{"id":"https://openalex.org/W24665303","doi":"https://doi.org/10.1007/978-3-7908-2674-6_13","title":"SPC Monitoring and Variance Estimation","display_name":"SPC Monitoring and Variance Estimation","publication_year":2004,"publication_date":"2004-01-01","ids":{"openalex":"https://openalex.org/W24665303","doi":"https://doi.org/10.1007/978-3-7908-2674-6_13","mag":"24665303"},"language":"en","primary_location":{"id":"doi:10.1007/978-3-7908-2674-6_13","doi":"https://doi.org/10.1007/978-3-7908-2674-6_13","is_oa":false,"landing_page_url":"https://doi.org/10.1007/978-3-7908-2674-6_13","pdf_url":null,"source":{"id":"https://openalex.org/S4306463753","display_name":"Physica-Verlag eBooks","issn_l":null,"issn":null,"is_oa":false,"is_in_doaj":false,"is_core":false,"listed_in":[],"host_organization":null,"host_organization_name":null,"host_organization_lineage":[],"host_organization_lineage_names":[],"type":"ebook platform"},"license":null,"license_id":null,"version":"publishedVersion","is_accepted":true,"is_published":true,"raw_source_name":"Frontiers in Statistical Quality Control 7","raw_type":"book-chapter"},"volume":{"id":"https://openalex.org/W4292928643","display_name":"Frontiers in Statistical Quality Control 7"},"type":"book-chapter","indexed_in":["crossref"],"open_access":{"is_oa":false,"oa_status":"closed","oa_url":null,"any_repository_has_fulltext":false},"authorships":[{"author_position":"first","author":{"id":"https://openalex.org/A5112342982","display_name":"C. Alexopoulos","orcid":null,"observed_orcids":[]},"institutions":[{"id":"https://openalex.org/I130701444","display_name":"Georgia Institute of Technology","ror":"https://ror.org/01zkghx44","country_code":"US","type":"education","lineage":["https://openalex.org/I130701444"]}],"countries":["US"],"is_corresponding":false,"raw_author_name":"C. Alexopoulos","raw_affiliation_strings":["School of Industrial and Systems Engineering, Georgia Institute of Technology, Atlanta, GA, 30332-0205, USA"],"raw_orcid":null,"affiliations":[{"raw_affiliation_string":"School of Industrial and Systems Engineering, Georgia Institute of Technology, Atlanta, GA, 30332-0205, USA","institution_ids":["https://openalex.org/I130701444"]}]},{"author_position":"middle","author":{"id":"https://openalex.org/A5086297102","display_name":"David M. Goldsman","orcid":"https://orcid.org/0000-0001-9033-8475","observed_orcids":["https://orcid.org/0000-0001-9033-8475"]},"institutions":[{"id":"https://openalex.org/I130701444","display_name":"Georgia Institute of Technology","ror":"https://ror.org/01zkghx44","country_code":"US","type":"education","lineage":["https://openalex.org/I130701444"]}],"countries":["US"],"is_corresponding":false,"raw_author_name":"D. Goldsman","raw_affiliation_strings":["School of Industrial and Systems Engineering, Georgia Institute of Technology, Atlanta, GA, 30332-0205, USA"],"raw_orcid":null,"affiliations":[{"raw_affiliation_string":"School of Industrial and Systems Engineering, Georgia Institute of Technology, Atlanta, GA, 30332-0205, USA","institution_ids":["https://openalex.org/I130701444"]}]},{"author_position":"middle","author":{"id":"https://openalex.org/A5002878668","display_name":"Kwok\u2010Leung Tsui","orcid":"https://orcid.org/0000-0002-0558-2279","observed_orcids":["https://orcid.org/0000-0002-0558-2279","https://orcid.org/0009-0008-1585-7804"]},"institutions":[{"id":"https://openalex.org/I130701444","display_name":"Georgia Institute of Technology","ror":"https://ror.org/01zkghx44","country_code":"US","type":"education","lineage":["https://openalex.org/I130701444"]}],"countries":["US"],"is_corresponding":false,"raw_author_name":"K.-L. Tsui","raw_affiliation_strings":["School of Industrial and Systems Engineering, Georgia Institute of Technology, Atlanta, GA, 30332-0205, USA"],"raw_orcid":null,"affiliations":[{"raw_affiliation_string":"School of Industrial and Systems Engineering, Georgia Institute of Technology, Atlanta, GA, 30332-0205, USA","institution_ids":["https://openalex.org/I130701444"]}]},{"author_position":"last","author":{"id":"https://openalex.org/A5101567609","display_name":"Wei Jiang","orcid":"https://orcid.org/0000-0002-4878-8381","observed_orcids":["https://orcid.org/0000-0002-4878-8381"]},"institutions":[{"id":"https://openalex.org/I1283103587","display_name":"AT&T (United States)","ror":"https://ror.org/02bbd5539","country_code":"US","type":"company","lineage":["https://openalex.org/I1283103587"]}],"countries":["US"],"is_corresponding":false,"raw_author_name":"W. Jiang","raw_affiliation_strings":["INSIGHT, AT&T Labs, Short Hills, NJ, 07078, USA"],"raw_orcid":null,"affiliations":[{"raw_affiliation_string":"INSIGHT, AT&T Labs, Short Hills, NJ, 07078, USA","institution_ids":["https://openalex.org/I1283103587"]}]}],"institutions":[],"countries_distinct_count":1,"institutions_distinct_count":2,"corresponding_author_ids":[],"corresponding_institution_ids":[],"apc_list":null,"apc_paid":null,"fwci":9.574,"has_fulltext":false,"cited_by_count":8,"citation_normalized_percentile":{"value":0.97069168,"is_in_top_1_percent":false,"is_in_top_10_percent":true},"cited_by_percentile_year":{"min":89,"max":96},"biblio":{"volume":null,"issue":null,"first_page":"194","last_page":"209"},"is_retracted":false,"is_paratext":false,"is_xpac":false,"primary_topic":{"id":"https://openalex.org/T11443","display_name":"Advanced Statistical Process Monitoring","score":0.9409000277519226,"subfield":{"id":"https://openalex.org/subfields/1804","display_name":"Statistics, Probability and Uncertainty"},"field":{"id":"https://openalex.org/fields/18","display_name":"Decision Sciences"},"domain":{"id":"https://openalex.org/domains/2","display_name":"Social Sciences"}},"topics":[{"id":"https://openalex.org/T11443","display_name":"Advanced Statistical Process Monitoring","score":0.9409000277519226,"subfield":{"id":"https://openalex.org/subfields/1804","display_name":"Statistics, Probability and Uncertainty"},"field":{"id":"https://openalex.org/fields/18","display_name":"Decision Sciences"},"domain":{"id":"https://openalex.org/domains/2","display_name":"Social Sciences"}},{"id":"https://openalex.org/T10876","display_name":"Fault Detection and Control Systems","score":0.0568000003695488,"subfield":{"id":"https://openalex.org/subfields/2207","display_name":"Control and Systems Engineering"},"field":{"id":"https://openalex.org/fields/22","display_name":"Engineering"},"domain":{"id":"https://openalex.org/domains/3","display_name":"Physical Sciences"}},{"id":"https://openalex.org/T10791","display_name":"Advanced Control Systems Optimization","score":0.0007999999797903001,"subfield":{"id":"https://openalex.org/subfields/2207","display_name":"Control and Systems Engineering"},"field":{"id":"https://openalex.org/fields/22","display_name":"Engineering"},"domain":{"id":"https://openalex.org/domains/3","display_name":"Physical Sciences"}}],"keywords":[{"id":"https://openalex.org/keywords/statistical-process-control","display_name":"statistical process control","score":0.9980000257492065},{"id":"https://openalex.org/keywords/variance-estimation","display_name":"variance estimation","score":0.7590000033378601},{"id":"https://openalex.org/keywords/common-cause-variation","display_name":"common cause variation","score":0.8920000195503235},{"id":"https://openalex.org/keywords/autocorrelated-processes","display_name":"autocorrelated processes","score":0.8669999837875366},{"id":"https://openalex.org/keywords/automatic-process-control","display_name":"automated process control","score":0.9049999713897705},{"id":"https://openalex.org/keywords/batch-means","display_name":"batch means","score":0.75},{"id":"https://openalex.org/keywords/process-monitoring","display_name":"process monitoring","score":0.628000020980835},{"id":"https://openalex.org/keywords/process-adjustment","display_name":"process adjustment","score":0.6389999985694885},{"id":"https://openalex.org/keywords/feedforward-and-feedback-control","display_name":"feedforward and feedback control","score":0.6380000114440918}],"concepts":[{"id":"https://openalex.org/C196985124","wikidata":"https://www.wikidata.org/wiki/Q1369242","display_name":"Control chart","level":3,"score":0.6997920274734497},{"id":"https://openalex.org/C113644684","wikidata":"https://www.wikidata.org/wiki/Q1356717","display_name":"Statistical process control","level":3,"score":0.6788760423660278},{"id":"https://openalex.org/C14396502","wikidata":"https://www.wikidata.org/wiki/Q280951","display_name":"Common cause and special cause","level":2,"score":0.6363903880119324},{"id":"https://openalex.org/C5297727","wikidata":"https://www.wikidata.org/wiki/Q786970","display_name":"Autocorrelation","level":2,"score":0.5931161642074585},{"id":"https://openalex.org/C98045186","wikidata":"https://www.wikidata.org/wiki/Q205663","display_name":"Process (computing)","level":2,"score":0.5910851359367371},{"id":"https://openalex.org/C130963320","wikidata":"https://www.wikidata.org/wiki/Q1401207","display_name":"Root cause analysis","level":2,"score":0.5570383071899414},{"id":"https://openalex.org/C93389723","wikidata":"https://www.wikidata.org/wiki/Q7247313","display_name":"Process variation","level":3,"score":0.5408634543418884},{"id":"https://openalex.org/C2778334786","wikidata":"https://www.wikidata.org/wiki/Q1586270","display_name":"Variation (astronomy)","level":2,"score":0.5190873146057129},{"id":"https://openalex.org/C84945661","wikidata":"https://www.wikidata.org/wiki/Q7366567","display_name":"Root cause","level":2,"score":0.46492671966552734},{"id":"https://openalex.org/C38858127","wikidata":"https://www.wikidata.org/wiki/Q5441228","display_name":"Feed forward","level":2,"score":0.43772023916244507},{"id":"https://openalex.org/C105795698","wikidata":"https://www.wikidata.org/wiki/Q12483","display_name":"Statistics","level":1,"score":0.4339353144168854},{"id":"https://openalex.org/C196083921","wikidata":"https://www.wikidata.org/wiki/Q7915758","display_name":"Variance (accounting)","level":2,"score":0.4257563054561615},{"id":"https://openalex.org/C41008148","wikidata":"https://www.wikidata.org/wiki/Q21198","display_name":"Computer science","level":0,"score":0.42571133375167847},{"id":"https://openalex.org/C155386361","wikidata":"https://www.wikidata.org/wiki/Q1649571","display_name":"Process control","level":3,"score":0.42156949639320374},{"id":"https://openalex.org/C124101348","wikidata":"https://www.wikidata.org/wiki/Q172491","display_name":"Data mining","level":1,"score":0.32317042350769043},{"id":"https://openalex.org/C127413603","wikidata":"https://www.wikidata.org/wiki/Q11023","display_name":"Engineering","level":0,"score":0.3147830069065094},{"id":"https://openalex.org/C33923547","wikidata":"https://www.wikidata.org/wiki/Q395","display_name":"Mathematics","level":0,"score":0.2138974368572235},{"id":"https://openalex.org/C200601418","wikidata":"https://www.wikidata.org/wiki/Q2193887","display_name":"Reliability engineering","level":1,"score":0.1753484010696411},{"id":"https://openalex.org/C133731056","wikidata":"https://www.wikidata.org/wiki/Q4917288","display_name":"Control engineering","level":1,"score":0.1627187430858612},{"id":"https://openalex.org/C121955636","wikidata":"https://www.wikidata.org/wiki/Q4116214","display_name":"Accounting","level":1,"score":0.0},{"id":"https://openalex.org/C44870925","wikidata":"https://www.wikidata.org/wiki/Q37547","display_name":"Astrophysics","level":1,"score":0.0},{"id":"https://openalex.org/C111919701","wikidata":"https://www.wikidata.org/wiki/Q9135","display_name":"Operating system","level":1,"score":0.0},{"id":"https://openalex.org/C121332964","wikidata":"https://www.wikidata.org/wiki/Q413","display_name":"Physics","level":0,"score":0.0},{"id":"https://openalex.org/C144133560","wikidata":"https://www.wikidata.org/wiki/Q4830453","display_name":"Business","level":0,"score":0.0}],"mesh":[],"locations_count":1,"locations":[{"id":"doi:10.1007/978-3-7908-2674-6_13","doi":"https://doi.org/10.1007/978-3-7908-2674-6_13","is_oa":false,"landing_page_url":"https://doi.org/10.1007/978-3-7908-2674-6_13","pdf_url":null,"source":{"id":"https://openalex.org/S4306463753","display_name":"Physica-Verlag eBooks","issn_l":null,"issn":null,"is_oa":false,"is_in_doaj":false,"is_core":false,"listed_in":[],"host_organization":null,"host_organization_name":null,"host_organization_lineage":[],"host_organization_lineage_names":[],"type":"ebook platform"},"license":null,"license_id":null,"version":"publishedVersion","is_accepted":true,"is_published":true,"raw_source_name":"Frontiers in Statistical Quality Control 7","raw_type":"book-chapter"}],"best_oa_location":null,"sustainable_development_goals":[],"study_designs":[],"awards":[],"funders":[],"has_content":{"grobid_xml":false,"pdf":false},"content_urls":null,"referenced_works_count":49,"referenced_works":["https://openalex.org/W184744508","https://openalex.org/W636757716","https://openalex.org/W1560446283","https://openalex.org/W1566641586","https://openalex.org/W1585261948","https://openalex.org/W1790255224","https://openalex.org/W1918142849","https://openalex.org/W1965155137","https://openalex.org/W1969310047","https://openalex.org/W1977622055","https://openalex.org/W1998067103","https://openalex.org/W2030494882","https://openalex.org/W2031051057","https://openalex.org/W2031953346","https://openalex.org/W2033739720","https://openalex.org/W2037446532","https://openalex.org/W2038255163","https://openalex.org/W2044167995","https://openalex.org/W2047653254","https://openalex.org/W2064748218","https://openalex.org/W2065755655","https://openalex.org/W2070850594","https://openalex.org/W2074512528","https://openalex.org/W2077383827","https://openalex.org/W2081299601","https://openalex.org/W2090161364","https://openalex.org/W2090272684","https://openalex.org/W2091311817","https://openalex.org/W2099898794","https://openalex.org/W2110335061","https://openalex.org/W2112471412","https://openalex.org/W2123845751","https://openalex.org/W2126515060","https://openalex.org/W2133480714","https://openalex.org/W2141422615","https://openalex.org/W2146907324","https://openalex.org/W2151318511","https://openalex.org/W2152050474","https://openalex.org/W2157202423","https://openalex.org/W2157550689","https://openalex.org/W2169224483","https://openalex.org/W2169493532","https://openalex.org/W2236606055","https://openalex.org/W2312970899","https://openalex.org/W2313953460","https://openalex.org/W2332467718","https://openalex.org/W2405160052","https://openalex.org/W2802739963","https://openalex.org/W3168516550"],"related_works":["https://openalex.org/W2024976919","https://openalex.org/W2137505662","https://openalex.org/W2965510686","https://openalex.org/W587862351","https://openalex.org/W2069878606","https://openalex.org/W2297118570","https://openalex.org/W2560376065","https://openalex.org/W2044568926","https://openalex.org/W2527435721","https://openalex.org/W1995183380"],"abstract_inverted_index":{"According":[0],"to":[1,52,75],"W.":[2],"Shewhart,":[3],"process":[4,24,38,47,69,88,116,147,166,172,207],"variation":[5,18,42,62,82],"can":[6,19,63,83,101],"be":[7,20,64,84,214],"classified":[8],"into":[9],"assignable":[10],"cause":[11,14,17,35,41,61,81],"and":[12,30,48,70,98,113,152,168,184,189,201,210],"common":[13,60,80,165],"variations.":[15],"Assignable":[16],"eliminated":[21],"by":[22,54,66,86,148,199,203],"statistical":[23],"control":[25,89,160,173],"(SPC)":[26],"methods":[27,91,100,112,118,170,179],"through":[28,92],"identification":[29],"elimination":[31],"of":[32,36,96,139,174,191],"the":[33,37,46,59,77,79,140,146,155,186,192,204,211,217],"root":[34],"shift.":[39],"Common":[40],"is":[43,49,208],"inherent":[44],"in":[45,103,106],"generally":[50],"difficult":[51],"reduce":[53],"SPC":[55,97,110],"methods.":[56],"However,":[57],"if":[58],"modeled":[65],"an":[67],"autocorrelated":[68,175],"physical":[71],"variables":[72],"are":[73],"available":[74],"adjust":[76],"output,":[78],"reduced":[85],"automatic":[87],"(APC)":[90],"feedback/feedforward":[93],"controllers.":[94],"Integration":[95],"APC":[99,115],"result":[102],"major":[104],"improvements":[105],"industrial":[107],"efficiency.":[108],"Most":[109],"monitoring":[111,154,167],"traditional":[114],"adjustment":[117,169],"(such":[119],"as":[120,216],"those":[121],"based":[122,180],"on":[123,181],"one-step-ahead":[124],"minimum":[125],"mean":[126],"squared":[127],"error":[128],"predictors":[129],"or":[130,137],"proportional":[131],"integral":[132],"derivative":[133],"controllers)":[134],"involve":[135],"one":[136],"both":[138],"following":[141],"two":[142],"steps:":[143],"(i)":[144],"\u201cwhitening\u201d":[145],"subtracting":[149],"a":[150],"predictor":[151],"(ii)":[153],"prediction":[156],"errors":[157],"with":[158],"appropriate":[159],"limits.":[161],"This":[162,206],"paper":[163],"reviews":[164],"for":[171],"data,":[176],"including":[177],"model-free":[178],"batch":[182],"means,":[183],"investigates":[185],"general":[187],"relationships":[188],"properties":[190],"underlying":[193],"models.":[194],"These":[195],"keywords":[196,212],"were":[197],"added":[198],"machine":[200],"not":[202],"authors.":[205],"experimental":[209],"may":[213],"updated":[215],"learning":[218],"algorithm":[219],"improves.":[220]},"counts_by_year":[{"year":2026,"cited_by_count":1},{"year":2023,"cited_by_count":1},{"year":2013,"cited_by_count":1}],"updated_date":"2026-10-10T09:11:00.788812","created_date":"2016-06-24T00:00:00"}