{"id":"https://openalex.org/W2605583754","doi":"https://doi.org/10.3788/gzxb20174603.0312003","title":"Calibration Method for Standard Scattering Plate Calibration System Used in Calibrating Visibility Meter","display_name":"Calibration Method for Standard Scattering Plate Calibration System Used in Calibrating Visibility Meter","publication_year":2017,"publication_date":"2017-01-01","ids":{"openalex":"https://openalex.org/W2605583754","doi":"https://doi.org/10.3788/gzxb20174603.0312003","mag":"2605583754"},"language":"en","primary_location":{"id":"doi:10.3788/gzxb20174603.0312003","doi":"https://doi.org/10.3788/gzxb20174603.0312003","is_oa":false,"landing_page_url":"https://doi.org/10.3788/gzxb20174603.0312003","pdf_url":null,"source":{"id":"https://openalex.org/S197797711","display_name":"ACTA PHOTONICA SINICA","issn_l":"1004-4213","issn":["1004-4213"],"is_oa":false,"is_in_doaj":false,"is_core":false,"listed_in":["norway-1","poland-20","russia-white-list-4"],"host_organization":"https://openalex.org/P4320800582","host_organization_name":"Chinese Optical Society","host_organization_lineage":["https://openalex.org/P4320800582"],"host_organization_lineage_names":["Chinese Optical Society"],"type":"journal"},"license":null,"license_id":null,"version":"publishedVersion","is_accepted":true,"is_published":true,"raw_source_name":"ACTA PHOTONICA SINICA","raw_type":"journal-article"},"volume":null,"type":"article","is_traditional":true,"indexed_in":["crossref"],"open_access":{"is_oa":false,"oa_status":"closed","oa_url":null,"any_repository_has_fulltext":false},"authorships":[{"author_position":"first","author":{"id":null,"display_name":"\u5f20\u5065 ZHANG Jian","orcid":null,"observed_orcids":[]},"institutions":[],"countries":[],"is_corresponding":false,"raw_author_name":"\u5f20\u5065 ZHANG Jian","raw_affiliation_strings":[],"raw_orcid":null,"affiliations":[]},{"author_position":"middle","author":{"id":"https://openalex.org/A5038759028","display_name":"\u5f20\u56fd\u7389 Zhang Guoyu","orcid":null,"observed_orcids":[]},"institutions":[],"countries":[],"is_corresponding":false,"raw_author_name":"\u5f20\u56fd\u7389 ZHANG Guo-yu","raw_affiliation_strings":[],"raw_orcid":null,"affiliations":[]},{"author_position":"middle","author":{"id":"https://openalex.org/A5088620593","display_name":"Gaofei Sun","orcid":"https://orcid.org/0000-0003-3009-0281","observed_orcids":["https://orcid.org/0000-0003-3009-0281"]},"institutions":[],"countries":[],"is_corresponding":false,"raw_author_name":"\u5b59\u9ad8\u98de SUN Gao-fei","raw_affiliation_strings":[],"raw_orcid":null,"affiliations":[]},{"author_position":"middle","author":{"id":"https://openalex.org/A5054934911","display_name":"\u82cf\u62fe Su Shi","orcid":null,"observed_orcids":[]},"institutions":[],"countries":[],"is_corresponding":false,"raw_author_name":"\u82cf\u62fe SU Shi","raw_affiliation_strings":[],"raw_orcid":null,"affiliations":[]},{"author_position":"last","author":{"id":"https://openalex.org/A5013899743","display_name":"\u5f20\u5efa\u826f ZHANG Jian-liang","orcid":null,"observed_orcids":[]},"institutions":[],"countries":[],"is_corresponding":false,"raw_author_name":"\u5f20\u5efa\u826f ZHANG Jian-liang","raw_affiliation_strings":[],"raw_orcid":null,"affiliations":[]}],"institutions":[],"countries_distinct_count":0,"institutions_distinct_count":0,"corresponding_author_ids":[],"corresponding_institution_ids":[],"apc_list":null,"apc_paid":null,"fwci":0.539,"has_fulltext":false,"cited_by_count":9,"citation_normalized_percentile":{"value":0.67833556,"is_in_top_1_percent":false,"is_in_top_10_percent":false},"cited_by_percentile_year":{"min":88,"max":96},"biblio":{"volume":"46","issue":"3","first_page":"312003","last_page":"312003"},"is_retracted":false,"is_paratext":false,"is_xpac":false,"primary_topic":{"id":"https://openalex.org/T12019","display_name":"Calibration and Measurement Techniques","score":0.8022000193595886,"subfield":{"id":"https://openalex.org/subfields/2202","display_name":"Aerospace Engineering"},"field":{"id":"https://openalex.org/fields/22","display_name":"Engineering"},"domain":{"id":"https://openalex.org/domains/3","display_name":"Physical Sciences"}},"topics":[{"id":"https://openalex.org/T12019","display_name":"Calibration and Measurement Techniques","score":0.8022000193595886,"subfield":{"id":"https://openalex.org/subfields/2202","display_name":"Aerospace Engineering"},"field":{"id":"https://openalex.org/fields/22","display_name":"Engineering"},"domain":{"id":"https://openalex.org/domains/3","display_name":"Physical Sciences"}},{"id":"https://openalex.org/T14257","display_name":"Advanced Measurement and Detection Methods","score":0.08669999986886978,"subfield":{"id":"https://openalex.org/subfields/2208","display_name":"Electrical and Electronic Engineering"},"field":{"id":"https://openalex.org/fields/22","display_name":"Engineering"},"domain":{"id":"https://openalex.org/domains/3","display_name":"Physical Sciences"}},{"id":"https://openalex.org/T11890","display_name":"Scientific Measurement and Uncertainty Evaluation","score":0.01850000023841858,"subfield":{"id":"https://openalex.org/subfields/3105","display_name":"Instrumentation"},"field":{"id":"https://openalex.org/fields/31","display_name":"Physics and Astronomy"},"domain":{"id":"https://openalex.org/domains/3","display_name":"Physical Sciences"}}],"keywords":[{"id":"https://openalex.org/keywords/visibility-meter","display_name":"visibility meter","score":0.5519999861717224},{"id":"https://openalex.org/keywords/calibration","display_name":"calibration","score":0.42800000309944153},{"id":"https://openalex.org/keywords/visibility-measurement","display_name":"visibility measurement","score":0.5210000276565552},{"id":"https://openalex.org/keywords/light-scattering","display_name":"light scattering","score":0.5419999957084656},{"id":"https://openalex.org/keywords/atmospheric-visibility","display_name":"atmospheric visibility","score":0.3409999907016754}],"concepts":[{"id":"https://openalex.org/C123403432","wikidata":"https://www.wikidata.org/wiki/Q654068","display_name":"Visibility","level":2,"score":0.8690389394760132},{"id":"https://openalex.org/C165838908","wikidata":"https://www.wikidata.org/wiki/Q736777","display_name":"Calibration","level":2,"score":0.8579000234603882},{"id":"https://openalex.org/C151011524","wikidata":"https://www.wikidata.org/wiki/Q11573","display_name":"Metre","level":2,"score":0.67143714427948},{"id":"https://openalex.org/C120665830","wikidata":"https://www.wikidata.org/wiki/Q14620","display_name":"Optics","level":1,"score":0.5122267603874207},{"id":"https://openalex.org/C191486275","wikidata":"https://www.wikidata.org/wiki/Q210028","display_name":"Scattering","level":2,"score":0.4846504330635071},{"id":"https://openalex.org/C62649853","wikidata":"https://www.wikidata.org/wiki/Q199687","display_name":"Remote sensing","level":1,"score":0.48209431767463684},{"id":"https://openalex.org/C41008148","wikidata":"https://www.wikidata.org/wiki/Q21198","display_name":"Computer science","level":0,"score":0.36242276430130005},{"id":"https://openalex.org/C121332964","wikidata":"https://www.wikidata.org/wiki/Q413","display_name":"Physics","level":0,"score":0.1896689534187317},{"id":"https://openalex.org/C127313418","wikidata":"https://www.wikidata.org/wiki/Q1069","display_name":"Geology","level":0,"score":0.08304360508918762},{"id":"https://openalex.org/C62520636","wikidata":"https://www.wikidata.org/wiki/Q944","display_name":"Quantum mechanics","level":1,"score":0.0},{"id":"https://openalex.org/C1276947","wikidata":"https://www.wikidata.org/wiki/Q333","display_name":"Astronomy","level":1,"score":0.0}],"mesh":[],"locations_count":1,"locations":[{"id":"doi:10.3788/gzxb20174603.0312003","doi":"https://doi.org/10.3788/gzxb20174603.0312003","is_oa":false,"landing_page_url":"https://doi.org/10.3788/gzxb20174603.0312003","pdf_url":null,"source":{"id":"https://openalex.org/S197797711","display_name":"ACTA PHOTONICA SINICA","issn_l":"1004-4213","issn":["1004-4213"],"is_oa":false,"is_in_doaj":false,"is_core":false,"listed_in":["norway-1","poland-20","russia-white-list-4"],"host_organization":"https://openalex.org/P4320800582","host_organization_name":"Chinese Optical Society","host_organization_lineage":["https://openalex.org/P4320800582"],"host_organization_lineage_names":["Chinese Optical Society"],"type":"journal"},"license":null,"license_id":null,"version":"publishedVersion","is_accepted":true,"is_published":true,"raw_source_name":"ACTA PHOTONICA SINICA","raw_type":"journal-article"}],"best_oa_location":null,"sustainable_development_goals":[],"study_designs":[],"awards":[],"funders":[],"has_content":{"grobid_xml":false,"pdf":false},"content_urls":null,"referenced_works_count":0,"referenced_works":[],"related_works":["https://openalex.org/W2660975285","https://openalex.org/W2589904973","https://openalex.org/W2347058768","https://openalex.org/W2091139095","https://openalex.org/W2059180619","https://openalex.org/W2557783645","https://openalex.org/W1983000508","https://openalex.org/W3116048326","https://openalex.org/W4205776658","https://openalex.org/W2997982877"],"abstract_inverted_index":null,"counts_by_year":[{"year":2026,"cited_by_count":2},{"year":2025,"cited_by_count":1},{"year":2022,"cited_by_count":1},{"year":2021,"cited_by_count":3},{"year":2020,"cited_by_count":1},{"year":2019,"cited_by_count":1}],"updated_date":"2026-09-25T08:18:29.962427","created_date":"2017-04-28T00:00:00"}