{"id":"https://openalex.org/W2543536827","doi":"https://doi.org/10.1109/jssc.2016.2608349","title":"Scalable Parasitic Charge Redistribution: Design of High-Efficiency Fully Integrated Switched-Capacitor DC\u2013DC Converters","display_name":"Scalable Parasitic Charge Redistribution: Design of High-Efficiency Fully Integrated Switched-Capacitor DC\u2013DC Converters","publication_year":2016,"publication_date":"2016-10-31","ids":{"openalex":"https://openalex.org/W2543536827","doi":"https://doi.org/10.1109/jssc.2016.2608349","mag":"2543536827"},"language":"en","primary_location":{"id":"doi:10.1109/jssc.2016.2608349","doi":"https://doi.org/10.1109/jssc.2016.2608349","is_oa":false,"landing_page_url":"https://doi.org/10.1109/jssc.2016.2608349","pdf_url":null,"source":{"id":"https://openalex.org/S83637746","display_name":"IEEE Journal of Solid-State Circuits","issn_l":"0018-9200","issn":["0018-9200","1558-173X"],"is_oa":false,"is_in_doaj":false,"is_core":true,"listed_in":["cwts-core","dongbi-a","jufo-3","norway-2","poland-140","russia-white-list-1"],"host_organization":"https://openalex.org/P4310319808","host_organization_name":"Institute of Electrical and Electronics Engineers","host_organization_lineage":["https://openalex.org/P4310319808"],"host_organization_lineage_names":["Institute of Electrical and Electronics Engineers"],"type":"journal"},"license":null,"license_id":null,"version":"publishedVersion","is_accepted":true,"is_published":true,"raw_source_name":"IEEE Journal of Solid-State Circuits","raw_type":"journal-article"},"volume":null,"type":"article","is_traditional":true,"indexed_in":["crossref"],"open_access":{"is_oa":true,"oa_status":"green","oa_url":"https://lirias.kuleuven.be/retrieve/e1265913-9dbc-4f4e-978e-3bb0f7df976c","any_repository_has_fulltext":true},"authorships":[{"author_position":"first","author":{"id":"https://openalex.org/A5063453028","display_name":"Nicolas Butzen","orcid":"https://orcid.org/0000-0002-4242-5563","observed_orcids":["https://orcid.org/0000-0002-4242-5563"]},"institutions":[{"id":"https://openalex.org/I99464096","display_name":"KU Leuven","ror":"https://ror.org/05f950310","country_code":"BE","type":"education","lineage":["https://openalex.org/I99464096"]}],"countries":["BE"],"is_corresponding":false,"raw_author_name":"Nicolas Butzen","raw_affiliation_strings":["Department of Electrical Engineering, KU Leuven, Leuven, Belgium"],"raw_orcid":"https://orcid.org/0000-0002-4242-5563","affiliations":[{"raw_affiliation_string":"Department of Electrical Engineering, KU Leuven, Leuven, Belgium","institution_ids":["https://openalex.org/I99464096"]}]},{"author_position":"last","author":{"id":"https://openalex.org/A5051481722","display_name":"Michiel S. J. Steyaert","orcid":"https://orcid.org/0000-0001-6398-8325","observed_orcids":["https://orcid.org/0000-0001-6398-8325"]},"institutions":[{"id":"https://openalex.org/I99464096","display_name":"KU Leuven","ror":"https://ror.org/05f950310","country_code":"BE","type":"education","lineage":["https://openalex.org/I99464096"]}],"countries":["BE"],"is_corresponding":false,"raw_author_name":"Michiel S. J. Steyaert","raw_affiliation_strings":["Department of Electrical Engineering, KU Leuven, Leuven, Belgium"],"raw_orcid":null,"affiliations":[{"raw_affiliation_string":"Department of Electrical Engineering, KU Leuven, Leuven, Belgium","institution_ids":["https://openalex.org/I99464096"]}]}],"institutions":[],"countries_distinct_count":1,"institutions_distinct_count":1,"corresponding_author_ids":[],"corresponding_institution_ids":["https://openalex.org/I99464096"],"apc_list":{"value":2645,"currency":"USD","value_usd":2645},"apc_paid":null,"fwci":3.0023,"has_fulltext":true,"cited_by_count":73,"citation_normalized_percentile":{"value":0.91447071,"is_in_top_1_percent":false,"is_in_top_10_percent":true},"cited_by_percentile_year":{"min":96,"max":99},"biblio":{"volume":"51","issue":"12","first_page":"2843","last_page":"2853"},"is_retracted":false,"is_paratext":false,"is_xpac":false,"primary_topic":{"id":"https://openalex.org/T10175","display_name":"Advanced DC-DC Converters","score":0.9980000257492065,"subfield":{"id":"https://openalex.org/subfields/2208","display_name":"Electrical and Electronic Engineering"},"field":{"id":"https://openalex.org/fields/22","display_name":"Engineering"},"domain":{"id":"https://openalex.org/domains/3","display_name":"Physical Sciences"}},"topics":[{"id":"https://openalex.org/T10175","display_name":"Advanced DC-DC Converters","score":0.9980000257492065,"subfield":{"id":"https://openalex.org/subfields/2208","display_name":"Electrical and Electronic Engineering"},"field":{"id":"https://openalex.org/fields/22","display_name":"Engineering"},"domain":{"id":"https://openalex.org/domains/3","display_name":"Physical Sciences"}},{"id":"https://openalex.org/T10323","display_name":"Analog and Mixed-Signal Circuit Design","score":0.0017999999690800905,"subfield":{"id":"https://openalex.org/subfields/2208","display_name":"Electrical and Electronic Engineering"},"field":{"id":"https://openalex.org/fields/22","display_name":"Engineering"},"domain":{"id":"https://openalex.org/domains/3","display_name":"Physical Sciences"}},{"id":"https://openalex.org/T10187","display_name":"Radio Frequency Integrated Circuit Design","score":0.0,"subfield":{"id":"https://openalex.org/subfields/2208","display_name":"Electrical and Electronic Engineering"},"field":{"id":"https://openalex.org/fields/22","display_name":"Engineering"},"domain":{"id":"https://openalex.org/domains/3","display_name":"Physical Sciences"}}],"keywords":[{"id":"https://openalex.org/keywords/switched-capacitor-dc-dc-converter","display_name":"switched-capacitor DC-DC converter","score":0.8379999995231628},{"id":"https://openalex.org/keywords/power-density","display_name":"power density","score":0.6100000143051147},{"id":"https://openalex.org/keywords/40-nm-cmos","display_name":"40-nm CMOS","score":0.8320000171661377}],"concepts":[{"id":"https://openalex.org/C2778422915","wikidata":"https://www.wikidata.org/wiki/Q10302051","display_name":"Converters","level":3,"score":0.7322289943695068},{"id":"https://openalex.org/C52192207","wikidata":"https://www.wikidata.org/wiki/Q5322","display_name":"Capacitor","level":3,"score":0.6396547555923462},{"id":"https://openalex.org/C46362747","wikidata":"https://www.wikidata.org/wiki/Q173431","display_name":"CMOS","level":2,"score":0.6334840059280396},{"id":"https://openalex.org/C48044578","wikidata":"https://www.wikidata.org/wiki/Q727490","display_name":"Scalability","level":2,"score":0.6010864973068237},{"id":"https://openalex.org/C103357873","wikidata":"https://www.wikidata.org/wiki/Q572656","display_name":"Switched capacitor","level":4,"score":0.5807303190231323},{"id":"https://openalex.org/C172385210","wikidata":"https://www.wikidata.org/wiki/Q5339","display_name":"Transistor","level":3,"score":0.5772724151611328},{"id":"https://openalex.org/C30066665","wikidata":"https://www.wikidata.org/wiki/Q164399","display_name":"Capacitance","level":3,"score":0.5723931789398193},{"id":"https://openalex.org/C154318817","wikidata":"https://www.wikidata.org/wiki/Q2157249","display_name":"Parasitic capacitance","level":4,"score":0.5613815188407898},{"id":"https://openalex.org/C119599485","wikidata":"https://www.wikidata.org/wiki/Q43035","display_name":"Electrical engineering","level":1,"score":0.5457167625427246},{"id":"https://openalex.org/C188198153","wikidata":"https://www.wikidata.org/wiki/Q1613840","display_name":"Limiting","level":2,"score":0.4693869948387146},{"id":"https://openalex.org/C165801399","wikidata":"https://www.wikidata.org/wiki/Q25428","display_name":"Voltage","level":2,"score":0.4468280076980591},{"id":"https://openalex.org/C24326235","wikidata":"https://www.wikidata.org/wiki/Q126095","display_name":"Electronic engineering","level":1,"score":0.444095253944397},{"id":"https://openalex.org/C71367568","wikidata":"https://www.wikidata.org/wiki/Q3363655","display_name":"Parasitic element","level":2,"score":0.42428550124168396},{"id":"https://openalex.org/C41008148","wikidata":"https://www.wikidata.org/wiki/Q21198","display_name":"Computer science","level":0,"score":0.3803246319293976},{"id":"https://openalex.org/C121332964","wikidata":"https://www.wikidata.org/wiki/Q413","display_name":"Physics","level":0,"score":0.3649612069129944},{"id":"https://openalex.org/C184720557","wikidata":"https://www.wikidata.org/wiki/Q7825049","display_name":"Topology (electrical circuits)","level":2,"score":0.3444479703903198},{"id":"https://openalex.org/C127413603","wikidata":"https://www.wikidata.org/wiki/Q11023","display_name":"Engineering","level":0,"score":0.31377121806144714},{"id":"https://openalex.org/C77088390","wikidata":"https://www.wikidata.org/wiki/Q8513","display_name":"Database","level":1,"score":0.0},{"id":"https://openalex.org/C62520636","wikidata":"https://www.wikidata.org/wiki/Q944","display_name":"Quantum mechanics","level":1,"score":0.0},{"id":"https://openalex.org/C78519656","wikidata":"https://www.wikidata.org/wiki/Q101333","display_name":"Mechanical engineering","level":1,"score":0.0},{"id":"https://openalex.org/C17525397","wikidata":"https://www.wikidata.org/wiki/Q176140","display_name":"Electrode","level":2,"score":0.0}],"mesh":[],"locations_count":2,"locations":[{"id":"doi:10.1109/jssc.2016.2608349","doi":"https://doi.org/10.1109/jssc.2016.2608349","is_oa":false,"landing_page_url":"https://doi.org/10.1109/jssc.2016.2608349","pdf_url":null,"source":{"id":"https://openalex.org/S83637746","display_name":"IEEE Journal of Solid-State Circuits","issn_l":"0018-9200","issn":["0018-9200","1558-173X"],"is_oa":false,"is_in_doaj":false,"is_core":true,"listed_in":["cwts-core","dongbi-a","jufo-3","norway-2","poland-140","russia-white-list-1"],"host_organization":"https://openalex.org/P4310319808","host_organization_name":"Institute of Electrical and Electronics Engineers","host_organization_lineage":["https://openalex.org/P4310319808"],"host_organization_lineage_names":["Institute of Electrical and Electronics Engineers"],"type":"journal"},"license":null,"license_id":null,"version":"publishedVersion","is_accepted":true,"is_published":true,"raw_source_name":"IEEE Journal of Solid-State Circuits","raw_type":"journal-article"},{"id":"pmh:oai:lirias2repo.kuleuven.be:123456789/560361","doi":null,"is_oa":true,"landing_page_url":"https://lirias.kuleuven.be/handle/123456789/560361","pdf_url":"https://lirias.kuleuven.be/retrieve/e1265913-9dbc-4f4e-978e-3bb0f7df976c","source":{"id":"https://openalex.org/S7407055369","display_name":"Lirias","issn_l":null,"issn":null,"is_oa":false,"is_in_doaj":false,"is_core":false,"listed_in":[],"host_organization":null,"host_organization_name":null,"host_organization_lineage":[],"host_organization_lineage_names":[],"type":"repository"},"license":"other-oa","license_id":"https://openalex.org/licenses/other-oa","version":"submittedVersion","is_accepted":false,"is_published":false,"raw_source_name":"IEEE Journal of Solid-State Circuits, vol. 51 (12), Art.No. 12, (2843-2853)","raw_type":"info:eu-repo/semantics/article"}],"best_oa_location":{"id":"pmh:oai:lirias2repo.kuleuven.be:123456789/560361","doi":null,"is_oa":true,"landing_page_url":"https://lirias.kuleuven.be/handle/123456789/560361","pdf_url":"https://lirias.kuleuven.be/retrieve/e1265913-9dbc-4f4e-978e-3bb0f7df976c","source":{"id":"https://openalex.org/S7407055369","display_name":"Lirias","issn_l":null,"issn":null,"is_oa":false,"is_in_doaj":false,"is_core":false,"listed_in":[],"host_organization":null,"host_organization_name":null,"host_organization_lineage":[],"host_organization_lineage_names":[],"type":"repository"},"license":"other-oa","license_id":"https://openalex.org/licenses/other-oa","version":"submittedVersion","is_accepted":false,"is_published":false,"raw_source_name":"IEEE Journal of Solid-State Circuits, vol. 51 (12), Art.No. 12, (2843-2853)","raw_type":"info:eu-repo/semantics/article"},"sustainable_development_goals":[{"score":0.571399986743927,"id":"https://metadata.un.org/sdg/7","display_name":"Affordable and clean energy"},{"score":0.5378999710083008,"id":"https://metadata.un.org/sdg/9","display_name":"Industry, innovation and infrastructure"}],"study_designs":[],"awards":[],"funders":[],"has_content":{"grobid_xml":true,"pdf":true},"content_urls":{"pdf":"https://content.openalex.org/works/W2543536827.pdf","grobid_xml":"https://content.openalex.org/works/W2543536827.grobid-xml"},"referenced_works_count":23,"referenced_works":["https://openalex.org/W1944261027","https://openalex.org/W1969269883","https://openalex.org/W1997266768","https://openalex.org/W2066343042","https://openalex.org/W2069211113","https://openalex.org/W2073989151","https://openalex.org/W2075455151","https://openalex.org/W2077230550","https://openalex.org/W2106065075","https://openalex.org/W2115664328","https://openalex.org/W2116175063","https://openalex.org/W2121623496","https://openalex.org/W2131862714","https://openalex.org/W2134081181","https://openalex.org/W2158552598","https://openalex.org/W2171445444","https://openalex.org/W2180502428","https://openalex.org/W2288534889","https://openalex.org/W2289217771","https://openalex.org/W2295065602","https://openalex.org/W2342666747","https://openalex.org/W2577088522","https://openalex.org/W3151455454"],"related_works":["https://openalex.org/W3039129107","https://openalex.org/W2288534889","https://openalex.org/W3115610077","https://openalex.org/W3019445048","https://openalex.org/W2158552598","https://openalex.org/W4312908915","https://openalex.org/W4411724768","https://openalex.org/W93064408","https://openalex.org/W2518902906","https://openalex.org/W3119488475"],"abstract_inverted_index":{"This":[0,29],"paper":[1],"introduces":[2],"a":[3,106,140,151],"technique,":[4],"called":[5],"scalable":[6],"parasitic":[7,14,36,50],"charge":[8,37,131],"redistribution":[9,132],"(SPCR),":[10],"that":[11,146],"reduces":[12],"the":[13,35,46,53,57,62,67,101,128],"bottom-plate":[15],"losses":[16],"in":[17,139],"fully":[18,64,155],"integrated":[19,65,156],"switched-capacitor":[20],"(SC)":[21],"voltage":[22],"regulators":[23],"up":[24],"to":[25,52,74,84,92,99,113,127],"any":[26],"desired":[27],"level.":[28],"is":[30,82,90,137],"realized":[31],"by":[32,149],"continuously":[33],"redistributing":[34],"in-between":[38],"phase-shifted":[39],"converter":[40,136],"cores.":[41],"Because":[42],"earlier":[43],"models":[44,94],"described":[45],"ratio":[47],"of":[48,69,103,109,121,130,160],"this":[49],"coupling":[51],"flying":[54],"capacitance":[55],"as":[56],"only":[58],"limiting":[59,87],"factor":[60,88],"on":[61],"achievable":[63],"efficiency,":[66],"use":[68,129],"SPCR":[70,104,122,148],"allows":[71],"SC":[72,158],"converters":[73,159],"achieve":[75],"efficiencies":[76],"previously":[77],"deemed":[78],"impossible.":[79],"Transistor":[80],"leakage":[81],"shown":[83],"be":[85],"another":[86],"and":[89,116],"added":[91],"existing":[93],"which":[95],"are":[96],"then":[97],"used":[98],"prove":[100],"effectiveness":[102],"over":[105],"wide":[107],"range":[108],"power":[110],"densities":[111],"(up":[112],"10":[114],"W/mm2)":[115],"technological":[117],"parameters.":[118],"The":[119],"implementation":[120],"requires":[123],"little":[124],"overhead":[125],"thanks":[126],"buses.":[133],"A":[134],"1/2":[135],"fabricated":[138],"40":[141],"nm":[142],"bulk":[143],"CMOS":[144],"technology":[145],"demonstrates":[147],"achieving":[150],"record":[152],"efficiency":[153],"for":[154],"closed-loop":[157],"94.6%.":[161]},"counts_by_year":[{"year":2026,"cited_by_count":5},{"year":2025,"cited_by_count":7},{"year":2024,"cited_by_count":9},{"year":2023,"cited_by_count":6},{"year":2022,"cited_by_count":8},{"year":2021,"cited_by_count":5},{"year":2020,"cited_by_count":12},{"year":2019,"cited_by_count":12},{"year":2018,"cited_by_count":6},{"year":2017,"cited_by_count":3}],"updated_date":"2026-11-06T12:05:46.655746","created_date":"2016-11-04T00:00:00"}