{"id":"https://openalex.org/W2346306352","doi":"https://doi.org/10.14257/ijca.2016.9.4.13","title":"Visual Inspection System of the Defect of Collets for Wafer Handling Process","display_name":"Visual Inspection System of the Defect of Collets for Wafer Handling Process","publication_year":2016,"publication_date":"2016-04-30","ids":{"openalex":"https://openalex.org/W2346306352","doi":"https://doi.org/10.14257/ijca.2016.9.4.13","mag":"2346306352"},"language":"en","primary_location":{"id":"doi:10.14257/ijca.2016.9.4.13","doi":"https://doi.org/10.14257/ijca.2016.9.4.13","is_oa":true,"landing_page_url":"https://doi.org/10.14257/ijca.2016.9.4.13","pdf_url":"https://doi.org/10.14257/ijca.2016.9.4.13","source":{"id":"https://openalex.org/S2764546951","display_name":"International Journal of Control and Automation","issn_l":"2005-4297","issn":["2005-4297","2207-6387"],"is_oa":false,"is_in_doaj":false,"is_core":true,"listed_in":["cwts-core","poland-20"],"host_organization":"https://openalex.org/P4353079759","host_organization_name":"Science and Engineering Research Support Society","host_organization_lineage":["https://openalex.org/P4353079759"],"host_organization_lineage_names":["Science and Engineering Research Support Society"],"type":"journal"},"license":null,"license_id":null,"version":"publishedVersion","is_accepted":true,"is_published":true,"raw_source_name":"International Journal of Control and Automation","raw_type":"journal-article"},"volume":null,"type":"article","is_traditional":true,"indexed_in":["crossref"],"open_access":{"is_oa":true,"oa_status":"bronze","oa_url":"https://doi.org/10.14257/ijca.2016.9.4.13","any_repository_has_fulltext":false},"authorships":[{"author_position":"first","author":{"id":"https://openalex.org/A5100360075","display_name":"Jiyeon Lee","orcid":"https://orcid.org/0009-0004-0969-4819","observed_orcids":["https://orcid.org/0009-0004-0969-4819"]},"institutions":[{"id":"https://openalex.org/I51926615","display_name":"Sun Moon University","ror":"https://ror.org/009e5cd49","country_code":"KR","type":"education","lineage":["https://openalex.org/I51926615"]}],"countries":["KR"],"is_corresponding":true,"raw_author_name":"Jiyeon Lee","raw_affiliation_strings":["School of Mechanical and ICT Convergence Engineering, Sunmoon University"],"raw_orcid":null,"affiliations":[{"raw_affiliation_string":"School of Mechanical and ICT Convergence Engineering, Sunmoon University","institution_ids":["https://openalex.org/I51926615"]}]},{"author_position":"middle","author":{"id":"https://openalex.org/A5103559601","display_name":"Kuk Won Ko","orcid":"https://orcid.org/0009-0003-0870-8492","observed_orcids":["https://orcid.org/0009-0003-0870-8492"]},"institutions":[{"id":"https://openalex.org/I51926615","display_name":"Sun Moon University","ror":"https://ror.org/009e5cd49","country_code":"KR","type":"education","lineage":["https://openalex.org/I51926615"]}],"countries":["KR"],"is_corresponding":false,"raw_author_name":"Kuk Won Ko","raw_affiliation_strings":["School of Mechanical and ICT Convergence Engineering, Sunmoon University"],"raw_orcid":null,"affiliations":[{"raw_affiliation_string":"School of Mechanical and ICT Convergence Engineering, Sunmoon University","institution_ids":["https://openalex.org/I51926615"]}]},{"author_position":"last","author":{"id":"https://openalex.org/A5100750443","display_name":"Sang-Joon Lee","orcid":"https://orcid.org/0000-0002-9829-4822","observed_orcids":["https://orcid.org/0000-0002-9829-4822"]},"institutions":[{"id":"https://openalex.org/I51926615","display_name":"Sun Moon University","ror":"https://ror.org/009e5cd49","country_code":"KR","type":"education","lineage":["https://openalex.org/I51926615"]}],"countries":["KR"],"is_corresponding":false,"raw_author_name":"Sangjoon Lee","raw_affiliation_strings":["School of Mechanical and ICT Convergence Engineering, Sunmoon University"],"raw_orcid":null,"affiliations":[{"raw_affiliation_string":"School of Mechanical and ICT Convergence Engineering, Sunmoon University","institution_ids":["https://openalex.org/I51926615"]}]}],"institutions":[],"countries_distinct_count":1,"institutions_distinct_count":1,"corresponding_author_ids":["https://openalex.org/A5100360075"],"corresponding_institution_ids":["https://openalex.org/I51926615"],"apc_list":null,"apc_paid":null,"fwci":0.9406,"has_fulltext":true,"cited_by_count":3,"citation_normalized_percentile":{"value":0.78412879,"is_in_top_1_percent":false,"is_in_top_10_percent":false},"cited_by_percentile_year":{"min":88,"max":95},"biblio":{"volume":"9","issue":"4","first_page":"129","last_page":"138"},"is_retracted":false,"is_paratext":false,"is_xpac":false,"primary_topic":{"id":"https://openalex.org/T12111","display_name":"Industrial Vision Systems and Defect Detection","score":1.0,"subfield":{"id":"https://openalex.org/subfields/2209","display_name":"Industrial and Manufacturing Engineering"},"field":{"id":"https://openalex.org/fields/22","display_name":"Engineering"},"domain":{"id":"https://openalex.org/domains/3","display_name":"Physical Sciences"}},"topics":[{"id":"https://openalex.org/T12111","display_name":"Industrial Vision Systems and Defect Detection","score":1.0,"subfield":{"id":"https://openalex.org/subfields/2209","display_name":"Industrial and Manufacturing Engineering"},"field":{"id":"https://openalex.org/fields/22","display_name":"Engineering"},"domain":{"id":"https://openalex.org/domains/3","display_name":"Physical Sciences"}},{"id":"https://openalex.org/T12169","display_name":"Non-Destructive Testing Techniques","score":0.0,"subfield":{"id":"https://openalex.org/subfields/2210","display_name":"Mechanical Engineering"},"field":{"id":"https://openalex.org/fields/22","display_name":"Engineering"},"domain":{"id":"https://openalex.org/domains/3","display_name":"Physical Sciences"}},{"id":"https://openalex.org/T10653","display_name":"Robot Manipulation and Learning","score":0.0,"subfield":{"id":"https://openalex.org/subfields/2207","display_name":"Control and Systems Engineering"},"field":{"id":"https://openalex.org/fields/22","display_name":"Engineering"},"domain":{"id":"https://openalex.org/domains/3","display_name":"Physical Sciences"}}],"keywords":[{"id":"https://openalex.org/keywords/visual-inspection","display_name":"visual inspection","score":0.7609999775886536},{"id":"https://openalex.org/keywords/wafer-handling","display_name":"wafer handling","score":0.7889999747276306},{"id":"https://openalex.org/keywords/pattern-matching","display_name":"pattern matching","score":0.7089999914169312},{"id":"https://openalex.org/keywords/semiconductor-manufacturing","display_name":"semiconductor manufacturing","score":0.7300000190734863},{"id":"https://openalex.org/keywords/toolmaking","display_name":"tool manufacturing","score":0.4429999887943268},{"id":"https://openalex.org/keywords/surface-defect-detection","display_name":"surface defect detection","score":0.6299999952316284}],"concepts":[{"id":"https://openalex.org/C160671074","wikidata":"https://www.wikidata.org/wiki/Q267131","display_name":"Wafer","level":2,"score":0.7538174390792847},{"id":"https://openalex.org/C168820333","wikidata":"https://www.wikidata.org/wiki/Q448889","display_name":"Visual inspection","level":2,"score":0.6751633286476135},{"id":"https://openalex.org/C98045186","wikidata":"https://www.wikidata.org/wiki/Q205663","display_name":"Process (computing)","level":2,"score":0.6289775371551514},{"id":"https://openalex.org/C41008148","wikidata":"https://www.wikidata.org/wiki/Q21198","display_name":"Computer science","level":0,"score":0.4947216212749481},{"id":"https://openalex.org/C199639397","wikidata":"https://www.wikidata.org/wiki/Q1788588","display_name":"Engineering drawing","level":1,"score":0.4046301245689392},{"id":"https://openalex.org/C21880701","wikidata":"https://www.wikidata.org/wiki/Q2144042","display_name":"Process engineering","level":1,"score":0.3239279091358185},{"id":"https://openalex.org/C154945302","wikidata":"https://www.wikidata.org/wiki/Q11660","display_name":"Artificial intelligence","level":1,"score":0.2732813358306885},{"id":"https://openalex.org/C127413603","wikidata":"https://www.wikidata.org/wiki/Q11023","display_name":"Engineering","level":0,"score":0.2658810615539551},{"id":"https://openalex.org/C111919701","wikidata":"https://www.wikidata.org/wiki/Q9135","display_name":"Operating system","level":1,"score":0.08405685424804688},{"id":"https://openalex.org/C119599485","wikidata":"https://www.wikidata.org/wiki/Q43035","display_name":"Electrical engineering","level":1,"score":0.040139585733413696}],"mesh":[],"locations_count":1,"locations":[{"id":"doi:10.14257/ijca.2016.9.4.13","doi":"https://doi.org/10.14257/ijca.2016.9.4.13","is_oa":true,"landing_page_url":"https://doi.org/10.14257/ijca.2016.9.4.13","pdf_url":"https://doi.org/10.14257/ijca.2016.9.4.13","source":{"id":"https://openalex.org/S2764546951","display_name":"International Journal of Control and Automation","issn_l":"2005-4297","issn":["2005-4297","2207-6387"],"is_oa":false,"is_in_doaj":false,"is_core":true,"listed_in":["cwts-core","poland-20"],"host_organization":"https://openalex.org/P4353079759","host_organization_name":"Science and Engineering Research Support Society","host_organization_lineage":["https://openalex.org/P4353079759"],"host_organization_lineage_names":["Science and Engineering Research Support Society"],"type":"journal"},"license":null,"license_id":null,"version":"publishedVersion","is_accepted":true,"is_published":true,"raw_source_name":"International Journal of Control and Automation","raw_type":"journal-article"}],"best_oa_location":{"id":"doi:10.14257/ijca.2016.9.4.13","doi":"https://doi.org/10.14257/ijca.2016.9.4.13","is_oa":true,"landing_page_url":"https://doi.org/10.14257/ijca.2016.9.4.13","pdf_url":"https://doi.org/10.14257/ijca.2016.9.4.13","source":{"id":"https://openalex.org/S2764546951","display_name":"International Journal of Control and Automation","issn_l":"2005-4297","issn":["2005-4297","2207-6387"],"is_oa":false,"is_in_doaj":false,"is_core":true,"listed_in":["cwts-core","poland-20"],"host_organization":"https://openalex.org/P4353079759","host_organization_name":"Science and Engineering Research Support Society","host_organization_lineage":["https://openalex.org/P4353079759"],"host_organization_lineage_names":["Science and Engineering Research Support Society"],"type":"journal"},"license":null,"license_id":null,"version":"publishedVersion","is_accepted":true,"is_published":true,"raw_source_name":"International Journal of Control and Automation","raw_type":"journal-article"},"sustainable_development_goals":[],"study_designs":[],"awards":[],"funders":[{"id":"https://openalex.org/F4320320671","display_name":"National Research Foundation","ror":"https://ror.org/05s0g1g46"},{"id":"https://openalex.org/F4320322120","display_name":"National Research Foundation of Korea","ror":"https://ror.org/013aysd81"},{"id":"https://openalex.org/F4320322724","display_name":"Ministry of Education, India","ror":"https://ror.org/048xjjh50"},{"id":"https://openalex.org/F4320334880","display_name":"Small and Medium Business Administration","ror":"https://ror.org/022c4zk48"}],"has_content":{"pdf":true,"grobid_xml":true},"content_urls":{"pdf":"https://content.openalex.org/works/W2346306352.pdf","grobid_xml":"https://content.openalex.org/works/W2346306352.grobid-xml"},"referenced_works_count":3,"referenced_works":["https://openalex.org/W2114317651","https://openalex.org/W2129708923","https://openalex.org/W2170930628"],"related_works":["https://openalex.org/W2326301719","https://openalex.org/W4322503962","https://openalex.org/W2013927912","https://openalex.org/W2086283026","https://openalex.org/W2164538089","https://openalex.org/W2259440591","https://openalex.org/W1949377679","https://openalex.org/W2062480939","https://openalex.org/W1780285521","https://openalex.org/W1912315109"],"abstract_inverted_index":{"Pick":[0],"up":[1,37],"and":[2,19,29,45,83],"placement":[3],"tools":[4,10,38],"(collet)":[5],"are":[6],"one":[7],"of":[8,21,27,35,43,86],"important":[9,52],"for":[11],"semi-conduct":[12],"manufacturing":[13,56],"process.It":[14],"should":[15],"have":[16],"acceptable":[17],"precision":[18],"reliability":[20],"shape":[22],"to":[23,66,76,89],"pick":[24,36],"the":[25,78],"piece":[26],"wafer":[28],"chip":[30],"without":[31],"damages.To":[32],"defect":[33,67],"detection":[34,68],"such":[39],"as":[40],"wrong":[41],"size":[42],"hole":[44],"flaw":[46],"in":[47,54],"collet":[48],"surface":[49],"plays":[50],"an":[51],"role":[53],"tool":[55],"process.In":[57],"this":[58],"study,":[59],"we":[60],"propose":[61],"a":[62],"visual":[63,80],"inspection":[64,81],"system":[65,82],"based":[69],"on":[70],"pattern":[71],"matching":[72],"algorithm.Experiments":[73],"were":[74],"performed":[75],"evaluate":[77],"proposed":[79],"showed":[84],"99.3%":[85],"success":[87],"rate":[88],"detect":[90],"defection.":[91]},"counts_by_year":[{"year":2019,"cited_by_count":2},{"year":2017,"cited_by_count":1}],"updated_date":"2026-10-30T12:39:25.321706","created_date":"2016-06-24T00:00:00"}