{"id":"https://openalex.org/W2393322323","doi":null,"title":"Automatic delaytime creating circuits","display_name":"Automatic delaytime creating circuits","publication_year":2005,"publication_date":"2005-01-01","ids":{"openalex":"https://openalex.org/W2393322323","mag":"2393322323"},"language":"en","primary_location":{"id":"mag:2393322323","doi":null,"is_oa":false,"landing_page_url":"https://en.cnki.com.cn/Article_en/CJFDTOTAL-GWDZ200507002.htm","pdf_url":null,"source":{"id":"https://openalex.org/S2764843302","display_name":"International Electronic Elements","issn_l":null,"issn":null,"is_oa":false,"is_in_doaj":false,"is_core":false,"listed_in":[],"host_organization":"https://openalex.org/P4366370411","host_organization_name":"Xi'an Sancai Technology","host_organization_lineage":["https://openalex.org/P4366370411"],"host_organization_lineage_names":["Xi'an Sancai Technology"],"type":"journal"},"license":null,"license_id":null,"version":null,"is_accepted":false,"is_published":false,"raw_source_name":"International Electronic Elements","raw_type":null},"volume":null,"type":"article","is_traditional":true,"indexed_in":[],"open_access":{"is_oa":false,"oa_status":"closed","oa_url":null,"any_repository_has_fulltext":false},"authorships":[{"author_position":"first","author":{"id":"https://openalex.org/A5083320321","display_name":"Yinfeng Xia","orcid":"https://orcid.org/0000-0001-9457-2656","observed_orcids":["https://orcid.org/0000-0001-9457-2656"]},"institutions":[],"countries":[],"is_corresponding":true,"raw_author_name":"Yinfeng Xia","raw_affiliation_strings":["Guo Ying2"],"raw_orcid":"https://orcid.org/0000-0001-9457-2656","affiliations":[{"raw_affiliation_string":"Guo Ying2","institution_ids":[]}]}],"institutions":[],"countries_distinct_count":0,"institutions_distinct_count":0,"corresponding_author_ids":["https://openalex.org/A5083320321"],"corresponding_institution_ids":[],"apc_list":null,"apc_paid":null,"fwci":0.0,"has_fulltext":false,"cited_by_count":0,"citation_normalized_percentile":{"value":0.46043848,"is_in_top_1_percent":false,"is_in_top_10_percent":false},"cited_by_percentile_year":null,"biblio":{"volume":null,"issue":null,"first_page":null,"last_page":null},"is_retracted":false,"is_paratext":false,"is_xpac":false,"primary_topic":{"id":"https://openalex.org/T10323","display_name":"Analog and Mixed-Signal Circuit Design","score":0.5116999745368958,"subfield":{"id":"https://openalex.org/subfields/2208","display_name":"Electrical and Electronic Engineering"},"field":{"id":"https://openalex.org/fields/22","display_name":"Engineering"},"domain":{"id":"https://openalex.org/domains/3","display_name":"Physical Sciences"}},"topics":[{"id":"https://openalex.org/T10323","display_name":"Analog and Mixed-Signal Circuit Design","score":0.5116999745368958,"subfield":{"id":"https://openalex.org/subfields/2208","display_name":"Electrical and Electronic Engineering"},"field":{"id":"https://openalex.org/fields/22","display_name":"Engineering"},"domain":{"id":"https://openalex.org/domains/3","display_name":"Physical Sciences"}},{"id":"https://openalex.org/T12899","display_name":"Engineering and Technology Innovations","score":0.2800000011920929,"subfield":{"id":"https://openalex.org/subfields/2208","display_name":"Electrical and Electronic Engineering"},"field":{"id":"https://openalex.org/fields/22","display_name":"Engineering"},"domain":{"id":"https://openalex.org/domains/3","display_name":"Physical Sciences"}},{"id":"https://openalex.org/T12300","display_name":"Advanced Electrical Measurement Techniques","score":0.06369999796152115,"subfield":{"id":"https://openalex.org/subfields/2208","display_name":"Electrical and Electronic Engineering"},"field":{"id":"https://openalex.org/fields/22","display_name":"Engineering"},"domain":{"id":"https://openalex.org/domains/3","display_name":"Physical Sciences"}}],"keywords":[{"id":"https://openalex.org/keywords/test-equipment","display_name":"test equipment","score":0.5479999780654907},{"id":"https://openalex.org/keywords/test-circuit","display_name":"test circuit","score":0.34299999475479126}],"concepts":[{"id":"https://openalex.org/C134146338","wikidata":"https://www.wikidata.org/wiki/Q1815901","display_name":"Electronic circuit","level":2,"score":0.6732856631278992},{"id":"https://openalex.org/C2777267654","wikidata":"https://www.wikidata.org/wiki/Q3519023","display_name":"Test (biology)","level":2,"score":0.5503888130187988},{"id":"https://openalex.org/C141842801","wikidata":"https://www.wikidata.org/wiki/Q363815","display_name":"Automatic test equipment","level":3,"score":0.5363112688064575},{"id":"https://openalex.org/C165801399","wikidata":"https://www.wikidata.org/wiki/Q25428","display_name":"Voltage","level":2,"score":0.5280157923698425},{"id":"https://openalex.org/C110706871","wikidata":"https://www.wikidata.org/wiki/Q851210","display_name":"Voltage regulator","level":3,"score":0.5084099173545837},{"id":"https://openalex.org/C177264268","wikidata":"https://www.wikidata.org/wiki/Q1514741","display_name":"Set (abstract data type)","level":2,"score":0.49857473373413086},{"id":"https://openalex.org/C41008148","wikidata":"https://www.wikidata.org/wiki/Q21198","display_name":"Computer science","level":0,"score":0.4800030589103699},{"id":"https://openalex.org/C2983725658","wikidata":"https://www.wikidata.org/wiki/Q7705768","display_name":"Test equipment","level":2,"score":0.4779106080532074},{"id":"https://openalex.org/C119599485","wikidata":"https://www.wikidata.org/wiki/Q43035","display_name":"Electrical engineering","level":1,"score":0.4315565824508667},{"id":"https://openalex.org/C2776291640","wikidata":"https://www.wikidata.org/wiki/Q2912517","display_name":"Value (mathematics)","level":2,"score":0.421217679977417},{"id":"https://openalex.org/C200601418","wikidata":"https://www.wikidata.org/wiki/Q2193887","display_name":"Reliability engineering","level":1,"score":0.41850265860557556},{"id":"https://openalex.org/C127413603","wikidata":"https://www.wikidata.org/wiki/Q11023","display_name":"Engineering","level":0,"score":0.37841153144836426},{"id":"https://openalex.org/C9390403","wikidata":"https://www.wikidata.org/wiki/Q3966","display_name":"Computer hardware","level":1,"score":0.3381253778934479},{"id":"https://openalex.org/C86803240","wikidata":"https://www.wikidata.org/wiki/Q420","display_name":"Biology","level":0,"score":0.0},{"id":"https://openalex.org/C199360897","wikidata":"https://www.wikidata.org/wiki/Q9143","display_name":"Programming language","level":1,"score":0.0},{"id":"https://openalex.org/C119857082","wikidata":"https://www.wikidata.org/wiki/Q2539","display_name":"Machine learning","level":1,"score":0.0},{"id":"https://openalex.org/C51234621","wikidata":"https://www.wikidata.org/wiki/Q2149495","display_name":"Testability","level":2,"score":0.0},{"id":"https://openalex.org/C151730666","wikidata":"https://www.wikidata.org/wiki/Q7205","display_name":"Paleontology","level":1,"score":0.0}],"mesh":[],"locations_count":1,"locations":[{"id":"mag:2393322323","doi":null,"is_oa":false,"landing_page_url":"https://en.cnki.com.cn/Article_en/CJFDTOTAL-GWDZ200507002.htm","pdf_url":null,"source":{"id":"https://openalex.org/S2764843302","display_name":"International Electronic Elements","issn_l":null,"issn":null,"is_oa":false,"is_in_doaj":false,"is_core":false,"listed_in":[],"host_organization":"https://openalex.org/P4366370411","host_organization_name":"Xi'an Sancai Technology","host_organization_lineage":["https://openalex.org/P4366370411"],"host_organization_lineage_names":["Xi'an Sancai Technology"],"type":"journal"},"license":null,"license_id":null,"version":null,"is_accepted":false,"is_published":false,"raw_source_name":"International Electronic Elements","raw_type":null}],"best_oa_location":null,"sustainable_development_goals":[],"study_designs":[],"awards":[],"funders":[],"has_content":{"pdf":false,"grobid_xml":false},"content_urls":null,"referenced_works_count":0,"referenced_works":[],"related_works":["https://openalex.org/W4240427602","https://openalex.org/W2270879509","https://openalex.org/W2158959564","https://openalex.org/W2028036756","https://openalex.org/W4413410948","https://openalex.org/W79896478","https://openalex.org/W4246513988","https://openalex.org/W4390640830","https://openalex.org/W2056512105","https://openalex.org/W2977914641"],"abstract_inverted_index":{"In":[0],"the":[1,9,13,22,34,40],"test":[2,14],"for":[3],"voltage":[4],"regulator,the":[5],"load":[6],"current":[7],"of":[8,30],"DUT":[10],"provided":[11],"by":[12],"equipment":[15],"needs":[16],"a":[17,28],"certain":[18],"delaytime":[19,41],"to":[20],"reach":[21],"provision":[23],"value.":[24],"This":[25],"article":[26],"introduces":[27],"set":[29],"circuits,":[31],"based":[32],"on":[33],"ASL-1000":[35],",":[36],"which":[37],"can":[38,48],"create":[39],"automatically.":[42],"With":[43],"accuracy":[44],"and":[45],"economy,":[46],"it":[47],"also":[49],"be":[50],"used":[51],"widely.":[52]},"counts_by_year":[],"updated_date":"2025-10-10T17:16:08.811792","created_date":"2016-06-24T00:00:00"}