{"id":"https://openalex.org/W2391587280","doi":null,"title":"Test Method for Electromagnetic Radiation Safety Margin Combined Injection with Radiation","display_name":"Test Method for Electromagnetic Radiation Safety Margin Combined Injection with Radiation","publication_year":2012,"publication_date":"2012-01-01","ids":{"openalex":"https://openalex.org/W2391587280","mag":"2391587280"},"language":"en","primary_location":{"id":"mag:2391587280","doi":null,"is_oa":false,"landing_page_url":"http://en.cnki.com.cn/Article_en/CJFDTotal-GDYJ201209011.htm","pdf_url":null,"source":{"id":"https://openalex.org/S2764603912","display_name":"Gao dianya jishu","issn_l":"1003-6520","issn":["1003-6520"],"is_oa":false,"is_in_doaj":false,"is_core":true,"listed_in":["cwts-core","poland-100","russia-white-list-2"],"host_organization":"https://openalex.org/P4310319982","host_organization_name":"Science Press","host_organization_lineage":["https://openalex.org/P4310319982"],"host_organization_lineage_names":["Science Press"],"type":"journal"},"license":null,"license_id":null,"version":null,"is_accepted":false,"is_published":false,"raw_source_name":"Gao dianya jishu","raw_type":null},"volume":null,"type":"standard","is_traditional":false,"indexed_in":[],"open_access":{"is_oa":false,"oa_status":"closed","oa_url":null,"any_repository_has_fulltext":false},"authorships":[{"author_position":"first","author":{"id":"https://openalex.org/A5080426410","display_name":"Xinfu Lu","orcid":"https://orcid.org/0000-0002-5418-8446","observed_orcids":["https://orcid.org/0000-0002-5418-8446"]},"institutions":[],"countries":[],"is_corresponding":true,"raw_author_name":"Xinfu Lu","raw_affiliation_strings":["Research Institute of Electrostatic and Electromagnetic Protection,Mechanical Engineering College, Shijiazhuang 050003,China)"],"raw_orcid":null,"affiliations":[{"raw_affiliation_string":"Research Institute of Electrostatic and Electromagnetic Protection,Mechanical Engineering College, Shijiazhuang 050003,China)","institution_ids":[]}]}],"institutions":[],"countries_distinct_count":0,"institutions_distinct_count":0,"corresponding_author_ids":["https://openalex.org/A5080426410"],"corresponding_institution_ids":[],"apc_list":null,"apc_paid":null,"fwci":null,"has_fulltext":false,"cited_by_count":2,"citation_normalized_percentile":null,"cited_by_percentile_year":null,"biblio":{"volume":null,"issue":null,"first_page":null,"last_page":null},"is_retracted":false,"is_paratext":false,"is_xpac":false,"primary_topic":{"id":"https://openalex.org/T11851","display_name":"Electromagnetic Compatibility and Measurements","score":0.9922000169754028,"subfield":{"id":"https://openalex.org/subfields/2208","display_name":"Electrical and Electronic Engineering"},"field":{"id":"https://openalex.org/fields/22","display_name":"Engineering"},"domain":{"id":"https://openalex.org/domains/3","display_name":"Physical Sciences"}},"topics":[{"id":"https://openalex.org/T11851","display_name":"Electromagnetic Compatibility and Measurements","score":0.9922000169754028,"subfield":{"id":"https://openalex.org/subfields/2208","display_name":"Electrical and Electronic Engineering"},"field":{"id":"https://openalex.org/fields/22","display_name":"Engineering"},"domain":{"id":"https://openalex.org/domains/3","display_name":"Physical Sciences"}},{"id":"https://openalex.org/T11444","display_name":"Electromagnetic Compatibility and Noise Suppression","score":0.007499999832361937,"subfield":{"id":"https://openalex.org/subfields/2208","display_name":"Electrical and Electronic Engineering"},"field":{"id":"https://openalex.org/fields/22","display_name":"Engineering"},"domain":{"id":"https://openalex.org/domains/3","display_name":"Physical Sciences"}},{"id":"https://openalex.org/T10069","display_name":"Antenna Design and Analysis","score":0.0,"subfield":{"id":"https://openalex.org/subfields/2208","display_name":"Electrical and Electronic Engineering"},"field":{"id":"https://openalex.org/fields/22","display_name":"Engineering"},"domain":{"id":"https://openalex.org/domains/3","display_name":"Physical Sciences"}}],"keywords":[{"id":"https://openalex.org/keywords/electromagnetic-compatibility","display_name":"electromagnetic compatibility","score":0.7089999914169312},{"id":"https://openalex.org/keywords/electromagnetic-susceptibility-testing","display_name":"electromagnetic susceptibility testing","score":0.8920000195503235},{"id":"https://openalex.org/keywords/injection-tests","display_name":"injection tests","score":0.36000001430511475},{"id":"https://openalex.org/keywords/s-parameters","display_name":"S-parameters","score":0.8379999995231628}],"concepts":[{"id":"https://openalex.org/C125470083","wikidata":"https://www.wikidata.org/wiki/Q747288","display_name":"Electromagnetic compatibility","level":2,"score":0.6166669130325317},{"id":"https://openalex.org/C147584655","wikidata":"https://www.wikidata.org/wiki/Q1474513","display_name":"Conducted electromagnetic interference","level":4,"score":0.5016803741455078},{"id":"https://openalex.org/C153385146","wikidata":"https://www.wikidata.org/wiki/Q18335","display_name":"Radiation","level":2,"score":0.49132099747657776},{"id":"https://openalex.org/C165801399","wikidata":"https://www.wikidata.org/wiki/Q25428","display_name":"Voltage","level":2,"score":0.4278736114501953},{"id":"https://openalex.org/C28843909","wikidata":"https://www.wikidata.org/wiki/Q177625","display_name":"Electromagnetic field","level":2,"score":0.41710221767425537},{"id":"https://openalex.org/C127413603","wikidata":"https://www.wikidata.org/wiki/Q11023","display_name":"Engineering","level":0,"score":0.3947064280509949},{"id":"https://openalex.org/C184892835","wikidata":"https://www.wikidata.org/wiki/Q1474513","display_name":"Electromagnetic interference","level":2,"score":0.380293607711792},{"id":"https://openalex.org/C119599485","wikidata":"https://www.wikidata.org/wiki/Q43035","display_name":"Electrical engineering","level":1,"score":0.34449878334999084},{"id":"https://openalex.org/C24326235","wikidata":"https://www.wikidata.org/wiki/Q126095","display_name":"Electronic engineering","level":1,"score":0.3401811718940735},{"id":"https://openalex.org/C121332964","wikidata":"https://www.wikidata.org/wiki/Q413","display_name":"Physics","level":0,"score":0.2875165343284607},{"id":"https://openalex.org/C120665830","wikidata":"https://www.wikidata.org/wiki/Q14620","display_name":"Optics","level":1,"score":0.1995631754398346},{"id":"https://openalex.org/C43461449","wikidata":"https://www.wikidata.org/wiki/Q2495531","display_name":"EMI","level":3,"score":0.16362938284873962},{"id":"https://openalex.org/C62520636","wikidata":"https://www.wikidata.org/wiki/Q944","display_name":"Quantum mechanics","level":1,"score":0.0}],"mesh":[],"locations_count":1,"locations":[{"id":"mag:2391587280","doi":null,"is_oa":false,"landing_page_url":"http://en.cnki.com.cn/Article_en/CJFDTotal-GDYJ201209011.htm","pdf_url":null,"source":{"id":"https://openalex.org/S2764603912","display_name":"Gao dianya jishu","issn_l":"1003-6520","issn":["1003-6520"],"is_oa":false,"is_in_doaj":false,"is_core":true,"listed_in":["cwts-core","poland-100","russia-white-list-2"],"host_organization":"https://openalex.org/P4310319982","host_organization_name":"Science Press","host_organization_lineage":["https://openalex.org/P4310319982"],"host_organization_lineage_names":["Science Press"],"type":"journal"},"license":null,"license_id":null,"version":null,"is_accepted":false,"is_published":false,"raw_source_name":"Gao dianya jishu","raw_type":null}],"best_oa_location":null,"sustainable_development_goals":[],"study_designs":[],"awards":[],"funders":[],"has_content":{"pdf":false,"grobid_xml":false},"content_urls":null,"referenced_works_count":0,"referenced_works":[],"related_works":["https://openalex.org/W2382780949","https://openalex.org/W2371696837","https://openalex.org/W4405104202","https://openalex.org/W1987087277","https://openalex.org/W2541803692","https://openalex.org/W4408565703","https://openalex.org/W1989756366","https://openalex.org/W4407361803","https://openalex.org/W2098198549","https://openalex.org/W2089460070"],"abstract_inverted_index":{"As":[0],"to":[1],"the":[2,14,36,41,50,54,117],"technology":[3],"requirements":[4],"of":[5,73,84,119,135],"electromagnetic":[6,19,26,136],"compatibility":[7],"and":[8,59,113,129],"protection":[9],"performance":[10],"test":[11,21,30,82,140],"for":[12,91],"system,considering":[13],"problems":[15],"existed":[16],"in":[17],"traditional":[18],"susceptibility":[20],"method,we":[22],"put":[23,98],"forward":[24],"an":[25,88],"radiation":[27,60,92,114,137,145],"safety":[28,138],"margin":[29,139],"method":[31,83,141],"combined":[32,142],"injection":[33,58,86,112,130,143],"with":[34,76,144],"radiation.Considering":[35],"equal":[37,120],"response":[38],"voltage":[39,131],"on":[40,53,94],"equipment":[42,107],"input":[43],"port":[44],"as":[45,87,106],"equivalent":[46,89],"principle":[47],"rather":[48],"than":[49],"distributive":[51],"current":[52],"cable,the":[55],"equivalence":[56],"between":[57,125],"was":[61,79,97,104,132,146],"theoretically":[62],"analyzed.By":[63],"adopting":[64],"antisymmetric":[65],"directional":[66],"coupler":[67],"cascade":[68],"design":[69],"scheme,the":[70],"S":[71],"parameter":[72],"coupling":[74,95],"module":[75,96],"six":[77],"ports":[78],"calculated.Moreover,the":[80],"effect":[81,115],"using":[85],"substitute":[90],"based":[93],"forward.The":[99],"typical":[100],"antenna":[101],"receiving":[102],"system":[103],"selected":[105],"under":[108],"test.By":[109],"carrying":[110],"out":[111],"test,under":[116],"condition":[118],"output":[121],"response,the":[122],"curvilinear":[123],"relation":[124],"radiated":[126],"field":[127],"intensity":[128],"determined.The":[133],"validity":[134],"verified.":[147]},"counts_by_year":[{"year":2021,"cited_by_count":2}],"updated_date":"2026-09-21T07:43:02.447757","created_date":"2016-06-24T00:00:00"}