{"id":"https://openalex.org/W2595884019","doi":"https://doi.org/10.1166/jnn.2017.14273","title":"Characterization of RF Sputtered-ZnS Thin Film Grown at Various Annealing Temperatures","display_name":"Characterization of RF Sputtered-ZnS Thin Film Grown at Various Annealing Temperatures","publication_year":2017,"publication_date":"2017-03-19","ids":{"openalex":"https://openalex.org/W2595884019","doi":"https://doi.org/10.1166/jnn.2017.14273","mag":"2595884019"},"language":"en","primary_location":{"id":"doi:10.1166/jnn.2017.14273","doi":"https://doi.org/10.1166/jnn.2017.14273","is_oa":false,"landing_page_url":"https://doi.org/10.1166/jnn.2017.14273","pdf_url":null,"source":{"id":"https://openalex.org/S133947007","display_name":"Journal of Nanoscience and Nanotechnology","issn_l":"1533-4880","issn":["1533-4880","1533-4899"],"is_oa":false,"is_in_doaj":false,"is_core":true,"listed_in":["anvur-scientific","cwts-core","poland-40"],"host_organization":"https://openalex.org/P4310321646","host_organization_name":"American Scientific Publishers","host_organization_lineage":["https://openalex.org/P4310321646"],"host_organization_lineage_names":["American Scientific Publishers"],"type":"journal"},"license":null,"license_id":null,"version":"publishedVersion","is_accepted":true,"is_published":true,"raw_source_name":"Journal of Nanoscience and Nanotechnology","raw_type":"journal-article"},"volume":null,"type":"article","is_traditional":true,"indexed_in":["crossref"],"open_access":{"is_oa":false,"oa_status":"closed","oa_url":null,"any_repository_has_fulltext":false},"authorships":[{"author_position":"first","author":{"id":"https://openalex.org/A5011937760","display_name":"Donghyun Hwang","orcid":"https://orcid.org/0000-0001-5634-6463","observed_orcids":["https://orcid.org/0000-0001-5634-6463"]},"institutions":[{"id":"https://openalex.org/I4210123920","display_name":"Silla University","ror":"https://ror.org/02w3gk008","country_code":"KR","type":"education","lineage":["https://openalex.org/I4210123920"]}],"countries":["KR"],"is_corresponding":false,"raw_author_name":"Donghyun Hwang","raw_affiliation_strings":["Department of Materials Science and Engineering, Silla University, Busan 46958, Korea"],"raw_orcid":null,"affiliations":[{"raw_affiliation_string":"Department of Materials Science and Engineering, Silla University, Busan 46958, Korea","institution_ids":["https://openalex.org/I4210123920"]}]},{"author_position":"last","author":{"id":"https://openalex.org/A5063553716","display_name":"Chang\u2010Sik Son","orcid":"https://orcid.org/0000-0001-5682-1770","observed_orcids":["https://orcid.org/0000-0001-5682-1770"]},"institutions":[{"id":"https://openalex.org/I4210123920","display_name":"Silla University","ror":"https://ror.org/02w3gk008","country_code":"KR","type":"education","lineage":["https://openalex.org/I4210123920"]}],"countries":["KR"],"is_corresponding":false,"raw_author_name":"Chang-Sik Son","raw_affiliation_strings":["Department of Materials Science and Engineering, Silla University, Busan 46958, Korea"],"raw_orcid":null,"affiliations":[{"raw_affiliation_string":"Department of Materials Science and Engineering, Silla University, Busan 46958, Korea","institution_ids":["https://openalex.org/I4210123920"]}]}],"institutions":[],"countries_distinct_count":1,"institutions_distinct_count":1,"corresponding_author_ids":[],"corresponding_institution_ids":["https://openalex.org/I4210123920"],"apc_list":null,"apc_paid":null,"fwci":0.1112,"has_fulltext":false,"cited_by_count":1,"citation_normalized_percentile":{"value":0.44755268,"is_in_top_1_percent":false,"is_in_top_10_percent":false},"cited_by_percentile_year":{"min":88,"max":93},"biblio":{"volume":"17","issue":"7","first_page":"5042","last_page":"5045"},"is_retracted":false,"is_paratext":false,"is_xpac":false,"primary_topic":{"id":"https://openalex.org/T10590","display_name":"Chalcogenide Semiconductor Thin Films","score":0.8574000000953674,"subfield":{"id":"https://openalex.org/subfields/2208","display_name":"Electrical and Electronic Engineering"},"field":{"id":"https://openalex.org/fields/22","display_name":"Engineering"},"domain":{"id":"https://openalex.org/domains/3","display_name":"Physical Sciences"}},"topics":[{"id":"https://openalex.org/T10590","display_name":"Chalcogenide Semiconductor Thin Films","score":0.8574000000953674,"subfield":{"id":"https://openalex.org/subfields/2208","display_name":"Electrical and Electronic Engineering"},"field":{"id":"https://openalex.org/fields/22","display_name":"Engineering"},"domain":{"id":"https://openalex.org/domains/3","display_name":"Physical Sciences"}},{"id":"https://openalex.org/T10090","display_name":"ZnO doping and properties","score":0.10639999806880951,"subfield":{"id":"https://openalex.org/subfields/2505","display_name":"Materials Chemistry"},"field":{"id":"https://openalex.org/fields/25","display_name":"Materials Science"},"domain":{"id":"https://openalex.org/domains/3","display_name":"Physical Sciences"}},{"id":"https://openalex.org/T13889","display_name":"Advanced Materials and Semiconductor Technologies","score":0.01889999955892563,"subfield":{"id":"https://openalex.org/subfields/2505","display_name":"Materials Chemistry"},"field":{"id":"https://openalex.org/fields/25","display_name":"Materials Science"},"domain":{"id":"https://openalex.org/domains/3","display_name":"Physical Sciences"}}],"keywords":[{"id":"https://openalex.org/keywords/zns-thin-films","display_name":"ZnS thin films","score":0.9539999961853027},{"id":"https://openalex.org/keywords/zinc-sulfide","display_name":"zinc sulfide","score":0.8309999704360962},{"id":"https://openalex.org/keywords/rf-magnetron-sputtering","display_name":"RF magnetron sputtering","score":0.9710000157356262},{"id":"https://openalex.org/keywords/post-deposition-annealing","display_name":"post-deposition annealing","score":0.8600000143051147},{"id":"https://openalex.org/keywords/annealing-temperature","display_name":"annealing temperature","score":0.9710000157356262},{"id":"https://openalex.org/keywords/zinc-blende-structure","display_name":"zinc-blende structure","score":0.9190000295639038},{"id":"https://openalex.org/keywords/crystallographic-texture","display_name":"crystallographic texture","score":0.7670000195503235},{"id":"https://openalex.org/keywords/particle-size","display_name":"particle size","score":0.7480000257492065},{"id":"https://openalex.org/keywords/optical-band-gap","display_name":"optical band gap","score":0.9829999804496765},{"id":"https://openalex.org/keywords/structural-properties","display_name":"structural properties","score":0.8889999985694885},{"id":"https://openalex.org/keywords/optical-properties","display_name":"optical properties","score":0.9700000286102295}],"concepts":[{"id":"https://openalex.org/C192562407","wikidata":"https://www.wikidata.org/wiki/Q228736","display_name":"Materials science","level":0,"score":0.9091894626617432},{"id":"https://openalex.org/C2777855556","wikidata":"https://www.wikidata.org/wiki/Q4339544","display_name":"Annealing (glass)","level":2,"score":0.8216379880905151},{"id":"https://openalex.org/C19067145","wikidata":"https://www.wikidata.org/wiki/Q1137203","display_name":"Thin film","level":2,"score":0.739145040512085},{"id":"https://openalex.org/C113196181","wikidata":"https://www.wikidata.org/wiki/Q485223","display_name":"Analytical Chemistry (journal)","level":2,"score":0.5650102496147156},{"id":"https://openalex.org/C207114421","wikidata":"https://www.wikidata.org/wiki/Q133900","display_name":"Diffraction","level":2,"score":0.5617109537124634},{"id":"https://openalex.org/C181966813","wikidata":"https://www.wikidata.org/wiki/Q806352","display_name":"Band gap","level":2,"score":0.5165766477584839},{"id":"https://openalex.org/C22423302","wikidata":"https://www.wikidata.org/wiki/Q898444","display_name":"Sputtering","level":3,"score":0.48507729172706604},{"id":"https://openalex.org/C146088050","wikidata":"https://www.wikidata.org/wiki/Q744818","display_name":"Transmission electron microscopy","level":2,"score":0.4744250178337097},{"id":"https://openalex.org/C61427134","wikidata":"https://www.wikidata.org/wiki/Q847609","display_name":"Sputter deposition","level":4,"score":0.46213454008102417},{"id":"https://openalex.org/C49040817","wikidata":"https://www.wikidata.org/wiki/Q193091","display_name":"Optoelectronics","level":1,"score":0.32462525367736816},{"id":"https://openalex.org/C120665830","wikidata":"https://www.wikidata.org/wiki/Q14620","display_name":"Optics","level":1,"score":0.2985215187072754},{"id":"https://openalex.org/C171250308","wikidata":"https://www.wikidata.org/wiki/Q11468","display_name":"Nanotechnology","level":1,"score":0.17158013582229614},{"id":"https://openalex.org/C159985019","wikidata":"https://www.wikidata.org/wiki/Q181790","display_name":"Composite material","level":1,"score":0.15873122215270996},{"id":"https://openalex.org/C121332964","wikidata":"https://www.wikidata.org/wiki/Q413","display_name":"Physics","level":0,"score":0.0},{"id":"https://openalex.org/C185592680","wikidata":"https://www.wikidata.org/wiki/Q2329","display_name":"Chemistry","level":0,"score":0.0},{"id":"https://openalex.org/C43617362","wikidata":"https://www.wikidata.org/wiki/Q170050","display_name":"Chromatography","level":1,"score":0.0}],"mesh":[],"locations_count":1,"locations":[{"id":"doi:10.1166/jnn.2017.14273","doi":"https://doi.org/10.1166/jnn.2017.14273","is_oa":false,"landing_page_url":"https://doi.org/10.1166/jnn.2017.14273","pdf_url":null,"source":{"id":"https://openalex.org/S133947007","display_name":"Journal of Nanoscience and Nanotechnology","issn_l":"1533-4880","issn":["1533-4880","1533-4899"],"is_oa":false,"is_in_doaj":false,"is_core":true,"listed_in":["anvur-scientific","cwts-core","poland-40"],"host_organization":"https://openalex.org/P4310321646","host_organization_name":"American Scientific Publishers","host_organization_lineage":["https://openalex.org/P4310321646"],"host_organization_lineage_names":["American Scientific Publishers"],"type":"journal"},"license":null,"license_id":null,"version":"publishedVersion","is_accepted":true,"is_published":true,"raw_source_name":"Journal of Nanoscience and Nanotechnology","raw_type":"journal-article"}],"best_oa_location":null,"sustainable_development_goals":[],"study_designs":[],"awards":[],"funders":[],"has_content":{"grobid_xml":false,"pdf":false},"content_urls":null,"referenced_works_count":0,"referenced_works":[],"related_works":["https://openalex.org/W2064975779","https://openalex.org/W2993213748","https://openalex.org/W2621619740","https://openalex.org/W1983818212","https://openalex.org/W2034175182","https://openalex.org/W3029113178","https://openalex.org/W2371105339","https://openalex.org/W2161071094","https://openalex.org/W2887069069","https://openalex.org/W1989735455"],"abstract_inverted_index":{"ZnS":[0,69,170],"thin":[1,70,171],"films":[2,17,71,141,172],"were":[3,18,50],"deposited":[4],"onto":[5],"glass":[6],"substrates":[7],"by":[8,176],"radio":[9],"(RF)":[10],"magnetron":[11],"sputtering":[12],"at":[13,20,26,79],"room":[14],"temperature.":[15],"The":[16,35,97,135,164],"grown":[19],"various":[21],"annealing":[22,38,106,133,178],"temperatures":[23,39],"in":[24,73,131],"vacuum":[25,74],"the":[27,41,47,88,100,112,132,140,148,160],"range":[28],"of":[29,37,46,68,99,139,169],"100\u2013350":[30],"\u00b0C":[31],"for":[32],"60":[33],"min.":[34],"effects":[36],"on":[40],"structural":[42,165],"and":[43,62,83,147,166],"optical":[44,136,167],"properties":[45,168],"annealed":[48,72],"samples":[49],"investigated":[51],"with":[52,105,129],"X-ray":[53],"diffraction":[54,101],"(XRD),":[55],"field":[56],"emission":[57],"scanning":[58],"electron":[59],"microscopy":[60],"(FESEM)":[61],"UV-visible":[63],"transmission":[64],"spectra.":[65],"XRD":[66],"patterns":[67],"show":[75],"a":[76,84,93,144],"single":[77],"peak":[78],"2\ue70d":[80],"=":[81],"28.91\u00b0":[82],"preferred":[85],"orientation":[86],"along":[87],"(111)":[89],"reflection":[90],"plane,":[91],"indicating":[92],"zinc":[94],"blende":[95],"structure.":[96],"intensity":[98],"peaks":[102],"is":[103,115],"increased":[104],"temperatures.":[107,134,179],"FESEM":[108],"images":[109],"reveal":[110],"that":[111],"particle":[113],"size":[114],"enhanced":[116],"from":[117,154],"22.6":[118],"nm":[119,125],"(at":[120,126],"100":[121],"\u00b0C)":[122,128],"to":[123,143,156],"48.7":[124],"350":[127],"increase":[130],"band":[137],"gap":[138],"shifts":[142],"higher":[145],"energy":[146],"calculated":[149],"value":[150],"shows":[151],"an":[152],"increment":[153],"3.27":[155],"3.51":[157],"eV":[158],"as":[159],"growth":[161],"temperature":[162],"increases.":[163],"are":[173],"significantly":[174],"affected":[175],"their":[177]},"counts_by_year":[{"year":2018,"cited_by_count":1}],"updated_date":"2026-10-01T08:54:57.152042","created_date":"2017-03-23T00:00:00"}