{"id":"https://openalex.org/W2396464484","doi":null,"title":"Fault-Tolerant B6-B4 Inverter Reconfiguration with Fuses and Ideal Short-On Failure IGBT Modules","display_name":"Fault-Tolerant B6-B4 Inverter Reconfiguration with Fuses and Ideal Short-On Failure IGBT Modules","publication_year":2016,"publication_date":"2016-05-10","ids":{"openalex":"https://openalex.org/W2396464484","mag":"2396464484"},"language":"en","primary_location":{"id":"mag:2396464484","doi":null,"is_oa":false,"landing_page_url":"http://ieeexplore.ieee.org/document/7499421/","pdf_url":null,"source":null,"license":null,"license_id":null,"version":null,"is_accepted":false,"is_published":false,"raw_source_name":"PCIM Europe 2016; International Exhibition and Conference for Power Electronics, Intelligent Motion, Renewable Energy and Energy Management; Proceedings of","raw_type":null},"volume":null,"type":"conference-paper","indexed_in":[],"open_access":{"is_oa":false,"oa_status":"closed","oa_url":null,"any_repository_has_fulltext":false},"authorships":[{"author_position":"first","author":{"id":"https://openalex.org/A5047947332","display_name":"Michael Glei\u00dfner","orcid":"https://orcid.org/0000-0002-3497-786X","observed_orcids":["https://orcid.org/0000-0002-3497-786X"]},"institutions":[],"countries":[],"is_corresponding":false,"raw_author_name":"Michael Glei\u00dfner","raw_affiliation_strings":[],"raw_orcid":null,"affiliations":[]},{"author_position":"last","author":{"id":"https://openalex.org/A5031727720","display_name":"Mark\u2010M. Bakran","orcid":"https://orcid.org/0000-0002-0622-5855","observed_orcids":["https://orcid.org/0000-0002-0622-5855"]},"institutions":[],"countries":[],"is_corresponding":false,"raw_author_name":"Mark\u2010M. Bakran","raw_affiliation_strings":[],"raw_orcid":"https://orcid.org/0000-0002-0622-5855","affiliations":[]}],"institutions":[],"countries_distinct_count":0,"institutions_distinct_count":0,"corresponding_author_ids":[],"corresponding_institution_ids":[],"apc_list":null,"apc_paid":null,"fwci":2.3453,"has_fulltext":false,"cited_by_count":8,"citation_normalized_percentile":{"value":0.86422591,"is_in_top_1_percent":false,"is_in_top_10_percent":false},"cited_by_percentile_year":{"min":88,"max":96},"biblio":{"volume":null,"issue":null,"first_page":"1","last_page":"8"},"is_retracted":false,"is_paratext":false,"is_xpac":false,"primary_topic":{"id":"https://openalex.org/T10228","display_name":"Multilevel Inverters and Converters","score":0.9106000065803528,"subfield":{"id":"https://openalex.org/subfields/2208","display_name":"Electrical and Electronic Engineering"},"field":{"id":"https://openalex.org/fields/22","display_name":"Engineering"},"domain":{"id":"https://openalex.org/domains/3","display_name":"Physical Sciences"}},"topics":[{"id":"https://openalex.org/T10228","display_name":"Multilevel Inverters and Converters","score":0.9106000065803528,"subfield":{"id":"https://openalex.org/subfields/2208","display_name":"Electrical and Electronic Engineering"},"field":{"id":"https://openalex.org/fields/22","display_name":"Engineering"},"domain":{"id":"https://openalex.org/domains/3","display_name":"Physical Sciences"}},{"id":"https://openalex.org/T10361","display_name":"Silicon Carbide Semiconductor Technologies","score":0.0471000000834465,"subfield":{"id":"https://openalex.org/subfields/2208","display_name":"Electrical and Electronic Engineering"},"field":{"id":"https://openalex.org/fields/22","display_name":"Engineering"},"domain":{"id":"https://openalex.org/domains/3","display_name":"Physical Sciences"}},{"id":"https://openalex.org/T13093","display_name":"Electric Power Systems and Control","score":0.0071000000461936,"subfield":{"id":"https://openalex.org/subfields/2208","display_name":"Electrical and Electronic Engineering"},"field":{"id":"https://openalex.org/fields/22","display_name":"Engineering"},"domain":{"id":"https://openalex.org/domains/3","display_name":"Physical Sciences"}}],"keywords":[{"id":"https://openalex.org/keywords/fault-tolerant-inverter","display_name":"fault-tolerant inverter","score":0.8899999856948853},{"id":"https://openalex.org/keywords/igbt-modules","display_name":"IGBT modules","score":0.9279999732971191},{"id":"https://openalex.org/keywords/fuses","display_name":"fuses","score":0.7639999985694885},{"id":"https://openalex.org/keywords/three-phase-voltage-source-inverter","display_name":"three-phase voltage source inverter","score":0.7839999794960022},{"id":"https://openalex.org/keywords/post-fault-operation","display_name":"post-fault operation","score":0.7639999985694885},{"id":"https://openalex.org/keywords/current-stress","display_name":"current stress","score":0.6119999885559082},{"id":"https://openalex.org/keywords/functional-safety","display_name":"functional safety","score":0.906000018119812}],"concepts":[{"id":"https://openalex.org/C28285623","wikidata":"https://www.wikidata.org/wiki/Q176110","display_name":"Insulated-gate bipolar transistor","level":3,"score":0.7659893035888672},{"id":"https://openalex.org/C11190779","wikidata":"https://www.wikidata.org/wiki/Q664575","display_name":"Inverter","level":3,"score":0.7280392646789551},{"id":"https://openalex.org/C119701452","wikidata":"https://www.wikidata.org/wiki/Q5165881","display_name":"Control reconfiguration","level":2,"score":0.7135222554206848},{"id":"https://openalex.org/C63540848","wikidata":"https://www.wikidata.org/wiki/Q3140932","display_name":"Fault tolerance","level":2,"score":0.6419854164123535},{"id":"https://openalex.org/C175551986","wikidata":"https://www.wikidata.org/wiki/Q47089","display_name":"Fault (geology)","level":2,"score":0.5311055779457092},{"id":"https://openalex.org/C163258240","wikidata":"https://www.wikidata.org/wiki/Q25342","display_name":"Power (physics)","level":2,"score":0.4756968915462494},{"id":"https://openalex.org/C119599485","wikidata":"https://www.wikidata.org/wiki/Q43035","display_name":"Electrical engineering","level":1,"score":0.4362831115722656},{"id":"https://openalex.org/C127413603","wikidata":"https://www.wikidata.org/wiki/Q11023","display_name":"Engineering","level":0,"score":0.4339069724082947},{"id":"https://openalex.org/C2776639384","wikidata":"https://www.wikidata.org/wiki/Q840396","display_name":"Ideal (ethics)","level":2,"score":0.43344414234161377},{"id":"https://openalex.org/C165801399","wikidata":"https://www.wikidata.org/wiki/Q25428","display_name":"Voltage","level":2,"score":0.41227641701698303},{"id":"https://openalex.org/C178911571","wikidata":"https://www.wikidata.org/wiki/Q593143","display_name":"Power electronics","level":3,"score":0.4103173315525055},{"id":"https://openalex.org/C41008148","wikidata":"https://www.wikidata.org/wiki/Q21198","display_name":"Computer science","level":0,"score":0.36394375562667847},{"id":"https://openalex.org/C184720557","wikidata":"https://www.wikidata.org/wiki/Q7825049","display_name":"Topology (electrical circuits)","level":2,"score":0.35862523317337036},{"id":"https://openalex.org/C24326235","wikidata":"https://www.wikidata.org/wiki/Q126095","display_name":"Electronic engineering","level":1,"score":0.3564775288105011},{"id":"https://openalex.org/C47446073","wikidata":"https://www.wikidata.org/wiki/Q5165890","display_name":"Control theory (sociology)","level":3,"score":0.33749645948410034},{"id":"https://openalex.org/C200601418","wikidata":"https://www.wikidata.org/wiki/Q2193887","display_name":"Reliability engineering","level":1,"score":0.2877197265625},{"id":"https://openalex.org/C149635348","wikidata":"https://www.wikidata.org/wiki/Q193040","display_name":"Embedded system","level":1,"score":0.20074030756950378},{"id":"https://openalex.org/C121332964","wikidata":"https://www.wikidata.org/wiki/Q413","display_name":"Physics","level":0,"score":0.08196637034416199},{"id":"https://openalex.org/C111472728","wikidata":"https://www.wikidata.org/wiki/Q9471","display_name":"Epistemology","level":1,"score":0.0},{"id":"https://openalex.org/C138885662","wikidata":"https://www.wikidata.org/wiki/Q5891","display_name":"Philosophy","level":0,"score":0.0},{"id":"https://openalex.org/C165205528","wikidata":"https://www.wikidata.org/wiki/Q83371","display_name":"Seismology","level":1,"score":0.0},{"id":"https://openalex.org/C2775924081","wikidata":"https://www.wikidata.org/wiki/Q55608371","display_name":"Control (management)","level":2,"score":0.0},{"id":"https://openalex.org/C127313418","wikidata":"https://www.wikidata.org/wiki/Q1069","display_name":"Geology","level":0,"score":0.0},{"id":"https://openalex.org/C154945302","wikidata":"https://www.wikidata.org/wiki/Q11660","display_name":"Artificial intelligence","level":1,"score":0.0},{"id":"https://openalex.org/C62520636","wikidata":"https://www.wikidata.org/wiki/Q944","display_name":"Quantum mechanics","level":1,"score":0.0}],"mesh":[],"locations_count":1,"locations":[{"id":"mag:2396464484","doi":null,"is_oa":false,"landing_page_url":"http://ieeexplore.ieee.org/document/7499421/","pdf_url":null,"source":null,"license":null,"license_id":null,"version":null,"is_accepted":false,"is_published":false,"raw_source_name":"PCIM Europe 2016; International Exhibition and Conference for Power Electronics, Intelligent Motion, Renewable Energy and Energy Management; Proceedings of","raw_type":null}],"best_oa_location":null,"sustainable_development_goals":[{"score":0.75,"id":"https://metadata.un.org/sdg/7","display_name":"Affordable and clean energy"},{"score":0.7240999937057495,"id":"https://metadata.un.org/sdg/9","display_name":"Industry, innovation and infrastructure"}],"study_designs":[],"awards":[],"funders":[],"has_content":{"pdf":false,"grobid_xml":false},"content_urls":null,"referenced_works_count":0,"referenced_works":[],"related_works":["https://openalex.org/W4313011914","https://openalex.org/W2189157427","https://openalex.org/W2143059492","https://openalex.org/W4220799771","https://openalex.org/W4402808517","https://openalex.org/W2103910123","https://openalex.org/W4200310180","https://openalex.org/W3141526566","https://openalex.org/W2805581835","https://openalex.org/W2068442443"],"abstract_inverted_index":{"Fault-tolerance":[0],"is":[1,78,106],"a":[2,26,44,75,100],"common":[3],"measure":[4],"to":[5,11,25],"improve":[6],"power":[7],"electronics":[8],"availability":[9],"and":[10,59,80,90,98],"ensure":[12],"functional":[13],"safety.":[14],"A":[15],"six-switch":[16],"three-phase":[17,28],"voltage":[18,29],"source":[19,30],"inverter":[20,31,88,105],"(B6)":[21],"can":[22],"be":[23],"reconfigured":[24],"four-switch":[27],"(B4)":[32],"with":[33,68,99],"DC":[34],"link":[35],"midpoint":[36],"connection":[37],"after":[38,71],"semiconductor":[39],"failure.":[40],"This":[41],"paper":[42],"presents":[43],"new":[45,103],"reconfiguration":[46,89],"method":[47],"without":[48],"active":[49],"switches":[50],"for":[51],"ideal":[52,62],"short-on":[53,63],"failure":[54,64],"IGBT":[55],"modules":[56,67],"via":[57],"diodes":[58],"fuses.":[60],"The":[61,102],"behaviour":[65],"of":[66],"sandwich":[69],"structure":[70],"current":[72],"stress":[73],"over":[74],"longer":[76],"period":[77],"investigated":[79],"verified":[81],"by":[82],"cross-section":[83],"analysis.":[84],"Details":[85],"on":[86],"the":[87],"post-fault":[91],"operation":[92],"strategy":[93],"are":[94],"explained":[95],"in":[96],"theory":[97],"prototype.":[101],"fault-tolerant":[104],"less":[107],"complex":[108],"than":[109],"known":[110],"equivalents.":[111]},"counts_by_year":[{"year":2023,"cited_by_count":1},{"year":2021,"cited_by_count":1},{"year":2020,"cited_by_count":1},{"year":2018,"cited_by_count":2},{"year":2017,"cited_by_count":2},{"year":2016,"cited_by_count":1}],"updated_date":"2026-10-07T09:51:55.459714","created_date":"2016-06-24T00:00:00"}