{"id":"https://openalex.org/W2395413458","doi":"https://doi.org/10.1109/eecea.2016.7470765","title":"Express evaluation of measurement uncertainty digital power meter in LabVIEW","display_name":"Express evaluation of measurement uncertainty digital power meter in LabVIEW","publication_year":2016,"publication_date":"2016-04-01","ids":{"openalex":"https://openalex.org/W2395413458","doi":"https://doi.org/10.1109/eecea.2016.7470765","mag":"2395413458"},"language":"en","primary_location":{"id":"doi:10.1109/eecea.2016.7470765","doi":"https://doi.org/10.1109/eecea.2016.7470765","is_oa":false,"landing_page_url":"https://doi.org/10.1109/eecea.2016.7470765","pdf_url":null,"source":{"id":"https://openalex.org/S7407120123","display_name":"International Conference on Electrical, Electronics, Computer Engineering and their Applications (EECEA)","issn_l":null,"issn":null,"is_oa":false,"is_in_doaj":false,"is_core":false,"listed_in":[],"host_organization":"https://openalex.org/P4310319808","host_organization_name":"Institute of Electrical and Electronics Engineers","host_organization_lineage":["https://openalex.org/P4310319808"],"host_organization_lineage_names":["Institute of Electrical and Electronics Engineers"],"type":"conference"},"license":null,"license_id":null,"version":"publishedVersion","is_accepted":true,"is_published":true,"raw_source_name":"2016 Third International Conference on Electrical, Electronics, Computer Engineering and their Applications (EECEA)","raw_type":"proceedings-article"},"volume":null,"type":"conference-paper","indexed_in":["crossref"],"open_access":{"is_oa":false,"oa_status":"closed","oa_url":null,"any_repository_has_fulltext":false},"authorships":[{"author_position":"first","author":{"id":"https://openalex.org/A5112175344","display_name":"N M Natalinova","orcid":null,"observed_orcids":[]},"institutions":[{"id":"https://openalex.org/I30849647","display_name":"Tomsk Polytechnic University","ror":"https://ror.org/00a45v709","country_code":"RU","type":"education","lineage":["https://openalex.org/I30849647"]}],"countries":["RU"],"is_corresponding":false,"raw_author_name":"N.M. Natalinova","raw_affiliation_strings":["Tomsk Polytechnic University Tomsk, Russia"],"raw_orcid":null,"affiliations":[{"raw_affiliation_string":"Tomsk Polytechnic University Tomsk, Russia","institution_ids":["https://openalex.org/I30849647"]}]},{"author_position":"middle","author":{"id":"https://openalex.org/A5019846379","display_name":"Olga Galtseva","orcid":"https://orcid.org/0000-0001-6919-4833","observed_orcids":["https://orcid.org/0000-0001-6919-4833"]},"institutions":[{"id":"https://openalex.org/I30849647","display_name":"Tomsk Polytechnic University","ror":"https://ror.org/00a45v709","country_code":"RU","type":"education","lineage":["https://openalex.org/I30849647"]}],"countries":["RU"],"is_corresponding":false,"raw_author_name":"O.V. Galtseva","raw_affiliation_strings":["Tomsk Polytechnic University Tomsk, Russia"],"raw_orcid":null,"affiliations":[{"raw_affiliation_string":"Tomsk Polytechnic University Tomsk, Russia","institution_ids":["https://openalex.org/I30849647"]}]},{"author_position":"last","author":{"id":"https://openalex.org/A5072063824","display_name":"Evgeniya A. Moldovanova","orcid":"https://orcid.org/0000-0002-1638-4366","observed_orcids":["https://orcid.org/0000-0002-1638-4366"]},"institutions":[{"id":"https://openalex.org/I30849647","display_name":"Tomsk Polytechnic University","ror":"https://ror.org/00a45v709","country_code":"RU","type":"education","lineage":["https://openalex.org/I30849647"]}],"countries":["RU"],"is_corresponding":false,"raw_author_name":"E.A. Moldovanova","raw_affiliation_strings":["Tomsk Polytechnic University Tomsk, Russia"],"raw_orcid":null,"affiliations":[{"raw_affiliation_string":"Tomsk Polytechnic University Tomsk, Russia","institution_ids":["https://openalex.org/I30849647"]}]}],"institutions":[],"countries_distinct_count":1,"institutions_distinct_count":1,"corresponding_author_ids":[],"corresponding_institution_ids":["https://openalex.org/I30849647"],"apc_list":null,"apc_paid":null,"fwci":5.9971,"has_fulltext":false,"cited_by_count":8,"citation_normalized_percentile":{"value":0.96123651,"is_in_top_1_percent":false,"is_in_top_10_percent":true},"cited_by_percentile_year":{"min":89,"max":97},"biblio":{"volume":"65","issue":null,"first_page":"52","last_page":"56"},"is_retracted":false,"is_paratext":false,"is_xpac":false,"primary_topic":{"id":"https://openalex.org/T11890","display_name":"Scientific Measurement and Uncertainty Evaluation","score":0.8428000211715698,"subfield":{"id":"https://openalex.org/subfields/1804","display_name":"Statistics, Probability and Uncertainty"},"field":{"id":"https://openalex.org/fields/18","display_name":"Decision Sciences"},"domain":{"id":"https://openalex.org/domains/2","display_name":"Social Sciences"}},"topics":[{"id":"https://openalex.org/T11890","display_name":"Scientific Measurement and Uncertainty Evaluation","score":0.8428000211715698,"subfield":{"id":"https://openalex.org/subfields/1804","display_name":"Statistics, Probability and Uncertainty"},"field":{"id":"https://openalex.org/fields/18","display_name":"Decision Sciences"},"domain":{"id":"https://openalex.org/domains/2","display_name":"Social Sciences"}},{"id":"https://openalex.org/T12300","display_name":"Advanced Electrical Measurement Techniques","score":0.15389999747276306,"subfield":{"id":"https://openalex.org/subfields/2208","display_name":"Electrical and Electronic Engineering"},"field":{"id":"https://openalex.org/fields/22","display_name":"Engineering"},"domain":{"id":"https://openalex.org/domains/3","display_name":"Physical Sciences"}},{"id":"https://openalex.org/T11583","display_name":"Advanced Measurement and Metrology Techniques","score":0.0008999999845400453,"subfield":{"id":"https://openalex.org/subfields/2210","display_name":"Mechanical Engineering"},"field":{"id":"https://openalex.org/fields/22","display_name":"Engineering"},"domain":{"id":"https://openalex.org/domains/3","display_name":"Physical Sciences"}}],"keywords":[{"id":"https://openalex.org/keywords/measurement-uncertainty","display_name":"measurement uncertainty","score":0.9769999980926514},{"id":"https://openalex.org/keywords/digital-power-meter","display_name":"digital power meter","score":0.9890000224113464},{"id":"https://openalex.org/keywords/uncertainty-analysis","display_name":"uncertainty analysis","score":0.890999972820282},{"id":"https://openalex.org/keywords/labview","display_name":"LabVIEW","score":0.8149999976158142}],"concepts":[{"id":"https://openalex.org/C137209882","wikidata":"https://www.wikidata.org/wiki/Q1403517","display_name":"Measurement uncertainty","level":2,"score":0.7668361663818359},{"id":"https://openalex.org/C151011524","wikidata":"https://www.wikidata.org/wiki/Q11573","display_name":"Metre","level":2,"score":0.7364985346794128},{"id":"https://openalex.org/C67172668","wikidata":"https://www.wikidata.org/wiki/Q622756","display_name":"Electricity meter","level":3,"score":0.6608220338821411},{"id":"https://openalex.org/C41008148","wikidata":"https://www.wikidata.org/wiki/Q21198","display_name":"Computer science","level":0,"score":0.6036653518676758},{"id":"https://openalex.org/C163258240","wikidata":"https://www.wikidata.org/wiki/Q25342","display_name":"Power (physics)","level":2,"score":0.4953881502151489},{"id":"https://openalex.org/C177803969","wikidata":"https://www.wikidata.org/wiki/Q29205","display_name":"Uncertainty analysis","level":2,"score":0.4431520700454712},{"id":"https://openalex.org/C44154836","wikidata":"https://www.wikidata.org/wiki/Q45045","display_name":"Simulation","level":1,"score":0.20276594161987305},{"id":"https://openalex.org/C33923547","wikidata":"https://www.wikidata.org/wiki/Q395","display_name":"Mathematics","level":0,"score":0.1103898286819458},{"id":"https://openalex.org/C105795698","wikidata":"https://www.wikidata.org/wiki/Q12483","display_name":"Statistics","level":1,"score":0.07603830099105835},{"id":"https://openalex.org/C62520636","wikidata":"https://www.wikidata.org/wiki/Q944","display_name":"Quantum mechanics","level":1,"score":0.0},{"id":"https://openalex.org/C1276947","wikidata":"https://www.wikidata.org/wiki/Q333","display_name":"Astronomy","level":1,"score":0.0},{"id":"https://openalex.org/C121332964","wikidata":"https://www.wikidata.org/wiki/Q413","display_name":"Physics","level":0,"score":0.0}],"mesh":[],"locations_count":1,"locations":[{"id":"doi:10.1109/eecea.2016.7470765","doi":"https://doi.org/10.1109/eecea.2016.7470765","is_oa":false,"landing_page_url":"https://doi.org/10.1109/eecea.2016.7470765","pdf_url":null,"source":{"id":"https://openalex.org/S7407120123","display_name":"International Conference on Electrical, Electronics, Computer Engineering and their Applications (EECEA)","issn_l":null,"issn":null,"is_oa":false,"is_in_doaj":false,"is_core":false,"listed_in":[],"host_organization":"https://openalex.org/P4310319808","host_organization_name":"Institute of Electrical and Electronics Engineers","host_organization_lineage":["https://openalex.org/P4310319808"],"host_organization_lineage_names":["Institute of Electrical and Electronics Engineers"],"type":"conference"},"license":null,"license_id":null,"version":"publishedVersion","is_accepted":true,"is_published":true,"raw_source_name":"2016 Third International Conference on Electrical, Electronics, Computer Engineering and their Applications (EECEA)","raw_type":"proceedings-article"}],"best_oa_location":null,"sustainable_development_goals":[],"study_designs":[],"awards":[],"funders":[],"has_content":{"grobid_xml":false,"pdf":false},"content_urls":null,"referenced_works_count":16,"referenced_works":["https://openalex.org/W149807329","https://openalex.org/W291942548","https://openalex.org/W837273694","https://openalex.org/W1917725253","https://openalex.org/W2010346999","https://openalex.org/W2074671922","https://openalex.org/W2078419815","https://openalex.org/W2129338541","https://openalex.org/W2179766298","https://openalex.org/W2188865202","https://openalex.org/W2190405218","https://openalex.org/W2201547326","https://openalex.org/W2279654597","https://openalex.org/W2543884108","https://openalex.org/W2544161546","https://openalex.org/W4300497458"],"related_works":["https://openalex.org/W2356805018","https://openalex.org/W4256106009","https://openalex.org/W2390224850","https://openalex.org/W2201780308","https://openalex.org/W2182658604","https://openalex.org/W3199959134","https://openalex.org/W2372729348","https://openalex.org/W2376244450","https://openalex.org/W2121845702","https://openalex.org/W7053026279"],"abstract_inverted_index":{"The":[0,11],"procedures":[1,14],"of":[2,5],"uncertainty":[3,12],"calculation":[4,13],"digital":[6],"power":[7],"meter":[8],"are":[9,15],"developed.":[10],"performed":[16],"in":[17],"LabVIEW.":[18]},"counts_by_year":[{"year":2024,"cited_by_count":1},{"year":2023,"cited_by_count":1},{"year":2018,"cited_by_count":1},{"year":2017,"cited_by_count":3},{"year":2016,"cited_by_count":2}],"updated_date":"2026-10-28T10:33:24.094632","created_date":"2016-06-24T00:00:00"}