{"id":"https://openalex.org/W2544532243","doi":"https://doi.org/10.1109/iecon.2006.347641","title":"A Teaching System Fostering Expertise for the Tuning of Printed Circuit Board Inspection Systems","display_name":"A Teaching System Fostering Expertise for the Tuning of Printed Circuit Board Inspection Systems","publication_year":2006,"publication_date":"2006-11-01","ids":{"openalex":"https://openalex.org/W2544532243","doi":"https://doi.org/10.1109/iecon.2006.347641","mag":"2544532243"},"language":"en","primary_location":{"id":"doi:10.1109/iecon.2006.347641","doi":"https://doi.org/10.1109/iecon.2006.347641","is_oa":false,"landing_page_url":"https://doi.org/10.1109/iecon.2006.347641","pdf_url":null,"source":{"id":"https://openalex.org/S4210172894","display_name":"Annual Conference of the IEEE Industrial Electronics Society (IECON)","issn_l":"1553-572X","issn":["1553-572X","2577-1647"],"is_oa":false,"is_in_doaj":false,"is_core":false,"listed_in":["jufo-1","norway-1"],"host_organization":"https://openalex.org/P4310319808","host_organization_name":"Institute of Electrical and Electronics Engineers","host_organization_lineage":["https://openalex.org/P4310319808"],"host_organization_lineage_names":["Institute of Electrical and Electronics Engineers"],"type":"conference"},"license":null,"license_id":null,"version":"publishedVersion","is_accepted":true,"is_published":true,"raw_source_name":"IECON 2006 - 32nd Annual Conference on IEEE Industrial Electronics","raw_type":"proceedings-article"},"volume":null,"type":"conference-paper","is_traditional":true,"indexed_in":["crossref"],"open_access":{"is_oa":false,"oa_status":"closed","oa_url":null,"any_repository_has_fulltext":false},"authorships":[{"author_position":"first","author":{"id":"https://openalex.org/A5010530086","display_name":"Hirotaka Wada","orcid":null,"observed_orcids":[]},"institutions":[{"id":"https://openalex.org/I146230289","display_name":"Omron (Japan)","ror":"https://ror.org/00q0w1h45","country_code":"JP","type":"company","lineage":["https://openalex.org/I146230289"]}],"countries":["JP"],"is_corresponding":false,"raw_author_name":"Hirotaka Wada","raw_affiliation_strings":["Sensing & Control Technology Laboratory, OMRON Corporation, Kyoto, Japan"],"raw_orcid":null,"affiliations":[{"raw_affiliation_string":"Sensing & Control Technology Laboratory, OMRON Corporation, Kyoto, Japan","institution_ids":["https://openalex.org/I146230289"]}]},{"author_position":"middle","author":{"id":"https://openalex.org/A5017258609","display_name":"Akira Nakajima","orcid":"https://orcid.org/0000-0002-5571-8912","observed_orcids":["https://orcid.org/0000-0002-5571-8912"]},"institutions":[{"id":"https://openalex.org/I146230289","display_name":"Omron (Japan)","ror":"https://ror.org/00q0w1h45","country_code":"JP","type":"company","lineage":["https://openalex.org/I146230289"]}],"countries":["JP"],"is_corresponding":false,"raw_author_name":"Akira Nakajima","raw_affiliation_strings":["Sensing & Control Technology Laboratory, OMRON Corporation, Kyoto, Japan"],"raw_orcid":null,"affiliations":[{"raw_affiliation_string":"Sensing & Control Technology Laboratory, OMRON Corporation, Kyoto, Japan","institution_ids":["https://openalex.org/I146230289"]}]},{"author_position":"middle","author":{"id":"https://openalex.org/A5003680291","display_name":"Tetsuo Sawaragi","orcid":null,"observed_orcids":[]},"institutions":[{"id":"https://openalex.org/I22299242","display_name":"Kyoto University","ror":"https://ror.org/02kpeqv85","country_code":"JP","type":"education","lineage":["https://openalex.org/I22299242"]}],"countries":["JP"],"is_corresponding":false,"raw_author_name":"Tetsuo Sawaragi","raw_affiliation_strings":["Graduate School of Engineering, Kyoto University, Kyoto, Japan"],"raw_orcid":null,"affiliations":[{"raw_affiliation_string":"Graduate School of Engineering, Kyoto University, Kyoto, Japan","institution_ids":["https://openalex.org/I22299242"]}]},{"author_position":"last","author":{"id":"https://openalex.org/A5102192828","display_name":"Yukio Horiguchi","orcid":null,"observed_orcids":[]},"institutions":[{"id":"https://openalex.org/I22299242","display_name":"Kyoto University","ror":"https://ror.org/02kpeqv85","country_code":"JP","type":"education","lineage":["https://openalex.org/I22299242"]}],"countries":["JP"],"is_corresponding":false,"raw_author_name":"Yukio Horiguchi","raw_affiliation_strings":["Graduate School of Engineering, Kyoto University, Kyoto, Japan"],"raw_orcid":null,"affiliations":[{"raw_affiliation_string":"Graduate School of Engineering, Kyoto University, Kyoto, Japan","institution_ids":["https://openalex.org/I22299242"]}]}],"institutions":[],"countries_distinct_count":1,"institutions_distinct_count":2,"corresponding_author_ids":[],"corresponding_institution_ids":[],"apc_list":null,"apc_paid":null,"fwci":1.0471,"has_fulltext":false,"cited_by_count":2,"citation_normalized_percentile":{"value":0.78981207,"is_in_top_1_percent":false,"is_in_top_10_percent":false},"cited_by_percentile_year":{"min":88,"max":93},"biblio":{"volume":"e 83 c","issue":null,"first_page":"3739","last_page":"3744"},"is_retracted":false,"is_paratext":false,"is_xpac":false,"primary_topic":{"id":"https://openalex.org/T12111","display_name":"Industrial Vision Systems and Defect Detection","score":0.6151999831199646,"subfield":{"id":"https://openalex.org/subfields/2209","display_name":"Industrial and Manufacturing Engineering"},"field":{"id":"https://openalex.org/fields/22","display_name":"Engineering"},"domain":{"id":"https://openalex.org/domains/3","display_name":"Physical Sciences"}},"topics":[{"id":"https://openalex.org/T12111","display_name":"Industrial Vision Systems and Defect Detection","score":0.6151999831199646,"subfield":{"id":"https://openalex.org/subfields/2209","display_name":"Industrial and Manufacturing Engineering"},"field":{"id":"https://openalex.org/fields/22","display_name":"Engineering"},"domain":{"id":"https://openalex.org/domains/3","display_name":"Physical Sciences"}},{"id":"https://openalex.org/T14508","display_name":"Vocational Education and Training","score":0.052799999713897705,"subfield":{"id":"https://openalex.org/subfields/3304","display_name":"Education"},"field":{"id":"https://openalex.org/fields/33","display_name":"Social Sciences"},"domain":{"id":"https://openalex.org/domains/2","display_name":"Social Sciences"}},{"id":"https://openalex.org/T13734","display_name":"Advanced Computational Techniques and Applications","score":0.050700001418590546,"subfield":{"id":"https://openalex.org/subfields/1702","display_name":"Artificial Intelligence"},"field":{"id":"https://openalex.org/fields/17","display_name":"Computer Science"},"domain":{"id":"https://openalex.org/domains/3","display_name":"Physical Sciences"}}],"keywords":[{"id":"https://openalex.org/keywords/printed-circuit-board-inspection","display_name":"printed circuit board inspection","score":0.890999972820282},{"id":"https://openalex.org/keywords/parameter-tuning","display_name":"parameter tuning","score":0.7289999723434448},{"id":"https://openalex.org/keywords/non-expert-users","display_name":"non-expert users","score":0.6520000100135803},{"id":"https://openalex.org/keywords/deskilling","display_name":"deskilling","score":0.6399999856948853},{"id":"https://openalex.org/keywords/automation","display_name":"automation","score":0.4259999990463257},{"id":"https://openalex.org/keywords/verbal-expression","display_name":"verbal expression","score":0.6179999709129333},{"id":"https://openalex.org/keywords/expertise-development","display_name":"expertise development","score":0.4309999942779541},{"id":"https://openalex.org/keywords/human-machine-interaction","display_name":"human-machine interaction","score":0.37299999594688416},{"id":"https://openalex.org/keywords/skilled-labor-shortage","display_name":"skilled labor shortage","score":0.5509999990463257}],"concepts":[{"id":"https://openalex.org/C2780451532","wikidata":"https://www.wikidata.org/wiki/Q759676","display_name":"Task (project management)","level":2,"score":0.7719316482543945},{"id":"https://openalex.org/C2779944411","wikidata":"https://www.wikidata.org/wiki/Q5264558","display_name":"Deskilling","level":3,"score":0.7251049280166626},{"id":"https://openalex.org/C194051981","wikidata":"https://www.wikidata.org/wiki/Q1337691","display_name":"Economic shortage","level":3,"score":0.7180519700050354},{"id":"https://openalex.org/C115901376","wikidata":"https://www.wikidata.org/wiki/Q184199","display_name":"Automation","level":2,"score":0.6452975869178772},{"id":"https://openalex.org/C41008148","wikidata":"https://www.wikidata.org/wiki/Q21198","display_name":"Computer science","level":0,"score":0.6006459593772888},{"id":"https://openalex.org/C120793396","wikidata":"https://www.wikidata.org/wiki/Q173350","display_name":"Printed circuit board","level":2,"score":0.5108482241630554},{"id":"https://openalex.org/C58328972","wikidata":"https://www.wikidata.org/wiki/Q184609","display_name":"Expert system","level":2,"score":0.4887502193450928},{"id":"https://openalex.org/C18762648","wikidata":"https://www.wikidata.org/wiki/Q42213","display_name":"Work (physics)","level":2,"score":0.4452989101409912},{"id":"https://openalex.org/C2778348673","wikidata":"https://www.wikidata.org/wiki/Q739302","display_name":"Production (economics)","level":2,"score":0.43697771430015564},{"id":"https://openalex.org/C117671659","wikidata":"https://www.wikidata.org/wiki/Q11049265","display_name":"Manufacturing engineering","level":1,"score":0.38077133893966675},{"id":"https://openalex.org/C107457646","wikidata":"https://www.wikidata.org/wiki/Q207434","display_name":"Human\u2013computer interaction","level":1,"score":0.32704293727874756},{"id":"https://openalex.org/C110354214","wikidata":"https://www.wikidata.org/wiki/Q6314146","display_name":"Engineering management","level":1,"score":0.32605552673339844},{"id":"https://openalex.org/C127413603","wikidata":"https://www.wikidata.org/wiki/Q11023","display_name":"Engineering","level":0,"score":0.2915356159210205},{"id":"https://openalex.org/C154945302","wikidata":"https://www.wikidata.org/wiki/Q11660","display_name":"Artificial intelligence","level":1,"score":0.2691704332828522},{"id":"https://openalex.org/C201995342","wikidata":"https://www.wikidata.org/wiki/Q682496","display_name":"Systems engineering","level":1,"score":0.16982898116111755},{"id":"https://openalex.org/C78519656","wikidata":"https://www.wikidata.org/wiki/Q101333","display_name":"Mechanical engineering","level":1,"score":0.0},{"id":"https://openalex.org/C41895202","wikidata":"https://www.wikidata.org/wiki/Q8162","display_name":"Linguistics","level":1,"score":0.0},{"id":"https://openalex.org/C111919701","wikidata":"https://www.wikidata.org/wiki/Q9135","display_name":"Operating system","level":1,"score":0.0},{"id":"https://openalex.org/C139719470","wikidata":"https://www.wikidata.org/wiki/Q39680","display_name":"Macroeconomics","level":1,"score":0.0},{"id":"https://openalex.org/C162324750","wikidata":"https://www.wikidata.org/wiki/Q8134","display_name":"Economics","level":0,"score":0.0},{"id":"https://openalex.org/C2778137410","wikidata":"https://www.wikidata.org/wiki/Q2732820","display_name":"Government (linguistics)","level":2,"score":0.0},{"id":"https://openalex.org/C138885662","wikidata":"https://www.wikidata.org/wiki/Q5891","display_name":"Philosophy","level":0,"score":0.0}],"mesh":[],"locations_count":1,"locations":[{"id":"doi:10.1109/iecon.2006.347641","doi":"https://doi.org/10.1109/iecon.2006.347641","is_oa":false,"landing_page_url":"https://doi.org/10.1109/iecon.2006.347641","pdf_url":null,"source":{"id":"https://openalex.org/S4210172894","display_name":"Annual Conference of the IEEE Industrial Electronics Society (IECON)","issn_l":"1553-572X","issn":["1553-572X","2577-1647"],"is_oa":false,"is_in_doaj":false,"is_core":false,"listed_in":["jufo-1","norway-1"],"host_organization":"https://openalex.org/P4310319808","host_organization_name":"Institute of Electrical and Electronics Engineers","host_organization_lineage":["https://openalex.org/P4310319808"],"host_organization_lineage_names":["Institute of Electrical and Electronics Engineers"],"type":"conference"},"license":null,"license_id":null,"version":"publishedVersion","is_accepted":true,"is_published":true,"raw_source_name":"IECON 2006 - 32nd Annual Conference on IEEE Industrial Electronics","raw_type":"proceedings-article"}],"best_oa_location":null,"sustainable_development_goals":[{"score":0.5,"id":"https://metadata.un.org/sdg/4","display_name":"Quality education"},{"score":0.4943999946117401,"id":"https://metadata.un.org/sdg/9","display_name":"Industry, innovation and infrastructure"}],"study_designs":[],"awards":[],"funders":[],"has_content":{"pdf":false,"grobid_xml":false},"content_urls":null,"referenced_works_count":3,"referenced_works":["https://openalex.org/W194200376","https://openalex.org/W653450777","https://openalex.org/W2004241456"],"related_works":["https://openalex.org/W2160786297","https://openalex.org/W2141642718","https://openalex.org/W7098395878","https://openalex.org/W2062027733","https://openalex.org/W2139815714","https://openalex.org/W7223402279","https://openalex.org/W7035984356","https://openalex.org/W2559477212","https://openalex.org/W2551768530","https://openalex.org/W7054259467"],"abstract_inverted_index":{"Japanese":[0],"manufacturing":[1,76],"companies":[2],"are":[3],"now":[4],"facing":[5],"a":[6,192],"real":[7],"shortage":[8],"of":[9,89,113,145,182,199],"skilled":[10,115],"workers":[11],"who":[12],"have":[13],"expertise":[14,112,176],"on":[15,174],"production":[16,40],"facilities":[17,41],"and":[18,50,54,78],"instruments.":[19],"Automating":[20],"their":[21,160,175],"tasks":[22],"by":[23,62,168,180,197],"machine":[24],"may":[25],"be":[26,43],"one":[27,207],"promising":[28],"solution":[29],"to":[30,56,100,110,126,131,158,205,209],"this":[31],"problem.":[32],"However,":[33,118],"it":[34,47,95],"is":[35,166,178],"not":[36],"enough.":[37],"The":[38,188],"future":[39],"should":[42],"designed":[44],"so":[45,93],"that":[46,94,137,177,191],"can":[48,96,141,155,203],"develop":[49,80],"nurture":[51],"workers'":[52],"qualities":[53],"skills":[55,161],"overcome":[57],"the":[58,68,87,90,111,114,143,146,163,171,183,206],"\"deskilling\"":[59],"problem":[60],"caused":[61],"automation.":[63],"This":[64,104],"paper":[65],"deals":[66],"with":[67],"printed":[69],"circuit":[70],"board":[71],"inspection":[72,91],"system":[73,84,92,116,122,140,154,202],"utilized":[74],"in":[75],"sites,":[77],"we":[79,151],"an":[81,132,211],"automated":[82],"teaching":[83,121,139,201],"for":[85,162],"tuning":[86,105,129,147],"parameters":[88],"work":[97],"being":[98],"customized":[99],"particular":[101],"site":[102],"conditions.":[103],"task":[106,148],"has":[107,213],"been":[108],"left":[109],"engineers.":[117],"our":[119,138,153,200],"developing":[120],"enables":[123],"non-expert":[124,193],"users":[125],"achieve":[127],"accurate":[128],"equivalent":[130],"expert's":[133],"level.":[134],"We":[135],"show":[136],"improve":[142],"accuracy":[144],"drastically.":[149],"Moreover,":[150],"present":[152],"encourage":[156],"non-experts":[157],"enhance":[159],"tuning,":[164],"which":[165],"verified":[167],"investigating":[169],"into":[170],"verbal":[172],"expressions":[173],"analyzed":[179],"usage":[181,198],"fuzzy":[184],"structural":[185],"modelling":[186],"technique.":[187],"result":[189],"shows":[190],"user's":[194],"knowledge":[195],"cultivated":[196],"change":[204],"similar":[208],"what":[210],"expert":[212]},"counts_by_year":[{"year":2016,"cited_by_count":1}],"updated_date":"2026-10-27T15:51:10.671819","created_date":"2016-11-04T00:00:00"}