{"id":"https://openalex.org/W2397843780","doi":null,"title":"Current Measurement and Gate-Resistance Mismatch in Paralleled Phases of High Power SiC MOSFET Modules","display_name":"Current Measurement and Gate-Resistance Mismatch in Paralleled Phases of High Power SiC MOSFET Modules","publication_year":2016,"publication_date":"2016-05-10","ids":{"openalex":"https://openalex.org/W2397843780","mag":"2397843780"},"language":"en","primary_location":{"id":"pmh:oai:eref.uni-bayreuth.de:32407","doi":null,"is_oa":false,"landing_page_url":"https://eref.uni-bayreuth.de/32407/","pdf_url":null,"source":{"id":"https://openalex.org/S4377196442","display_name":"ERef Bayreuth (University of Bayreuth)","issn_l":null,"issn":null,"is_oa":false,"is_in_doaj":false,"is_core":false,"listed_in":[],"host_organization":"https://openalex.org/I54009628","host_organization_name":"University of Bayreuth","host_organization_lineage":["https://openalex.org/I54009628"],"host_organization_lineage_names":[],"type":"repository"},"license":null,"license_id":null,"version":"acceptedVersion","is_accepted":true,"is_published":false,"raw_source_name":"","raw_type":"Veranstaltungsbeitrag"},"volume":null,"type":"article","is_traditional":true,"indexed_in":[],"open_access":{"is_oa":false,"oa_status":"closed","oa_url":null,"any_repository_has_fulltext":false},"authorships":[{"author_position":"first","author":{"id":"https://openalex.org/A5025297842","display_name":"Roman Horff","orcid":null,"observed_orcids":[]},"institutions":[],"countries":[],"is_corresponding":false,"raw_author_name":"Roman Horff","raw_affiliation_strings":[],"raw_orcid":null,"affiliations":[]},{"author_position":"middle","author":{"id":"https://openalex.org/A5034867802","display_name":"Teresa Bertelshofer","orcid":"https://orcid.org/0000-0001-6926-8732","observed_orcids":["https://orcid.org/0000-0001-6926-8732"]},"institutions":[],"countries":[],"is_corresponding":false,"raw_author_name":"Teresa Bertelshofer","raw_affiliation_strings":[],"raw_orcid":"https://orcid.org/0000-0001-6926-8732","affiliations":[]},{"author_position":"middle","author":{"id":"https://openalex.org/A5110691891","display_name":"Andreas M\u00e4rz","orcid":"https://orcid.org/0000-0002-2917-8924","observed_orcids":["https://orcid.org/0000-0002-2917-8924"]},"institutions":[],"countries":[],"is_corresponding":false,"raw_author_name":"Andreas Maerz","raw_affiliation_strings":[],"raw_orcid":"https://orcid.org/0000-0002-2917-8924","affiliations":[]},{"author_position":"last","author":{"id":"https://openalex.org/A5031727720","display_name":"Mark\u2010M. Bakran","orcid":"https://orcid.org/0000-0002-0622-5855","observed_orcids":["https://orcid.org/0000-0002-0622-5855"]},"institutions":[],"countries":[],"is_corresponding":false,"raw_author_name":"Mark\u2010M. Bakran","raw_affiliation_strings":[],"raw_orcid":"https://orcid.org/0000-0002-0622-5855","affiliations":[]}],"institutions":[],"countries_distinct_count":0,"institutions_distinct_count":0,"corresponding_author_ids":[],"corresponding_institution_ids":[],"apc_list":null,"apc_paid":null,"fwci":0.7148,"has_fulltext":false,"cited_by_count":5,"citation_normalized_percentile":{"value":0.72437173,"is_in_top_1_percent":false,"is_in_top_10_percent":false},"cited_by_percentile_year":{"min":88,"max":97},"biblio":{"volume":null,"issue":null,"first_page":"1","last_page":"8"},"is_retracted":false,"is_paratext":false,"is_xpac":false,"primary_topic":{"id":"https://openalex.org/T10361","display_name":"Silicon Carbide Semiconductor Technologies","score":1.0,"subfield":{"id":"https://openalex.org/subfields/2208","display_name":"Electrical and Electronic Engineering"},"field":{"id":"https://openalex.org/fields/22","display_name":"Engineering"},"domain":{"id":"https://openalex.org/domains/3","display_name":"Physical Sciences"}},"topics":[{"id":"https://openalex.org/T10361","display_name":"Silicon Carbide Semiconductor Technologies","score":1.0,"subfield":{"id":"https://openalex.org/subfields/2208","display_name":"Electrical and Electronic Engineering"},"field":{"id":"https://openalex.org/fields/22","display_name":"Engineering"},"domain":{"id":"https://openalex.org/domains/3","display_name":"Physical Sciences"}},{"id":"https://openalex.org/T11444","display_name":"Electromagnetic Compatibility and Noise Suppression","score":0.0,"subfield":{"id":"https://openalex.org/subfields/2208","display_name":"Electrical and Electronic Engineering"},"field":{"id":"https://openalex.org/fields/22","display_name":"Engineering"},"domain":{"id":"https://openalex.org/domains/3","display_name":"Physical Sciences"}},{"id":"https://openalex.org/T10228","display_name":"Multilevel Inverters and Converters","score":0.0,"subfield":{"id":"https://openalex.org/subfields/2208","display_name":"Electrical and Electronic Engineering"},"field":{"id":"https://openalex.org/fields/22","display_name":"Engineering"},"domain":{"id":"https://openalex.org/domains/3","display_name":"Physical Sciences"}}],"keywords":[{"id":"https://openalex.org/keywords/sic-mosfet-modules","display_name":"SiC MOSFET modules","score":0.8610000014305115},{"id":"https://openalex.org/keywords/current-measurement","display_name":"current measurement","score":0.7689999938011169},{"id":"https://openalex.org/keywords/high-power-electronics","display_name":"high-power electronics","score":0.5669999718666077},{"id":"https://openalex.org/keywords/gate-drive","display_name":"gate drive","score":0.3019999861717224},{"id":"https://openalex.org/keywords/power-module-reliability","display_name":"power module reliability","score":0.36800000071525574}],"concepts":[{"id":"https://openalex.org/C88653102","wikidata":"https://www.wikidata.org/wiki/Q570553","display_name":"Power MOSFET","level":5,"score":0.6104906797409058},{"id":"https://openalex.org/C2778413303","wikidata":"https://www.wikidata.org/wiki/Q210793","display_name":"MOSFET","level":4,"score":0.609878420829773},{"id":"https://openalex.org/C192562407","wikidata":"https://www.wikidata.org/wiki/Q228736","display_name":"Materials science","level":0,"score":0.5522065162658691},{"id":"https://openalex.org/C49040817","wikidata":"https://www.wikidata.org/wiki/Q193091","display_name":"Optoelectronics","level":1,"score":0.5134295225143433},{"id":"https://openalex.org/C2780722187","wikidata":"https://www.wikidata.org/wiki/Q412356","display_name":"Silicon carbide","level":2,"score":0.5123344659805298},{"id":"https://openalex.org/C119599485","wikidata":"https://www.wikidata.org/wiki/Q43035","display_name":"Electrical engineering","level":1,"score":0.4974212944507599},{"id":"https://openalex.org/C163258240","wikidata":"https://www.wikidata.org/wiki/Q25342","display_name":"Power (physics)","level":2,"score":0.4533396065235138},{"id":"https://openalex.org/C131017901","wikidata":"https://www.wikidata.org/wiki/Q170451","display_name":"Logic gate","level":2,"score":0.4254711866378784},{"id":"https://openalex.org/C148043351","wikidata":"https://www.wikidata.org/wiki/Q4456944","display_name":"Current (fluid)","level":2,"score":0.4189111590385437},{"id":"https://openalex.org/C129014197","wikidata":"https://www.wikidata.org/wiki/Q906544","display_name":"Power semiconductor device","level":3,"score":0.41592782735824585},{"id":"https://openalex.org/C61696701","wikidata":"https://www.wikidata.org/wiki/Q770766","display_name":"Engineering physics","level":1,"score":0.41357314586639404},{"id":"https://openalex.org/C24326235","wikidata":"https://www.wikidata.org/wiki/Q126095","display_name":"Electronic engineering","level":1,"score":0.3317585587501526},{"id":"https://openalex.org/C127413603","wikidata":"https://www.wikidata.org/wiki/Q11023","display_name":"Engineering","level":0,"score":0.247575581073761},{"id":"https://openalex.org/C172385210","wikidata":"https://www.wikidata.org/wiki/Q5339","display_name":"Transistor","level":3,"score":0.2246416211128235},{"id":"https://openalex.org/C121332964","wikidata":"https://www.wikidata.org/wiki/Q413","display_name":"Physics","level":0,"score":0.14421790838241577},{"id":"https://openalex.org/C165801399","wikidata":"https://www.wikidata.org/wiki/Q25428","display_name":"Voltage","level":2,"score":0.13474634289741516},{"id":"https://openalex.org/C191897082","wikidata":"https://www.wikidata.org/wiki/Q11467","display_name":"Metallurgy","level":1,"score":0.0903293788433075},{"id":"https://openalex.org/C62520636","wikidata":"https://www.wikidata.org/wiki/Q944","display_name":"Quantum mechanics","level":1,"score":0.0}],"mesh":[],"locations_count":2,"locations":[{"id":"pmh:oai:eref.uni-bayreuth.de:32407","doi":null,"is_oa":false,"landing_page_url":"https://eref.uni-bayreuth.de/32407/","pdf_url":null,"source":{"id":"https://openalex.org/S4377196442","display_name":"ERef Bayreuth (University of Bayreuth)","issn_l":null,"issn":null,"is_oa":false,"is_in_doaj":false,"is_core":false,"listed_in":[],"host_organization":"https://openalex.org/I54009628","host_organization_name":"University of Bayreuth","host_organization_lineage":["https://openalex.org/I54009628"],"host_organization_lineage_names":[],"type":"repository"},"license":null,"license_id":null,"version":"acceptedVersion","is_accepted":true,"is_published":false,"raw_source_name":"","raw_type":"Veranstaltungsbeitrag"},{"id":"mag:2397843780","doi":null,"is_oa":false,"landing_page_url":"https://eref.uni-bayreuth.de/32407/","pdf_url":null,"source":null,"license":null,"license_id":null,"version":null,"is_accepted":false,"is_published":false,"raw_source_name":"PCIM Europe 2016; International Exhibition and Conference for Power Electronics, Intelligent Motion, Renewable Energy and Energy Management; Proceedings of","raw_type":null}],"best_oa_location":null,"sustainable_development_goals":[],"study_designs":[],"awards":[],"funders":[],"has_content":{"pdf":false,"grobid_xml":false},"content_urls":null,"referenced_works_count":0,"referenced_works":[],"related_works":["https://openalex.org/W2546753112","https://openalex.org/W2901911222","https://openalex.org/W2142610875","https://openalex.org/W7165116683","https://openalex.org/W7169146128","https://openalex.org/W7064347671","https://openalex.org/W2949005495","https://openalex.org/W7165011299","https://openalex.org/W2964237245","https://openalex.org/W2759456917"],"abstract_inverted_index":null,"counts_by_year":[{"year":2018,"cited_by_count":1},{"year":2017,"cited_by_count":3},{"year":2016,"cited_by_count":1}],"updated_date":"2026-10-13T10:08:12.033832","created_date":"2016-06-24T00:00:00"}