{"id":"https://openalex.org/W2333199477","doi":"https://doi.org/10.1557/proc-268-363","title":"Correlation between Chemical Modification and Generated Refractive Index on Ion Implanted PMMA","display_name":"Correlation between Chemical Modification and Generated Refractive Index on Ion Implanted PMMA","publication_year":1992,"publication_date":"1992-01-01","ids":{"openalex":"https://openalex.org/W2333199477","doi":"https://doi.org/10.1557/proc-268-363","mag":"2333199477"},"language":"en","primary_location":{"id":"doi:10.1557/proc-268-363","doi":"https://doi.org/10.1557/proc-268-363","is_oa":false,"landing_page_url":"https://doi.org/10.1557/proc-268-363","pdf_url":null,"source":{"id":"https://openalex.org/S2530005873","display_name":"MRS Proceedings","issn_l":"0272-9172","issn":["0272-9172","1946-4274"],"is_oa":false,"is_in_doaj":false,"is_core":true,"listed_in":["cwts-core","jufo-1","norway-1"],"host_organization":"https://openalex.org/P4310311721","host_organization_name":"Cambridge University Press","host_organization_lineage":["https://openalex.org/P4310311721","https://openalex.org/P4310311702"],"host_organization_lineage_names":["Cambridge University Press","University of Cambridge"],"type":"journal"},"license":null,"license_id":null,"version":"publishedVersion","is_accepted":true,"is_published":true,"raw_source_name":"MRS Proceedings","raw_type":"journal-article"},"volume":null,"type":"article","is_traditional":true,"indexed_in":["crossref"],"open_access":{"is_oa":false,"oa_status":"closed","oa_url":null,"any_repository_has_fulltext":false},"authorships":[{"author_position":"first","author":{"id":"https://openalex.org/A5026586679","display_name":"R. Kallweit","orcid":null,"observed_orcids":[]},"institutions":[{"id":"https://openalex.org/I2802562207","display_name":"Deutsche Bundespost","ror":"https://ror.org/0150tj573","country_code":"DE","type":"government","lineage":["https://openalex.org/I2802562207"]}],"countries":["DE"],"is_corresponding":false,"raw_author_name":"R. Kallweit","raw_affiliation_strings":["Forschungsinstitut der Deutschen Bundespost TELEKOM, Postfach 10 00 03, D-6100, Darmstadt, Germany"],"raw_orcid":null,"affiliations":[{"raw_affiliation_string":"Forschungsinstitut der Deutschen Bundespost TELEKOM, Postfach 10 00 03, D-6100, Darmstadt, Germany","institution_ids":["https://openalex.org/I2802562207"]}]},{"author_position":"middle","author":{"id":"https://openalex.org/A5047618582","display_name":"Ulrich Roll","orcid":null,"observed_orcids":[]},"institutions":[],"countries":[],"is_corresponding":false,"raw_author_name":"U. Roll","raw_affiliation_strings":["Perkin-Elmer Physical Electronics Division, Bruckmannring 40, D-8042, Oberschlei\u00dfheim, Germany"],"raw_orcid":null,"affiliations":[{"raw_affiliation_string":"Perkin-Elmer Physical Electronics Division, Bruckmannring 40, D-8042, Oberschlei\u00dfheim, Germany","institution_ids":[]}]},{"author_position":"middle","author":{"id":null,"display_name":"P. Eichinger","orcid":null,"observed_orcids":[]},"institutions":[],"countries":[],"is_corresponding":false,"raw_author_name":"P. Eichinger","raw_affiliation_strings":["Gesellschaft f\u00fcr Me\u00dftechnik und Technologie mbH, GeMeTec, Geretsrieder Stra\u00dfe 10a, D-8000, M\u00fcnchen 70, Germany"],"raw_orcid":null,"affiliations":[{"raw_affiliation_string":"Gesellschaft f\u00fcr Me\u00dftechnik und Technologie mbH, GeMeTec, Geretsrieder Stra\u00dfe 10a, D-8000, M\u00fcnchen 70, Germany","institution_ids":[]}]},{"author_position":"middle","author":{"id":"https://openalex.org/A5011772437","display_name":"Hans Strack","orcid":null,"observed_orcids":[]},"institutions":[{"id":"https://openalex.org/I31512782","display_name":"Technische Universit\u00e4t Darmstadt","ror":"https://ror.org/05n911h24","country_code":"DE","type":"education","lineage":["https://openalex.org/I31512782"]}],"countries":["DE"],"is_corresponding":false,"raw_author_name":"H. Strack","raw_affiliation_strings":["Technische Hochschule Darmstadt, Schlo\u00dfgartenstr. 8, D, -6100, Darmstadt, Germany"],"raw_orcid":null,"affiliations":[{"raw_affiliation_string":"Technische Hochschule Darmstadt, Schlo\u00dfgartenstr. 8, D, -6100, Darmstadt, Germany","institution_ids":["https://openalex.org/I31512782"]}]},{"author_position":"last","author":{"id":"https://openalex.org/A5025520616","display_name":"A. P\u00f6cker","orcid":null,"observed_orcids":[]},"institutions":[{"id":"https://openalex.org/I2802562207","display_name":"Deutsche Bundespost","ror":"https://ror.org/0150tj573","country_code":"DE","type":"government","lineage":["https://openalex.org/I2802562207"]}],"countries":["DE"],"is_corresponding":false,"raw_author_name":"A. P\u00f6cker","raw_affiliation_strings":["Forschungsinstitut der Deutschen Bundespost TELEKOM, Postfach 10 00 03, D-6100, Darmstadt, Germany"],"raw_orcid":null,"affiliations":[{"raw_affiliation_string":"Forschungsinstitut der Deutschen Bundespost TELEKOM, Postfach 10 00 03, D-6100, Darmstadt, Germany","institution_ids":["https://openalex.org/I2802562207"]}]}],"institutions":[],"countries_distinct_count":1,"institutions_distinct_count":2,"corresponding_author_ids":[],"corresponding_institution_ids":[],"apc_list":null,"apc_paid":null,"fwci":0.0,"has_fulltext":false,"cited_by_count":1,"citation_normalized_percentile":{"value":0.29722011,"is_in_top_1_percent":false,"is_in_top_10_percent":false},"cited_by_percentile_year":null,"biblio":{"volume":"268","issue":null,"first_page":null,"last_page":null},"is_retracted":false,"is_paratext":false,"is_xpac":false,"primary_topic":{"id":"https://openalex.org/T12166","display_name":"Ion-surface interactions and analysis","score":0.9990000128746033,"subfield":{"id":"https://openalex.org/subfields/2508","display_name":"Surfaces, Coatings and Films"},"field":{"id":"https://openalex.org/fields/25","display_name":"Materials Science"},"domain":{"id":"https://openalex.org/domains/3","display_name":"Physical Sciences"}},"topics":[{"id":"https://openalex.org/T12166","display_name":"Ion-surface interactions and analysis","score":0.9990000128746033,"subfield":{"id":"https://openalex.org/subfields/2508","display_name":"Surfaces, Coatings and Films"},"field":{"id":"https://openalex.org/fields/25","display_name":"Materials Science"},"domain":{"id":"https://openalex.org/domains/3","display_name":"Physical Sciences"}},{"id":"https://openalex.org/T12416","display_name":"Polymer Nanocomposite Synthesis and Irradiation","score":0.0006000000284984708,"subfield":{"id":"https://openalex.org/subfields/2507","display_name":"Polymers and Plastics"},"field":{"id":"https://openalex.org/fields/25","display_name":"Materials Science"},"domain":{"id":"https://openalex.org/domains/3","display_name":"Physical Sciences"}},{"id":"https://openalex.org/T12084","display_name":"Synthesis and properties of polymers","score":9.999999747378752e-05,"subfield":{"id":"https://openalex.org/subfields/2507","display_name":"Polymers and Plastics"},"field":{"id":"https://openalex.org/fields/25","display_name":"Materials Science"},"domain":{"id":"https://openalex.org/domains/3","display_name":"Physical Sciences"}}],"keywords":[{"id":"https://openalex.org/keywords/poly-methyl-methacrylate","display_name":"poly(methyl methacrylate)","score":0.8379999995231628},{"id":"https://openalex.org/keywords/ion-implantation","display_name":"ion implantation","score":0.9800000190734863},{"id":"https://openalex.org/keywords/refractive-index","display_name":"refractive index","score":0.9330000281333923},{"id":"https://openalex.org/keywords/chemical-modification","display_name":"chemical modification","score":0.7580000162124634},{"id":"https://openalex.org/keywords/inert-gas-ions","display_name":"inert gas ions","score":0.796999990940094},{"id":"https://openalex.org/keywords/surface-damage","display_name":"surface damage","score":0.4909999966621399},{"id":"https://openalex.org/keywords/secondary-ion-emission","display_name":"secondary ion emission","score":0.7160000205039978},{"id":"https://openalex.org/keywords/surface-functional-groups","display_name":"surface functional groups","score":0.5479999780654907},{"id":"https://openalex.org/keywords/chain-scission","display_name":"chain scission","score":0.640999972820282},{"id":"https://openalex.org/keywords/x-ray-photoelectron-spectroscopy","display_name":"X-ray photoelectron spectroscopy","score":0.3880000114440918},{"id":"https://openalex.org/keywords/sims","display_name":"SIMS","score":0.8130000233650208}],"concepts":[{"id":"https://openalex.org/C192562407","wikidata":"https://www.wikidata.org/wiki/Q228736","display_name":"Materials science","level":0,"score":0.8196372985839844},{"id":"https://openalex.org/C175708663","wikidata":"https://www.wikidata.org/wiki/Q899559","display_name":"X-ray photoelectron spectroscopy","level":2,"score":0.8106421232223511},{"id":"https://openalex.org/C145148216","wikidata":"https://www.wikidata.org/wiki/Q36496","display_name":"Ion","level":2,"score":0.7359686493873596},{"id":"https://openalex.org/C41823505","wikidata":"https://www.wikidata.org/wiki/Q1436752","display_name":"Ion implantation","level":3,"score":0.6424357891082764},{"id":"https://openalex.org/C42067758","wikidata":"https://www.wikidata.org/wiki/Q174102","display_name":"Refractive index","level":2,"score":0.6038832068443298},{"id":"https://openalex.org/C77671233","wikidata":"https://www.wikidata.org/wiki/Q556046","display_name":"Secondary ion mass spectrometry","level":3,"score":0.5376312732696533},{"id":"https://openalex.org/C111337013","wikidata":"https://www.wikidata.org/wiki/Q2737837","display_name":"Irradiation","level":2,"score":0.5251455307006836},{"id":"https://openalex.org/C113196181","wikidata":"https://www.wikidata.org/wiki/Q485223","display_name":"Analytical Chemistry (journal)","level":2,"score":0.5236178040504456},{"id":"https://openalex.org/C154256306","wikidata":"https://www.wikidata.org/wiki/Q41795528","display_name":"Inert","level":2,"score":0.5234267711639404},{"id":"https://openalex.org/C32909587","wikidata":"https://www.wikidata.org/wiki/Q11369","display_name":"Molecule","level":2,"score":0.486666738986969},{"id":"https://openalex.org/C115537861","wikidata":"https://www.wikidata.org/wiki/Q7645993","display_name":"Surface modification","level":2,"score":0.46396908164024353},{"id":"https://openalex.org/C49040817","wikidata":"https://www.wikidata.org/wiki/Q193091","display_name":"Optoelectronics","level":1,"score":0.1870688498020172},{"id":"https://openalex.org/C147789679","wikidata":"https://www.wikidata.org/wiki/Q11372","display_name":"Physical chemistry","level":1,"score":0.14564451575279236},{"id":"https://openalex.org/C42360764","wikidata":"https://www.wikidata.org/wiki/Q83588","display_name":"Chemical engineering","level":1,"score":0.12132039666175842},{"id":"https://openalex.org/C185592680","wikidata":"https://www.wikidata.org/wiki/Q2329","display_name":"Chemistry","level":0,"score":0.09334319829940796},{"id":"https://openalex.org/C178790620","wikidata":"https://www.wikidata.org/wiki/Q11351","display_name":"Organic chemistry","level":1,"score":0.08314758539199829},{"id":"https://openalex.org/C121332964","wikidata":"https://www.wikidata.org/wiki/Q413","display_name":"Physics","level":0,"score":0.0},{"id":"https://openalex.org/C127413603","wikidata":"https://www.wikidata.org/wiki/Q11023","display_name":"Engineering","level":0,"score":0.0},{"id":"https://openalex.org/C185544564","wikidata":"https://www.wikidata.org/wiki/Q81197","display_name":"Nuclear physics","level":1,"score":0.0}],"mesh":[],"locations_count":1,"locations":[{"id":"doi:10.1557/proc-268-363","doi":"https://doi.org/10.1557/proc-268-363","is_oa":false,"landing_page_url":"https://doi.org/10.1557/proc-268-363","pdf_url":null,"source":{"id":"https://openalex.org/S2530005873","display_name":"MRS Proceedings","issn_l":"0272-9172","issn":["0272-9172","1946-4274"],"is_oa":false,"is_in_doaj":false,"is_core":true,"listed_in":["cwts-core","jufo-1","norway-1"],"host_organization":"https://openalex.org/P4310311721","host_organization_name":"Cambridge University Press","host_organization_lineage":["https://openalex.org/P4310311721","https://openalex.org/P4310311702"],"host_organization_lineage_names":["Cambridge University Press","University of Cambridge"],"type":"journal"},"license":null,"license_id":null,"version":"publishedVersion","is_accepted":true,"is_published":true,"raw_source_name":"MRS Proceedings","raw_type":"journal-article"}],"best_oa_location":null,"sustainable_development_goals":[],"study_designs":[],"awards":[],"funders":[],"has_content":{"pdf":false,"grobid_xml":false},"content_urls":null,"referenced_works_count":5,"referenced_works":["https://openalex.org/W1976164145","https://openalex.org/W2062761881","https://openalex.org/W2084681876","https://openalex.org/W2316233621","https://openalex.org/W4233458316"],"related_works":["https://openalex.org/W2032246996","https://openalex.org/W1971779495","https://openalex.org/W1990860509","https://openalex.org/W2316233621","https://openalex.org/W2323651548","https://openalex.org/W2007846171","https://openalex.org/W2062761881","https://openalex.org/W2008251897","https://openalex.org/W2056302672","https://openalex.org/W2061740231"],"abstract_inverted_index":null,"counts_by_year":[],"updated_date":"2026-10-01T08:54:57.152042","created_date":"2016-06-24T00:00:00"}