{"id":"https://openalex.org/W2463672669","doi":"https://doi.org/10.5370/kiee.2016.65.6.911","title":"An Analysis on Fault Response Characteristics in Low Voltage DC Distribution System","display_name":"An Analysis on Fault Response Characteristics in Low Voltage DC Distribution System","publication_year":2016,"publication_date":"2016-06-01","ids":{"openalex":"https://openalex.org/W2463672669","doi":"https://doi.org/10.5370/kiee.2016.65.6.911","mag":"2463672669"},"language":"en","primary_location":{"id":"doi:10.5370/kiee.2016.65.6.911","doi":"https://doi.org/10.5370/kiee.2016.65.6.911","is_oa":false,"landing_page_url":"https://doi.org/10.5370/kiee.2016.65.6.911","pdf_url":null,"source":{"id":"https://openalex.org/S2764620966","display_name":"The Transactions of The Korean Institute of Electrical Engineers","issn_l":"1975-8359","issn":["1975-8359","2287-4364"],"is_oa":false,"is_in_doaj":false,"is_core":false,"listed_in":["kci-registered","poland-20","russia-white-list-4"],"host_organization":"https://openalex.org/P4322697825","host_organization_name":"Korean Institute of Electrical Engineers","host_organization_lineage":["https://openalex.org/P4322697825"],"host_organization_lineage_names":["Korean Institute of Electrical Engineers"],"type":"journal"},"license":null,"license_id":null,"version":"publishedVersion","is_accepted":true,"is_published":true,"raw_source_name":"The Transactions of The Korean Institute of Electrical Engineers","raw_type":"journal-article"},"volume":null,"type":"article","is_traditional":true,"indexed_in":["crossref"],"open_access":{"is_oa":false,"oa_status":"closed","oa_url":null,"any_repository_has_fulltext":false},"authorships":[{"author_position":"first","author":{"id":"https://openalex.org/A5046551555","display_name":"Chul-Ho Noh","orcid":"https://orcid.org/0000-0003-1515-446X","observed_orcids":["https://orcid.org/0000-0003-1515-446X"]},"institutions":[],"countries":[],"is_corresponding":false,"raw_author_name":"Chul-Ho Noh","raw_affiliation_strings":[],"raw_orcid":null,"affiliations":[]},{"author_position":"middle","author":{"id":"https://openalex.org/A5003830541","display_name":"Gi-Hyeon Gwon","orcid":"https://orcid.org/0000-0002-5396-6250","observed_orcids":["https://orcid.org/0000-0002-5396-6250"]},"institutions":[],"countries":[],"is_corresponding":false,"raw_author_name":"Gi-Hyeon Gwon","raw_affiliation_strings":[],"raw_orcid":null,"affiliations":[]},{"author_position":"middle","author":{"id":"https://openalex.org/A5086043968","display_name":"Jong-Il Song","orcid":"https://orcid.org/0000-0001-7265-9347","observed_orcids":["https://orcid.org/0000-0001-7265-9347"]},"institutions":[],"countries":[],"is_corresponding":false,"raw_author_name":"Jong-Il Song","raw_affiliation_strings":[],"raw_orcid":null,"affiliations":[]},{"author_position":"middle","author":{"id":"https://openalex.org/A5103229043","display_name":"Joon Han","orcid":"https://orcid.org/0000-0001-7411-6151","observed_orcids":["https://orcid.org/0000-0001-7411-6151"]},"institutions":[],"countries":[],"is_corresponding":false,"raw_author_name":"Joon Han","raw_affiliation_strings":[],"raw_orcid":null,"affiliations":[]},{"author_position":"middle","author":{"id":"https://openalex.org/A5078303858","display_name":"Yun\u2010Sik Oh","orcid":"https://orcid.org/0000-0003-3950-4145","observed_orcids":["https://orcid.org/0000-0003-3950-4145"]},"institutions":[],"countries":[],"is_corresponding":false,"raw_author_name":"Yun-Sik Oh","raw_affiliation_strings":[],"raw_orcid":null,"affiliations":[]},{"author_position":"last","author":{"id":"https://openalex.org/A5018905527","display_name":"Chul\u2010Hwan Kim","orcid":"https://orcid.org/0000-0002-3418-9687","observed_orcids":["https://orcid.org/0000-0002-3418-9687"]},"institutions":[],"countries":[],"is_corresponding":false,"raw_author_name":"Chul-Hwan Kim","raw_affiliation_strings":[],"raw_orcid":null,"affiliations":[]}],"institutions":[],"countries_distinct_count":0,"institutions_distinct_count":0,"corresponding_author_ids":[],"corresponding_institution_ids":[],"apc_list":null,"apc_paid":null,"fwci":0.2616,"has_fulltext":false,"cited_by_count":5,"citation_normalized_percentile":{"value":0.56947693,"is_in_top_1_percent":false,"is_in_top_10_percent":false},"cited_by_percentile_year":{"min":87,"max":93},"biblio":{"volume":"65","issue":"6","first_page":"911","last_page":"917"},"is_retracted":false,"is_paratext":false,"is_xpac":false,"primary_topic":{"id":"https://openalex.org/T11102","display_name":"HVDC Systems and Fault Protection","score":0.5,"subfield":{"id":"https://openalex.org/subfields/2208","display_name":"Electrical and Electronic Engineering"},"field":{"id":"https://openalex.org/fields/22","display_name":"Engineering"},"domain":{"id":"https://openalex.org/domains/3","display_name":"Physical Sciences"}},"topics":[{"id":"https://openalex.org/T11102","display_name":"HVDC Systems and Fault Protection","score":0.5,"subfield":{"id":"https://openalex.org/subfields/2208","display_name":"Electrical and Electronic Engineering"},"field":{"id":"https://openalex.org/fields/22","display_name":"Engineering"},"domain":{"id":"https://openalex.org/domains/3","display_name":"Physical Sciences"}},{"id":"https://openalex.org/T10972","display_name":"Power Systems Fault Detection","score":0.4672999978065491,"subfield":{"id":"https://openalex.org/subfields/2207","display_name":"Control and Systems Engineering"},"field":{"id":"https://openalex.org/fields/22","display_name":"Engineering"},"domain":{"id":"https://openalex.org/domains/3","display_name":"Physical Sciences"}},{"id":"https://openalex.org/T13093","display_name":"Electric Power Systems and Control","score":0.006300000008195639,"subfield":{"id":"https://openalex.org/subfields/2208","display_name":"Electrical and Electronic Engineering"},"field":{"id":"https://openalex.org/fields/22","display_name":"Engineering"},"domain":{"id":"https://openalex.org/domains/3","display_name":"Physical Sciences"}}],"keywords":[{"id":"https://openalex.org/keywords/low-voltage-dc-distribution-system","display_name":"low-voltage DC distribution system","score":0.9800000190734863},{"id":"https://openalex.org/keywords/fault-current-analysis","display_name":"fault current analysis","score":0.9190000295639038},{"id":"https://openalex.org/keywords/ac-dc-converter","display_name":"AC-DC converter","score":0.8939999938011169},{"id":"https://openalex.org/keywords/dc-dc-converter","display_name":"DC-DC converter","score":1.0},{"id":"https://openalex.org/keywords/power-quality","display_name":"power quality","score":0.7570000290870667},{"id":"https://openalex.org/keywords/power-system-reliability","display_name":"power system reliability","score":0.578000009059906}],"concepts":[{"id":"https://openalex.org/C2778363592","wikidata":"https://www.wikidata.org/wiki/Q5374837","display_name":"Emtp","level":4,"score":0.7259014248847961},{"id":"https://openalex.org/C175551986","wikidata":"https://www.wikidata.org/wiki/Q47089","display_name":"Fault (geology)","level":2,"score":0.5921196937561035},{"id":"https://openalex.org/C128624480","wikidata":"https://www.wikidata.org/wiki/Q1504817","display_name":"Low voltage","level":3,"score":0.5878185629844666},{"id":"https://openalex.org/C43214815","wikidata":"https://www.wikidata.org/wiki/Q7310987","display_name":"Reliability (semiconductor)","level":3,"score":0.5584161281585693},{"id":"https://openalex.org/C127413603","wikidata":"https://www.wikidata.org/wiki/Q11023","display_name":"Engineering","level":0,"score":0.5194670557975769},{"id":"https://openalex.org/C119599485","wikidata":"https://www.wikidata.org/wiki/Q43035","display_name":"Electrical engineering","level":1,"score":0.5130411386489868},{"id":"https://openalex.org/C89227174","wikidata":"https://www.wikidata.org/wiki/Q2388981","display_name":"Electric power system","level":3,"score":0.5115521550178528},{"id":"https://openalex.org/C200601418","wikidata":"https://www.wikidata.org/wiki/Q2193887","display_name":"Reliability engineering","level":1,"score":0.4889441728591919},{"id":"https://openalex.org/C163258240","wikidata":"https://www.wikidata.org/wiki/Q25342","display_name":"Power (physics)","level":2,"score":0.4751836359500885},{"id":"https://openalex.org/C165801399","wikidata":"https://www.wikidata.org/wiki/Q25428","display_name":"Voltage","level":2,"score":0.4453997313976288},{"id":"https://openalex.org/C24326235","wikidata":"https://www.wikidata.org/wiki/Q126095","display_name":"Electronic engineering","level":1,"score":0.38735419511795044},{"id":"https://openalex.org/C121332964","wikidata":"https://www.wikidata.org/wiki/Q413","display_name":"Physics","level":0,"score":0.061902403831481934},{"id":"https://openalex.org/C127313418","wikidata":"https://www.wikidata.org/wiki/Q1069","display_name":"Geology","level":0,"score":0.0},{"id":"https://openalex.org/C165205528","wikidata":"https://www.wikidata.org/wiki/Q83371","display_name":"Seismology","level":1,"score":0.0},{"id":"https://openalex.org/C62520636","wikidata":"https://www.wikidata.org/wiki/Q944","display_name":"Quantum mechanics","level":1,"score":0.0}],"mesh":[],"locations_count":2,"locations":[{"id":"doi:10.5370/kiee.2016.65.6.911","doi":"https://doi.org/10.5370/kiee.2016.65.6.911","is_oa":false,"landing_page_url":"https://doi.org/10.5370/kiee.2016.65.6.911","pdf_url":null,"source":{"id":"https://openalex.org/S2764620966","display_name":"The Transactions of The Korean Institute of Electrical Engineers","issn_l":"1975-8359","issn":["1975-8359","2287-4364"],"is_oa":false,"is_in_doaj":false,"is_core":false,"listed_in":["kci-registered","poland-20","russia-white-list-4"],"host_organization":"https://openalex.org/P4322697825","host_organization_name":"Korean Institute of Electrical Engineers","host_organization_lineage":["https://openalex.org/P4322697825"],"host_organization_lineage_names":["Korean Institute of Electrical Engineers"],"type":"journal"},"license":null,"license_id":null,"version":"publishedVersion","is_accepted":true,"is_published":true,"raw_source_name":"The Transactions of The Korean Institute of Electrical Engineers","raw_type":"journal-article"},{"id":"mag:2437890355","doi":null,"is_oa":false,"landing_page_url":"http://dspace.kci.go.kr/handle/kci/318793","pdf_url":null,"source":{"id":"https://openalex.org/S2764620966","display_name":"The Transactions of The Korean Institute of Electrical Engineers","issn_l":"1975-8359","issn":["1975-8359","2287-4364"],"is_oa":false,"is_in_doaj":false,"is_core":false,"listed_in":["kci-registered","poland-20","russia-white-list-4"],"host_organization":"https://openalex.org/P4322697825","host_organization_name":"Korean Institute of Electrical Engineers","host_organization_lineage":["https://openalex.org/P4322697825"],"host_organization_lineage_names":["Korean Institute of Electrical Engineers"],"type":"journal"},"license":null,"license_id":null,"version":null,"is_accepted":false,"is_published":false,"raw_source_name":"\uc804\uae30\ud559\ud68c\ub17c\ubb38\uc9c0","raw_type":null}],"best_oa_location":null,"sustainable_development_goals":[{"id":"https://metadata.un.org/sdg/9","score":0.5378999710083008,"display_name":"Industry, innovation and infrastructure"}],"study_designs":[],"awards":[],"funders":[],"has_content":{"pdf":false,"grobid_xml":false},"content_urls":null,"referenced_works_count":0,"referenced_works":[],"related_works":["https://openalex.org/W2437890355","https://openalex.org/W2626052438","https://openalex.org/W2624635284","https://openalex.org/W2565159227","https://openalex.org/W2919047442","https://openalex.org/W2781570018","https://openalex.org/W4200268026","https://openalex.org/W1620779725","https://openalex.org/W2346648693","https://openalex.org/W4387038696"],"abstract_inverted_index":{"DC-based":[0],"power":[1,12,38,47],"system":[2,26,62,126],"is":[3,33,49,83,127],"paid":[4],"attention":[5],"as":[6,63],"interests":[7],"in":[8,46,59,114],"energy":[9],"efficiency":[10],"and":[11,18,41,80,85,93],"quality":[13],"are":[14,27,88,98],"increased.":[15],"However,":[16],"standardization":[17],"researches":[19],"for":[20,118,123],"commercializing":[21],"Low":[22],"Voltage":[23],"DC(LVDC)":[24],"distribution":[25,61,125],"still":[28],"insufficient.":[29],"Protection":[30],"system,":[31,48],"which":[32],"closely":[34],"related":[35,86],"with":[36,95],"reliability,":[37],"quality,":[39],"safety,":[40],"life":[42],"expectancy":[43],"of":[44,120],"components":[45],"also":[50],"included.":[51],"This":[52],"paper":[53],"therefore":[54],"analyzes":[55],"fault":[56,74],"response":[57],"characteristics":[58],"LVDC":[60,124],"a":[64],"preliminary":[65],"study":[66],"on":[67,73,111],"protection":[68,121],"schemes.":[69],"A":[70],"stepwise":[71],"analysis":[72,108],"current":[75],"from":[76],"both":[77],"AC/DC":[78],"converter":[79,82],"DC/DC":[81],"performed":[84],"expressions":[87],"derived.":[89],"And":[90],"then,":[91],"modeling":[92],"simulation":[94],"various":[96],"conditions":[97],"conducted":[99],"by":[100],"using":[101],"ElectroMagnetic":[102],"Transients":[103],"Program":[104],"(EMTP)":[105],"to":[106],"verify":[107],"results.":[109],"Based":[110],"research":[112],"results":[113],"the":[115],"paper,":[116],"direction":[117],"development":[119],"schemes":[122],"suggested.":[128]},"counts_by_year":[{"year":2025,"cited_by_count":1},{"year":2023,"cited_by_count":1},{"year":2022,"cited_by_count":1},{"year":2018,"cited_by_count":1},{"year":2016,"cited_by_count":1}],"updated_date":"2026-11-04T10:54:05.112534","created_date":"2016-07-22T00:00:00"}