{"id":"https://openalex.org/W2336730865","doi":"https://doi.org/10.1115/1.4033344","title":"Effect of Dielectric Electrical Conductivity on the Characteristics of Micro Electro-Discharge Machining Plasma and Material Removal","display_name":"Effect of Dielectric Electrical Conductivity on the Characteristics of Micro Electro-Discharge Machining Plasma and Material Removal","publication_year":2016,"publication_date":"2016-04-11","ids":{"openalex":"https://openalex.org/W2336730865","doi":"https://doi.org/10.1115/1.4033344","mag":"2336730865"},"language":"en","primary_location":{"id":"doi:10.1115/1.4033344","doi":"https://doi.org/10.1115/1.4033344","is_oa":false,"landing_page_url":"https://doi.org/10.1115/1.4033344","pdf_url":null,"source":{"id":"https://openalex.org/S2764568738","display_name":"Journal of Micro and Nano-Manufacturing","issn_l":"2166-0468","issn":["2166-0468","2166-0476","2994-7316","2994-7324"],"is_oa":false,"is_in_doaj":false,"is_core":true,"listed_in":["cwts-core","dongbi-c","jufo-1","norway-1","poland-40","russia-white-list-2"],"host_organization":"https://openalex.org/P4310316053","host_organization_name":"ASM International","host_organization_lineage":["https://openalex.org/P4310316053"],"host_organization_lineage_names":["ASM International"],"type":"journal"},"license":null,"license_id":null,"version":"publishedVersion","is_accepted":true,"is_published":true,"raw_source_name":"Journal of Micro and Nano-Manufacturing","raw_type":"journal-article"},"volume":null,"type":"article","indexed_in":["crossref"],"open_access":{"is_oa":false,"oa_status":"closed","oa_url":null,"any_repository_has_fulltext":false},"authorships":[{"author_position":"first","author":{"id":"https://openalex.org/A5071887934","display_name":"Soham S. Mujumdar","orcid":"https://orcid.org/0000-0002-8349-440X","observed_orcids":["https://orcid.org/0000-0002-8349-440X"]},"institutions":[{"id":"https://openalex.org/I157725225","display_name":"University of Illinois Urbana-Champaign","ror":"https://ror.org/047426m28","country_code":"US","type":"education","lineage":["https://openalex.org/I157725225"]}],"countries":["US"],"is_corresponding":true,"raw_author_name":"Soham S. Mujumdar","raw_affiliation_strings":["Department of Mechanical Science and Engineering, University of Illinois at Urbana-Champaign, Champaign, IL 61801 e-mail:"],"raw_orcid":null,"affiliations":[{"raw_affiliation_string":"Department of Mechanical Science and Engineering, University of Illinois at Urbana-Champaign, Champaign, IL 61801 e-mail:","institution_ids":["https://openalex.org/I157725225"]}]},{"author_position":"middle","author":{"id":"https://openalex.org/A5046527353","display_name":"Davide Curreli","orcid":"https://orcid.org/0000-0001-6406-6699","observed_orcids":["https://orcid.org/0000-0001-6406-6699"]},"institutions":[{"id":"https://openalex.org/I157725225","display_name":"University of Illinois Urbana-Champaign","ror":"https://ror.org/047426m28","country_code":"US","type":"education","lineage":["https://openalex.org/I157725225"]}],"countries":["US"],"is_corresponding":true,"raw_author_name":"Davide Curreli","raw_affiliation_strings":["Assistant Professor Department of Nuclear, Plasma and Radiological Engineering, University of Illinois at Urbana-Champaign, Champaign, IL 61801 e-mail:"],"raw_orcid":null,"affiliations":[{"raw_affiliation_string":"Assistant Professor Department of Nuclear, Plasma and Radiological Engineering, University of Illinois at Urbana-Champaign, Champaign, IL 61801 e-mail:","institution_ids":["https://openalex.org/I157725225"]}]},{"author_position":"last","author":{"id":"https://openalex.org/A5035488719","display_name":"Shiv Gopal Kapoor","orcid":"https://orcid.org/0009-0009-6517-3272","observed_orcids":["https://orcid.org/0009-0009-6517-3272"]},"institutions":[{"id":"https://openalex.org/I157725225","display_name":"University of Illinois Urbana-Champaign","ror":"https://ror.org/047426m28","country_code":"US","type":"education","lineage":["https://openalex.org/I157725225"]}],"countries":["US"],"is_corresponding":true,"raw_author_name":"Shiv G. Kapoor","raw_affiliation_strings":["Professor Department of Mechanical Science and Engineering, University of Illinois at Urbana-Champaign, Champaign, IL 61801 e-mail:"],"raw_orcid":null,"affiliations":[{"raw_affiliation_string":"Professor Department of Mechanical Science and Engineering, University of Illinois at Urbana-Champaign, Champaign, IL 61801 e-mail:","institution_ids":["https://openalex.org/I157725225"]}]}],"institutions":[],"countries_distinct_count":1,"institutions_distinct_count":1,"corresponding_author_ids":["https://openalex.org/A5035488719","https://openalex.org/A5046527353","https://openalex.org/A5071887934"],"corresponding_institution_ids":["https://openalex.org/I157725225"],"apc_list":null,"apc_paid":null,"fwci":0.5534,"has_fulltext":false,"cited_by_count":16,"citation_normalized_percentile":{"value":0.68277368,"is_in_top_1_percent":false,"is_in_top_10_percent":false},"cited_by_percentile_year":{"min":88,"max":98},"biblio":{"volume":"4","issue":"2","first_page":null,"last_page":null},"is_retracted":false,"is_paratext":false,"is_xpac":false,"primary_topic":{"id":"https://openalex.org/T11451","display_name":"Advanced Machining and Optimization Techniques","score":1.0,"subfield":{"id":"https://openalex.org/subfields/2208","display_name":"Electrical and Electronic Engineering"},"field":{"id":"https://openalex.org/fields/22","display_name":"Engineering"},"domain":{"id":"https://openalex.org/domains/3","display_name":"Physical Sciences"}},"topics":[{"id":"https://openalex.org/T11451","display_name":"Advanced Machining and Optimization Techniques","score":1.0,"subfield":{"id":"https://openalex.org/subfields/2208","display_name":"Electrical and Electronic Engineering"},"field":{"id":"https://openalex.org/fields/22","display_name":"Engineering"},"domain":{"id":"https://openalex.org/domains/3","display_name":"Physical Sciences"}},{"id":"https://openalex.org/T10642","display_name":"Plasma Applications and Diagnostics","score":0.0,"subfield":{"id":"https://openalex.org/subfields/2741","display_name":"Radiology, Nuclear Medicine and Imaging"},"field":{"id":"https://openalex.org/fields/27","display_name":"Medicine"},"domain":{"id":"https://openalex.org/domains/4","display_name":"Health Sciences"}},{"id":"https://openalex.org/T10781","display_name":"Plasma Diagnostics and Applications","score":0.0,"subfield":{"id":"https://openalex.org/subfields/2208","display_name":"Electrical and Electronic Engineering"},"field":{"id":"https://openalex.org/fields/22","display_name":"Engineering"},"domain":{"id":"https://openalex.org/domains/3","display_name":"Physical Sciences"}}],"keywords":[{"id":"https://openalex.org/keywords/micro-electrical-discharge-machining","display_name":"micro electrical discharge machining","score":0.9869999885559082},{"id":"https://openalex.org/keywords/electrical-breakdown","display_name":"electrical breakdown","score":0.8999999761581421},{"id":"https://openalex.org/keywords/plasma-characteristics","display_name":"plasma characteristics","score":0.6940000057220459},{"id":"https://openalex.org/keywords/material-removal-rate","display_name":"material removal rate","score":0.9710000157356262},{"id":"https://openalex.org/keywords/electron-density","display_name":"electron density","score":0.8289999961853027},{"id":"https://openalex.org/keywords/plasma-temperature","display_name":"plasma temperature","score":0.8500000238418579},{"id":"https://openalex.org/keywords/plasma-resistance","display_name":"plasma resistance","score":0.8569999933242798},{"id":"https://openalex.org/keywords/discharge-energy","display_name":"discharge energy","score":0.9890000224113464},{"id":"https://openalex.org/keywords/craters","display_name":"craters","score":0.47699999809265137}],"concepts":[{"id":"https://openalex.org/C192562407","wikidata":"https://www.wikidata.org/wiki/Q228736","display_name":"Materials science","level":0,"score":0.8034360408782959},{"id":"https://openalex.org/C133386390","wikidata":"https://www.wikidata.org/wiki/Q184996","display_name":"Dielectric","level":2,"score":0.7844991683959961},{"id":"https://openalex.org/C82706917","wikidata":"https://www.wikidata.org/wiki/Q10251","display_name":"Plasma","level":2,"score":0.6318665146827698},{"id":"https://openalex.org/C69990965","wikidata":"https://www.wikidata.org/wiki/Q65402698","display_name":"Electrical resistivity and conductivity","level":2,"score":0.6247830390930176},{"id":"https://openalex.org/C131540310","wikidata":"https://www.wikidata.org/wiki/Q907564","display_name":"Conductivity","level":2,"score":0.6166044473648071},{"id":"https://openalex.org/C140075996","wikidata":"https://www.wikidata.org/wiki/Q577484","display_name":"Electrical discharge machining","level":3,"score":0.5807749032974243},{"id":"https://openalex.org/C159985019","wikidata":"https://www.wikidata.org/wiki/Q181790","display_name":"Composite material","level":1,"score":0.5179890394210815},{"id":"https://openalex.org/C80487561","wikidata":"https://www.wikidata.org/wiki/Q6557433","display_name":"Liquid dielectric","level":3,"score":0.4857776463031769},{"id":"https://openalex.org/C89395315","wikidata":"https://www.wikidata.org/wiki/Q181232","display_name":"Anode","level":3,"score":0.4500015377998352},{"id":"https://openalex.org/C49040817","wikidata":"https://www.wikidata.org/wiki/Q193091","display_name":"Optoelectronics","level":1,"score":0.19496750831604004},{"id":"https://openalex.org/C523214423","wikidata":"https://www.wikidata.org/wiki/Q192047","display_name":"Machining","level":2,"score":0.19213342666625977},{"id":"https://openalex.org/C17525397","wikidata":"https://www.wikidata.org/wiki/Q176140","display_name":"Electrode","level":2,"score":0.18203625082969666},{"id":"https://openalex.org/C185592680","wikidata":"https://www.wikidata.org/wiki/Q2329","display_name":"Chemistry","level":0,"score":0.15995144844055176},{"id":"https://openalex.org/C119599485","wikidata":"https://www.wikidata.org/wiki/Q43035","display_name":"Electrical engineering","level":1,"score":0.15213951468467712},{"id":"https://openalex.org/C191897082","wikidata":"https://www.wikidata.org/wiki/Q11467","display_name":"Metallurgy","level":1,"score":0.14443135261535645},{"id":"https://openalex.org/C121332964","wikidata":"https://www.wikidata.org/wiki/Q413","display_name":"Physics","level":0,"score":0.0},{"id":"https://openalex.org/C62520636","wikidata":"https://www.wikidata.org/wiki/Q944","display_name":"Quantum mechanics","level":1,"score":0.0},{"id":"https://openalex.org/C127413603","wikidata":"https://www.wikidata.org/wiki/Q11023","display_name":"Engineering","level":0,"score":0.0},{"id":"https://openalex.org/C147789679","wikidata":"https://www.wikidata.org/wiki/Q11372","display_name":"Physical chemistry","level":1,"score":0.0}],"mesh":[],"locations_count":1,"locations":[{"id":"doi:10.1115/1.4033344","doi":"https://doi.org/10.1115/1.4033344","is_oa":false,"landing_page_url":"https://doi.org/10.1115/1.4033344","pdf_url":null,"source":{"id":"https://openalex.org/S2764568738","display_name":"Journal of Micro and Nano-Manufacturing","issn_l":"2166-0468","issn":["2166-0468","2166-0476","2994-7316","2994-7324"],"is_oa":false,"is_in_doaj":false,"is_core":true,"listed_in":["cwts-core","dongbi-c","jufo-1","norway-1","poland-40","russia-white-list-2"],"host_organization":"https://openalex.org/P4310316053","host_organization_name":"ASM International","host_organization_lineage":["https://openalex.org/P4310316053"],"host_organization_lineage_names":["ASM International"],"type":"journal"},"license":null,"license_id":null,"version":"publishedVersion","is_accepted":true,"is_published":true,"raw_source_name":"Journal of Micro and Nano-Manufacturing","raw_type":"journal-article"}],"best_oa_location":null,"sustainable_development_goals":[],"study_designs":[],"awards":[],"funders":[{"id":"https://openalex.org/F4320306076","display_name":"National Science Foundation","ror":"https://ror.org/021nxhr62"}],"has_content":{"pdf":false,"grobid_xml":false},"content_urls":null,"referenced_works_count":35,"referenced_works":["https://openalex.org/W224037883","https://openalex.org/W624652195","https://openalex.org/W1480160699","https://openalex.org/W1926950498","https://openalex.org/W1938975035","https://openalex.org/W1964615019","https://openalex.org/W1971313537","https://openalex.org/W1972552764","https://openalex.org/W1978032248","https://openalex.org/W1988236879","https://openalex.org/W1992264797","https://openalex.org/W1997421121","https://openalex.org/W2000344937","https://openalex.org/W2007328824","https://openalex.org/W2018286052","https://openalex.org/W2023062206","https://openalex.org/W2025338436","https://openalex.org/W2026600802","https://openalex.org/W2028679502","https://openalex.org/W2031168580","https://openalex.org/W2033587136","https://openalex.org/W2036447022","https://openalex.org/W2038167037","https://openalex.org/W2043910006","https://openalex.org/W2063675888","https://openalex.org/W2064581776","https://openalex.org/W2074823867","https://openalex.org/W2086704975","https://openalex.org/W2103132516","https://openalex.org/W2108244511","https://openalex.org/W2108955175","https://openalex.org/W2127282881","https://openalex.org/W2625269717","https://openalex.org/W4250455110","https://openalex.org/W4285719527"],"related_works":["https://openalex.org/W2790188106","https://openalex.org/W4391780993","https://openalex.org/W2331546672","https://openalex.org/W3135183451","https://openalex.org/W2965356800","https://openalex.org/W1938975035","https://openalex.org/W2986339245","https://openalex.org/W2046571532","https://openalex.org/W2766795423","https://openalex.org/W2033587136"],"abstract_inverted_index":{"In":[0],"micro":[1],"electro-discharge":[2],"machining":[3],"(micro-EDM),":[4],"it":[5],"is":[6,123,155,203,206],"believed":[7],"that":[8,163],"electrical":[9,25,66,94,111,171],"conductivity":[10,57,67,95,139,168,202,241],"of":[11,48,55,65,68,93,96,113,137,173,195],"the":[12,29,53,63,69,72,114,127,135,166,170,174,178,193,209,217,239],"dielectric":[13,56,70,115,138,167,175,201,240],"modified":[14],"by":[15,176,216],"additives":[16],"plays":[17],"an":[18],"important":[19],"role":[20,64],"in":[21,58,79,130,165,192,211,226,230,235],"discharge":[22,152,199,236],"initiation":[23],"and":[24,39,76,83,106,116,133,151,160,233],"breakdown,":[26,73],"thereby":[27],"affecting":[28],"process":[30,33],"characteristics":[31],"including":[32],"accuracy,":[34],"material":[35,77,196],"removal":[36,78],"rate":[37],"(MRR),":[38],"surface":[40],"finish.":[41],"However,":[42],"there":[43],"has":[44],"been":[45,87],"a":[46,183],"lack":[47],"systematic":[49],"efforts":[50],"to":[51,109,125,147,208],"evaluate":[52],"effect":[54,136],"micro-EDM.":[59],"This":[60],"paper":[61],"investigates":[62],"on":[71,140],"plasma":[74,129,143,149,219,231],"characteristics,":[75],"micro-EDM":[80,128,218],"via":[81],"modeling":[82,121],"experimentation.":[84],"Experiments":[85],"have":[86],"carried":[88],"out":[89],"at":[90,182],"four":[91],"levels":[92],"saline":[97,131],"water,":[98],"i.e.,":[99],"4":[100],"\u03bcS/cm,":[101,103,105,108],"362":[102],"1106":[104],"4116":[107],"study":[110],"breakdown":[112,172,180],"resulting":[117],"craters.":[118],"A":[119],"global":[120],"approach":[122],"employed":[124],"model":[126,222],"water":[132],"predict":[134],"electron":[141,227],"density,":[142,228],"temperature,":[144],"heat":[145,213],"flux":[146,214],"anode,":[148],"resistance,":[150,232],"energy.":[153],"It":[154],"found":[156],"from":[157],"both":[158],"experiments":[159],"model-based":[161],"simulations":[162],"increase":[164,191,210,225],"facilitates":[169],"lowering":[177],"minimum":[179],"potential":[181],"given":[184],"interelectrode":[185],"gap.":[186],"Experimental":[187],"results":[188],"also":[189,223],"show":[190],"volume":[194],"removed":[197],"per":[198],"when":[200],"increased,":[204],"which":[205],"attributed":[207],"anode":[212],"predicted":[215],"model.":[220],"The":[221],"predicts":[224],"decrease":[229,234],"energy":[237],"as":[238],"increases.":[242]},"counts_by_year":[{"year":2025,"cited_by_count":4},{"year":2024,"cited_by_count":4},{"year":2023,"cited_by_count":1},{"year":2022,"cited_by_count":2},{"year":2020,"cited_by_count":1},{"year":2019,"cited_by_count":2},{"year":2018,"cited_by_count":2}],"updated_date":"2026-11-04T10:54:05.112534","created_date":"2016-06-24T00:00:00"}