{"id":"https://openalex.org/W2351242819","doi":null,"title":"Testing Maturity Model","display_name":"Testing Maturity Model","publication_year":2003,"publication_date":"2003-01-01","ids":{"openalex":"https://openalex.org/W2351242819","mag":"2351242819"},"language":"en","primary_location":{"id":"mag:2351242819","doi":null,"is_oa":false,"landing_page_url":"https://en.cnki.com.cn/Article_en/CJFDTotal-JSJC200315042.htm","pdf_url":null,"source":null,"license":null,"license_id":null,"version":null,"is_accepted":false,"is_published":false,"raw_source_name":null,"raw_type":null},"volume":null,"type":"article","is_traditional":true,"indexed_in":[],"open_access":{"is_oa":false,"oa_status":"closed","oa_url":null,"any_repository_has_fulltext":false},"authorships":[{"author_position":"first","author":{"id":"https://openalex.org/A5100930465","display_name":"Hu Jingyu","orcid":null,"observed_orcids":[]},"institutions":[],"countries":[],"is_corresponding":true,"raw_author_name":"Hu Jingyu","raw_affiliation_strings":["China Electronic Device System Engineering Company , Beijing 100039  )"],"raw_orcid":null,"affiliations":[{"raw_affiliation_string":"China Electronic Device System Engineering Company , Beijing 100039  )","institution_ids":[]}]}],"institutions":[],"countries_distinct_count":0,"institutions_distinct_count":0,"corresponding_author_ids":["https://openalex.org/A5100930465"],"corresponding_institution_ids":[],"apc_list":null,"apc_paid":null,"fwci":0.0,"has_fulltext":false,"cited_by_count":0,"citation_normalized_percentile":{"value":0.0,"is_in_top_1_percent":false,"is_in_top_10_percent":false},"cited_by_percentile_year":null,"biblio":{"volume":null,"issue":null,"first_page":null,"last_page":null},"is_retracted":false,"is_paratext":false,"is_xpac":false,"primary_topic":{"id":"https://openalex.org/T10430","display_name":"Software Engineering Techniques and Practices","score":0.7035999894142151,"subfield":{"id":"https://openalex.org/subfields/1710","display_name":"Information Systems"},"field":{"id":"https://openalex.org/fields/17","display_name":"Computer Science"},"domain":{"id":"https://openalex.org/domains/3","display_name":"Physical Sciences"}},"topics":[{"id":"https://openalex.org/T10430","display_name":"Software Engineering Techniques and Practices","score":0.7035999894142151,"subfield":{"id":"https://openalex.org/subfields/1710","display_name":"Information Systems"},"field":{"id":"https://openalex.org/fields/17","display_name":"Computer Science"},"domain":{"id":"https://openalex.org/domains/3","display_name":"Physical Sciences"}},{"id":"https://openalex.org/T10743","display_name":"Software Testing and Debugging Techniques","score":0.2833999991416931,"subfield":{"id":"https://openalex.org/subfields/1712","display_name":"Software"},"field":{"id":"https://openalex.org/fields/17","display_name":"Computer Science"},"domain":{"id":"https://openalex.org/domains/3","display_name":"Physical Sciences"}},{"id":"https://openalex.org/T12127","display_name":"Software System Performance and Reliability","score":0.0008999999845400453,"subfield":{"id":"https://openalex.org/subfields/1705","display_name":"Computer Networks and Communications"},"field":{"id":"https://openalex.org/fields/17","display_name":"Computer Science"},"domain":{"id":"https://openalex.org/domains/3","display_name":"Physical Sciences"}}],"keywords":[{"id":"https://openalex.org/keywords/software-testing","display_name":"software testing","score":0.7919999957084656},{"id":"https://openalex.org/keywords/software-capability-maturity-model","display_name":"software capability maturity model","score":0.921999990940094},{"id":"https://openalex.org/keywords/software-testing-process","display_name":"software testing process","score":0.42500001192092896},{"id":"https://openalex.org/keywords/organizational-maturity-levels","display_name":"organizational maturity levels","score":0.7200000286102295},{"id":"https://openalex.org/keywords/software-process-improvement","display_name":"software process improvement","score":0.4779999852180481}],"concepts":[{"id":"https://openalex.org/C101433766","wikidata":"https://www.wikidata.org/wiki/Q3543263","display_name":"Maturity (psychological)","level":2,"score":0.9094505310058594},{"id":"https://openalex.org/C85890633","wikidata":"https://www.wikidata.org/wiki/Q929673","display_name":"Capability Maturity Model","level":3,"score":0.8943825960159302},{"id":"https://openalex.org/C41008148","wikidata":"https://www.wikidata.org/wiki/Q21198","display_name":"Computer science","level":0,"score":0.7173337340354919},{"id":"https://openalex.org/C73890322","wikidata":"https://www.wikidata.org/wiki/Q7455693","display_name":"Service Integration Maturity Model","level":4,"score":0.702796220779419},{"id":"https://openalex.org/C68269808","wikidata":"https://www.wikidata.org/wiki/Q17096559","display_name":"LeanCMMI","level":5,"score":0.5154081583023071},{"id":"https://openalex.org/C2777904410","wikidata":"https://www.wikidata.org/wiki/Q7397","display_name":"Software","level":2,"score":0.3369819223880768},{"id":"https://openalex.org/C115903868","wikidata":"https://www.wikidata.org/wiki/Q80993","display_name":"Software engineering","level":1,"score":0.3260478079319},{"id":"https://openalex.org/C117447612","wikidata":"https://www.wikidata.org/wiki/Q1412670","display_name":"Software quality","level":4,"score":0.20929256081581116},{"id":"https://openalex.org/C529173508","wikidata":"https://www.wikidata.org/wiki/Q638608","display_name":"Software development","level":3,"score":0.1578158140182495},{"id":"https://openalex.org/C15744967","wikidata":"https://www.wikidata.org/wiki/Q9418","display_name":"Psychology","level":0,"score":0.09011059999465942},{"id":"https://openalex.org/C111919701","wikidata":"https://www.wikidata.org/wiki/Q9135","display_name":"Operating system","level":1,"score":0.0851474404335022},{"id":"https://openalex.org/C138496976","wikidata":"https://www.wikidata.org/wiki/Q175002","display_name":"Developmental psychology","level":1,"score":0.0}],"mesh":[],"locations_count":1,"locations":[{"id":"mag:2351242819","doi":null,"is_oa":false,"landing_page_url":"https://en.cnki.com.cn/Article_en/CJFDTotal-JSJC200315042.htm","pdf_url":null,"source":null,"license":null,"license_id":null,"version":null,"is_accepted":false,"is_published":false,"raw_source_name":null,"raw_type":null}],"best_oa_location":null,"sustainable_development_goals":[],"study_designs":[],"awards":[],"funders":[],"has_content":{"grobid_xml":false,"pdf":false},"content_urls":null,"referenced_works_count":0,"referenced_works":[],"related_works":["https://openalex.org/W2367035037","https://openalex.org/W2502453266","https://openalex.org/W2344860509","https://openalex.org/W174203187","https://openalex.org/W1853584165","https://openalex.org/W3129262778","https://openalex.org/W1043320331","https://openalex.org/W1946509379","https://openalex.org/W197501866","https://openalex.org/W4226094329"],"abstract_inverted_index":{"This":[0],"article":[1],"introduces":[2],"testing":[3,26,39],"maturity":[4,27,30,40,46],"model":[5,28,41],"(TMM)":[6],"developed":[7],"by":[8],"Illinois":[9],"Institute":[10],"of":[11,17,21],"Technology":[12],"and":[13,42,48],"describes":[14],"the":[15,24,35,38,43],"structure":[16],"TMM,":[18],"behavioral":[19],"characteristics":[20],"organizations":[22],"at":[23],"five":[25],"levels,the":[29],"goals,":[31],"subgoals,":[32],"also":[33],"illustrates":[34],"correlation":[36],"between":[37],"software":[44],"capability":[45],"model,":[47],"author's":[49],"consideration":[50],"on":[51],"TMM.":[52]},"counts_by_year":[],"updated_date":"2025-11-06T04:12:42.849631","created_date":"2016-06-24T00:00:00"}