{"id":"https://openalex.org/W2524255982","doi":"https://doi.org/10.1080/22348972.2016.1228493","title":"Detection of high-impedance fault in low-voltage DC distribution system via mathematical morphology","display_name":"Detection of high-impedance fault in low-voltage DC distribution system via mathematical morphology","publication_year":2016,"publication_date":"2016-01-01","ids":{"openalex":"https://openalex.org/W2524255982","doi":"https://doi.org/10.1080/22348972.2016.1228493","mag":"2524255982"},"language":"en","primary_location":{"id":"doi:10.1080/22348972.2016.1228493","doi":"https://doi.org/10.1080/22348972.2016.1228493","is_oa":true,"landing_page_url":"https://doi.org/10.1080/22348972.2016.1228493","pdf_url":"https://www.tandfonline.com/doi/pdf/10.1080/22348972.2016.1228493?needAccess=true&role=button","source":{"id":"https://openalex.org/S2764589145","display_name":"Journal of International Council on Electrical Engineering","issn_l":"2233-5951","issn":["2233-5951","2234-8972"],"is_oa":false,"is_in_doaj":false,"is_core":true,"listed_in":["cwts-core"],"host_organization":"https://openalex.org/P4310320547","host_organization_name":"Taylor & Francis","host_organization_lineage":["https://openalex.org/P4310320547","https://openalex.org/P4310320449"],"host_organization_lineage_names":["Taylor & Francis","Informa"],"type":"journal"},"license":"cc-by","license_id":"https://openalex.org/licenses/cc-by","version":"publishedVersion","is_accepted":true,"is_published":true,"raw_source_name":"Journal of International Council on Electrical Engineering","raw_type":"journal-article"},"volume":null,"type":"article","is_traditional":true,"indexed_in":["crossref"],"open_access":{"is_oa":true,"oa_status":"hybrid","oa_url":"https://www.tandfonline.com/doi/pdf/10.1080/22348972.2016.1228493?needAccess=true&role=button","any_repository_has_fulltext":false},"authorships":[{"author_position":"first","author":{"id":"https://openalex.org/A5078303858","display_name":"Yun\u2010Sik Oh","orcid":"https://orcid.org/0000-0003-3950-4145","observed_orcids":["https://orcid.org/0000-0003-3950-4145"]},"institutions":[{"id":"https://openalex.org/I848706","display_name":"Sungkyunkwan University","ror":"https://ror.org/04q78tk20","country_code":"KR","type":"education","lineage":["https://openalex.org/I848706"]}],"countries":["KR"],"is_corresponding":false,"raw_author_name":"Yun-Sik Oh","raw_affiliation_strings":["College of Information and Communication Engineering, Sungkyunkwan University, Suwon, Korea"],"raw_orcid":null,"affiliations":[{"raw_affiliation_string":"College of Information and Communication Engineering, Sungkyunkwan University, Suwon, Korea","institution_ids":["https://openalex.org/I848706"]}]},{"author_position":"middle","author":{"id":"https://openalex.org/A5103229043","display_name":"Joon Han","orcid":"https://orcid.org/0000-0001-7411-6151","observed_orcids":["https://orcid.org/0000-0001-7411-6151"]},"institutions":[{"id":"https://openalex.org/I848706","display_name":"Sungkyunkwan University","ror":"https://ror.org/04q78tk20","country_code":"KR","type":"education","lineage":["https://openalex.org/I848706"]}],"countries":["KR"],"is_corresponding":false,"raw_author_name":"Joon Han","raw_affiliation_strings":["College of Information and Communication Engineering, Sungkyunkwan University, Suwon, Korea"],"raw_orcid":null,"affiliations":[{"raw_affiliation_string":"College of Information and Communication Engineering, Sungkyunkwan University, Suwon, Korea","institution_ids":["https://openalex.org/I848706"]}]},{"author_position":"middle","author":{"id":"https://openalex.org/A5003830541","display_name":"Gi-Hyeon Gwon","orcid":"https://orcid.org/0000-0002-5396-6250","observed_orcids":["https://orcid.org/0000-0002-5396-6250"]},"institutions":[{"id":"https://openalex.org/I848706","display_name":"Sungkyunkwan University","ror":"https://ror.org/04q78tk20","country_code":"KR","type":"education","lineage":["https://openalex.org/I848706"]}],"countries":["KR"],"is_corresponding":false,"raw_author_name":"Gi-Hyeon Gwon","raw_affiliation_strings":["College of Information and Communication Engineering, Sungkyunkwan University, Suwon, Korea"],"raw_orcid":null,"affiliations":[{"raw_affiliation_string":"College of Information and Communication Engineering, Sungkyunkwan University, Suwon, Korea","institution_ids":["https://openalex.org/I848706"]}]},{"author_position":"middle","author":{"id":"https://openalex.org/A5008345069","display_name":"Doo-Ung Kim","orcid":null,"observed_orcids":[]},"institutions":[{"id":"https://openalex.org/I848706","display_name":"Sungkyunkwan University","ror":"https://ror.org/04q78tk20","country_code":"KR","type":"education","lineage":["https://openalex.org/I848706"]}],"countries":["KR"],"is_corresponding":false,"raw_author_name":"Doo-Ung Kim","raw_affiliation_strings":["College of Information and Communication Engineering, Sungkyunkwan University, Suwon, Korea"],"raw_orcid":null,"affiliations":[{"raw_affiliation_string":"College of Information and Communication Engineering, Sungkyunkwan University, Suwon, Korea","institution_ids":["https://openalex.org/I848706"]}]},{"author_position":"middle","author":{"id":"https://openalex.org/A5046551555","display_name":"Chul-Ho Noh","orcid":"https://orcid.org/0000-0003-1515-446X","observed_orcids":["https://orcid.org/0000-0003-1515-446X"]},"institutions":[{"id":"https://openalex.org/I848706","display_name":"Sungkyunkwan University","ror":"https://ror.org/04q78tk20","country_code":"KR","type":"education","lineage":["https://openalex.org/I848706"]}],"countries":["KR"],"is_corresponding":false,"raw_author_name":"Chul-Ho Noh","raw_affiliation_strings":["College of Information and Communication Engineering, Sungkyunkwan University, Suwon, Korea"],"raw_orcid":null,"affiliations":[{"raw_affiliation_string":"College of Information and Communication Engineering, Sungkyunkwan University, Suwon, Korea","institution_ids":["https://openalex.org/I848706"]}]},{"author_position":"middle","author":{"id":"https://openalex.org/A5018905527","display_name":"Chul\u2010Hwan Kim","orcid":"https://orcid.org/0000-0002-3418-9687","observed_orcids":["https://orcid.org/0000-0002-3418-9687"]},"institutions":[{"id":"https://openalex.org/I848706","display_name":"Sungkyunkwan University","ror":"https://ror.org/04q78tk20","country_code":"KR","type":"education","lineage":["https://openalex.org/I848706"]}],"countries":["KR"],"is_corresponding":true,"raw_author_name":"Chul-Hwan Kim","raw_affiliation_strings":["College of Information and Communication Engineering, Sungkyunkwan University, Suwon, Korea"],"raw_orcid":null,"affiliations":[{"raw_affiliation_string":"College of Information and Communication Engineering, Sungkyunkwan University, Suwon, Korea","institution_ids":["https://openalex.org/I848706"]}]},{"author_position":"middle","author":{"id":"https://openalex.org/A5112281784","display_name":"Toshihisa Funabashi","orcid":null,"observed_orcids":[]},"institutions":[{"id":"https://openalex.org/I60134161","display_name":"Nagoya University","ror":"https://ror.org/04chrp450","country_code":"JP","type":"education","lineage":["https://openalex.org/I60134161"]}],"countries":["JP"],"is_corresponding":false,"raw_author_name":"Toshihisa Funabashi","raw_affiliation_strings":["Dept. of Electrical Engineering, University of Nagoya, Nagoya, Japan"],"raw_orcid":null,"affiliations":[{"raw_affiliation_string":"Dept. of Electrical Engineering, University of Nagoya, Nagoya, Japan","institution_ids":["https://openalex.org/I60134161"]}]},{"author_position":"last","author":{"id":"https://openalex.org/A5031089304","display_name":"Tomonobu Shah Senjyu","orcid":"https://orcid.org/0000-0003-4494-6773","observed_orcids":["https://orcid.org/0000-0003-4494-6773"]},"institutions":[{"id":"https://openalex.org/I32915989","display_name":"University of the Ryukyus","ror":"https://ror.org/02z1n9q24","country_code":"JP","type":"education","lineage":["https://openalex.org/I32915989"]}],"countries":["JP"],"is_corresponding":false,"raw_author_name":"Tomonobu Senjyu","raw_affiliation_strings":["Dept. of Electrical and Electronics Engineering, University of the Ryukyus, Nakagami, Japan"],"raw_orcid":null,"affiliations":[{"raw_affiliation_string":"Dept. of Electrical and Electronics Engineering, University of the Ryukyus, Nakagami, Japan","institution_ids":["https://openalex.org/I32915989"]}]}],"institutions":[],"countries_distinct_count":2,"institutions_distinct_count":3,"corresponding_author_ids":["https://openalex.org/A5018905527"],"corresponding_institution_ids":["https://openalex.org/I848706"],"apc_list":{"value":1000,"currency":"USD","value_usd":1000},"apc_paid":{"value":1000,"currency":"USD","value_usd":1000},"fwci":0.3702,"has_fulltext":false,"cited_by_count":12,"citation_normalized_percentile":{"value":0.63390957,"is_in_top_1_percent":false,"is_in_top_10_percent":false},"cited_by_percentile_year":{"min":88,"max":97},"biblio":{"volume":"6","issue":"1","first_page":"194","last_page":"201"},"is_retracted":false,"is_paratext":false,"is_xpac":false,"primary_topic":{"id":"https://openalex.org/T10972","display_name":"Power Systems Fault Detection","score":0.9477999806404114,"subfield":{"id":"https://openalex.org/subfields/2207","display_name":"Control and Systems Engineering"},"field":{"id":"https://openalex.org/fields/22","display_name":"Engineering"},"domain":{"id":"https://openalex.org/domains/3","display_name":"Physical Sciences"}},"topics":[{"id":"https://openalex.org/T10972","display_name":"Power Systems Fault Detection","score":0.9477999806404114,"subfield":{"id":"https://openalex.org/subfields/2207","display_name":"Control and Systems Engineering"},"field":{"id":"https://openalex.org/fields/22","display_name":"Engineering"},"domain":{"id":"https://openalex.org/domains/3","display_name":"Physical Sciences"}},{"id":"https://openalex.org/T12737","display_name":"Electrical Fault Detection and Protection","score":0.04039999842643738,"subfield":{"id":"https://openalex.org/subfields/2208","display_name":"Electrical and Electronic Engineering"},"field":{"id":"https://openalex.org/fields/22","display_name":"Engineering"},"domain":{"id":"https://openalex.org/domains/3","display_name":"Physical Sciences"}},{"id":"https://openalex.org/T10573","display_name":"Power Quality and Harmonics","score":0.004800000227987766,"subfield":{"id":"https://openalex.org/subfields/2208","display_name":"Electrical and Electronic Engineering"},"field":{"id":"https://openalex.org/fields/22","display_name":"Engineering"},"domain":{"id":"https://openalex.org/domains/3","display_name":"Physical Sciences"}}],"keywords":[{"id":"https://openalex.org/keywords/high-impedance-fault-detection","display_name":"high impedance fault detection","score":0.9520000219345093},{"id":"https://openalex.org/keywords/low-voltage-dc-distribution-system","display_name":"low-voltage DC distribution system","score":0.9350000023841858},{"id":"https://openalex.org/keywords/mathematical-morphology","display_name":"mathematical morphology","score":0.9959999918937683},{"id":"https://openalex.org/keywords/dilation-and-erosion","display_name":"erosion and dilation","score":0.9789999723434448},{"id":"https://openalex.org/keywords/current-waveform-analysis","display_name":"current waveform analysis","score":0.6190000176429749},{"id":"https://openalex.org/keywords/power-converters","display_name":"power converters","score":0.7850000262260437},{"id":"https://openalex.org/keywords/dc-dc-converter","display_name":"DC-DC converter","score":0.8619999885559082},{"id":"https://openalex.org/keywords/ac-dc-converter","display_name":"AC-DC converter","score":0.8169999718666077},{"id":"https://openalex.org/keywords/emtp-simulation","display_name":"EMTP simulation","score":0.49300000071525574}],"concepts":[{"id":"https://openalex.org/C2778363592","wikidata":"https://www.wikidata.org/wiki/Q5374837","display_name":"Emtp","level":4,"score":0.9021210670471191},{"id":"https://openalex.org/C2778422915","wikidata":"https://www.wikidata.org/wiki/Q10302051","display_name":"Converters","level":3,"score":0.6014957427978516},{"id":"https://openalex.org/C197424946","wikidata":"https://www.wikidata.org/wiki/Q1165717","display_name":"Waveform","level":3,"score":0.5958905816078186},{"id":"https://openalex.org/C2780799671","wikidata":"https://www.wikidata.org/wiki/Q17087362","display_name":"Transient (computer programming)","level":2,"score":0.5838027000427246},{"id":"https://openalex.org/C24326235","wikidata":"https://www.wikidata.org/wiki/Q126095","display_name":"Electronic engineering","level":1,"score":0.5569547414779663},{"id":"https://openalex.org/C17829176","wikidata":"https://www.wikidata.org/wiki/Q179043","display_name":"Electrical impedance","level":2,"score":0.5421335697174072},{"id":"https://openalex.org/C128624480","wikidata":"https://www.wikidata.org/wiki/Q1504817","display_name":"Low voltage","level":3,"score":0.5202180743217468},{"id":"https://openalex.org/C175551986","wikidata":"https://www.wikidata.org/wiki/Q47089","display_name":"Fault (geology)","level":2,"score":0.4651094079017639},{"id":"https://openalex.org/C165801399","wikidata":"https://www.wikidata.org/wiki/Q25428","display_name":"Voltage","level":2,"score":0.4603092670440674},{"id":"https://openalex.org/C127413603","wikidata":"https://www.wikidata.org/wiki/Q11023","display_name":"Engineering","level":0,"score":0.4598894715309143},{"id":"https://openalex.org/C89227174","wikidata":"https://www.wikidata.org/wiki/Q2388981","display_name":"Electric power system","level":3,"score":0.37157636880874634},{"id":"https://openalex.org/C163258240","wikidata":"https://www.wikidata.org/wiki/Q25342","display_name":"Power (physics)","level":2,"score":0.3703223466873169},{"id":"https://openalex.org/C119599485","wikidata":"https://www.wikidata.org/wiki/Q43035","display_name":"Electrical engineering","level":1,"score":0.34580397605895996},{"id":"https://openalex.org/C41008148","wikidata":"https://www.wikidata.org/wiki/Q21198","display_name":"Computer science","level":0,"score":0.30787962675094604},{"id":"https://openalex.org/C121332964","wikidata":"https://www.wikidata.org/wiki/Q413","display_name":"Physics","level":0,"score":0.12484875321388245},{"id":"https://openalex.org/C127313418","wikidata":"https://www.wikidata.org/wiki/Q1069","display_name":"Geology","level":0,"score":0.0},{"id":"https://openalex.org/C62520636","wikidata":"https://www.wikidata.org/wiki/Q944","display_name":"Quantum mechanics","level":1,"score":0.0},{"id":"https://openalex.org/C165205528","wikidata":"https://www.wikidata.org/wiki/Q83371","display_name":"Seismology","level":1,"score":0.0},{"id":"https://openalex.org/C111919701","wikidata":"https://www.wikidata.org/wiki/Q9135","display_name":"Operating system","level":1,"score":0.0}],"mesh":[],"locations_count":1,"locations":[{"id":"doi:10.1080/22348972.2016.1228493","doi":"https://doi.org/10.1080/22348972.2016.1228493","is_oa":true,"landing_page_url":"https://doi.org/10.1080/22348972.2016.1228493","pdf_url":"https://www.tandfonline.com/doi/pdf/10.1080/22348972.2016.1228493?needAccess=true&role=button","source":{"id":"https://openalex.org/S2764589145","display_name":"Journal of International Council on Electrical Engineering","issn_l":"2233-5951","issn":["2233-5951","2234-8972"],"is_oa":false,"is_in_doaj":false,"is_core":true,"listed_in":["cwts-core"],"host_organization":"https://openalex.org/P4310320547","host_organization_name":"Taylor & Francis","host_organization_lineage":["https://openalex.org/P4310320547","https://openalex.org/P4310320449"],"host_organization_lineage_names":["Taylor & Francis","Informa"],"type":"journal"},"license":"cc-by","license_id":"https://openalex.org/licenses/cc-by","version":"publishedVersion","is_accepted":true,"is_published":true,"raw_source_name":"Journal of International Council on Electrical Engineering","raw_type":"journal-article"}],"best_oa_location":{"id":"doi:10.1080/22348972.2016.1228493","doi":"https://doi.org/10.1080/22348972.2016.1228493","is_oa":true,"landing_page_url":"https://doi.org/10.1080/22348972.2016.1228493","pdf_url":"https://www.tandfonline.com/doi/pdf/10.1080/22348972.2016.1228493?needAccess=true&role=button","source":{"id":"https://openalex.org/S2764589145","display_name":"Journal of International Council on Electrical Engineering","issn_l":"2233-5951","issn":["2233-5951","2234-8972"],"is_oa":false,"is_in_doaj":false,"is_core":true,"listed_in":["cwts-core"],"host_organization":"https://openalex.org/P4310320547","host_organization_name":"Taylor & Francis","host_organization_lineage":["https://openalex.org/P4310320547","https://openalex.org/P4310320449"],"host_organization_lineage_names":["Taylor & Francis","Informa"],"type":"journal"},"license":"cc-by","license_id":"https://openalex.org/licenses/cc-by","version":"publishedVersion","is_accepted":true,"is_published":true,"raw_source_name":"Journal of International Council on Electrical Engineering","raw_type":"journal-article"},"sustainable_development_goals":[{"score":0.4943999946117401,"display_name":"Industry, innovation and infrastructure","id":"https://metadata.un.org/sdg/9"}],"study_designs":[],"awards":[],"funders":[{"id":"https://openalex.org/F4320321681","display_name":"Ministry of Trade, Industry and Energy","ror":"https://ror.org/008nkqk13"},{"id":"https://openalex.org/F4320335199","display_name":"Korea Institute of Energy Technology Evaluation and Planning","ror":"https://ror.org/02zq38y32"}],"has_content":{"grobid_xml":false,"pdf":true},"content_urls":{"pdf":"https://content.openalex.org/works/W2524255982.pdf"},"referenced_works_count":13,"referenced_works":["https://openalex.org/W1562652516","https://openalex.org/W1740445234","https://openalex.org/W1992260210","https://openalex.org/W2020076411","https://openalex.org/W2096405239","https://openalex.org/W2113229722","https://openalex.org/W2113614886","https://openalex.org/W2122634891","https://openalex.org/W2155894365","https://openalex.org/W2157729707","https://openalex.org/W2158664673","https://openalex.org/W2165427810","https://openalex.org/W3139555398"],"related_works":["https://openalex.org/W2465306945","https://openalex.org/W2280257574","https://openalex.org/W2345825235","https://openalex.org/W2122634891","https://openalex.org/W2899815832","https://openalex.org/W3010872134","https://openalex.org/W2906188127","https://openalex.org/W4312056215","https://openalex.org/W4311890315","https://openalex.org/W4390659226"],"abstract_inverted_index":{"This":[0],"study":[1],"presents":[2],"a":[3,11,86],"method":[4,98],"for":[5,90],"high-impedance":[6],"fault":[7],"(HIF)":[8],"detection":[9],"in":[10,75,106],"low-voltage":[12],"DC":[13,77],"(LVDC)":[14],"distribution":[15,46,109],"system":[16,78],"via":[17],"mathematical":[18],"morphology":[19],"(MM),":[20],"which":[21,84],"is":[22,58,79,85],"composed":[23],"of":[24,41],"two":[25],"elementary":[26],"transformations,":[27],"namely,":[28],"dilation":[29],"and":[30,55],"erosion.":[31],"Various":[32],"MM-based":[33],"filters":[34],"are":[35],"used":[36],"to":[37,66,102],"detect":[38,103],"abnormal":[39],"signals":[40],"current":[42],"waveform.":[43],"The":[44,71],"LVDC":[45,108],"system,":[47],"including":[48],"power":[49],"conversion":[50],"devices,":[51],"such":[52],"as":[53],"AC/DC":[54],"DC/DC":[56],"converters,":[57],"modelled":[59],"with":[60,82],"electromagnetic":[61],"transient":[62],"program":[63],"(EMTP)":[64],"software":[65],"verify":[67],"the":[68,76,96,107],"proposed":[69,97],"method.":[70],"HIF":[72,104],"arc":[73],"model":[74],"also":[80],"implemented":[81],"EMTP/MODELS,":[83],"symbolic":[87],"language":[88],"interpreter":[89],"EMTP.":[91],"Simulation":[92],"results":[93],"show":[94],"that":[95],"can":[99],"be":[100],"applied":[101],"effectively":[105],"system.":[110]},"counts_by_year":[{"year":2023,"cited_by_count":2},{"year":2022,"cited_by_count":4},{"year":2021,"cited_by_count":3},{"year":2020,"cited_by_count":1},{"year":2018,"cited_by_count":2}],"updated_date":"2026-11-13T13:42:25.865203","created_date":"2016-10-07T00:00:00"}