{"id":"https://openalex.org/W2399600341","doi":"https://doi.org/10.1088/1674-4926/37/5/054007","title":"Measurement of charge transfer potential barrier in pinned photodiode CMOS image sensors","display_name":"Measurement of charge transfer potential barrier in pinned photodiode CMOS image sensors","publication_year":2016,"publication_date":"2016-05-01","ids":{"openalex":"https://openalex.org/W2399600341","doi":"https://doi.org/10.1088/1674-4926/37/5/054007","mag":"2399600341"},"language":"en","primary_location":{"id":"doi:10.1088/1674-4926/37/5/054007","doi":"https://doi.org/10.1088/1674-4926/37/5/054007","is_oa":false,"landing_page_url":"https://doi.org/10.1088/1674-4926/37/5/054007","pdf_url":null,"source":{"id":"https://openalex.org/S52834336","display_name":"Journal of Semiconductors","issn_l":"1674-4926","issn":["1674-4926","2058-6140"],"is_oa":false,"is_in_doaj":false,"is_core":true,"listed_in":["cwts-core","dongbi-b","jufo-1","poland-40","russia-white-list-2"],"host_organization":"https://openalex.org/P4310320083","host_organization_name":"IOP Publishing","host_organization_lineage":["https://openalex.org/P4310320083","https://openalex.org/P4310311669"],"host_organization_lineage_names":["IOP Publishing","Institute of Physics"],"type":"journal"},"license":null,"license_id":null,"version":"publishedVersion","is_accepted":true,"is_published":true,"raw_source_name":"Journal of Semiconductors","raw_type":"journal-article"},"volume":null,"type":"article","is_traditional":true,"indexed_in":["crossref"],"open_access":{"is_oa":false,"oa_status":"closed","oa_url":null,"any_repository_has_fulltext":false},"authorships":[{"author_position":"first","author":{"id":"https://openalex.org/A5101438364","display_name":"Chen Cao","orcid":"https://orcid.org/0000-0002-2061-5593","observed_orcids":["https://orcid.org/0000-0002-2061-5593"]},"institutions":[],"countries":[],"is_corresponding":true,"raw_author_name":"Chen Cao","raw_affiliation_strings":["Xi'an Microelectronics Technology Institute, Xi'an 710071, China"],"raw_orcid":null,"affiliations":[{"raw_affiliation_string":"Xi'an Microelectronics Technology Institute, Xi'an 710071, China","institution_ids":[]}]},{"author_position":"middle","author":{"id":"https://openalex.org/A5100389657","display_name":"Bing Zhang","orcid":"https://orcid.org/0000-0001-7296-3314","observed_orcids":["https://orcid.org/0000-0001-7296-3314"]},"institutions":[],"countries":[],"is_corresponding":false,"raw_author_name":"Bing Zhang","raw_affiliation_strings":["Xi'an Microelectronics Technology Institute, Xi'an 710071, China"],"raw_orcid":null,"affiliations":[{"raw_affiliation_string":"Xi'an Microelectronics Technology Institute, Xi'an 710071, China","institution_ids":[]}]},{"author_position":"middle","author":{"id":"https://openalex.org/A5025362382","display_name":"Junfeng Wang","orcid":"https://orcid.org/0000-0002-5720-056X","observed_orcids":["https://orcid.org/0000-0002-5720-056X"]},"institutions":[],"countries":[],"is_corresponding":false,"raw_author_name":"Junfeng Wang","raw_affiliation_strings":["Xi'an Microelectronics Technology Institute, Xi'an 710071, China"],"raw_orcid":null,"affiliations":[{"raw_affiliation_string":"Xi'an Microelectronics Technology Institute, Xi'an 710071, China","institution_ids":[]}]},{"author_position":"last","author":{"id":"https://openalex.org/A5018010656","display_name":"Longsheng Wu","orcid":"https://orcid.org/0000-0001-9099-3883","observed_orcids":["https://orcid.org/0000-0001-9099-3883"]},"institutions":[],"countries":[],"is_corresponding":false,"raw_author_name":"Longsheng Wu","raw_affiliation_strings":["Xi'an Microelectronics Technology Institute, Xi'an 710071, China"],"raw_orcid":null,"affiliations":[{"raw_affiliation_string":"Xi'an Microelectronics Technology Institute, Xi'an 710071, China","institution_ids":[]}]}],"institutions":[],"countries_distinct_count":0,"institutions_distinct_count":0,"corresponding_author_ids":["https://openalex.org/A5101438364"],"corresponding_institution_ids":[],"apc_list":{"value":2450,"currency":"USD","value_usd":2450},"apc_paid":null,"fwci":0.7148,"has_fulltext":false,"cited_by_count":12,"citation_normalized_percentile":{"value":0.72446327,"is_in_top_1_percent":false,"is_in_top_10_percent":false},"cited_by_percentile_year":{"min":88,"max":97},"biblio":{"volume":"37","issue":"5","first_page":"054007","last_page":"054007"},"is_retracted":false,"is_paratext":false,"is_xpac":false,"primary_topic":{"id":"https://openalex.org/T11992","display_name":"CCD and CMOS Imaging Sensors","score":1.0,"subfield":{"id":"https://openalex.org/subfields/2208","display_name":"Electrical and Electronic Engineering"},"field":{"id":"https://openalex.org/fields/22","display_name":"Engineering"},"domain":{"id":"https://openalex.org/domains/3","display_name":"Physical Sciences"}},"topics":[{"id":"https://openalex.org/T11992","display_name":"CCD and CMOS Imaging Sensors","score":1.0,"subfield":{"id":"https://openalex.org/subfields/2208","display_name":"Electrical and Electronic Engineering"},"field":{"id":"https://openalex.org/fields/22","display_name":"Engineering"},"domain":{"id":"https://openalex.org/domains/3","display_name":"Physical Sciences"}},{"id":"https://openalex.org/T11637","display_name":"Advanced Semiconductor Detectors and Materials","score":0.0,"subfield":{"id":"https://openalex.org/subfields/2208","display_name":"Electrical and Electronic Engineering"},"field":{"id":"https://openalex.org/fields/22","display_name":"Engineering"},"domain":{"id":"https://openalex.org/domains/3","display_name":"Physical Sciences"}},{"id":"https://openalex.org/T10323","display_name":"Analog and Mixed-Signal Circuit Design","score":0.0,"subfield":{"id":"https://openalex.org/subfields/2208","display_name":"Electrical and Electronic Engineering"},"field":{"id":"https://openalex.org/fields/22","display_name":"Engineering"},"domain":{"id":"https://openalex.org/domains/3","display_name":"Physical Sciences"}}],"keywords":[{"id":"https://openalex.org/keywords/pinned-photodiode","display_name":"pinned photodiode","score":0.9879999756813049},{"id":"https://openalex.org/keywords/cmos-image-sensor","display_name":"CMOS image sensor","score":0.9539999961853027},{"id":"https://openalex.org/keywords/image-lag","display_name":"image lag","score":0.9789999723434448},{"id":"https://openalex.org/keywords/transfer-gate","display_name":"transfer gate","score":0.796999990940094},{"id":"https://openalex.org/keywords/linear-extrapolation","display_name":"linear extrapolation","score":0.878000020980835},{"id":"https://openalex.org/keywords/high-speed-image-sensor","display_name":"high-speed image sensor","score":0.5759999752044678}],"concepts":[{"id":"https://openalex.org/C751236","wikidata":"https://www.wikidata.org/wiki/Q175943","display_name":"Photodiode","level":2,"score":0.8676275014877319},{"id":"https://openalex.org/C76935873","wikidata":"https://www.wikidata.org/wiki/Q209121","display_name":"Image sensor","level":2,"score":0.7043555974960327},{"id":"https://openalex.org/C46362747","wikidata":"https://www.wikidata.org/wiki/Q173431","display_name":"CMOS","level":2,"score":0.6253487467765808},{"id":"https://openalex.org/C188082385","wikidata":"https://www.wikidata.org/wiki/Q73792","display_name":"Charge (physics)","level":2,"score":0.5952914953231812},{"id":"https://openalex.org/C132459708","wikidata":"https://www.wikidata.org/wiki/Q744069","display_name":"Extrapolation","level":2,"score":0.5700384974479675},{"id":"https://openalex.org/C49040817","wikidata":"https://www.wikidata.org/wiki/Q193091","display_name":"Optoelectronics","level":1,"score":0.5627538561820984},{"id":"https://openalex.org/C192562407","wikidata":"https://www.wikidata.org/wiki/Q228736","display_name":"Materials science","level":0,"score":0.550555944442749},{"id":"https://openalex.org/C152213855","wikidata":"https://www.wikidata.org/wiki/Q189880","display_name":"Charge-coupled device","level":2,"score":0.5477268099784851},{"id":"https://openalex.org/C160633673","wikidata":"https://www.wikidata.org/wiki/Q355198","display_name":"Pixel","level":2,"score":0.5474954843521118},{"id":"https://openalex.org/C2780009758","wikidata":"https://www.wikidata.org/wiki/Q6804172","display_name":"Measure (data warehouse)","level":2,"score":0.5397999286651611},{"id":"https://openalex.org/C108225325","wikidata":"https://www.wikidata.org/wiki/Q11456","display_name":"Semiconductor","level":2,"score":0.4467217028141022},{"id":"https://openalex.org/C120665830","wikidata":"https://www.wikidata.org/wiki/Q14620","display_name":"Optics","level":1,"score":0.36534634232521057},{"id":"https://openalex.org/C121332964","wikidata":"https://www.wikidata.org/wiki/Q413","display_name":"Physics","level":0,"score":0.22492411732673645},{"id":"https://openalex.org/C41008148","wikidata":"https://www.wikidata.org/wiki/Q21198","display_name":"Computer science","level":0,"score":0.21145054697990417},{"id":"https://openalex.org/C33923547","wikidata":"https://www.wikidata.org/wiki/Q395","display_name":"Mathematics","level":0,"score":0.06803110241889954},{"id":"https://openalex.org/C134306372","wikidata":"https://www.wikidata.org/wiki/Q7754","display_name":"Mathematical analysis","level":1,"score":0.0},{"id":"https://openalex.org/C62520636","wikidata":"https://www.wikidata.org/wiki/Q944","display_name":"Quantum mechanics","level":1,"score":0.0},{"id":"https://openalex.org/C77088390","wikidata":"https://www.wikidata.org/wiki/Q8513","display_name":"Database","level":1,"score":0.0}],"mesh":[],"locations_count":2,"locations":[{"id":"doi:10.1088/1674-4926/37/5/054007","doi":"https://doi.org/10.1088/1674-4926/37/5/054007","is_oa":false,"landing_page_url":"https://doi.org/10.1088/1674-4926/37/5/054007","pdf_url":null,"source":{"id":"https://openalex.org/S52834336","display_name":"Journal of Semiconductors","issn_l":"1674-4926","issn":["1674-4926","2058-6140"],"is_oa":false,"is_in_doaj":false,"is_core":true,"listed_in":["cwts-core","dongbi-b","jufo-1","poland-40","russia-white-list-2"],"host_organization":"https://openalex.org/P4310320083","host_organization_name":"IOP Publishing","host_organization_lineage":["https://openalex.org/P4310320083","https://openalex.org/P4310311669"],"host_organization_lineage_names":["IOP Publishing","Institute of Physics"],"type":"journal"},"license":null,"license_id":null,"version":"publishedVersion","is_accepted":true,"is_published":true,"raw_source_name":"Journal of Semiconductors","raw_type":"journal-article"},{"id":"mag:2528710244","doi":null,"is_oa":false,"landing_page_url":"http://www.cqvip.com/QK/94689X/201605/668958927.html","pdf_url":null,"source":{"id":"https://openalex.org/S4306544928","display_name":"\u534a\u5bfc\u4f53\u5b66\u62a5\uff1a\u82f1\u6587\u7248","issn_l":null,"issn":null,"is_oa":false,"is_in_doaj":false,"is_core":false,"listed_in":[],"host_organization":null,"host_organization_name":null,"host_organization_lineage":[],"host_organization_lineage_names":[],"type":"journal"},"license":null,"license_id":null,"version":null,"is_accepted":false,"is_published":false,"raw_source_name":"\u534a\u5bfc\u4f53\u5b66\u62a5\uff1a\u82f1\u6587\u7248","raw_type":null}],"best_oa_location":null,"sustainable_development_goals":[],"study_designs":[],"awards":[],"funders":[],"has_content":{"pdf":false,"grobid_xml":false},"content_urls":null,"referenced_works_count":19,"referenced_works":["https://openalex.org/W50387485","https://openalex.org/W1577056577","https://openalex.org/W1991512196","https://openalex.org/W1997195704","https://openalex.org/W2002620270","https://openalex.org/W2021213810","https://openalex.org/W2031224907","https://openalex.org/W2064990327","https://openalex.org/W2065036374","https://openalex.org/W2068042477","https://openalex.org/W2070094114","https://openalex.org/W2093301245","https://openalex.org/W2127636286","https://openalex.org/W2154266954","https://openalex.org/W2164867045","https://openalex.org/W2256894389","https://openalex.org/W2258184617","https://openalex.org/W2318152329","https://openalex.org/W4230690632"],"related_works":["https://openalex.org/W4294167388","https://openalex.org/W4205109300","https://openalex.org/W3154978512","https://openalex.org/W4319079102","https://openalex.org/W2093301245","https://openalex.org/W3112097657","https://openalex.org/W2058864919","https://openalex.org/W4310196536","https://openalex.org/W2300387168","https://openalex.org/W3128895138"],"abstract_inverted_index":{"The":[0,77],"charge":[1],"transfer":[2,9],"potential":[3],"barrier":[4],"(CTPB)":[5],"formed":[6],"beneath":[7],"the":[8,36,42,55,69,74,85,88,93,119,122],"gate":[10],"causes":[11],"a":[12,60,65,96,111],"noticeable":[13],"image":[14,22],"lag":[15],"issue":[16],"in":[17,82],"pinned":[18],"photodiode":[19],"(PPD)":[20],"CMOS":[21],"sensors":[23,126],"(CIS),":[24],"and":[25,124],"is":[26,33,108],"difficult":[27],"to":[28,52,114],"measure":[29,54],"straightforwardly":[30],"since":[31],"it":[32],"embedded":[34],"inside":[35],"device.":[37],"From":[38],"an":[39,49,101],"understanding":[40],"of":[41,87,92,103],"CTPB":[43,56],"formation":[44],"mechanism,":[45],"we":[46],"report":[47],"on":[48,68,84,95,118,129],"alternative":[50],"method":[51,112],"feasibly":[53],"height":[57],"by":[58],"performing":[59],"linear":[61],"extrapolation":[62],"coupled":[63],"with":[64,100],"horizontal":[66],"left-shift":[67],"sensor":[70],"photoresponse":[71],"curve":[72],"under":[73],"steady-state":[75],"illumination.":[76],"theoretical":[78],"study":[79],"was":[80],"performed":[81],"detail":[83],"principle":[86],"proposed":[89],"method.":[90],"Application":[91],"measurements":[94],"prototype":[97],"PPD-CIS":[98],"chip":[99],"array":[102],"160":[104,106],"\u00d7":[105],"pixels":[107],"demonstrated.":[109],"Such":[110],"intends":[113],"shine":[115],"new":[116],"light":[117],"guidance":[120],"for":[121],"lag-free":[123],"high-speed":[125],"optimization":[127],"based":[128],"PPD":[130],"devices.":[131]},"counts_by_year":[{"year":2024,"cited_by_count":1},{"year":2023,"cited_by_count":2},{"year":2022,"cited_by_count":2},{"year":2021,"cited_by_count":2},{"year":2018,"cited_by_count":3},{"year":2017,"cited_by_count":1},{"year":2016,"cited_by_count":1}],"updated_date":"2026-09-29T14:09:16.559479","created_date":"2016-06-24T00:00:00"}