{"id":"https://openalex.org/W2567547590","doi":"https://doi.org/10.1016/j.microrel.2016.12.008","title":"Emulation-based fault analysis on RFID tags for robustness and security evaluation","display_name":"Emulation-based fault analysis on RFID tags for robustness and security evaluation","publication_year":2016,"publication_date":"2016-12-20","ids":{"openalex":"https://openalex.org/W2567547590","doi":"https://doi.org/10.1016/j.microrel.2016.12.008","mag":"2567547590"},"language":"en","primary_location":{"id":"doi:10.1016/j.microrel.2016.12.008","doi":"https://doi.org/10.1016/j.microrel.2016.12.008","is_oa":false,"landing_page_url":"https://doi.org/10.1016/j.microrel.2016.12.008","pdf_url":null,"source":{"id":"https://openalex.org/S133646729","display_name":"Microelectronics Reliability","issn_l":"0026-2714","issn":["0026-2714","1872-941X"],"is_oa":false,"is_in_doaj":false,"is_core":true,"listed_in":["cwts-core","dongbi-c","jufo-1","norway-1","poland-70","russia-white-list-2"],"host_organization":"https://openalex.org/P4310320990","host_organization_name":"Elsevier BV","host_organization_lineage":["https://openalex.org/P4310320990"],"host_organization_lineage_names":["Elsevier BV"],"type":"journal"},"license":null,"license_id":null,"version":"publishedVersion","is_accepted":true,"is_published":true,"raw_source_name":"Microelectronics Reliability","raw_type":"journal-article"},"volume":null,"type":"article","indexed_in":["crossref"],"open_access":{"is_oa":false,"oa_status":"closed","oa_url":null,"any_repository_has_fulltext":false},"authorships":[{"author_position":"first","author":{"id":"https://openalex.org/A5081068768","display_name":"Ibrahim Mezzah","orcid":"https://orcid.org/0000-0003-2110-1567","observed_orcids":["https://orcid.org/0000-0003-2110-1567"]},"institutions":[{"id":"https://openalex.org/I40193446","display_name":"University Ferhat Abbas of Setif","ror":"https://ror.org/02rzqza52","country_code":"DZ","type":"education","lineage":["https://openalex.org/I40193446"]},{"id":"https://openalex.org/I4210102186","display_name":"Centre de D\u00e9veloppement des Technologies Avanc\u00e9es","ror":"https://ror.org/01ay87255","country_code":"DZ","type":"facility","lineage":["https://openalex.org/I4210102186"]}],"countries":["DZ"],"is_corresponding":true,"raw_author_name":"Ibrahim Mezzah","raw_affiliation_strings":["Centre de D\u00e9veloppement des Technologies Avanc\u00e9es (CDTA), Algiers, Algeria","Department of Electronics, University of Setif, Setif, Algeria"],"raw_orcid":null,"affiliations":[{"raw_affiliation_string":"Centre de D\u00e9veloppement des Technologies Avanc\u00e9es (CDTA), Algiers, Algeria","institution_ids":["https://openalex.org/I4210102186"]},{"raw_affiliation_string":"Department of Electronics, University of Setif, Setif, Algeria","institution_ids":["https://openalex.org/I40193446"]}]},{"author_position":"middle","author":{"id":"https://openalex.org/A5090505606","display_name":"Hamimi Chemal\u0131","orcid":"https://orcid.org/0000-0003-3441-9558","observed_orcids":["https://orcid.org/0000-0003-3441-9558"]},"institutions":[{"id":"https://openalex.org/I40193446","display_name":"University Ferhat Abbas of Setif","ror":"https://ror.org/02rzqza52","country_code":"DZ","type":"education","lineage":["https://openalex.org/I40193446"]}],"countries":["DZ"],"is_corresponding":false,"raw_author_name":"Hamimi Chemali","raw_affiliation_strings":["Department of Electronics, University of Setif, Setif, Algeria"],"raw_orcid":null,"affiliations":[{"raw_affiliation_string":"Department of Electronics, University of Setif, Setif, Algeria","institution_ids":["https://openalex.org/I40193446"]}]},{"author_position":"last","author":{"id":"https://openalex.org/A5075706510","display_name":"Omar Kermia","orcid":"https://orcid.org/0000-0002-4461-8350","observed_orcids":["https://orcid.org/0000-0002-4461-8350"]},"institutions":[{"id":"https://openalex.org/I4210102186","display_name":"Centre de D\u00e9veloppement des Technologies Avanc\u00e9es","ror":"https://ror.org/01ay87255","country_code":"DZ","type":"facility","lineage":["https://openalex.org/I4210102186"]}],"countries":["DZ"],"is_corresponding":false,"raw_author_name":"Omar Kermia","raw_affiliation_strings":["Centre de D\u00e9veloppement des Technologies Avanc\u00e9es (CDTA), Algiers, Algeria"],"raw_orcid":null,"affiliations":[{"raw_affiliation_string":"Centre de D\u00e9veloppement des Technologies Avanc\u00e9es (CDTA), Algiers, Algeria","institution_ids":["https://openalex.org/I4210102186"]}]}],"institutions":[],"countries_distinct_count":1,"institutions_distinct_count":2,"corresponding_author_ids":["https://openalex.org/A5081068768"],"corresponding_institution_ids":["https://openalex.org/I40193446","https://openalex.org/I4210102186"],"apc_list":{"value":2280,"currency":"USD","value_usd":2280},"apc_paid":null,"fwci":0.0,"has_fulltext":false,"cited_by_count":6,"citation_normalized_percentile":{"value":0.14461275,"is_in_top_1_percent":false,"is_in_top_10_percent":false},"cited_by_percentile_year":{"min":88,"max":97},"biblio":{"volume":"69","issue":null,"first_page":"115","last_page":"125"},"is_retracted":false,"is_paratext":false,"is_xpac":false,"primary_topic":{"id":"https://openalex.org/T11005","display_name":"Radiation Effects in Electronics","score":0.9086999893188477,"subfield":{"id":"https://openalex.org/subfields/2208","display_name":"Electrical and Electronic Engineering"},"field":{"id":"https://openalex.org/fields/22","display_name":"Engineering"},"domain":{"id":"https://openalex.org/domains/3","display_name":"Physical Sciences"}},"topics":[{"id":"https://openalex.org/T11005","display_name":"Radiation Effects in Electronics","score":0.9086999893188477,"subfield":{"id":"https://openalex.org/subfields/2208","display_name":"Electrical and Electronic Engineering"},"field":{"id":"https://openalex.org/fields/22","display_name":"Engineering"},"domain":{"id":"https://openalex.org/domains/3","display_name":"Physical Sciences"}},{"id":"https://openalex.org/T10986","display_name":"RFID technology advancements","score":0.06960000097751617,"subfield":{"id":"https://openalex.org/subfields/2214","display_name":"Media Technology"},"field":{"id":"https://openalex.org/fields/22","display_name":"Engineering"},"domain":{"id":"https://openalex.org/domains/3","display_name":"Physical Sciences"}},{"id":"https://openalex.org/T12122","display_name":"Physical Unclonable Functions (PUFs) and Hardware Security","score":0.009100000374019146,"subfield":{"id":"https://openalex.org/subfields/1708","display_name":"Hardware and Architecture"},"field":{"id":"https://openalex.org/fields/17","display_name":"Computer Science"},"domain":{"id":"https://openalex.org/domains/3","display_name":"Physical Sciences"}}],"keywords":[{"id":"https://openalex.org/keywords/rfid-tags","display_name":"RFID tags","score":0.9470000267028809},{"id":"https://openalex.org/keywords/fault-injection","display_name":"fault injection","score":0.7919999957084656},{"id":"https://openalex.org/keywords/fault-emulation","display_name":"fault emulation","score":0.718999981880188},{"id":"https://openalex.org/keywords/single-event-upset","display_name":"single event upset","score":0.9950000047683716},{"id":"https://openalex.org/keywords/single-event-transients","display_name":"single event transients","score":0.9940000176429749},{"id":"https://openalex.org/keywords/uhf-rfid","display_name":"UHF RFID","score":0.7390000224113464},{"id":"https://openalex.org/keywords/finite-state-machines","display_name":"finite automata","score":0.8460000157356262},{"id":"https://openalex.org/keywords/rfid-security","display_name":"RFID security","score":0.652999997138977}],"concepts":[{"id":"https://openalex.org/C149810388","wikidata":"https://www.wikidata.org/wiki/Q5374873","display_name":"Emulation","level":2,"score":0.9264005422592163},{"id":"https://openalex.org/C63479239","wikidata":"https://www.wikidata.org/wiki/Q7353546","display_name":"Robustness (evolution)","level":3,"score":0.7936309576034546},{"id":"https://openalex.org/C41008148","wikidata":"https://www.wikidata.org/wiki/Q21198","display_name":"Computer science","level":0,"score":0.623440682888031},{"id":"https://openalex.org/C200601418","wikidata":"https://www.wikidata.org/wiki/Q2193887","display_name":"Reliability engineering","level":1,"score":0.5535823702812195},{"id":"https://openalex.org/C149635348","wikidata":"https://www.wikidata.org/wiki/Q193040","display_name":"Embedded system","level":1,"score":0.5449544191360474},{"id":"https://openalex.org/C38369872","wikidata":"https://www.wikidata.org/wiki/Q7445009","display_name":"Security analysis","level":2,"score":0.5133423209190369},{"id":"https://openalex.org/C38652104","wikidata":"https://www.wikidata.org/wiki/Q3510521","display_name":"Computer security","level":1,"score":0.38974928855895996},{"id":"https://openalex.org/C127413603","wikidata":"https://www.wikidata.org/wiki/Q11023","display_name":"Engineering","level":0,"score":0.24062645435333252},{"id":"https://openalex.org/C104317684","wikidata":"https://www.wikidata.org/wiki/Q7187","display_name":"Gene","level":2,"score":0.0},{"id":"https://openalex.org/C55493867","wikidata":"https://www.wikidata.org/wiki/Q7094","display_name":"Biochemistry","level":1,"score":0.0},{"id":"https://openalex.org/C50522688","wikidata":"https://www.wikidata.org/wiki/Q189833","display_name":"Economic growth","level":1,"score":0.0},{"id":"https://openalex.org/C162324750","wikidata":"https://www.wikidata.org/wiki/Q8134","display_name":"Economics","level":0,"score":0.0},{"id":"https://openalex.org/C185592680","wikidata":"https://www.wikidata.org/wiki/Q2329","display_name":"Chemistry","level":0,"score":0.0}],"mesh":[],"locations_count":1,"locations":[{"id":"doi:10.1016/j.microrel.2016.12.008","doi":"https://doi.org/10.1016/j.microrel.2016.12.008","is_oa":false,"landing_page_url":"https://doi.org/10.1016/j.microrel.2016.12.008","pdf_url":null,"source":{"id":"https://openalex.org/S133646729","display_name":"Microelectronics Reliability","issn_l":"0026-2714","issn":["0026-2714","1872-941X"],"is_oa":false,"is_in_doaj":false,"is_core":true,"listed_in":["cwts-core","dongbi-c","jufo-1","norway-1","poland-70","russia-white-list-2"],"host_organization":"https://openalex.org/P4310320990","host_organization_name":"Elsevier BV","host_organization_lineage":["https://openalex.org/P4310320990"],"host_organization_lineage_names":["Elsevier BV"],"type":"journal"},"license":null,"license_id":null,"version":"publishedVersion","is_accepted":true,"is_published":true,"raw_source_name":"Microelectronics Reliability","raw_type":"journal-article"}],"best_oa_location":null,"sustainable_development_goals":[],"study_designs":[],"awards":[],"funders":[],"has_content":{"grobid_xml":false,"pdf":false},"content_urls":null,"referenced_works_count":25,"referenced_works":["https://openalex.org/W54110551","https://openalex.org/W1512292032","https://openalex.org/W1544388351","https://openalex.org/W1554115109","https://openalex.org/W1569815691","https://openalex.org/W1572628331","https://openalex.org/W1632962055","https://openalex.org/W2033589075","https://openalex.org/W2075149173","https://openalex.org/W2098513789","https://openalex.org/W2131171880","https://openalex.org/W2135764108","https://openalex.org/W2137284763","https://openalex.org/W2142584061","https://openalex.org/W2143105503","https://openalex.org/W2146081904","https://openalex.org/W2148156265","https://openalex.org/W2151990140","https://openalex.org/W2158450731","https://openalex.org/W2472045398","https://openalex.org/W2542283640","https://openalex.org/W4206114340","https://openalex.org/W4300856628","https://openalex.org/W6632795061","https://openalex.org/W6636489916"],"related_works":["https://openalex.org/W4234688737","https://openalex.org/W3183172529","https://openalex.org/W3021936681","https://openalex.org/W2141488148","https://openalex.org/W2137284763","https://openalex.org/W1554115109","https://openalex.org/W2542283640","https://openalex.org/W2534450389","https://openalex.org/W2518774358","https://openalex.org/W3090384255"],"abstract_inverted_index":null,"counts_by_year":[{"year":2025,"cited_by_count":1},{"year":2024,"cited_by_count":1},{"year":2021,"cited_by_count":1},{"year":2020,"cited_by_count":3}],"updated_date":"2026-10-16T09:59:22.235173","created_date":"2017-01-06T00:00:00"}