{"id":"https://openalex.org/W2377551998","doi":null,"title":"Analysis of Influencing Factors on Critical Load of Adhesion Strength in Scratch Test","display_name":"Analysis of Influencing Factors on Critical Load of Adhesion Strength in Scratch Test","publication_year":2015,"publication_date":"2015-01-01","ids":{"openalex":"https://openalex.org/W2377551998","mag":"2377551998"},"language":"en","primary_location":{"id":"mag:2377551998","doi":null,"is_oa":false,"landing_page_url":"https://en.cnki.com.cn/Article_en/CJFDTotal-BMJS201509022.htm","pdf_url":null,"source":{"id":"https://openalex.org/S191474129","display_name":"Surface Technology","issn_l":"0376-4583","issn":["0376-4583","1878-1063"],"is_oa":false,"is_in_doaj":false,"is_core":false,"listed_in":[],"host_organization":"https://openalex.org/P4310320990","host_organization_name":"Elsevier BV","host_organization_lineage":["https://openalex.org/P4310320990"],"host_organization_lineage_names":["Elsevier BV"],"type":"journal"},"license":null,"license_id":null,"version":null,"is_accepted":false,"is_published":false,"raw_source_name":"Surface Technology","raw_type":null},"volume":null,"type":"article","indexed_in":[],"open_access":{"is_oa":false,"oa_status":"closed","oa_url":null,"any_repository_has_fulltext":false},"authorships":[{"author_position":"first","author":{"id":"https://openalex.org/A5100524986","display_name":"Du Ju","orcid":null,"observed_orcids":[]},"institutions":[],"countries":[],"is_corresponding":true,"raw_author_name":"Du Ju","raw_affiliation_strings":["National Key Laboratory for Remanufacturing,Academy of Armored Force Engineering"],"raw_orcid":null,"affiliations":[{"raw_affiliation_string":"National Key Laboratory for Remanufacturing,Academy of Armored Force Engineering","institution_ids":[]}]}],"institutions":[],"countries_distinct_count":0,"institutions_distinct_count":0,"corresponding_author_ids":["https://openalex.org/A5100524986"],"corresponding_institution_ids":[],"apc_list":null,"apc_paid":null,"fwci":0.0,"has_fulltext":false,"cited_by_count":5,"citation_normalized_percentile":{"value":0.21578543,"is_in_top_1_percent":false,"is_in_top_10_percent":false},"cited_by_percentile_year":{"min":88,"max":94},"biblio":{"volume":null,"issue":null,"first_page":null,"last_page":null},"is_retracted":false,"is_paratext":false,"is_xpac":false,"primary_topic":{"id":"https://openalex.org/T10377","display_name":"Metal and Thin Film Mechanics","score":1.0,"subfield":{"id":"https://openalex.org/subfields/2211","display_name":"Mechanics of Materials"},"field":{"id":"https://openalex.org/fields/22","display_name":"Engineering"},"domain":{"id":"https://openalex.org/domains/3","display_name":"Physical Sciences"}},"topics":[{"id":"https://openalex.org/T10377","display_name":"Metal and Thin Film Mechanics","score":1.0,"subfield":{"id":"https://openalex.org/subfields/2211","display_name":"Mechanics of Materials"},"field":{"id":"https://openalex.org/fields/22","display_name":"Engineering"},"domain":{"id":"https://openalex.org/domains/3","display_name":"Physical Sciences"}},{"id":"https://openalex.org/T11799","display_name":"Adhesion, Friction, and Surface Interactions","score":0.0,"subfield":{"id":"https://openalex.org/subfields/2211","display_name":"Mechanics of Materials"},"field":{"id":"https://openalex.org/fields/22","display_name":"Engineering"},"domain":{"id":"https://openalex.org/domains/3","display_name":"Physical Sciences"}},{"id":"https://openalex.org/T10923","display_name":"Force Microscopy Techniques and Applications","score":0.0,"subfield":{"id":"https://openalex.org/subfields/3107","display_name":"Atomic and Molecular Physics, and Optics"},"field":{"id":"https://openalex.org/fields/31","display_name":"Physics and Astronomy"},"domain":{"id":"https://openalex.org/domains/3","display_name":"Physical Sciences"}}],"keywords":[{"id":"https://openalex.org/keywords/adhesion-strength","display_name":"adhesion strength","score":0.9070000052452087},{"id":"https://openalex.org/keywords/critical-load","display_name":"critical load","score":0.6460000276565552},{"id":"https://openalex.org/keywords/scratch-test","display_name":"scratch test","score":0.9549999833106995},{"id":"https://openalex.org/keywords/titanium-nitride-thin-films","display_name":"titanium nitride thin films","score":0.902999997138977},{"id":"https://openalex.org/keywords/aisi-304-stainless-steel-substrate","display_name":"304 stainless steel substrate","score":0.8379999995231628},{"id":"https://openalex.org/keywords/acoustic-emission","display_name":"acoustic emission","score":0.8859999775886536},{"id":"https://openalex.org/keywords/failure-modes","display_name":"failure modes","score":0.7390000224113464},{"id":"https://openalex.org/keywords/loading-rate","display_name":"loading rate","score":0.9829999804496765},{"id":"https://openalex.org/keywords/film-hardness","display_name":"film hardness","score":0.6600000262260437}],"concepts":[{"id":"https://openalex.org/C2781235140","wikidata":"https://www.wikidata.org/wiki/Q275131","display_name":"Scratch","level":2,"score":0.8618248701095581},{"id":"https://openalex.org/C192562407","wikidata":"https://www.wikidata.org/wiki/Q228736","display_name":"Materials science","level":0,"score":0.8235553503036499},{"id":"https://openalex.org/C159985019","wikidata":"https://www.wikidata.org/wiki/Q181790","display_name":"Composite material","level":1,"score":0.679938793182373},{"id":"https://openalex.org/C160671074","wikidata":"https://www.wikidata.org/wiki/Q267131","display_name":"Wafer","level":2,"score":0.6528567671775818},{"id":"https://openalex.org/C2777457327","wikidata":"https://www.wikidata.org/wiki/Q11254316","display_name":"Critical load","level":3,"score":0.6262547969818115},{"id":"https://openalex.org/C2777503765","wikidata":"https://www.wikidata.org/wiki/Q411472","display_name":"Polyethylene naphthalate","level":3,"score":0.4279312789440155},{"id":"https://openalex.org/C26771246","wikidata":"https://www.wikidata.org/wiki/Q321095","display_name":"Scanning electron microscope","level":2,"score":0.42204374074935913},{"id":"https://openalex.org/C84416704","wikidata":"https://www.wikidata.org/wiki/Q188666","display_name":"Adhesion","level":2,"score":0.410984605550766},{"id":"https://openalex.org/C171250308","wikidata":"https://www.wikidata.org/wiki/Q11468","display_name":"Nanotechnology","level":1,"score":0.14584946632385254},{"id":"https://openalex.org/C2779227376","wikidata":"https://www.wikidata.org/wiki/Q6505497","display_name":"Layer (electronics)","level":2,"score":0.10985377430915833},{"id":"https://openalex.org/C85476182","wikidata":"https://www.wikidata.org/wiki/Q693104","display_name":"Buckling","level":2,"score":0.06606349349021912}],"mesh":[],"locations_count":1,"locations":[{"id":"mag:2377551998","doi":null,"is_oa":false,"landing_page_url":"https://en.cnki.com.cn/Article_en/CJFDTotal-BMJS201509022.htm","pdf_url":null,"source":{"id":"https://openalex.org/S191474129","display_name":"Surface Technology","issn_l":"0376-4583","issn":["0376-4583","1878-1063"],"is_oa":false,"is_in_doaj":false,"is_core":false,"listed_in":[],"host_organization":"https://openalex.org/P4310320990","host_organization_name":"Elsevier BV","host_organization_lineage":["https://openalex.org/P4310320990"],"host_organization_lineage_names":["Elsevier BV"],"type":"journal"},"license":null,"license_id":null,"version":null,"is_accepted":false,"is_published":false,"raw_source_name":"Surface Technology","raw_type":null}],"best_oa_location":null,"sustainable_development_goals":[],"study_designs":[],"awards":[],"funders":[],"has_content":{"pdf":false,"grobid_xml":false},"content_urls":null,"referenced_works_count":0,"referenced_works":[],"related_works":["https://openalex.org/W2092280442","https://openalex.org/W2319757748","https://openalex.org/W2093149547","https://openalex.org/W2063673973","https://openalex.org/W4220700405","https://openalex.org/W2318369915","https://openalex.org/W2003267918","https://openalex.org/W1993230983","https://openalex.org/W2512820785","https://openalex.org/W2387102208"],"abstract_inverted_index":{"Objective":[0],"In":[1,193],"order":[2,194],"to":[3,195,200],"determine":[4],"precise":[5],"adhesion":[6,67,198,248],"strength":[7,68,249],"of":[8,12,14,50,76,100,106,130,161,172,223,250],"hard":[9,123],"film,the":[10],"effects":[11],"parameters":[13],"scratch":[15,72,210,243],"test":[16],"on":[17,34,83],"the":[18,74,84,115,141,149,169,179,242,247],"critical":[19,85],"failure":[20,176,202],"load":[21,86,217],"were":[22,54,87],"studied":[23,70],"and":[24,39,48,80,114,125,154,174,184],"discussed.":[25],"Methods":[26],"Titanium":[27],"Nitride(":[28],"Ti":[29,51,91,107,116,252],"N)":[30,153,183],"film":[31,53,93,109,124,254],"was":[32,62,69,110,122,255],"deposited":[33],"304":[35],"stainless":[36,119],"steel":[37,120],"plates":[38],"Si":[40],"wafer":[41],"by":[42,56,64,71],"magnetron":[43],"sputtering.":[44],"The":[45,104,128],"cross-section":[46],"morphology":[47,96],"thickness":[49,99],"N":[52,92,108,117,229,253],"observed":[55,207],"Scanning":[57],"Electric":[58],"Microscopy(":[59],"SEM),the":[60],"hardness":[61,105],"evaluated":[63],"nano-indentation":[65],"method,the":[66],"tester,and":[73],"influences":[75],"slide":[77,131,155,162,185],"length,slide":[78],"speed":[79],"loading":[81],"rate":[82],"analyzed.":[88],"Results":[89],"As-deposited":[90],"possessed":[94],"dense":[95],"with":[97,212,241],"a":[98],"about":[101,111],"2":[102],"\u03bcm.":[103],"2300":[112],"HV":[113],"/304":[118],"system":[121],"soft":[126],"substrate.":[127],"increase":[129,160],"speed(":[132,186],"1":[133],"~":[134,165],"3":[135,157,164,187],"mm":[136,188],"/":[137,189],"min)":[138,190],"resulted":[139,167],"in":[140,168,208],"first":[142],"acoustic":[143],"emission(":[144],"AE)":[145],"signal":[146,231],"delay":[147],"under":[148,178,236],"same":[150,180],"load(":[151,181],"10":[152,182],"length(":[156,163],"mm)":[158],"conditions,the":[159],"9mm)":[166],"gradual":[170],"weakening":[171],"III":[173],"IV":[175,201],"mode":[177,203],"conditions.":[191],"Conclusion":[192],"evaluate":[196],"ideal":[197],"strength,I":[199],"appearance":[204],"should":[205],"be":[206],"single":[209],"path":[211],"specific":[213],"AE":[214,230],"signal.":[215],"Critical":[216],"repeated":[218],"itself":[219],"within":[220],"proper":[221],"range":[222],"testing":[224],"parameters.":[225],"Position":[226],"4.":[227,256],"9":[228,257],"appeared":[232],"during":[233],"several":[234],"tests":[235],"different":[237],"setting":[238],"parameters,in":[239],"combination":[240],"morphology,it":[244],"clarified":[245],"that":[246],"as-deposited":[251],"N.":[258]},"counts_by_year":[{"year":2024,"cited_by_count":1},{"year":2023,"cited_by_count":1},{"year":2022,"cited_by_count":1},{"year":2021,"cited_by_count":1},{"year":2019,"cited_by_count":1}],"updated_date":"2026-10-12T09:40:04.860316","created_date":"2016-06-24T00:00:00"}