{"id":"https://openalex.org/W2390558538","doi":null,"title":"The Research on Yarn\u2019s Instrument of Real Images","display_name":"The Research on Yarn\u2019s Instrument of Real Images","publication_year":2005,"publication_date":"2005-01-01","ids":{"openalex":"https://openalex.org/W2390558538","mag":"2390558538"},"language":"en","primary_location":{"id":"mag:2390558538","doi":null,"is_oa":false,"landing_page_url":"https://en.cnki.com.cn/Article_en/CJFDTOTAL-AYXB200503006.htm","pdf_url":null,"source":{"id":"https://openalex.org/S2764754870","display_name":"Journal of Anyang University","issn_l":null,"issn":null,"is_oa":false,"is_in_doaj":false,"is_core":false,"listed_in":[],"host_organization":null,"host_organization_name":null,"host_organization_lineage":[],"host_organization_lineage_names":[],"type":"journal"},"license":null,"license_id":null,"version":null,"is_accepted":false,"is_published":false,"raw_source_name":"Journal of Anyang University","raw_type":null},"volume":null,"type":"article","is_traditional":true,"indexed_in":[],"open_access":{"is_oa":false,"oa_status":"closed","oa_url":null,"any_repository_has_fulltext":false},"authorships":[{"author_position":"first","author":{"id":"https://openalex.org/A5053516866","display_name":"XU Shan-sheng","orcid":null,"observed_orcids":[]},"institutions":[{"id":"https://openalex.org/I4210146051","display_name":"Anyang Institute of Technology","ror":"https://ror.org/03sd3t490","country_code":"CN","type":"education","lineage":["https://openalex.org/I4210146051"]}],"countries":["CN"],"is_corresponding":true,"raw_author_name":"XU Shan-sheng","raw_affiliation_strings":["Anyang Institute of Technology, Aanyang 455000, China)"],"raw_orcid":null,"affiliations":[{"raw_affiliation_string":"Anyang Institute of Technology, Aanyang 455000, China)","institution_ids":["https://openalex.org/I4210146051"]}]}],"institutions":[],"countries_distinct_count":1,"institutions_distinct_count":1,"corresponding_author_ids":["https://openalex.org/A5053516866"],"corresponding_institution_ids":["https://openalex.org/I4210146051"],"apc_list":null,"apc_paid":null,"fwci":0.0,"has_fulltext":false,"cited_by_count":2,"citation_normalized_percentile":{"value":0.60873626,"is_in_top_1_percent":false,"is_in_top_10_percent":false},"cited_by_percentile_year":null,"biblio":{"volume":null,"issue":null,"first_page":null,"last_page":null},"is_retracted":false,"is_paratext":false,"is_xpac":false,"primary_topic":{"id":"https://openalex.org/T12111","display_name":"Industrial Vision Systems and Defect Detection","score":0.9843999743461609,"subfield":{"id":"https://openalex.org/subfields/2209","display_name":"Industrial and Manufacturing Engineering"},"field":{"id":"https://openalex.org/fields/22","display_name":"Engineering"},"domain":{"id":"https://openalex.org/domains/3","display_name":"Physical Sciences"}},"topics":[{"id":"https://openalex.org/T12111","display_name":"Industrial Vision Systems and Defect Detection","score":0.9843999743461609,"subfield":{"id":"https://openalex.org/subfields/2209","display_name":"Industrial and Manufacturing Engineering"},"field":{"id":"https://openalex.org/fields/22","display_name":"Engineering"},"domain":{"id":"https://openalex.org/domains/3","display_name":"Physical Sciences"}},{"id":"https://openalex.org/T12941","display_name":"Embedded Systems and FPGA Design","score":0.005900000222027302,"subfield":{"id":"https://openalex.org/subfields/2207","display_name":"Control and Systems Engineering"},"field":{"id":"https://openalex.org/fields/22","display_name":"Engineering"},"domain":{"id":"https://openalex.org/domains/3","display_name":"Physical Sciences"}},{"id":"https://openalex.org/T14257","display_name":"Advanced Measurement and Detection Methods","score":0.00279999990016222,"subfield":{"id":"https://openalex.org/subfields/2208","display_name":"Electrical and Electronic Engineering"},"field":{"id":"https://openalex.org/fields/22","display_name":"Engineering"},"domain":{"id":"https://openalex.org/domains/3","display_name":"Physical Sciences"}}],"keywords":[{"id":"https://openalex.org/keywords/yarn-evenness","display_name":"yarn evenness","score":0.5680000185966492},{"id":"https://openalex.org/keywords/yarn-diameter-measurement","display_name":"yarn diameter measurement","score":0.6919999718666077},{"id":"https://openalex.org/keywords/real-time-image-processing","display_name":"real-time image processing","score":0.6819999814033508}],"concepts":[{"id":"https://openalex.org/C2778787235","wikidata":"https://www.wikidata.org/wiki/Q49007","display_name":"Yarn","level":2,"score":0.9011519551277161},{"id":"https://openalex.org/C132090242","wikidata":"https://www.wikidata.org/wiki/Q32738","display_name":"Microcomputer","level":3,"score":0.7481997609138489},{"id":"https://openalex.org/C113843644","wikidata":"https://www.wikidata.org/wiki/Q901882","display_name":"Interface (matter)","level":4,"score":0.6457250714302063},{"id":"https://openalex.org/C121684516","wikidata":"https://www.wikidata.org/wiki/Q7600677","display_name":"Computer graphics (images)","level":1,"score":0.6188510656356812},{"id":"https://openalex.org/C9390403","wikidata":"https://www.wikidata.org/wiki/Q3966","display_name":"Computer hardware","level":1,"score":0.569627046585083},{"id":"https://openalex.org/C9417928","wikidata":"https://www.wikidata.org/wiki/Q1070689","display_name":"Image processing","level":3,"score":0.5089645385742188},{"id":"https://openalex.org/C41008148","wikidata":"https://www.wikidata.org/wiki/Q21198","display_name":"Computer science","level":0,"score":0.4798804819583893},{"id":"https://openalex.org/C31972630","wikidata":"https://www.wikidata.org/wiki/Q844240","display_name":"Computer vision","level":1,"score":0.46675586700439453},{"id":"https://openalex.org/C198352243","wikidata":"https://www.wikidata.org/wiki/Q37105","display_name":"Line (geometry)","level":2,"score":0.43034207820892334},{"id":"https://openalex.org/C154945302","wikidata":"https://www.wikidata.org/wiki/Q11660","display_name":"Artificial intelligence","level":1,"score":0.4016834795475006},{"id":"https://openalex.org/C165005293","wikidata":"https://www.wikidata.org/wiki/Q1074500","display_name":"Chip","level":2,"score":0.3855614960193634},{"id":"https://openalex.org/C127413603","wikidata":"https://www.wikidata.org/wiki/Q11023","display_name":"Engineering","level":0,"score":0.3236551880836487},{"id":"https://openalex.org/C115961682","wikidata":"https://www.wikidata.org/wiki/Q860623","display_name":"Image (mathematics)","level":2,"score":0.14282259345054626},{"id":"https://openalex.org/C111919701","wikidata":"https://www.wikidata.org/wiki/Q9135","display_name":"Operating system","level":1,"score":0.09209907054901123},{"id":"https://openalex.org/C33923547","wikidata":"https://www.wikidata.org/wiki/Q395","display_name":"Mathematics","level":0,"score":0.07742640376091003},{"id":"https://openalex.org/C78519656","wikidata":"https://www.wikidata.org/wiki/Q101333","display_name":"Mechanical engineering","level":1,"score":0.066769540309906},{"id":"https://openalex.org/C76155785","wikidata":"https://www.wikidata.org/wiki/Q418","display_name":"Telecommunications","level":1,"score":0.0},{"id":"https://openalex.org/C129307140","wikidata":"https://www.wikidata.org/wiki/Q6795880","display_name":"Maximum bubble pressure method","level":3,"score":0.0},{"id":"https://openalex.org/C157915830","wikidata":"https://www.wikidata.org/wiki/Q2928001","display_name":"Bubble","level":2,"score":0.0},{"id":"https://openalex.org/C2524010","wikidata":"https://www.wikidata.org/wiki/Q8087","display_name":"Geometry","level":1,"score":0.0}],"mesh":[],"locations_count":1,"locations":[{"id":"mag:2390558538","doi":null,"is_oa":false,"landing_page_url":"https://en.cnki.com.cn/Article_en/CJFDTOTAL-AYXB200503006.htm","pdf_url":null,"source":{"id":"https://openalex.org/S2764754870","display_name":"Journal of Anyang University","issn_l":null,"issn":null,"is_oa":false,"is_in_doaj":false,"is_core":false,"listed_in":[],"host_organization":null,"host_organization_name":null,"host_organization_lineage":[],"host_organization_lineage_names":[],"type":"journal"},"license":null,"license_id":null,"version":null,"is_accepted":false,"is_published":false,"raw_source_name":"Journal of Anyang University","raw_type":null}],"best_oa_location":null,"sustainable_development_goals":[],"study_designs":[],"awards":[],"funders":[],"has_content":{"pdf":false,"grobid_xml":false},"content_urls":null,"referenced_works_count":0,"referenced_works":[],"related_works":["https://openalex.org/W2547200316","https://openalex.org/W2373662798","https://openalex.org/W1985157862","https://openalex.org/W2022937467","https://openalex.org/W2047769460","https://openalex.org/W2089327156","https://openalex.org/W6904180635","https://openalex.org/W2065670853","https://openalex.org/W2184517834","https://openalex.org/W2010905813"],"abstract_inverted_index":{"Yarn\u2019s":[0],"instrument":[1],"of":[2,12,19,46,85,95],"real":[3,49,80],"image":[4],"is":[5,14,40,84],"mainly":[6],"used":[7,41,92],"to":[8,34,42,57,59],"test":[9],"if":[10],"appearance":[11],"yarn":[13,47],"even.":[15],"The":[16,51,82],"system":[17,83],"consists":[18],"computer":[20],"(PC)":[21],"and":[22,31,64,89],"single":[23],"chip":[24],"microcomputer":[25],"(TMS320C25),":[26],"line":[27],"scanning":[28],"CCD":[29],"camera":[30],"their":[32],"interface":[33],"PC,":[35],"special":[36],"hardware":[37],"unit":[38],"that":[39],"detect":[43],"the":[44,67,73],"diameter":[45],"in":[48,79,93],"time.":[50,81],"acquired":[52],"data":[53,69],"would":[54,76],"be":[55,77,91],"sent":[56],"C25":[58,65],"make":[60],"initial":[61],"processing.":[62,70],"PC":[63],"harmonize":[66],"following":[68],"Then":[71],"all":[72],"required":[74],"results":[75],"outputted":[78],"a":[86],"wide":[87],"use":[88],"could":[90],"detection":[94],"barred":[96],"images.":[97]},"counts_by_year":[],"updated_date":"2025-10-10T17:16:08.811792","created_date":"2016-06-24T00:00:00"}