{"id":"https://openalex.org/W2594776646","doi":"https://doi.org/10.1109/mim.2006.1637979","title":"Measurement uncertainty","display_name":"Measurement uncertainty","publication_year":2006,"publication_date":"2006-06-01","ids":{"openalex":"https://openalex.org/W2594776646","doi":"https://doi.org/10.1109/mim.2006.1637979","mag":"2594776646"},"language":"en","primary_location":{"id":"doi:10.1109/mim.2006.1637979","doi":"https://doi.org/10.1109/mim.2006.1637979","is_oa":false,"landing_page_url":"https://doi.org/10.1109/mim.2006.1637979","pdf_url":null,"source":{"id":"https://openalex.org/S121167460","display_name":"IEEE Instrumentation & Measurement Magazine","issn_l":"1094-6969","issn":["1094-6969","1941-0123"],"is_oa":false,"is_in_doaj":false,"is_core":true,"listed_in":["cwts-core","dongbi-b","jufo-1","ki-jl-1","norway-1","poland-70","russia-white-list-2","vabb-shw"],"host_organization":"https://openalex.org/P4310319808","host_organization_name":"Institute of Electrical and Electronics Engineers","host_organization_lineage":["https://openalex.org/P4310319808"],"host_organization_lineage_names":["Institute of Electrical and Electronics Engineers"],"type":"journal"},"license":null,"license_id":null,"version":"publishedVersion","is_accepted":true,"is_published":true,"raw_source_name":"IEEE Instrumentation and Measurement Magazine","raw_type":"journal-article"},"volume":null,"type":"article","indexed_in":["crossref"],"open_access":{"is_oa":false,"oa_status":"closed","oa_url":null,"any_repository_has_fulltext":false},"authorships":[{"author_position":"first","author":{"id":"https://openalex.org/A5048123338","display_name":"Alessandro Ferrero","orcid":"https://orcid.org/0000-0002-6760-2925","observed_orcids":["https://orcid.org/0000-0002-6760-2925"]},"institutions":[{"id":"https://openalex.org/I93860229","display_name":"Politecnico di Milano","ror":"https://ror.org/01nffqt88","country_code":"IT","type":"education","lineage":["https://openalex.org/I93860229"]}],"countries":["IT"],"is_corresponding":false,"raw_author_name":"A. Ferrero","raw_affiliation_strings":["Dipartimento di Elettrotecnica, Politecnico di Milano, Italy"],"raw_orcid":null,"affiliations":[{"raw_affiliation_string":"Dipartimento di Elettrotecnica, Politecnico di Milano, Italy","institution_ids":["https://openalex.org/I93860229"]}]},{"author_position":"last","author":{"id":"https://openalex.org/A5054803036","display_name":"Simona Salicone","orcid":"https://orcid.org/0000-0003-4683-7669","observed_orcids":["https://orcid.org/0000-0003-4683-7669"]},"institutions":[{"id":"https://openalex.org/I93860229","display_name":"Politecnico di Milano","ror":"https://ror.org/01nffqt88","country_code":"IT","type":"education","lineage":["https://openalex.org/I93860229"]}],"countries":["IT"],"is_corresponding":false,"raw_author_name":"S. Salicone","raw_affiliation_strings":["Dipartimento di Elettrotecnica, Politecnico di Milano, Italy"],"raw_orcid":null,"affiliations":[{"raw_affiliation_string":"Dipartimento di Elettrotecnica, Politecnico di Milano, Italy","institution_ids":["https://openalex.org/I93860229"]}]}],"institutions":[],"countries_distinct_count":1,"institutions_distinct_count":1,"corresponding_author_ids":[],"corresponding_institution_ids":["https://openalex.org/I93860229"],"apc_list":{"value":2995,"currency":"USD","value_usd":2995},"apc_paid":null,"fwci":0.7605,"has_fulltext":false,"cited_by_count":99,"citation_normalized_percentile":{"value":0.80340012,"is_in_top_1_percent":false,"is_in_top_10_percent":false},"cited_by_percentile_year":{"min":94,"max":100},"biblio":{"volume":"9","issue":"3","first_page":"44","last_page":"51"},"is_retracted":false,"is_paratext":false,"is_xpac":false,"primary_topic":{"id":"https://openalex.org/T11890","display_name":"Scientific Measurement and Uncertainty Evaluation","score":1.0,"subfield":{"id":"https://openalex.org/subfields/1804","display_name":"Statistics, Probability and Uncertainty"},"field":{"id":"https://openalex.org/fields/18","display_name":"Decision Sciences"},"domain":{"id":"https://openalex.org/domains/2","display_name":"Social Sciences"}},"topics":[{"id":"https://openalex.org/T11890","display_name":"Scientific Measurement and Uncertainty Evaluation","score":1.0,"subfield":{"id":"https://openalex.org/subfields/1804","display_name":"Statistics, Probability and Uncertainty"},"field":{"id":"https://openalex.org/fields/18","display_name":"Decision Sciences"},"domain":{"id":"https://openalex.org/domains/2","display_name":"Social Sciences"}},{"id":"https://openalex.org/T11583","display_name":"Advanced Measurement and Metrology Techniques","score":0.0,"subfield":{"id":"https://openalex.org/subfields/2210","display_name":"Mechanical Engineering"},"field":{"id":"https://openalex.org/fields/22","display_name":"Engineering"},"domain":{"id":"https://openalex.org/domains/3","display_name":"Physical Sciences"}},{"id":"https://openalex.org/T12300","display_name":"Advanced Electrical Measurement Techniques","score":0.0,"subfield":{"id":"https://openalex.org/subfields/2208","display_name":"Electrical and Electronic Engineering"},"field":{"id":"https://openalex.org/fields/22","display_name":"Engineering"},"domain":{"id":"https://openalex.org/domains/3","display_name":"Physical Sciences"}}],"keywords":[{"id":"https://openalex.org/keywords/measurement-uncertainty","display_name":"measurement uncertainty","score":1.0},{"id":"https://openalex.org/keywords/uncertainty-estimation","display_name":"uncertainty estimation","score":0.8180000185966492},{"id":"https://openalex.org/keywords/measurement-results","display_name":"measurement results","score":0.7039999961853027},{"id":"https://openalex.org/keywords/measurand","display_name":"measurand","score":0.7110000252723694},{"id":"https://openalex.org/keywords/guide-to-the-expression-of-uncertainty-in-measurement","display_name":"Guide to the Expression of Uncertainty in Measurement","score":0.9649999737739563},{"id":"https://openalex.org/keywords/uncertainty-expression","display_name":"uncertainty expression","score":0.4090000092983246}],"concepts":[{"id":"https://openalex.org/C137209882","wikidata":"https://www.wikidata.org/wiki/Q1403517","display_name":"Measurement uncertainty","level":2,"score":0.8090957403182983},{"id":"https://openalex.org/C2776291640","wikidata":"https://www.wikidata.org/wiki/Q2912517","display_name":"Value (mathematics)","level":2,"score":0.5048955082893372},{"id":"https://openalex.org/C177803969","wikidata":"https://www.wikidata.org/wiki/Q29205","display_name":"Uncertainty analysis","level":2,"score":0.4757677912712097},{"id":"https://openalex.org/C19619285","wikidata":"https://www.wikidata.org/wiki/Q196372","display_name":"Observational error","level":2,"score":0.4751396179199219},{"id":"https://openalex.org/C41008148","wikidata":"https://www.wikidata.org/wiki/Q21198","display_name":"Computer science","level":0,"score":0.4704740643501282},{"id":"https://openalex.org/C26517878","wikidata":"https://www.wikidata.org/wiki/Q228039","display_name":"Key (lock)","level":2,"score":0.44626256823539734},{"id":"https://openalex.org/C2994224358","wikidata":"https://www.wikidata.org/wiki/Q13649246","display_name":"Standard uncertainty","level":3,"score":0.4245795011520386},{"id":"https://openalex.org/C33923547","wikidata":"https://www.wikidata.org/wiki/Q395","display_name":"Mathematics","level":0,"score":0.35323256254196167},{"id":"https://openalex.org/C149782125","wikidata":"https://www.wikidata.org/wiki/Q160039","display_name":"Econometrics","level":1,"score":0.25915074348449707},{"id":"https://openalex.org/C105795698","wikidata":"https://www.wikidata.org/wiki/Q12483","display_name":"Statistics","level":1,"score":0.2589890956878662},{"id":"https://openalex.org/C119857082","wikidata":"https://www.wikidata.org/wiki/Q2539","display_name":"Machine learning","level":1,"score":0.21076330542564392},{"id":"https://openalex.org/C44154836","wikidata":"https://www.wikidata.org/wiki/Q45045","display_name":"Simulation","level":1,"score":0.15870600938796997},{"id":"https://openalex.org/C38652104","wikidata":"https://www.wikidata.org/wiki/Q3510521","display_name":"Computer security","level":1,"score":0.0}],"mesh":[],"locations_count":2,"locations":[{"id":"doi:10.1109/mim.2006.1637979","doi":"https://doi.org/10.1109/mim.2006.1637979","is_oa":false,"landing_page_url":"https://doi.org/10.1109/mim.2006.1637979","pdf_url":null,"source":{"id":"https://openalex.org/S121167460","display_name":"IEEE Instrumentation & Measurement Magazine","issn_l":"1094-6969","issn":["1094-6969","1941-0123"],"is_oa":false,"is_in_doaj":false,"is_core":true,"listed_in":["cwts-core","dongbi-b","jufo-1","ki-jl-1","norway-1","poland-70","russia-white-list-2","vabb-shw"],"host_organization":"https://openalex.org/P4310319808","host_organization_name":"Institute of Electrical and Electronics Engineers","host_organization_lineage":["https://openalex.org/P4310319808"],"host_organization_lineage_names":["Institute of Electrical and Electronics Engineers"],"type":"journal"},"license":null,"license_id":null,"version":"publishedVersion","is_accepted":true,"is_published":true,"raw_source_name":"IEEE Instrumentation and Measurement Magazine","raw_type":"journal-article"},{"id":"pmh:oai:re.public.polimi.it:11311/553028","doi":null,"is_oa":false,"landing_page_url":"http://hdl.handle.net/11311/553028","pdf_url":null,"source":{"id":"https://openalex.org/S4306400312","display_name":"Virtual Community of Pathological Anatomy (University of Castilla La Mancha)","issn_l":null,"issn":null,"is_oa":false,"is_in_doaj":false,"is_core":false,"listed_in":[],"host_organization":"https://openalex.org/I79189158","host_organization_name":"University of Castilla-La Mancha","host_organization_lineage":["https://openalex.org/I79189158"],"host_organization_lineage_names":[],"type":"repository"},"license":null,"license_id":null,"version":"submittedVersion","is_accepted":false,"is_published":false,"raw_source_name":null,"raw_type":"info:eu-repo/semantics/article"}],"best_oa_location":null,"sustainable_development_goals":[],"sustainable_development_goals_aurora":[{"score":0.5,"id":"https://metadata.un.org/sdg/4","display_name":"Quality education"}],"study_designs":[],"awards":[],"funders":[],"has_content":{"grobid_xml":false,"pdf":false},"content_urls":null,"referenced_works_count":2,"referenced_works":["https://openalex.org/W2158386576","https://openalex.org/W4301347335"],"related_works":["https://openalex.org/W2134014413","https://openalex.org/W7151678327","https://openalex.org/W3042482507","https://openalex.org/W4235396758","https://openalex.org/W2352890534","https://openalex.org/W2153221519","https://openalex.org/W4240294951","https://openalex.org/W3204181705","https://openalex.org/W3135917189","https://openalex.org/W2037453698"],"abstract_inverted_index":{"The":[0,16,36],"following":[1],"fundamental":[2],"concepts":[3],"of":[4,18,25,47,95],"measurement":[5,20,53,58],"science":[6],"have":[7],"been":[8],"briefly":[9],"reported":[10],"in":[11,43,104],"this":[12],"tutorial":[13,89],"article:":[14],"1)":[15],"result":[17,59],"a":[19,40,85,92],"provides":[21],"only":[22,64],"incomplete":[23],"knowledge":[24,49],"the":[26,45,48,52,66,79,96,108,114],"measurand,":[27],"whose":[28],"true":[29],"value":[30],"remains":[31],"unknown":[32],"and":[33,55,71,101,110],"unknowable;":[34],"2)":[35],"uncertainty":[37,68,103],"concept":[38],"plays":[39],"key":[41],"role":[42],"quantifying":[44],"incompleteness":[46],"provided":[50],"by":[51,113],"result;":[54],"3)":[56],"A":[57],"can":[60,74],"be":[61,75],"usefully":[62],"employed":[63],"if":[65,72],"associated":[67],"is":[69,84],"estimated":[70],"it":[73,83],"traced":[76],"back":[77],"to":[78],"appertaining":[80],"standard;":[81],"otherwise,":[82],"meaningless":[86],"value.":[87],"This":[88],"has":[90],"given":[91,112],"short":[93],"review":[94],"present":[97],"practice":[98],"for":[99],"expressing":[100],"estimating":[102],"measurement,":[105],"based":[106],"on":[107],"definitions":[109],"prescriptions":[111],"GUM.":[115]},"counts_by_year":[{"year":2026,"cited_by_count":12},{"year":2025,"cited_by_count":10},{"year":2024,"cited_by_count":6},{"year":2023,"cited_by_count":5},{"year":2022,"cited_by_count":5},{"year":2021,"cited_by_count":6},{"year":2020,"cited_by_count":9},{"year":2019,"cited_by_count":3},{"year":2018,"cited_by_count":7},{"year":2017,"cited_by_count":6},{"year":2016,"cited_by_count":4},{"year":2015,"cited_by_count":3},{"year":2014,"cited_by_count":12},{"year":2013,"cited_by_count":3},{"year":2012,"cited_by_count":2}],"updated_date":"2026-10-18T09:31:52.927876","created_date":"2017-03-16T00:00:00"}