{"id":"https://openalex.org/W2491914733","doi":null,"title":"Theoretical model to determine the Porosity and refractive index of porous silicon type-n by using Atomic force microscope","display_name":"Theoretical model to determine the Porosity and refractive index of porous silicon type-n by using Atomic force microscope","publication_year":2016,"publication_date":"2016-01-01","ids":{"openalex":"https://openalex.org/W2491914733","mag":"2491914733"},"language":"en","primary_location":{"id":"mag:2491914733","doi":null,"is_oa":false,"landing_page_url":"http://yadda.icm.edu.pl/yadda/element/bwmeta1.element.psjd-a2c624a1-3bf0-428d-8379-136a108bc4c7","pdf_url":null,"source":{"id":"https://openalex.org/S4306534956","display_name":"World Scientific News","issn_l":"2392-2192","issn":["2392-2192"],"is_oa":false,"is_in_doaj":false,"is_core":true,"listed_in":["cwts-core"],"host_organization":null,"host_organization_name":null,"host_organization_lineage":[],"host_organization_lineage_names":[],"type":"journal"},"license":null,"license_id":null,"version":null,"is_accepted":false,"is_published":false,"raw_source_name":"World Scientific News","raw_type":null},"volume":null,"type":"article","is_traditional":true,"indexed_in":[],"open_access":{"is_oa":false,"oa_status":"closed","oa_url":null,"any_repository_has_fulltext":false},"authorships":[{"author_position":"first","author":{"id":"https://openalex.org/A5067820571","display_name":"Wasna\u2019a M. Abdulridha","orcid":"https://orcid.org/0000-0003-1923-3931","observed_orcids":["https://orcid.org/0000-0003-1923-3931"]},"institutions":[{"id":"https://openalex.org/I47229656","display_name":"University of Kufa","ror":"https://ror.org/02dwrdh81","country_code":"IQ","type":"education","lineage":["https://openalex.org/I47229656"]}],"countries":["IQ"],"is_corresponding":false,"raw_author_name":"Wasna\u2019a M. Abdulridha","raw_affiliation_strings":["Basic Science Department, University of Al- Kufa, Najaf, Iraq"],"raw_orcid":"https://orcid.org/0000-0003-1923-3931","affiliations":[{"raw_affiliation_string":"Basic Science Department, University of Al- Kufa, Najaf, Iraq","institution_ids":["https://openalex.org/I47229656"]}]},{"author_position":"middle","author":{"id":"https://openalex.org/A5008621951","display_name":"N. Ahmed","orcid":"https://orcid.org/0000-0003-0569-9650","observed_orcids":["https://orcid.org/0000-0003-0569-9650"]},"institutions":[{"id":"https://openalex.org/I15873915","display_name":"Mustansiriyah University","ror":"https://ror.org/05s04wy35","country_code":"IQ","type":"education","lineage":["https://openalex.org/I15873915"]}],"countries":["IQ"],"is_corresponding":false,"raw_author_name":"N. Ahmed","raw_affiliation_strings":["Physics Department, Science Faculty, University of Al- Mustansiriyah, Baghdad, Iraq"],"raw_orcid":"https://orcid.org/0000-0003-0569-9650","affiliations":[{"raw_affiliation_string":"Physics Department, Science Faculty, University of Al- Mustansiriyah, Baghdad, Iraq","institution_ids":["https://openalex.org/I15873915"]}]},{"author_position":"last","author":{"id":"https://openalex.org/A5045552225","display_name":"Mohammed Odda Dawood","orcid":"https://orcid.org/0000-0003-1329-7483","observed_orcids":["https://orcid.org/0000-0003-1329-7483"]},"institutions":[{"id":"https://openalex.org/I15873915","display_name":"Mustansiriyah University","ror":"https://ror.org/05s04wy35","country_code":"IQ","type":"education","lineage":["https://openalex.org/I15873915"]}],"countries":["IQ"],"is_corresponding":false,"raw_author_name":"Mohammed O. Dawood","raw_affiliation_strings":["Physics Department, Science Faculty, University of Al- Mustansiriyah, Baghdad, Iraq"],"raw_orcid":"https://orcid.org/0000-0003-1329-7483","affiliations":[{"raw_affiliation_string":"Physics Department, Science Faculty, University of Al- Mustansiriyah, Baghdad, Iraq","institution_ids":["https://openalex.org/I15873915"]}]}],"institutions":[],"countries_distinct_count":1,"institutions_distinct_count":2,"corresponding_author_ids":[],"corresponding_institution_ids":[],"apc_list":null,"apc_paid":null,"fwci":0.1224,"has_fulltext":false,"cited_by_count":2,"citation_normalized_percentile":{"value":0.38669733,"is_in_top_1_percent":false,"is_in_top_10_percent":false},"cited_by_percentile_year":{"min":87,"max":93},"biblio":{"volume":"28","issue":null,"first_page":"58","last_page":"69"},"is_retracted":false,"is_paratext":false,"is_xpac":false,"primary_topic":{"id":"https://openalex.org/T11169","display_name":"Silicon Nanostructures and Photoluminescence","score":0.9994999766349792,"subfield":{"id":"https://openalex.org/subfields/2505","display_name":"Materials Chemistry"},"field":{"id":"https://openalex.org/fields/25","display_name":"Materials Science"},"domain":{"id":"https://openalex.org/domains/3","display_name":"Physical Sciences"}},"topics":[{"id":"https://openalex.org/T11169","display_name":"Silicon Nanostructures and Photoluminescence","score":0.9994999766349792,"subfield":{"id":"https://openalex.org/subfields/2505","display_name":"Materials Chemistry"},"field":{"id":"https://openalex.org/fields/25","display_name":"Materials Science"},"domain":{"id":"https://openalex.org/domains/3","display_name":"Physical Sciences"}},{"id":"https://openalex.org/T10923","display_name":"Force Microscopy Techniques and Applications","score":9.999999747378752e-05,"subfield":{"id":"https://openalex.org/subfields/3107","display_name":"Atomic and Molecular Physics, and Optics"},"field":{"id":"https://openalex.org/fields/31","display_name":"Physics and Astronomy"},"domain":{"id":"https://openalex.org/domains/3","display_name":"Physical Sciences"}},{"id":"https://openalex.org/T13049","display_name":"Surface Roughness and Optical Measurements","score":9.999999747378752e-05,"subfield":{"id":"https://openalex.org/subfields/3105","display_name":"Instrumentation"},"field":{"id":"https://openalex.org/fields/31","display_name":"Physics and Astronomy"},"domain":{"id":"https://openalex.org/domains/3","display_name":"Physical Sciences"}}],"keywords":[{"id":"https://openalex.org/keywords/porous-silicon","display_name":"porous silicon","score":0.9860000014305115},{"id":"https://openalex.org/keywords/porosity","display_name":"porosity","score":0.9750000238418579},{"id":"https://openalex.org/keywords/refractive-index","display_name":"refractive index","score":1.0},{"id":"https://openalex.org/keywords/atomic-force-microscopy","display_name":"atomic force microscopy","score":0.8069999814033508},{"id":"https://openalex.org/keywords/theoretical-model","display_name":"theoretical model","score":0.6919999718666077},{"id":"https://openalex.org/keywords/surface-roughness","display_name":"surface roughness","score":0.43700000643730164}],"concepts":[{"id":"https://openalex.org/C6648577","wikidata":"https://www.wikidata.org/wiki/Q622669","display_name":"Porosity","level":2,"score":0.8291165828704834},{"id":"https://openalex.org/C42067758","wikidata":"https://www.wikidata.org/wiki/Q174102","display_name":"Refractive index","level":2,"score":0.7452853918075562},{"id":"https://openalex.org/C2776685891","wikidata":"https://www.wikidata.org/wiki/Q428660","display_name":"Porous silicon","level":3,"score":0.712139904499054},{"id":"https://openalex.org/C192562407","wikidata":"https://www.wikidata.org/wiki/Q228736","display_name":"Materials science","level":0,"score":0.5700485110282898},{"id":"https://openalex.org/C67649825","wikidata":"https://www.wikidata.org/wiki/Q196538","display_name":"Microscope","level":2,"score":0.5618807077407837},{"id":"https://openalex.org/C102951782","wikidata":"https://www.wikidata.org/wiki/Q49295","display_name":"Atomic force microscopy","level":2,"score":0.5271430015563965},{"id":"https://openalex.org/C2777382242","wikidata":"https://www.wikidata.org/wiki/Q6017816","display_name":"Index (typography)","level":2,"score":0.4921955168247223},{"id":"https://openalex.org/C544956773","wikidata":"https://www.wikidata.org/wiki/Q670","display_name":"Silicon","level":2,"score":0.43692469596862793},{"id":"https://openalex.org/C159985019","wikidata":"https://www.wikidata.org/wiki/Q181790","display_name":"Composite material","level":1,"score":0.39642274379730225},{"id":"https://openalex.org/C199289684","wikidata":"https://www.wikidata.org/wiki/Q83353","display_name":"Mineralogy","level":1,"score":0.3732585310935974},{"id":"https://openalex.org/C120665830","wikidata":"https://www.wikidata.org/wiki/Q14620","display_name":"Optics","level":1,"score":0.36857303977012634},{"id":"https://openalex.org/C171250308","wikidata":"https://www.wikidata.org/wiki/Q11468","display_name":"Nanotechnology","level":1,"score":0.22283175587654114},{"id":"https://openalex.org/C49040817","wikidata":"https://www.wikidata.org/wiki/Q193091","display_name":"Optoelectronics","level":1,"score":0.1865997016429901},{"id":"https://openalex.org/C185592680","wikidata":"https://www.wikidata.org/wiki/Q2329","display_name":"Chemistry","level":0,"score":0.178551584482193},{"id":"https://openalex.org/C121332964","wikidata":"https://www.wikidata.org/wiki/Q413","display_name":"Physics","level":0,"score":0.1549471914768219},{"id":"https://openalex.org/C41008148","wikidata":"https://www.wikidata.org/wiki/Q21198","display_name":"Computer science","level":0,"score":0.10183751583099365},{"id":"https://openalex.org/C136764020","wikidata":"https://www.wikidata.org/wiki/Q466","display_name":"World Wide Web","level":1,"score":0.0}],"mesh":[],"locations_count":1,"locations":[{"id":"mag:2491914733","doi":null,"is_oa":false,"landing_page_url":"http://yadda.icm.edu.pl/yadda/element/bwmeta1.element.psjd-a2c624a1-3bf0-428d-8379-136a108bc4c7","pdf_url":null,"source":{"id":"https://openalex.org/S4306534956","display_name":"World Scientific News","issn_l":"2392-2192","issn":["2392-2192"],"is_oa":false,"is_in_doaj":false,"is_core":true,"listed_in":["cwts-core"],"host_organization":null,"host_organization_name":null,"host_organization_lineage":[],"host_organization_lineage_names":[],"type":"journal"},"license":null,"license_id":null,"version":null,"is_accepted":false,"is_published":false,"raw_source_name":"World Scientific News","raw_type":null}],"best_oa_location":null,"sustainable_development_goals":[],"study_designs":[],"awards":[],"funders":[],"has_content":{"pdf":false,"grobid_xml":false},"content_urls":null,"referenced_works_count":7,"referenced_works":["https://openalex.org/W1989195046","https://openalex.org/W2015663864","https://openalex.org/W2036664963","https://openalex.org/W2094491269","https://openalex.org/W2124048728","https://openalex.org/W2263765686","https://openalex.org/W4297735240"],"related_works":["https://openalex.org/W2955285922","https://openalex.org/W2317730208","https://openalex.org/W2963251258","https://openalex.org/W3144407454","https://openalex.org/W1976880160","https://openalex.org/W4253976953","https://openalex.org/W2589738417","https://openalex.org/W1531450823","https://openalex.org/W2734587752","https://openalex.org/W3177117302"],"abstract_inverted_index":null,"counts_by_year":[{"year":2023,"cited_by_count":1},{"year":2018,"cited_by_count":1}],"updated_date":"2026-11-04T10:54:05.112534","created_date":"2016-08-23T00:00:00"}