{"id":"https://openalex.org/W2564593447","doi":"https://doi.org/10.2978/jsas.11006","title":"Crystal orientation control of antimony telluride thermoelectric thin films by oblique deposition","display_name":"Crystal orientation control of antimony telluride thermoelectric thin films by oblique deposition","publication_year":2016,"publication_date":"2016-01-01","ids":{"openalex":"https://openalex.org/W2564593447","doi":"https://doi.org/10.2978/jsas.11006","mag":"2564593447"},"language":"en","primary_location":{"id":"doi:10.2978/jsas.11006","doi":"https://doi.org/10.2978/jsas.11006","is_oa":true,"landing_page_url":"https://doi.org/10.2978/jsas.11006","pdf_url":"https://www.jstage.jst.go.jp/article/jsas/28/0/28_11006/_pdf","source":{"id":"https://openalex.org/S84158422","display_name":"Journal of Advanced Science","issn_l":"0915-5651","issn":["0915-5651","1881-3917","1884-0426"],"is_oa":true,"is_in_doaj":false,"is_core":false,"listed_in":[],"host_organization":"https://openalex.org/P4363603741","host_organization_name":"Society of Advanced Science","host_organization_lineage":["https://openalex.org/P4363603741"],"host_organization_lineage_names":["Society of Advanced Science"],"type":"journal"},"license":null,"license_id":null,"version":"publishedVersion","is_accepted":true,"is_published":true,"raw_source_name":"Journal of Advanced Science","raw_type":"journal-article"},"volume":null,"type":"article","is_traditional":true,"indexed_in":["crossref"],"open_access":{"is_oa":true,"oa_status":"diamond","oa_url":"https://www.jstage.jst.go.jp/article/jsas/28/0/28_11006/_pdf","any_repository_has_fulltext":false},"authorships":[{"author_position":"first","author":{"id":null,"display_name":"Takuya SHIMOJO","orcid":null,"observed_orcids":[]},"institutions":[{"id":"https://openalex.org/I1314466530","display_name":"Tokai University","ror":"https://ror.org/01p7qe739","country_code":"JP","type":"education","lineage":["https://openalex.org/I1314466530"]}],"countries":["JP"],"is_corresponding":false,"raw_author_name":"Takuya SHIMOJO","raw_affiliation_strings":["Department of Materials Science, Tokai University"],"raw_orcid":null,"affiliations":[{"raw_affiliation_string":"Department of Materials Science, Tokai University","institution_ids":["https://openalex.org/I1314466530"]}]},{"author_position":"middle","author":{"id":"https://openalex.org/A5026553349","display_name":"Yusuke Sasaki","orcid":"https://orcid.org/0000-0002-0286-0325","observed_orcids":["https://orcid.org/0000-0002-0286-0325"]},"institutions":[{"id":"https://openalex.org/I1314466530","display_name":"Tokai University","ror":"https://ror.org/01p7qe739","country_code":"JP","type":"education","lineage":["https://openalex.org/I1314466530"]}],"countries":["JP"],"is_corresponding":false,"raw_author_name":"Yusuke SASAKI","raw_affiliation_strings":["Department of Materials Science, Tokai University"],"raw_orcid":null,"affiliations":[{"raw_affiliation_string":"Department of Materials Science, Tokai University","institution_ids":["https://openalex.org/I1314466530"]}]},{"author_position":"last","author":{"id":"https://openalex.org/A5043751841","display_name":"Masayuki Takashiri","orcid":"https://orcid.org/0000-0001-7041-6595","observed_orcids":["https://orcid.org/0000-0001-7041-6595"]},"institutions":[{"id":"https://openalex.org/I1314466530","display_name":"Tokai University","ror":"https://ror.org/01p7qe739","country_code":"JP","type":"education","lineage":["https://openalex.org/I1314466530"]}],"countries":["JP"],"is_corresponding":false,"raw_author_name":"Masayuki TAKASHIRI","raw_affiliation_strings":["Department of Materials Science, Tokai University"],"raw_orcid":null,"affiliations":[{"raw_affiliation_string":"Department of Materials Science, Tokai University","institution_ids":["https://openalex.org/I1314466530"]}]}],"institutions":[],"countries_distinct_count":1,"institutions_distinct_count":1,"corresponding_author_ids":[],"corresponding_institution_ids":["https://openalex.org/I1314466530"],"apc_list":null,"apc_paid":null,"fwci":0.0,"has_fulltext":true,"cited_by_count":0,"citation_normalized_percentile":{"value":0.0,"is_in_top_1_percent":false,"is_in_top_10_percent":false},"cited_by_percentile_year":null,"biblio":{"volume":"28","issue":"0","first_page":"n/a","last_page":"n/a"},"is_retracted":false,"is_paratext":false,"is_xpac":false,"primary_topic":{"id":"https://openalex.org/T10440","display_name":"Advanced Thermoelectric Materials and Devices","score":0.9994999766349792,"subfield":{"id":"https://openalex.org/subfields/2505","display_name":"Materials Chemistry"},"field":{"id":"https://openalex.org/fields/25","display_name":"Materials Science"},"domain":{"id":"https://openalex.org/domains/3","display_name":"Physical Sciences"}},"topics":[{"id":"https://openalex.org/T10440","display_name":"Advanced Thermoelectric Materials and Devices","score":0.9994999766349792,"subfield":{"id":"https://openalex.org/subfields/2505","display_name":"Materials Chemistry"},"field":{"id":"https://openalex.org/fields/25","display_name":"Materials Science"},"domain":{"id":"https://openalex.org/domains/3","display_name":"Physical Sciences"}},{"id":"https://openalex.org/T10590","display_name":"Chalcogenide Semiconductor Thin Films","score":0.00019999999494757503,"subfield":{"id":"https://openalex.org/subfields/2208","display_name":"Electrical and Electronic Engineering"},"field":{"id":"https://openalex.org/fields/22","display_name":"Engineering"},"domain":{"id":"https://openalex.org/domains/3","display_name":"Physical Sciences"}},{"id":"https://openalex.org/T13251","display_name":"Electrical and Thermal Properties of Materials","score":0.0,"subfield":{"id":"https://openalex.org/subfields/2208","display_name":"Electrical and Electronic Engineering"},"field":{"id":"https://openalex.org/fields/22","display_name":"Engineering"},"domain":{"id":"https://openalex.org/domains/3","display_name":"Physical Sciences"}}],"keywords":[{"id":"https://openalex.org/keywords/sb2te3","display_name":"Sb2Te3","score":0.9990000128746033},{"id":"https://openalex.org/keywords/thermoelectric-thin-films","display_name":"thermoelectric thin films","score":0.9409999847412109},{"id":"https://openalex.org/keywords/glancing-angle-deposition","display_name":"glancing angle deposition","score":0.9760000109672546},{"id":"https://openalex.org/keywords/crystal-orientation","display_name":"crystal orientation","score":0.9290000200271606},{"id":"https://openalex.org/keywords/incidence-angle","display_name":"angle of incidence","score":0.890999972820282},{"id":"https://openalex.org/keywords/crystallite-size","display_name":"crystallite size","score":0.7919999957084656},{"id":"https://openalex.org/keywords/power-factor","display_name":"power factor","score":0.7979999780654907},{"id":"https://openalex.org/keywords/seebeck-coefficient","display_name":"Seebeck coefficient","score":0.9990000128746033},{"id":"https://openalex.org/keywords/electrical-conductivity","display_name":"electrical conductivity","score":0.8100000023841858},{"id":"https://openalex.org/keywords/p-type-thermoelectric-materials","display_name":"p-type thermoelectric materials","score":0.7639999985694885}],"concepts":[{"id":"https://openalex.org/C192562407","wikidata":"https://www.wikidata.org/wiki/Q228736","display_name":"Materials science","level":0,"score":0.7926008105278015},{"id":"https://openalex.org/C137637335","wikidata":"https://www.wikidata.org/wiki/Q899604","display_name":"Crystallite","level":2,"score":0.7564879655838013},{"id":"https://openalex.org/C19067145","wikidata":"https://www.wikidata.org/wiki/Q1137203","display_name":"Thin film","level":2,"score":0.751013457775116},{"id":"https://openalex.org/C26771246","wikidata":"https://www.wikidata.org/wiki/Q321095","display_name":"Scanning electron microscope","level":2,"score":0.6320493221282959},{"id":"https://openalex.org/C112625512","wikidata":"https://www.wikidata.org/wiki/Q1091448","display_name":"Seebeck coefficient","level":3,"score":0.5700905919075012},{"id":"https://openalex.org/C63024428","wikidata":"https://www.wikidata.org/wiki/Q552456","display_name":"Thermoelectric effect","level":2,"score":0.48963457345962524},{"id":"https://openalex.org/C2780786182","wikidata":"https://www.wikidata.org/wiki/Q425263","display_name":"Lead telluride","level":3,"score":0.47136059403419495},{"id":"https://openalex.org/C541565711","wikidata":"https://www.wikidata.org/wiki/Q1099","display_name":"Antimony","level":2,"score":0.46697068214416504},{"id":"https://openalex.org/C2781285689","wikidata":"https://www.wikidata.org/wiki/Q21921428","display_name":"Crystal (programming language)","level":2,"score":0.4444006383419037},{"id":"https://openalex.org/C120665830","wikidata":"https://www.wikidata.org/wiki/Q14620","display_name":"Optics","level":1,"score":0.43693995475769043},{"id":"https://openalex.org/C69990965","wikidata":"https://www.wikidata.org/wiki/Q65402698","display_name":"Electrical resistivity and conductivity","level":2,"score":0.42192769050598145},{"id":"https://openalex.org/C49040817","wikidata":"https://www.wikidata.org/wiki/Q193091","display_name":"Optoelectronics","level":1,"score":0.32879605889320374},{"id":"https://openalex.org/C159985019","wikidata":"https://www.wikidata.org/wiki/Q181790","display_name":"Composite material","level":1,"score":0.1913505494594574},{"id":"https://openalex.org/C171250308","wikidata":"https://www.wikidata.org/wiki/Q11468","display_name":"Nanotechnology","level":1,"score":0.15105408430099487},{"id":"https://openalex.org/C97346530","wikidata":"https://www.wikidata.org/wiki/Q487005","display_name":"Thermal conductivity","level":2,"score":0.06845515966415405},{"id":"https://openalex.org/C191897082","wikidata":"https://www.wikidata.org/wiki/Q11467","display_name":"Metallurgy","level":1,"score":0.050773799419403076},{"id":"https://openalex.org/C57863236","wikidata":"https://www.wikidata.org/wiki/Q1130571","display_name":"Doping","level":2,"score":0.04741820693016052},{"id":"https://openalex.org/C119599485","wikidata":"https://www.wikidata.org/wiki/Q43035","display_name":"Electrical engineering","level":1,"score":0.04482206702232361},{"id":"https://openalex.org/C127413603","wikidata":"https://www.wikidata.org/wiki/Q11023","display_name":"Engineering","level":0,"score":0.0},{"id":"https://openalex.org/C121332964","wikidata":"https://www.wikidata.org/wiki/Q413","display_name":"Physics","level":0,"score":0.0},{"id":"https://openalex.org/C97355855","wikidata":"https://www.wikidata.org/wiki/Q11473","display_name":"Thermodynamics","level":1,"score":0.0},{"id":"https://openalex.org/C199360897","wikidata":"https://www.wikidata.org/wiki/Q9143","display_name":"Programming language","level":1,"score":0.0},{"id":"https://openalex.org/C41008148","wikidata":"https://www.wikidata.org/wiki/Q21198","display_name":"Computer science","level":0,"score":0.0}],"mesh":[],"locations_count":1,"locations":[{"id":"doi:10.2978/jsas.11006","doi":"https://doi.org/10.2978/jsas.11006","is_oa":true,"landing_page_url":"https://doi.org/10.2978/jsas.11006","pdf_url":"https://www.jstage.jst.go.jp/article/jsas/28/0/28_11006/_pdf","source":{"id":"https://openalex.org/S84158422","display_name":"Journal of Advanced Science","issn_l":"0915-5651","issn":["0915-5651","1881-3917","1884-0426"],"is_oa":true,"is_in_doaj":false,"is_core":false,"listed_in":[],"host_organization":"https://openalex.org/P4363603741","host_organization_name":"Society of Advanced Science","host_organization_lineage":["https://openalex.org/P4363603741"],"host_organization_lineage_names":["Society of Advanced Science"],"type":"journal"},"license":null,"license_id":null,"version":"publishedVersion","is_accepted":true,"is_published":true,"raw_source_name":"Journal of Advanced Science","raw_type":"journal-article"}],"best_oa_location":{"id":"doi:10.2978/jsas.11006","doi":"https://doi.org/10.2978/jsas.11006","is_oa":true,"landing_page_url":"https://doi.org/10.2978/jsas.11006","pdf_url":"https://www.jstage.jst.go.jp/article/jsas/28/0/28_11006/_pdf","source":{"id":"https://openalex.org/S84158422","display_name":"Journal of Advanced Science","issn_l":"0915-5651","issn":["0915-5651","1881-3917","1884-0426"],"is_oa":true,"is_in_doaj":false,"is_core":false,"listed_in":[],"host_organization":"https://openalex.org/P4363603741","host_organization_name":"Society of Advanced Science","host_organization_lineage":["https://openalex.org/P4363603741"],"host_organization_lineage_names":["Society of Advanced Science"],"type":"journal"},"license":null,"license_id":null,"version":"publishedVersion","is_accepted":true,"is_published":true,"raw_source_name":"Journal of Advanced Science","raw_type":"journal-article"},"sustainable_development_goals":[{"id":"https://metadata.un.org/sdg/7","score":0.5690000057220459,"display_name":"Affordable and clean energy"}],"study_designs":[],"awards":[],"funders":[],"has_content":{"grobid_xml":true,"pdf":true},"content_urls":{"pdf":"https://content.openalex.org/works/W2564593447.pdf","grobid_xml":"https://content.openalex.org/works/W2564593447.grobid-xml"},"referenced_works_count":6,"referenced_works":["https://openalex.org/W951721212","https://openalex.org/W2005202826","https://openalex.org/W2023501709","https://openalex.org/W2034966628","https://openalex.org/W2105490625","https://openalex.org/W4252319468"],"related_works":["https://openalex.org/W2932339654","https://openalex.org/W2034966628","https://openalex.org/W2795424650","https://openalex.org/W2116839435","https://openalex.org/W3018523688","https://openalex.org/W2023501709","https://openalex.org/W2605395723","https://openalex.org/W1976926411","https://openalex.org/W2774797688","https://openalex.org/W2345877373"],"abstract_inverted_index":{"We":[0,20],"prepared":[1],"p-type":[2],"antimony":[3],"telluride":[4],"thin":[5,32,82,114,130],"films":[6],"by":[7,42,54],"an":[8],"oblique":[9],"deposition":[10],"at":[11,73,84,116,132],"the":[12,22,25,31,35,48,60,81,85,91,96,100,106,117,133],"incident":[13,86,97,118,134],"angle":[14,87,98,119,135],"ranging":[15],"from":[16],"0\u00ba":[17],"to":[18],"80\u00ba.":[19],"investigated":[21],"relationship":[23],"between":[24],"structural":[26,36],"and":[27,47,51,70,129],"electrical":[28,61,66],"properties":[29],"of":[30,88,113,120,136],"films.":[33],"As":[34,59,76,95],"properties,":[37,62],"we":[38,63,79],"analyzed":[39],"cross-section":[40],"morphology":[41],"scanning":[43],"electron":[44],"microscope":[45],"(SEM),":[46],"crystal":[49,93],"orientation":[50],"crystallite":[52,101],"size":[53,102],"x-ray":[55],"diffraction":[56],"(XRD)":[57],"analysis.":[58],"measured":[64],"in-plane":[65],"conductivity,":[67],"Seebeck":[68],"coefficient":[69],"power":[71,107,111],"factor":[72,108,112],"room":[74],"temperature.":[75],"a":[77],"result,":[78],"found":[80],"film":[83,115,131],"40\u00b0":[89],"obtained":[90],"highest":[92],"orientation.":[94],"increased,":[99],"were":[103],"enhanced":[104],"but":[105],"decreased.":[109],"The":[110],"0\u00b0":[121],"was":[122,138],"1.26":[123],"\u03bcW":[124,140],"/":[125,141],"(":[126,142],"cm\u00b7K2":[127,143],")":[128],"80\u00b0":[137],"0.38":[139],").":[144]},"counts_by_year":[],"updated_date":"2026-09-29T14:09:16.559479","created_date":"2017-01-06T00:00:00"}