{"id":"https://openalex.org/W2461128641","doi":"https://doi.org/10.3176/eng.2007.4.08","title":"Formation of nanometerscale layers of V-VI (Bi2Te3-related) compounds based on amorphous precursors","display_name":"Formation of nanometerscale layers of V-VI (Bi2Te3-related) compounds based on amorphous precursors","publication_year":2007,"publication_date":"2007-12-07","ids":{"openalex":"https://openalex.org/W2461128641","doi":"https://doi.org/10.3176/eng.2007.4.08","mag":"2461128641"},"language":"en","primary_location":{"id":"doi:10.3176/eng.2007.4.08","doi":"https://doi.org/10.3176/eng.2007.4.08","is_oa":true,"landing_page_url":"https://doi.org/10.3176/eng.2007.4.08","pdf_url":"https://kirj.ee/wp-content/plugins/kirj/pub/eng-4-2007-354-362_20230511160951.pdf","source":{"id":"https://openalex.org/S4210233007","display_name":"Proceedings of the Estonian Academy of Sciences Engineering","issn_l":"1406-0175","issn":["1406-0175","2228-0820"],"is_oa":false,"is_in_doaj":false,"is_core":false,"listed_in":["jufo-1"],"host_organization":"https://openalex.org/P4310319951","host_organization_name":"Estonian Academy Publishers","host_organization_lineage":["https://openalex.org/P4310319951"],"host_organization_lineage_names":["Estonian Academy Publishers"],"type":"journal"},"license":null,"license_id":null,"version":"publishedVersion","is_accepted":true,"is_published":true,"raw_source_name":"Proceedings of the Estonian Academy of Sciences. Engineering","raw_type":"journal-article"},"volume":null,"type":"article","is_traditional":true,"indexed_in":["crossref"],"open_access":{"is_oa":true,"oa_status":"bronze","oa_url":"https://kirj.ee/wp-content/plugins/kirj/pub/eng-4-2007-354-362_20230511160951.pdf","any_repository_has_fulltext":true},"authorships":[{"author_position":"first","author":{"id":"https://openalex.org/A5109572389","display_name":"H. B\u00f6ttner","orcid":null,"observed_orcids":[]},"institutions":[{"id":"https://openalex.org/I4210088263","display_name":"Fraunhofer Institute for Physical Measurement Techniques","ror":"https://ror.org/004n2nr09","country_code":"DE","type":"facility","lineage":["https://openalex.org/I4210088263","https://openalex.org/I4923324"]}],"countries":["DE"],"is_corresponding":true,"raw_author_name":"Harald B\u00f6ttner","raw_affiliation_strings":["Fraunhofer Institut Physikalische Messtechnik, Heidenhofstr. 8, DE-79110 Freiburg, Germany;"],"raw_orcid":null,"affiliations":[{"raw_affiliation_string":"Fraunhofer Institut Physikalische Messtechnik, Heidenhofstr. 8, DE-79110 Freiburg, Germany;","institution_ids":["https://openalex.org/I4210088263"]}]},{"author_position":"middle","author":{"id":"https://openalex.org/A5001591541","display_name":"D. Ebling","orcid":null,"observed_orcids":[]},"institutions":[{"id":"https://openalex.org/I4210088263","display_name":"Fraunhofer Institute for Physical Measurement Techniques","ror":"https://ror.org/004n2nr09","country_code":"DE","type":"facility","lineage":["https://openalex.org/I4210088263","https://openalex.org/I4923324"]}],"countries":["DE"],"is_corresponding":false,"raw_author_name":"Dirk Ebling","raw_affiliation_strings":["Fraunhofer Institut Physikalische Messtechnik, Heidenhofstr. 8, DE-79110 Freiburg, Germany;"],"raw_orcid":null,"affiliations":[{"raw_affiliation_string":"Fraunhofer Institut Physikalische Messtechnik, Heidenhofstr. 8, DE-79110 Freiburg, Germany;","institution_ids":["https://openalex.org/I4210088263"]}]},{"author_position":"middle","author":{"id":null,"display_name":"Heiko K\u00f6lbel","orcid":null,"observed_orcids":[]},"institutions":[{"id":"https://openalex.org/I4210088263","display_name":"Fraunhofer Institute for Physical Measurement Techniques","ror":"https://ror.org/004n2nr09","country_code":"DE","type":"facility","lineage":["https://openalex.org/I4210088263","https://openalex.org/I4923324"]}],"countries":["DE"],"is_corresponding":false,"raw_author_name":"Heiko K\u00f6lbel","raw_affiliation_strings":["Fraunhofer Institut Physikalische Messtechnik, Heidenhofstr. 8, DE-79110 Freiburg, Germany;"],"raw_orcid":null,"affiliations":[{"raw_affiliation_string":"Fraunhofer Institut Physikalische Messtechnik, Heidenhofstr. 8, DE-79110 Freiburg, Germany;","institution_ids":["https://openalex.org/I4210088263"]}]},{"author_position":"middle","author":{"id":null,"display_name":"Axel Schubert","orcid":null,"observed_orcids":[]},"institutions":[],"countries":[],"is_corresponding":false,"raw_author_name":"Axel Schubert","raw_affiliation_strings":["Micropelt GmbH, Emmy-Noether-Str. 2, 79110 Freiburg, Germany"],"raw_orcid":null,"affiliations":[{"raw_affiliation_string":"Micropelt GmbH, Emmy-Noether-Str. 2, 79110 Freiburg, Germany","institution_ids":[]}]},{"author_position":"middle","author":{"id":"https://openalex.org/A5071459615","display_name":"Alexander A. Gavrikov","orcid":"https://orcid.org/0000-0001-7210-5395","observed_orcids":["https://orcid.org/0000-0001-7210-5395"]},"institutions":[],"countries":[],"is_corresponding":false,"raw_author_name":"Alexander Gavrikov","raw_affiliation_strings":["Micropelt GmbH, Emmy-Noether-Str. 2, 79110 Freiburg, Germany"],"raw_orcid":null,"affiliations":[{"raw_affiliation_string":"Micropelt GmbH, Emmy-Noether-Str. 2, 79110 Freiburg, Germany","institution_ids":[]}]},{"author_position":"middle","author":{"id":"https://openalex.org/A5097235754","display_name":"A Mahlke","orcid":null,"observed_orcids":[]},"institutions":[],"countries":[],"is_corresponding":false,"raw_author_name":"Andreas Mahlke","raw_affiliation_strings":["Micropelt GmbH, Emmy-Noether-Str. 2, 79110 Freiburg, Germany"],"raw_orcid":null,"affiliations":[{"raw_affiliation_string":"Micropelt GmbH, Emmy-Noether-Str. 2, 79110 Freiburg, Germany","institution_ids":[]}]},{"author_position":"last","author":{"id":"https://openalex.org/A5019538518","display_name":"Joachim Nurnus","orcid":null,"observed_orcids":[]},"institutions":[],"countries":[],"is_corresponding":false,"raw_author_name":"Joachim Nurnus","raw_affiliation_strings":["Micropelt GmbH, Emmy-Noether-Str. 2, 79110 Freiburg, Germany"],"raw_orcid":null,"affiliations":[{"raw_affiliation_string":"Micropelt GmbH, Emmy-Noether-Str. 2, 79110 Freiburg, Germany","institution_ids":[]}]}],"institutions":[],"countries_distinct_count":1,"institutions_distinct_count":1,"corresponding_author_ids":["https://openalex.org/A5109572389"],"corresponding_institution_ids":["https://openalex.org/I4210088263"],"apc_list":null,"apc_paid":null,"fwci":0.0,"has_fulltext":true,"cited_by_count":0,"citation_normalized_percentile":{"value":0.0,"is_in_top_1_percent":false,"is_in_top_10_percent":false},"cited_by_percentile_year":null,"biblio":{"volume":"13","issue":"4","first_page":"354","last_page":"362"},"is_retracted":false,"is_paratext":false,"is_xpac":false,"primary_topic":{"id":"https://openalex.org/T10440","display_name":"Advanced Thermoelectric Materials and Devices","score":0.9994999766349792,"subfield":{"id":"https://openalex.org/subfields/2505","display_name":"Materials Chemistry"},"field":{"id":"https://openalex.org/fields/25","display_name":"Materials Science"},"domain":{"id":"https://openalex.org/domains/3","display_name":"Physical Sciences"}},"topics":[{"id":"https://openalex.org/T10440","display_name":"Advanced Thermoelectric Materials and Devices","score":0.9994999766349792,"subfield":{"id":"https://openalex.org/subfields/2505","display_name":"Materials Chemistry"},"field":{"id":"https://openalex.org/fields/25","display_name":"Materials Science"},"domain":{"id":"https://openalex.org/domains/3","display_name":"Physical Sciences"}},{"id":"https://openalex.org/T10590","display_name":"Chalcogenide Semiconductor Thin Films","score":0.0,"subfield":{"id":"https://openalex.org/subfields/2208","display_name":"Electrical and Electronic Engineering"},"field":{"id":"https://openalex.org/fields/22","display_name":"Engineering"},"domain":{"id":"https://openalex.org/domains/3","display_name":"Physical Sciences"}},{"id":"https://openalex.org/T11315","display_name":"Phase-change materials and chalcogenides","score":0.0,"subfield":{"id":"https://openalex.org/subfields/2505","display_name":"Materials Chemistry"},"field":{"id":"https://openalex.org/fields/25","display_name":"Materials Science"},"domain":{"id":"https://openalex.org/domains/3","display_name":"Physical Sciences"}}],"keywords":[{"id":"https://openalex.org/keywords/bismuth-telluride","display_name":"Bi2Te3","score":0.7490000128746033},{"id":"https://openalex.org/keywords/amorphous-precursor","display_name":"amorphous precursor","score":0.8870000243186951},{"id":"https://openalex.org/keywords/annealing","display_name":"annealing","score":0.6389999985694885},{"id":"https://openalex.org/keywords/compound-formation","display_name":"compound formation","score":0.6610000133514404},{"id":"https://openalex.org/keywords/thermoelectric-properties","display_name":"thermoelectric properties","score":0.8640000224113464},{"id":"https://openalex.org/keywords/seebeck-coefficient","display_name":"Seebeck coefficient","score":0.9710000157356262},{"id":"https://openalex.org/keywords/thin-films","display_name":"thin films","score":0.40799999237060547}],"concepts":[{"id":"https://openalex.org/C56052488","wikidata":"https://www.wikidata.org/wiki/Q103382","display_name":"Amorphous solid","level":2,"score":0.5241832137107849},{"id":"https://openalex.org/C192562407","wikidata":"https://www.wikidata.org/wiki/Q228736","display_name":"Materials science","level":0,"score":0.5006725788116455},{"id":"https://openalex.org/C42360764","wikidata":"https://www.wikidata.org/wiki/Q83588","display_name":"Chemical engineering","level":1,"score":0.3742098808288574},{"id":"https://openalex.org/C171250308","wikidata":"https://www.wikidata.org/wiki/Q11468","display_name":"Nanotechnology","level":1,"score":0.32249534130096436},{"id":"https://openalex.org/C185592680","wikidata":"https://www.wikidata.org/wiki/Q2329","display_name":"Chemistry","level":0,"score":0.2986393868923187},{"id":"https://openalex.org/C8010536","wikidata":"https://www.wikidata.org/wiki/Q160398","display_name":"Crystallography","level":1,"score":0.26231908798217773},{"id":"https://openalex.org/C127413603","wikidata":"https://www.wikidata.org/wiki/Q11023","display_name":"Engineering","level":0,"score":0.12056049704551697}],"mesh":[],"locations_count":3,"locations":[{"id":"doi:10.3176/eng.2007.4.08","doi":"https://doi.org/10.3176/eng.2007.4.08","is_oa":true,"landing_page_url":"https://doi.org/10.3176/eng.2007.4.08","pdf_url":"https://kirj.ee/wp-content/plugins/kirj/pub/eng-4-2007-354-362_20230511160951.pdf","source":{"id":"https://openalex.org/S4210233007","display_name":"Proceedings of the Estonian Academy of Sciences Engineering","issn_l":"1406-0175","issn":["1406-0175","2228-0820"],"is_oa":false,"is_in_doaj":false,"is_core":false,"listed_in":["jufo-1"],"host_organization":"https://openalex.org/P4310319951","host_organization_name":"Estonian Academy Publishers","host_organization_lineage":["https://openalex.org/P4310319951"],"host_organization_lineage_names":["Estonian Academy Publishers"],"type":"journal"},"license":null,"license_id":null,"version":"publishedVersion","is_accepted":true,"is_published":true,"raw_source_name":"Proceedings of the Estonian Academy of Sciences. Engineering","raw_type":"journal-article"},{"id":"pmh:oai:fraunhofer.de:N-134092","doi":null,"is_oa":true,"landing_page_url":"http://publica.fraunhofer.de/documents/N-134092.html","pdf_url":null,"source":{"id":"https://openalex.org/S4306400801","display_name":"Publikationsdatenbank der Fraunhofer-Gesellschaft (Fraunhofer-Gesellschaft)","issn_l":null,"issn":null,"is_oa":false,"is_in_doaj":false,"is_core":false,"listed_in":[],"host_organization":"https://openalex.org/I4923324","host_organization_name":"Fraunhofer-Gesellschaft","host_organization_lineage":["https://openalex.org/I4923324"],"host_organization_lineage_names":[],"type":"repository"},"license":"other-oa","license_id":"https://openalex.org/licenses/other-oa","version":"submittedVersion","is_accepted":false,"is_published":false,"raw_source_name":"Fraunhofer IPM","raw_type":"Journal Article"},{"id":"pmh:oai:publica.fraunhofer.de:publica/215019","doi":null,"is_oa":false,"landing_page_url":"https://publica.fraunhofer.de/handle/publica/215019","pdf_url":null,"source":{"id":"https://openalex.org/S4306400318","display_name":"Fraunhofer-Publica (Fraunhofer-Gesellschaft)","issn_l":null,"issn":null,"is_oa":false,"is_in_doaj":false,"is_core":false,"listed_in":[],"host_organization":"https://openalex.org/I4923324","host_organization_name":"Fraunhofer-Gesellschaft","host_organization_lineage":["https://openalex.org/I4923324"],"host_organization_lineage_names":[],"type":"repository"},"license":null,"license_id":null,"version":"submittedVersion","is_accepted":false,"is_published":false,"raw_source_name":null,"raw_type":"journal article"}],"best_oa_location":{"id":"doi:10.3176/eng.2007.4.08","doi":"https://doi.org/10.3176/eng.2007.4.08","is_oa":true,"landing_page_url":"https://doi.org/10.3176/eng.2007.4.08","pdf_url":"https://kirj.ee/wp-content/plugins/kirj/pub/eng-4-2007-354-362_20230511160951.pdf","source":{"id":"https://openalex.org/S4210233007","display_name":"Proceedings of the Estonian Academy of Sciences Engineering","issn_l":"1406-0175","issn":["1406-0175","2228-0820"],"is_oa":false,"is_in_doaj":false,"is_core":false,"listed_in":["jufo-1"],"host_organization":"https://openalex.org/P4310319951","host_organization_name":"Estonian Academy Publishers","host_organization_lineage":["https://openalex.org/P4310319951"],"host_organization_lineage_names":["Estonian Academy Publishers"],"type":"journal"},"license":null,"license_id":null,"version":"publishedVersion","is_accepted":true,"is_published":true,"raw_source_name":"Proceedings of the Estonian Academy of Sciences. Engineering","raw_type":"journal-article"},"sustainable_development_goals":[],"study_designs":[],"awards":[],"funders":[{"id":"https://openalex.org/F4320330618","display_name":"Infineon Technologies","ror":"https://ror.org/005kw6t15"}],"has_content":{"grobid_xml":true,"pdf":true},"content_urls":{"pdf":"https://content.openalex.org/works/W2461128641.pdf","grobid_xml":"https://content.openalex.org/works/W2461128641.grobid-xml"},"referenced_works_count":5,"referenced_works":["https://openalex.org/W1947740645","https://openalex.org/W2042056247","https://openalex.org/W2102109582","https://openalex.org/W2157471857","https://openalex.org/W4252066801"],"related_works":["https://openalex.org/W2077712523","https://openalex.org/W1978475436","https://openalex.org/W3003218653","https://openalex.org/W2165666811","https://openalex.org/W2087301319","https://openalex.org/W2299182347","https://openalex.org/W2079911838","https://openalex.org/W2914321835","https://openalex.org/W3033295446","https://openalex.org/W4244164507"],"abstract_inverted_index":{"Nanometerscale":[0],"textured":[1],"layers":[2],"were":[3],"achieved":[4],"by":[5],"annealing":[6],"corresponding":[7],"elemental":[8],"layers,":[9],"deposited":[10],"in":[11,40],"nanometerscale":[12],"thickness":[13],"which":[14],"fits":[15],"to":[16,42],"the":[17,21,30,43,46],"intended":[18],"stoichiometry":[19],"of":[20,45],"resulting":[22],"compounds.":[23],"The":[24,36],"compound":[25,37],"formation":[26,38],"as":[27,29],"well":[28],"accompanying":[31],"thermoelectric":[32],"properties":[33],"are":[34],"reported.":[35],"corresponds":[39],"particular":[41],"evolution":[44],"Seebeck":[47],"coefficient.":[48]},"counts_by_year":[],"updated_date":"2026-10-30T12:39:25.321706","created_date":"2016-07-22T00:00:00"}