{"id":"https://openalex.org/W2575486884","doi":"https://doi.org/10.60928/hhhl-8alz","title":"A 14-bit, 33-Mpixel, 120-fps Image Sensor with DMOS Capacitors in 90-nm/65-nm CMOS","display_name":"A 14-bit, 33-Mpixel, 120-fps Image Sensor with DMOS Capacitors in 90-nm/65-nm CMOS","publication_year":2015,"publication_date":"2015-01-01","ids":{"openalex":"https://openalex.org/W2575486884","doi":"https://doi.org/10.60928/hhhl-8alz","mag":"2575486884"},"language":"en","primary_location":{"id":"doi:10.60928/hhhl-8alz","doi":"https://doi.org/10.60928/hhhl-8alz","is_oa":true,"landing_page_url":"https://doi.org/10.60928/hhhl-8alz","pdf_url":null,"source":{"id":"https://openalex.org/S7407051673","display_name":"IISS online library","issn_l":null,"issn":null,"is_oa":false,"is_in_doaj":false,"is_core":false,"listed_in":[],"host_organization":"https://openalex.org/I4405252570","host_organization_name":"International Image Sensor Society","host_organization_lineage":["https://openalex.org/I4405252570"],"host_organization_lineage_names":[],"type":"repository"},"license":null,"license_id":null,"version":null,"is_accepted":false,"is_published":false,"raw_source_name":null,"raw_type":"ConferencePaper"},"volume":null,"type":"conference-paper","is_traditional":true,"indexed_in":["datacite"],"open_access":{"is_oa":true,"oa_status":"green","oa_url":"https://doi.org/10.60928/hhhl-8alz","any_repository_has_fulltext":true},"authorships":[{"author_position":"first","author":{"id":null,"display_name":"T. Yasue","orcid":null,"observed_orcids":[]},"institutions":[{"id":"https://openalex.org/I4210107548","display_name":"Japan Broadcasting Corporation (Japan)","ror":"https://ror.org/01s8tz949","country_code":"JP","type":"company","lineage":["https://openalex.org/I4210107548"]}],"countries":["JP"],"is_corresponding":false,"raw_author_name":"T. Yasue","raw_affiliation_strings":["NHK Science and Technical Research Laboratories"],"raw_orcid":null,"affiliations":[{"raw_affiliation_string":"NHK Science and Technical Research Laboratories","institution_ids":["https://openalex.org/I4210107548"]}]},{"author_position":"middle","author":{"id":null,"display_name":"K. Kitamura","orcid":null,"observed_orcids":[]},"institutions":[{"id":"https://openalex.org/I4210107548","display_name":"Japan Broadcasting Corporation (Japan)","ror":"https://ror.org/01s8tz949","country_code":"JP","type":"company","lineage":["https://openalex.org/I4210107548"]}],"countries":["JP"],"is_corresponding":false,"raw_author_name":"K. Kitamura","raw_affiliation_strings":["NHK Science and Technical Research Laboratories"],"raw_orcid":null,"affiliations":[{"raw_affiliation_string":"NHK Science and Technical Research Laboratories","institution_ids":["https://openalex.org/I4210107548"]}]},{"author_position":"middle","author":{"id":null,"display_name":"T. Watabe","orcid":null,"observed_orcids":[]},"institutions":[{"id":"https://openalex.org/I4405256961","display_name":"NHK Engineering System, Inc.","ror":"https://ror.org/04qgk0f68","country_code":"JP","type":"nonprofit","lineage":["https://openalex.org/I4405256961"]}],"countries":["JP"],"is_corresponding":false,"raw_author_name":"T. Watabe","raw_affiliation_strings":["NHK Engineering System Inc"],"raw_orcid":null,"affiliations":[{"raw_affiliation_string":"NHK Engineering System Inc","institution_ids":["https://openalex.org/I4405256961"]}]},{"author_position":"middle","author":{"id":null,"display_name":"H. Shimamoto","orcid":null,"observed_orcids":[]},"institutions":[{"id":"https://openalex.org/I4210107548","display_name":"Japan Broadcasting Corporation (Japan)","ror":"https://ror.org/01s8tz949","country_code":"JP","type":"company","lineage":["https://openalex.org/I4210107548"]}],"countries":["JP"],"is_corresponding":false,"raw_author_name":"H. Shimamoto","raw_affiliation_strings":["NHK Science and Technical Research Laboratories"],"raw_orcid":null,"affiliations":[{"raw_affiliation_string":"NHK Science and Technical Research Laboratories","institution_ids":["https://openalex.org/I4210107548"]}]},{"author_position":"middle","author":{"id":null,"display_name":"T. Kosugi","orcid":null,"observed_orcids":[]},"institutions":[],"countries":[],"is_corresponding":false,"raw_author_name":"T. Kosugi","raw_affiliation_strings":["Brookman Technology, Inc"],"raw_orcid":null,"affiliations":[{"raw_affiliation_string":"Brookman Technology, Inc","institution_ids":[]}]},{"author_position":"middle","author":{"id":null,"display_name":"T. Watanabe","orcid":null,"observed_orcids":[]},"institutions":[],"countries":[],"is_corresponding":false,"raw_author_name":"T. Watanabe","raw_affiliation_strings":["Brookman Technology, Inc"],"raw_orcid":null,"affiliations":[{"raw_affiliation_string":"Brookman Technology, Inc","institution_ids":[]}]},{"author_position":"middle","author":{"id":null,"display_name":"S. Aoyama","orcid":null,"observed_orcids":[]},"institutions":[],"countries":[],"is_corresponding":false,"raw_author_name":"S. Aoyama","raw_affiliation_strings":["Brookman Technology, Inc"],"raw_orcid":null,"affiliations":[{"raw_affiliation_string":"Brookman Technology, Inc","institution_ids":[]}]},{"author_position":"middle","author":{"id":null,"display_name":"M. Monoi","orcid":null,"observed_orcids":[]},"institutions":[{"id":"https://openalex.org/I1292669757","display_name":"Toshiba (Japan)","ror":"https://ror.org/0326v3z14","country_code":"JP","type":"company","lineage":["https://openalex.org/I1292669757"]}],"countries":["JP"],"is_corresponding":false,"raw_author_name":"M. Monoi","raw_affiliation_strings":["Toshiba Corporation Semiconductor & Storage Products Company"],"raw_orcid":null,"affiliations":[{"raw_affiliation_string":"Toshiba Corporation Semiconductor & Storage Products Company","institution_ids":["https://openalex.org/I1292669757"]}]},{"author_position":"middle","author":{"id":null,"display_name":"Z. Wei","orcid":null,"observed_orcids":[]},"institutions":[{"id":"https://openalex.org/I1298590031","display_name":"Shizuoka University","ror":"https://ror.org/01w6wtk13","country_code":"JP","type":"education","lineage":["https://openalex.org/I1298590031"]}],"countries":["JP"],"is_corresponding":false,"raw_author_name":"Z. Wei","raw_affiliation_strings":["Shizuoka University"],"raw_orcid":null,"affiliations":[{"raw_affiliation_string":"Shizuoka University","institution_ids":["https://openalex.org/I1298590031"]}]},{"author_position":"last","author":{"id":null,"display_name":"S. Kawahito","orcid":null,"observed_orcids":[]},"institutions":[{"id":"https://openalex.org/I1298590031","display_name":"Shizuoka University","ror":"https://ror.org/01w6wtk13","country_code":"JP","type":"education","lineage":["https://openalex.org/I1298590031"]}],"countries":["JP"],"is_corresponding":false,"raw_author_name":"S. Kawahito","raw_affiliation_strings":["Shizuoka University"],"raw_orcid":null,"affiliations":[{"raw_affiliation_string":"Shizuoka University","institution_ids":["https://openalex.org/I1298590031"]}]}],"institutions":[],"countries_distinct_count":1,"institutions_distinct_count":4,"corresponding_author_ids":[],"corresponding_institution_ids":[],"apc_list":null,"apc_paid":null,"fwci":4.1579,"has_fulltext":false,"cited_by_count":11,"citation_normalized_percentile":{"value":0.94905857,"is_in_top_1_percent":false,"is_in_top_10_percent":true},"cited_by_percentile_year":{"min":88,"max":98},"biblio":{"volume":"39","issue":"35","first_page":"25","last_page":"28"},"is_retracted":false,"is_paratext":false,"is_xpac":false,"primary_topic":{"id":"https://openalex.org/T11992","display_name":"CCD and CMOS Imaging Sensors","score":0.8788999915122986,"subfield":{"id":"https://openalex.org/subfields/2208","display_name":"Electrical and Electronic Engineering"},"field":{"id":"https://openalex.org/fields/22","display_name":"Engineering"},"domain":{"id":"https://openalex.org/domains/3","display_name":"Physical Sciences"}},"topics":[{"id":"https://openalex.org/T11992","display_name":"CCD and CMOS Imaging Sensors","score":0.8788999915122986,"subfield":{"id":"https://openalex.org/subfields/2208","display_name":"Electrical and Electronic Engineering"},"field":{"id":"https://openalex.org/fields/22","display_name":"Engineering"},"domain":{"id":"https://openalex.org/domains/3","display_name":"Physical Sciences"}},{"id":"https://openalex.org/T10323","display_name":"Analog and Mixed-Signal Circuit Design","score":0.11959999799728394,"subfield":{"id":"https://openalex.org/subfields/2208","display_name":"Electrical and Electronic Engineering"},"field":{"id":"https://openalex.org/fields/22","display_name":"Engineering"},"domain":{"id":"https://openalex.org/domains/3","display_name":"Physical Sciences"}},{"id":"https://openalex.org/T10187","display_name":"Radio Frequency Integrated Circuit Design","score":0.00019999999494757503,"subfield":{"id":"https://openalex.org/subfields/2208","display_name":"Electrical and Electronic Engineering"},"field":{"id":"https://openalex.org/fields/22","display_name":"Engineering"},"domain":{"id":"https://openalex.org/domains/3","display_name":"Physical Sciences"}}],"keywords":[{"id":"https://openalex.org/keywords/cmos-image-sensor","display_name":"CMOS image sensor","score":0.9879999756813049},{"id":"https://openalex.org/keywords/differential-nonlinearity","display_name":"differential nonlinearity","score":0.8799999952316284},{"id":"https://openalex.org/keywords/high-resolution-imaging","display_name":"high-resolution imaging","score":0.6290000081062317}],"concepts":[{"id":"https://openalex.org/C52192207","wikidata":"https://www.wikidata.org/wiki/Q5322","display_name":"Capacitor","level":3,"score":0.6727343201637268},{"id":"https://openalex.org/C46362747","wikidata":"https://www.wikidata.org/wiki/Q173431","display_name":"CMOS","level":2,"score":0.5800105929374695},{"id":"https://openalex.org/C117011727","wikidata":"https://www.wikidata.org/wiki/Q1278488","display_name":"Bit (key)","level":2,"score":0.5095887184143066},{"id":"https://openalex.org/C41008148","wikidata":"https://www.wikidata.org/wiki/Q21198","display_name":"Computer science","level":0,"score":0.42667779326438904},{"id":"https://openalex.org/C157808515","wikidata":"https://www.wikidata.org/wiki/Q4781508","display_name":"Filter capacitor","level":4,"score":0.41191181540489197},{"id":"https://openalex.org/C119599485","wikidata":"https://www.wikidata.org/wiki/Q43035","display_name":"Electrical engineering","level":1,"score":0.37197571992874146},{"id":"https://openalex.org/C49040817","wikidata":"https://www.wikidata.org/wiki/Q193091","display_name":"Optoelectronics","level":1,"score":0.3655758798122406},{"id":"https://openalex.org/C192562407","wikidata":"https://www.wikidata.org/wiki/Q228736","display_name":"Materials science","level":0,"score":0.2701147794723511},{"id":"https://openalex.org/C127413603","wikidata":"https://www.wikidata.org/wiki/Q11023","display_name":"Engineering","level":0,"score":0.25624901056289673},{"id":"https://openalex.org/C165801399","wikidata":"https://www.wikidata.org/wiki/Q25428","display_name":"Voltage","level":2,"score":0.1715080738067627},{"id":"https://openalex.org/C38652104","wikidata":"https://www.wikidata.org/wiki/Q3510521","display_name":"Computer security","level":1,"score":0.12113615870475769}],"mesh":[],"locations_count":2,"locations":[{"id":"doi:10.60928/hhhl-8alz","doi":"https://doi.org/10.60928/hhhl-8alz","is_oa":true,"landing_page_url":"https://doi.org/10.60928/hhhl-8alz","pdf_url":null,"source":{"id":"https://openalex.org/S7407051673","display_name":"IISS online library","issn_l":null,"issn":null,"is_oa":false,"is_in_doaj":false,"is_core":false,"listed_in":[],"host_organization":"https://openalex.org/I4405252570","host_organization_name":"International Image Sensor Society","host_organization_lineage":["https://openalex.org/I4405252570"],"host_organization_lineage_names":[],"type":"repository"},"license":null,"license_id":null,"version":null,"is_accepted":false,"is_published":false,"raw_source_name":null,"raw_type":"ConferencePaper"},{"id":"mag:2575486884","doi":null,"is_oa":false,"landing_page_url":"https://ite.or.jp/ken/paper/20150918WA4Z/eng/","pdf_url":null,"source":{"id":"https://openalex.org/S4306551927","display_name":"\u6620\u50cf\u60c5\u5831\u30e1\u30c7\u30a3\u30a2\u5b66\u4f1a\u6280\u8853\u5831\u544a","issn_l":null,"issn":null,"is_oa":false,"is_in_doaj":false,"is_core":false,"listed_in":[],"host_organization":null,"host_organization_name":null,"host_organization_lineage":[],"host_organization_lineage_names":[],"type":"journal"},"license":null,"license_id":null,"version":null,"is_accepted":false,"is_published":false,"raw_source_name":"ITE Technical Report; ITE Tech. Rep.","raw_type":null}],"best_oa_location":{"id":"doi:10.60928/hhhl-8alz","doi":"https://doi.org/10.60928/hhhl-8alz","is_oa":true,"landing_page_url":"https://doi.org/10.60928/hhhl-8alz","pdf_url":null,"source":{"id":"https://openalex.org/S7407051673","display_name":"IISS online library","issn_l":null,"issn":null,"is_oa":false,"is_in_doaj":false,"is_core":false,"listed_in":[],"host_organization":"https://openalex.org/I4405252570","host_organization_name":"International Image Sensor Society","host_organization_lineage":["https://openalex.org/I4405252570"],"host_organization_lineage_names":[],"type":"repository"},"license":null,"license_id":null,"version":null,"is_accepted":false,"is_published":false,"raw_source_name":null,"raw_type":"ConferencePaper"},"sustainable_development_goals":[],"study_designs":[],"awards":[],"funders":[],"has_content":{"grobid_xml":false,"pdf":false},"content_urls":null,"referenced_works_count":3,"referenced_works":["https://openalex.org/W1969965391","https://openalex.org/W1989248579","https://openalex.org/W2053943475"],"related_works":["https://openalex.org/W2200449959","https://openalex.org/W1989248579","https://openalex.org/W846258554","https://openalex.org/W1969965391","https://openalex.org/W1574120595","https://openalex.org/W2492167173","https://openalex.org/W2268526851","https://openalex.org/W2101640841","https://openalex.org/W6921222802","https://openalex.org/W1135052486"],"abstract_inverted_index":{"We":[0,44],"fabricated":[1,66],"a":[2,51,63,70],"33-Megapixel":[3],"and":[4],"120-fps":[5],"CMOS":[6],"image":[7,67],"sensor":[8,68],"with":[9,50],"14-bit":[10,77],"analog-to-digital":[11],"converters":[12],"(ADCs)":[13],"using":[14],"depletion-mode":[15],"MOS":[16],"(DMOS)":[17],"capacitors.":[18],"The":[19],"DMOS":[20],"capacitor":[21],"has":[22,35],"high":[23],"capacitance":[24,28],"density,":[25],"whereas":[26],"its":[27],"depends":[29],"on":[30],"input":[31],"voltage.":[32],"Hence":[33],"it":[34],"been":[36],"not":[37],"thought":[38],"to":[39,54],"be":[40],"suitable":[41],"for":[42],"ADCs.":[43],"used":[45],"two-stage":[46],"cyclic":[47],"ADC":[48],"architecture":[49],"split-sampling-capacitor":[52],"method":[53],"reduce":[55],"the":[56,65],"differential":[57],"non-linearity":[58],"(DNL)":[59],"of":[60,72],"ADC.":[61],"As":[62],"result,":[64],"exhibited":[69],"DNL":[71],"+0.95/-0.80":[73],"LSB,":[74],"realizing":[75],"genuine":[76],"resolution.":[78]},"counts_by_year":[{"year":2020,"cited_by_count":1},{"year":2018,"cited_by_count":5},{"year":2017,"cited_by_count":2},{"year":2016,"cited_by_count":3}],"updated_date":"2026-11-10T11:39:43.021295","created_date":"2017-01-26T00:00:00"}