresponding":false,"raw_author_name":"K Yamazawa","raw_affiliation_strings":["National Institute of Technology and Evaluation, Nishihara, Shibuya, Tokyo 151-0066, Japan","National Metrology Institute of Japan, AIST, Umezono, Tsukuba, Ibaraki 305-8563, Japan"],"raw_orcid":null,"affiliations":[{"raw_affiliation_string":"National Institute of Technology and Evaluation, Nishihara, Shibuya, Tokyo 151-0066, Japan","institution_ids":["https://openalex.org/I179759924"]},{"raw_affiliation_string":"National Metrology Institute of Japan, AIST, Umezono, Tsukuba, Ibaraki 305-8563, Japan","institution_ids":["https://openalex.org/I4405273829","https://openalex.org/I73613424"]}]},{"author_position":"last","author":{"id":"https://openalex.org/A5089866154","display_name":"Nobu\u2010Hisa Kaneko","orcid":"https://orcid.org/0000-0003-3857-7940","observed_orcids":["https://orcid.org/0000-0003-3857-7940"]},"institutions":[{"id":"https://openalex.org/I4405273829","display_name":"National Metrology Institute of Japan","ror":"https://ror.org/00j3eeb74","country_code":"JP","type":"government","lineage":["https://openalex.org/I4405273829","https://openalex.org/I73613424"]},{"id":"https://openalex.org/I73613424","display_name":"National Institute of Advanced Industrial Science and Technology","ror":"https://ror.org/01703db54","country_code":"JP","type":"government","lineage":["https://openalex.org/I73613424"]}],"countries":["JP"],"is_corresponding":false,"raw_author_name":"N-H Kaneko","raw_affiliation_strings":["National Metrology Institute of Japan, AIST, Umezono, Tsukuba, Ibaraki 305-8563, Japan"],"raw_orcid":null,"affiliations":[{"raw_affiliation_string":"National Metrology Institute of Japan, AIST, Umezono, Tsukuba, Ibaraki 305-8563, Japan","institution_ids":["https://openalex.org/I4405273829","https://openalex.org/I73613424"]}]}],"institutions":[],"countries_distinct_count":1,"institutions_distinct_count":3,"corresponding_author_ids":["https://openalex.org/A5011542345"],"corresponding_institution_ids":["https://openalex.org/I4405273829","https://openalex.org/I73613424"],"apc_list":{"value":3325,"currency":"USD","value_usd":3325},"apc_paid":{"value":3325,"currency":"USD","value_usd":3325},"fwci":4.1851,"has_fulltext":true,"cited_by_count":25,"citation_normalized_percentile":{"value":0.94276094,"is_in_top_1_percent":false,"is_in_top_10_percent":true},"cited_by_percentile_year":{"min":89,"max":99},"biblio":{"volume":"54","issue":"6","first_page":"847","last_page":"855"},"is_retracted":false,"is_paratext":false,"is_xpac":false,"primary_topic":{"id":"https://openalex.org/T11890","display_name":"Scientific Measurement and Uncertainty Evaluation","score":0.9038000106811523,"subfield":{"id":"https://openalex.org/subfields/1804","display_name":"Statistics, Probability and Uncertainty"},"field":{"id":"https://openalex.org/fields/18","display_name":"Decision Sciences"},"domain":{"id":"https://openalex.org/domains/2","display_name":"Social Sciences"}},"topics":[{"id":"https://openalex.org/T11890","display_name":"Scientific Measurement and Uncertainty Evaluation","score":0.9038000106811523,"subfield":{"id":"https://openalex.org/subfields/1804","display_name":"Statistics, Probability and Uncertainty"},"field":{"id":"https://openalex.org/fields/18","display_name":"Decision Sciences"},"domain":{"id":"https://openalex.org/domains/2","display_name":"Social Sciences"}},{"id":"https://openalex.org/T12019","display_name":"Calibration and Measurement Techniques","score":0.053700000047683716,"subfield":{"id":"https://openalex.org/subfields/2202","display_name":"Aerospace Engineering"},"field":{"id":"https://openalex.org/fields/22","display_name":"Engineering"},"domain":{"id":"https://openalex.org/domains/3","display_name":"Physical Sciences"}},{"id":"https://openalex.org/T12300","display_name":"Advanced Electrical Measurement Techniques","score":0.03550000116229057,"subfield":{"id":"https://openalex.org/subfields/2208","display_name":"Electrical and Electronic Engineering"},"field":{"id":"https://openalex.org/fields/22","display_name":"Engineering"},"domain":{"id":"https://openalex.org/domains/3","display_name":"Physical Sciences"}}],"keywords":[{"id":"https://openalex.org/keywords/boltzmann-constant","display_name":"Boltzmann constant","score":0.9909999966621399},{"id":"https://openalex.org/keywords/johnson-noise-thermometry","display_name":"Johnson noise thermometry","score":0.9980000257492065},{"id":"https://openalex.org/keywords/thermal-noise","display_name":"thermal noise","score":0.6790000200271606},{"id":"https://openalex.org/keywords/triple-point-of-water","display_name":"triple point of water","score":0.9380000233650208},{"id":"https://openalex.org/keywords/akaike-information-criterion","display_name":"Akaike information criterion","score":0.8479999899864197},{"id":"https://openalex.org/keywords/quadratic-model","display_name":"quadratic model","score":0.5440000295639038},{"id":"https://openalex.org/keywords/measurement-uncertainty","display_name":"measurement uncertainty","score":0.6119999885559082},{"id":"https://openalex.org/keywords/codata-comparison","display_name":"CODATA comparison","score":0.7070000171661377}],"concepts":[{"id":"https://openalex.org/C35304006","wikidata":"https://www.wikidata.org/wiki/Q5962","display_name":"Boltzmann constant","level":2,"score":0.7836882472038269},{"id":"https://openalex.org/C99498987","wikidata":"https://www.wikidata.org/wiki/Q2210247","display_name":"Noise (video)","level":3,"score":0.6928001046180725},{"id":"https://openalex.org/C104419016","wikidata":"https://www.wikidata.org/wiki/Q1337490","display_name":"Johnson\u2013Nyquist noise","level":3,"score":0.6582332253456116},{"id":"https://openalex.org/C2777027219","wikidata":"https://www.wikidata.org/wiki/Q1284190","display_name":"Constant (computer programming)","level":2,"score":0.6181564331054688},{"id":"https://openalex.org/C137488568","wikidata":"https://www.wikidata.org/wiki/Q5321","display_name":"Resistor","level":3,"score":0.5815345048904419},{"id":"https://openalex.org/C121332964","wikidata":"https://www.wikidata.org/wiki/Q413","display_name":"Physics","level":0,"score":0.5624942779541016},{"id":"https://openalex.org/C81370116","wikidata":"https://www.wikidata.org/wiki/Q1335249","display_name":"Time constant","level":2,"score":0.5330812931060791},{"id":"https://openalex.org/C165801399","wikidata":"https://www.wikidata.org/wiki/Q25428","display_name":"Voltage","level":2,"score":0.5029708743095398},{"id":"https://openalex.org/C112633086","wikidata":"https://www.wikidata.org/wiki/Q381287","display_name":"White noise","level":2,"score":0.4771275520324707},{"id":"https://openalex.org/C204323151","wikidata":"https://www.wikidata.org/wiki/Q905424","display_name":"Range (aeronautics)","level":2,"score":0.4278014898300171},{"id":"https://openalex.org/C126674687","wikidata":"https://www.wikidata.org/wiki/Q1662573","display_name":"Akaike information criterion","level":2,"score":0.4194238483905792},{"id":"https://openalex.org/C180188523","wikidata":"https://www.wikidata.org/wiki/Q574576","display_name":"Exponential decay","level":2,"score":0.41504934430122375},{"id":"https://openalex.org/C30475298","wikidata":"https://www.wikidata.org/wiki/Q909554","display_name":"Computational physics","level":1,"score":0.4137958884239197},{"id":"https://openalex.org/C121864883","wikidata":"https://www.wikidata.org/wiki/Q677916","display_name":"Statistical physics","level":1,"score":0.3944462835788727},{"id":"https://openalex.org/C97355855","wikidata":"https://www.wikidata.org/wiki/Q11473","display_name":"Thermodynamics","level":1,"score":0.26487672328948975},{"id":"https://openalex.org/C119599485","wikidata":"https://www.wikidata.org/wiki/Q43035","display_name":"Electrical engineering","level":1,"score":0.2548779249191284},{"id":"https://openalex.org/C192562407","wikidata":"https://www.wikidata.org/wiki/Q228736","display_name":"Materials science","level":0,"score":0.24270623922348022},{"id":"https://openalex.org/C62520636","wikidata":"https://www.wikidata.org/wiki/Q944","display_name":"Quantum mechanics","level":1,"score":0.2228134274482727},{"id":"https://openalex.org/C33923547","wikidata":"https://www.wikidata.org/wiki/Q395","display_name":"Mathematics","level":0,"score":0.2059958577156067},{"id":"https://openalex.org/C105795698","wikidata":"https://www.wikidata.org/wiki/Q12483","display_name":"Statistics","level":1,"score":0.16616210341453552},{"id":"https://openalex.org/C41008148","wikidata":"https://www.wikidata.org/wiki/Q21198","display_name":"Computer science","level":0,"score":0.16303566098213196},{"id":"https://openalex.org/C127413603","wikidata":"https://www.wikidata.org/wiki/Q11023","display_name":"Engineering","level":0,"score":0.0},{"id":"https://openalex.org/C159985019","wikidata":"https://www.wikidata.org/wiki/Q181790","display_name":"Composite material","level":1,"score":0.0},{"id":"https://openalex.org/C199360897","wikidata":"https://www.wikidata.org/wiki/Q9143","display_name":"Programming language","level":1,"score":0.0},{"id":"https://openalex.org/C115961682","wikidata":"https://www.wikidata.org/wiki/Q860623","display_name":"Image (mathematics)","level":2,"score":0.0},{"id":"https://openalex.org/C154945302","wikidata":"https://www.wikidata.org/wiki/Q11660","display_name":"Artificial intelligence","level":1,"score":0.0}],"mesh":[],"locations_count":1,"locations":[{"id":"doi:10.1088/1681-7575/aa7cdd","doi":"https://doi.org/10.1088/1681-7575/aa7cdd","is_oa":true,"landing_page_url":"https://doi.org/10.1088/1681-7575/aa7cdd","pdf_url":"https://iopscience.iop.org/article/10.1088/1681-7575/aa7cdd/pdf","source":{"id":"https://openalex.org/S7291761","display_name":"Metrologia","issn_l":"0026-1394","issn":["0026-1394","1681-7575"],"is_oa":false,"is_in_doaj":false,"is_core":true,"listed_in":["anvur-scientific","cwts-core","dongbi-b","jufo-2","norway-1","poland-70","russia-white-list-2"],"host_organization":"https://openalex.org/P4310320083","host_organization_name":"IOP Publishing","host_organization_lineage":["https://openalex.org/P4310320083","https://openalex.org/P4310311669"],"host_organization_lineage_names":["IOP Publishing","Institute of Physics"],"type":"journal"},"license":"cc-by","license_id":"https://openalex.org/licenses/cc-by","version":"publishedVersion","is_accepted":true,"is_published":true,"raw_source_name":"Metrologia","raw_type":"journal-article"}],"best_oa_location":{"id":"doi:10.1088/1681-7575/aa7cdd","doi":"https://doi.org/10.1088/1681-7575/aa7cdd","is_oa":true,"landing_page_url":"https://doi.org/10.1088/1681-7575/aa7cdd","pdf_url":"https://iopscience.iop.org/article/10.1088/1681-7575/aa7cdd/pdf","source":{"id":"https://openalex.org/S7291761","display_name":"Metrologia","issn_l":"0026-1394","issn":["0026-1394","1681-7575"],"is_oa":false,"is_in_doaj":false,"is_core":true,"listed_in":["anvur-scientific","cwts-core","dongbi-b","jufo-2","norway-1","poland-70","russia-white-list-2"],"host_organization":"https://openalex.org/P4310320083","host_organization_name":"IOP Publishing","host_organization_lineage":["https://openalex.org/P4310320083","https://openalex.org/P4310311669"],"host_organization_lineage_names":["IOP Publishing","Institute of Physics"],"type":"journal"},"license":"cc-by","license_id":"https://openalex.org/licenses/cc-by","version":"publishedVersion","is_accepted":true,"is_published":true,"raw_source_name":"Metrologia","raw_type":"journal-article"},"sustainable_development_goals":[],"sustainable_development_goals_aurora":[{"id":"https://metadata.un.org/sdg/7","display_name":"Affordable and clean energy","score":0.8199999928474426}],"study_designs":[],"awards":[{"id":"https://openalex.org/G3991772329","display_name":"Development of thermodynamic temperature measurement technique based on Josephson effect and Quantum Hall effect","funder_award_id":"22246013","funder_id":"https://openalex.org/F4320334764","funder_display_name":"Japan Society for the Promotion of Science"},{"id":"https://openalex.org/G4053943703","display_name":"Integrated quantum voltage noise source for Johnson noise thermometers","funder_award_id":"25289126","funder_id":"https://openalex.org/F4320334764","funder_display_name":"Japan Society for the Promotion of Science"},{"id":"https://openalex.org/G8687537133","display_name":"Precise Measurement of Themodynamic Temperature Based on Johnson Noise Thermometry Using Integrated Quantum Voltage Noise Source","funder_award_id":"17K05113","funder_id":"https://openalex.org/F4320334764","funder_display_name":"Japan Society for the Promotion of Science"}],"funders":[{"id":"https://openalex.org/F4320311508","display_name":"National Institute of Advanced Industrial Science and Technology","ror":"https://ror.org/01703db54"},{"id":"https://openalex.org/F4320334764","display_name":"Japan Society for the Promotion of Science","ror":"https://ror.org/00hhkn466"}],"has_content":{"grobid_xml":true,"pdf":true},"content_urls":{"pdf":"https://content.openalex.org/works/W2731398032.pdf","grobid_xml":"https://content.openalex.org/works/W2731398032.grobid-xml"},"referenced_works_count":21,"referenced_works":["https://openalex.org/W1609336370","https://openalex.org/W2027493053","https://openalex.org/W2036605565","https://openalex.org/W2057893961","https://openalex.org/W2058815839","https://openalex.org/W2095507762","https://openalex.org/W2131356494","https://openalex.org/W2169282251","https://openalex.org/W2294758492","https://openalex.org/W2295906197","https://openalex.org/W2299529207","https://openalex.org/W2339029212","https://openalex.org/W2569148135","https://openalex.org/W2587410496","https://openalex.org/W2621488256","https://openalex.org/W2722581998","https://openalex.org/W2729453689","https://openalex.org/W2730558737","https://openalex.org/W2911070639","https://openalex.org/W4211153246","https://openalex.org/W4252106337"],"related_works":["https://openalex.org/W2569148135","https://openalex.org/W2508293599","https://openalex.org/W2299529207","https://openalex.org/W2027493053","https://openalex.org/W2294758492","https://openalex.org/W2243436648","https://openalex.org/W2158168847","https://openalex.org/W2722581998","https://openalex.org/W2047230044","https://openalex.org/W2157187356"],"abstract_inverted_index":{"We":[0,68],"report":[1],"on":[2],"our":[3],"measurement":[4],"of":[5,47,55,59,71,106,124,128],"the":[6,41,53,56,65,84,90,95,100,107,110,134],"Boltzmann":[7,101,113],"constant":[8,114],"by":[9,64],"Johnson":[10],"noise":[11,19,37,46],"thermometry":[12],"(JNT)":[13],"using":[14],"an":[15],"integrated":[16,28],"quantum":[17],"voltage":[18],"source":[20],"(IQVNS)":[21],"that":[22],"is":[23,130],"fully":[24],"implemented":[25],"with":[26,119],"superconducting":[27],"circuit":[29],"technology.":[30],"The":[31,44,126],"IQVNS":[32],"generates":[33],"calculable":[34],"pseudo":[35],"white":[36],"voltages":[38],"to":[39,88,98],"calibrate":[40],"JNT":[42],"system.":[43],"thermal":[45],"a":[48,120],"sensing":[49],"resistor":[50],"placed":[51],"at":[52],"temperature":[54],"triple":[57],"point":[58],"water":[60],"was":[61,115],"measured":[62],"precisely":[63],"IQVNS-based":[66],"JNT.":[67],"accumulated":[69],"data":[70],"more":[72],"than":[73,133],"429":[74],"200":[75],"s":[76],"in":[77],"total":[78],"(over":[79],"6":[80],"d)":[81],"and":[82],"used":[83],"Akaike":[85],"information":[86],"criterion":[87],"estimate":[89],"fitting":[91],"frequency":[92],"range":[93],"for":[94],"quadratic":[96],"model":[97],"calculate":[99],"constant.":[102],"Upon":[103],"detailed":[104],"evaluation":[105],"uncertainty":[108,123],"components,":[109],"experimentally":[111],"obtained":[112],"J":[116],"K":[117],"\u22121":[118],"relative":[121],"combined":[122],".":[125,145],"value":[127,137],"k":[129],"relatively":[131],"lower":[132],"CODATA":[135],"2014":[136],"(Mohr":[138],"et":[139],"al":[140],"2016":[141],"Rev.":[142],"Mod.":[143],"Phys":[144],"88":[146],"035009).":[147]},"counts_by_year":[{"year":2024,"cited_by_count":1},{"year":2023,"cited_by_count":2},{"year":2021,"cited_by_count":5},{"year":2020,"cited_by_count":1},{"year":2019,"cited_by_count":7},{"year":2018,"cited_by_count":5},{"year":2017,"cited_by_count":4}],"updated_date":"2026-10-16T09:59:22.235173","created_date":"2017-07-14T00:00:00"}