{"id":"https://openalex.org/W2620936769","doi":"https://doi.org/10.1109/irps.2017.7936351","title":"Adaptive accelerated aging with 28nm HKMG technology","display_name":"Adaptive accelerated aging with 28nm HKMG technology","publication_year":2017,"publication_date":"2017-04-01","ids":{"openalex":"https://openalex.org/W2620936769","doi":"https://doi.org/10.1109/irps.2017.7936351","mag":"2620936769"},"language":"en","primary_location":{"id":"doi:10.1109/irps.2017.7936351","doi":"https://doi.org/10.1109/irps.2017.7936351","is_oa":false,"landing_page_url":"https://doi.org/10.1109/irps.2017.7936351","pdf_url":null,"source":{"id":"https://openalex.org/S4210238090","display_name":"IEEE International Reliability Physics Symposium proceedings","issn_l":"0735-0791","issn":["0735-0791","1541-7026","1938-1891"],"is_oa":false,"is_in_doaj":false,"is_core":false,"listed_in":[],"host_organization":"https://openalex.org/P4310319808","host_organization_name":"Institute of Electrical and Electronics Engineers","host_organization_lineage":["https://openalex.org/P4310319808"],"host_organization_lineage_names":["Institute of Electrical and Electronics Engineers"],"type":"conference"},"license":null,"license_id":null,"version":"publishedVersion","is_accepted":true,"is_published":true,"raw_source_name":"2017 IEEE International Reliability Physics Symposium (IRPS)","raw_type":"proceedings-article"},"volume":null,"type":"conference-paper","indexed_in":["crossref"],"open_access":{"is_oa":false,"oa_status":"closed","oa_url":null,"any_repository_has_fulltext":false},"authorships":[{"author_position":"first","author":{"id":"https://openalex.org/A5089024476","display_name":"Devyani Patra","orcid":null,"observed_orcids":[]},"institutions":[{"id":"https://openalex.org/I55732556","display_name":"Arizona State University","ror":"https://ror.org/03efmqc40","country_code":"US","type":"education","lineage":["https://openalex.org/I55732556"]}],"countries":["US"],"is_corresponding":false,"raw_author_name":"Devyani Patra","raw_affiliation_strings":["School of ECEE, Arizona State University, Tempe, AZ"],"raw_orcid":null,"affiliations":[{"raw_affiliation_string":"School of ECEE, Arizona State University, Tempe, AZ","institution_ids":["https://openalex.org/I55732556"]}]},{"author_position":"middle","author":{"id":"https://openalex.org/A5008093354","display_name":"Ahmed Kamal Reza","orcid":"https://orcid.org/0000-0003-0381-8708","observed_orcids":["https://orcid.org/0000-0003-0381-8708"]},"institutions":[{"id":"https://openalex.org/I219193219","display_name":"Purdue University West Lafayette","ror":"https://ror.org/02dqehb95","country_code":"US","type":"education","lineage":["https://openalex.org/I219193219"]}],"countries":["US"],"is_corresponding":false,"raw_author_name":"Ahmed Kamal Reza","raw_affiliation_strings":["School of ECE, Purdue University, West Lafayette, IN"],"raw_orcid":null,"affiliations":[{"raw_affiliation_string":"School of ECE, Purdue University, West Lafayette, IN","institution_ids":["https://openalex.org/I219193219"]}]},{"author_position":"middle","author":{"id":"https://openalex.org/A5102418504","display_name":"Mohammed Khaled Hassan","orcid":null,"observed_orcids":[]},"institutions":[{"id":"https://openalex.org/I219193219","display_name":"Purdue University West Lafayette","ror":"https://ror.org/02dqehb95","country_code":"US","type":"education","lineage":["https://openalex.org/I219193219"]}],"countries":["US"],"is_corresponding":false,"raw_author_name":"Mohammed Khaled Hassan","raw_affiliation_strings":["School of ECE, Purdue University, West Lafayette, IN"],"raw_orcid":null,"affiliations":[{"raw_affiliation_string":"School of ECE, Purdue University, West Lafayette, IN","institution_ids":["https://openalex.org/I219193219"]}]},{"author_position":"middle","author":{"id":"https://openalex.org/A5044513450","display_name":"Mehdi Katoozi","orcid":null,"observed_orcids":[]},"institutions":[{"id":"https://openalex.org/I1295339012","display_name":"Boeing (United States)","ror":"https://ror.org/04sm5zn07","country_code":"US","type":"company","lineage":["https://openalex.org/I1295339012"]}],"countries":["US"],"is_corresponding":false,"raw_author_name":"Mehdi Katoozi","raw_affiliation_strings":["The Boeing Company, Seattle, WA"],"raw_orcid":null,"affiliations":[{"raw_affiliation_string":"The Boeing Company, Seattle, WA","institution_ids":["https://openalex.org/I1295339012"]}]},{"author_position":"middle","author":{"id":"https://openalex.org/A5067006645","display_name":"Ethan H. Cannon","orcid":null,"observed_orcids":[]},"institutions":[{"id":"https://openalex.org/I1295339012","display_name":"Boeing (United States)","ror":"https://ror.org/04sm5zn07","country_code":"US","type":"company","lineage":["https://openalex.org/I1295339012"]}],"countries":["US"],"is_corresponding":false,"raw_author_name":"Ethan H. Cannon","raw_affiliation_strings":["The Boeing Company, Seattle, WA"],"raw_orcid":null,"affiliations":[{"raw_affiliation_string":"The Boeing Company, Seattle, WA","institution_ids":["https://openalex.org/I1295339012"]}]},{"author_position":"middle","author":{"id":"https://openalex.org/A5031161187","display_name":"Kaushik Roy","orcid":"https://orcid.org/0000-0002-0735-9695","observed_orcids":["https://orcid.org/0000-0002-0735-9695"]},"institutions":[{"id":"https://openalex.org/I219193219","display_name":"Purdue University West Lafayette","ror":"https://ror.org/02dqehb95","country_code":"US","type":"education","lineage":["https://openalex.org/I219193219"]}],"countries":["US"],"is_corresponding":false,"raw_author_name":"Kaushik Roy","raw_affiliation_strings":["School of ECE, Purdue University, West Lafayette, IN"],"raw_orcid":null,"affiliations":[{"raw_affiliation_string":"School of ECE, Purdue University, West Lafayette, IN","institution_ids":["https://openalex.org/I219193219"]}]},{"author_position":"last","author":{"id":"https://openalex.org/A5100740019","display_name":"Yu Kevin Cao","orcid":"https://orcid.org/0000-0001-6968-1180","observed_orcids":["https://orcid.org/0000-0001-6968-1180","https://orcid.org/0000-0003-4451-2756"]},"institutions":[{"id":"https://openalex.org/I55732556","display_name":"Arizona State University","ror":"https://ror.org/03efmqc40","country_code":"US","type":"education","lineage":["https://openalex.org/I55732556"]}],"countries":["US"],"is_corresponding":false,"raw_author_name":"Yu Cao","raw_affiliation_strings":["School of ECEE, Arizona State University, Tempe, AZ"],"raw_orcid":null,"affiliations":[{"raw_affiliation_string":"School of ECEE, Arizona State University, Tempe, AZ","institution_ids":["https://openalex.org/I55732556"]}]}],"institutions":[],"countries_distinct_count":1,"institutions_distinct_count":3,"corresponding_author_ids":[],"corresponding_institution_ids":[],"apc_list":null,"apc_paid":null,"fwci":0.3882,"has_fulltext":false,"cited_by_count":2,"citation_normalized_percentile":{"value":0.4914101,"is_in_top_1_percent":false,"is_in_top_10_percent":false},"cited_by_percentile_year":{"min":89,"max":94},"biblio":{"volume":null,"issue":null,"first_page":"CR","last_page":"2.1"},"is_retracted":false,"is_paratext":false,"is_xpac":false,"primary_topic":{"id":"https://openalex.org/T11032","display_name":"VLSI and Analog Circuit Testing","score":0.45680001378059387,"subfield":{"id":"https://openalex.org/subfields/1708","display_name":"Hardware and Architecture"},"field":{"id":"https://openalex.org/fields/17","display_name":"Computer Science"},"domain":{"id":"https://openalex.org/domains/3","display_name":"Physical Sciences"}},"topics":[{"id":"https://openalex.org/T11032","display_name":"VLSI and Analog Circuit Testing","score":0.45680001378059387,"subfield":{"id":"https://openalex.org/subfields/1708","display_name":"Hardware and Architecture"},"field":{"id":"https://openalex.org/fields/17","display_name":"Computer Science"},"domain":{"id":"https://openalex.org/domains/3","display_name":"Physical Sciences"}},{"id":"https://openalex.org/T14117","display_name":"Integrated Circuits and Semiconductor Failure Analysis","score":0.27639999985694885,"subfield":{"id":"https://openalex.org/subfields/2208","display_name":"Electrical and Electronic Engineering"},"field":{"id":"https://openalex.org/fields/22","display_name":"Engineering"},"domain":{"id":"https://openalex.org/domains/3","display_name":"Physical Sciences"}},{"id":"https://openalex.org/T11005","display_name":"Radiation Effects in Electronics","score":0.07270000129938126,"subfield":{"id":"https://openalex.org/subfields/2208","display_name":"Electrical and Electronic Engineering"},"field":{"id":"https://openalex.org/fields/22","display_name":"Engineering"},"domain":{"id":"https://openalex.org/domains/3","display_name":"Physical Sciences"}}],"keywords":[{"id":"https://openalex.org/keywords/28-nm-cmos","display_name":"28nm CMOS","score":0.8209999799728394},{"id":"https://openalex.org/keywords/device-reliability","display_name":"device reliability","score":0.7260000109672546},{"id":"https://openalex.org/keywords/accelerated-aging-test","display_name":"accelerated aging test","score":0.4300000071525574},{"id":"https://openalex.org/keywords/lifetime-extrapolation","display_name":"lifetime extrapolation","score":0.5519999861717224}],"concepts":[{"id":"https://openalex.org/C43214815","wikidata":"https://www.wikidata.org/wiki/Q7310987","display_name":"Reliability (semiconductor)","level":3,"score":0.7974702715873718},{"id":"https://openalex.org/C200601418","wikidata":"https://www.wikidata.org/wiki/Q2193887","display_name":"Reliability engineering","level":1,"score":0.7078752517700195},{"id":"https://openalex.org/C118820876","wikidata":"https://www.wikidata.org/wiki/Q4672283","display_name":"Accelerated aging","level":2,"score":0.6338464021682739},{"id":"https://openalex.org/C41008148","wikidata":"https://www.wikidata.org/wiki/Q21198","display_name":"Computer science","level":0,"score":0.611623227596283},{"id":"https://openalex.org/C18762648","wikidata":"https://www.wikidata.org/wiki/Q42213","display_name":"Work (physics)","level":2,"score":0.5164389610290527},{"id":"https://openalex.org/C2777267654","wikidata":"https://www.wikidata.org/wiki/Q3519023","display_name":"Test (biology)","level":2,"score":0.45107075572013855},{"id":"https://openalex.org/C127413603","wikidata":"https://www.wikidata.org/wiki/Q11023","display_name":"Engineering","level":0,"score":0.19588235020637512},{"id":"https://openalex.org/C78519656","wikidata":"https://www.wikidata.org/wiki/Q101333","display_name":"Mechanical engineering","level":1,"score":0.05923780798912048},{"id":"https://openalex.org/C121332964","wikidata":"https://www.wikidata.org/wiki/Q413","display_name":"Physics","level":0,"score":0.0},{"id":"https://openalex.org/C62520636","wikidata":"https://www.wikidata.org/wiki/Q944","display_name":"Quantum mechanics","level":1,"score":0.0},{"id":"https://openalex.org/C163258240","wikidata":"https://www.wikidata.org/wiki/Q25342","display_name":"Power (physics)","level":2,"score":0.0},{"id":"https://openalex.org/C151730666","wikidata":"https://www.wikidata.org/wiki/Q7205","display_name":"Paleontology","level":1,"score":0.0},{"id":"https://openalex.org/C86803240","wikidata":"https://www.wikidata.org/wiki/Q420","display_name":"Biology","level":0,"score":0.0}],"mesh":[],"locations_count":1,"locations":[{"id":"doi:10.1109/irps.2017.7936351","doi":"https://doi.org/10.1109/irps.2017.7936351","is_oa":false,"landing_page_url":"https://doi.org/10.1109/irps.2017.7936351","pdf_url":null,"source":{"id":"https://openalex.org/S4210238090","display_name":"IEEE International Reliability Physics Symposium proceedings","issn_l":"0735-0791","issn":["0735-0791","1541-7026","1938-1891"],"is_oa":false,"is_in_doaj":false,"is_core":false,"listed_in":[],"host_organization":"https://openalex.org/P4310319808","host_organization_name":"Institute of Electrical and Electronics Engineers","host_organization_lineage":["https://openalex.org/P4310319808"],"host_organization_lineage_names":["Institute of Electrical and Electronics Engineers"],"type":"conference"},"license":null,"license_id":null,"version":"publishedVersion","is_accepted":true,"is_published":true,"raw_source_name":"2017 IEEE International Reliability Physics Symposium (IRPS)","raw_type":"proceedings-article"}],"best_oa_location":null,"sustainable_development_goals":[],"study_designs":[],"awards":[],"funders":[{"id":"https://openalex.org/F4320306078","display_name":"U.S. Department of Defense","ror":"https://ror.org/0447fe631"},{"id":"https://openalex.org/F4320332180","display_name":"Defense Advanced Research Projects Agency","ror":"https://ror.org/02caytj08"}],"has_content":{"grobid_xml":false,"pdf":false},"content_urls":null,"referenced_works_count":4,"referenced_works":["https://openalex.org/W1522481364","https://openalex.org/W2014390999","https://openalex.org/W2075614785","https://openalex.org/W2620884380"],"related_works":["https://openalex.org/W2776276387","https://openalex.org/W4364857893","https://openalex.org/W4283780494","https://openalex.org/W4253643998","https://openalex.org/W4322729622","https://openalex.org/W7033214855","https://openalex.org/W2621283933","https://openalex.org/W2903318332","https://openalex.org/W2056250704","https://openalex.org/W2800470148"],"abstract_inverted_index":{"Device":[0],"and":[1,52,87,91],"circuit":[2],"reliability":[3],"analysis":[4],"lacks":[5],"a":[6,19,37,50,63],"direct":[7],"validation":[8],"of":[9,26,29,47,57],"the":[10,27,42,45,98],"lifetime.":[11],"Usually,":[12],"aging":[13],"in":[14,23,49,84],"devices":[15],"is":[16],"extrapolated":[17],"from":[18],"short-term":[20],"measurement,":[21],"resulting":[22],"unreliable":[24],"prediction":[25],"end":[28,46],"lifetime":[30,48],"(EOL).":[31],"This":[32],"work":[33,59],"aims":[34],"at":[35,94],"providing":[36],"new":[38],"approach":[39],"to":[40,44,96],"test":[41,64,73,92],"device":[43],"fast":[51],"controllable":[53],"manner.":[54],"The":[55],"contributions":[56],"this":[58],"include:":[60],"(1)":[61],"Introducing":[62],"methodology":[65],"called":[66],"Adaptive":[67],"Accelerated":[68],"Aging":[69],"(AAA),":[70],"(2)":[71],"Providing":[72],"conditions":[74],"for":[75,81],"multiple":[76],"stress":[77],"conditions,":[78],"including":[79],"those":[80],"achieving":[82],"EOL":[83],"1":[85],"hour,":[86],"(3)":[88],"Presenting":[89],"simulation":[90],"results":[93],"28nm":[95],"validate":[97],"proposed":[99],"methodology.":[100]},"counts_by_year":[{"year":2019,"cited_by_count":1},{"year":2018,"cited_by_count":1}],"updated_date":"2026-10-06T10:28:23.643775","created_date":"2017-06-09T00:00:00"}