{"id":"https://openalex.org/W2329967006","doi":"https://doi.org/10.1557/opl.2011.624","title":"X-Ray Study of Strained and Strain Balanced Superlattice Materials","display_name":"X-Ray Study of Strained and Strain Balanced Superlattice Materials","publication_year":2011,"publication_date":"2011-01-01","ids":{"openalex":"https://openalex.org/W2329967006","doi":"https://doi.org/10.1557/opl.2011.624","mag":"2329967006"},"language":"en","primary_location":{"id":"doi:10.1557/opl.2011.624","doi":"https://doi.org/10.1557/opl.2011.624","is_oa":false,"landing_page_url":"https://doi.org/10.1557/opl.2011.624","pdf_url":null,"source":{"id":"https://openalex.org/S2530005873","display_name":"MRS Proceedings","issn_l":"0272-9172","issn":["0272-9172","1946-4274"],"is_oa":false,"is_in_doaj":false,"is_core":true,"listed_in":["cwts-core","jufo-1","norway-1"],"host_organization":"https://openalex.org/P4310311721","host_organization_name":"Cambridge University Press","host_organization_lineage":["https://openalex.org/P4310311721","https://openalex.org/P4310311702"],"host_organization_lineage_names":["Cambridge University Press","University of Cambridge"],"type":"journal"},"license":null,"license_id":null,"version":"publishedVersion","is_accepted":true,"is_published":true,"raw_source_name":"MRS Proceedings","raw_type":"journal-article"},"volume":null,"type":"article","indexed_in":["crossref"],"open_access":{"is_oa":false,"oa_status":"closed","oa_url":null,"any_repository_has_fulltext":false},"authorships":[{"author_position":"first","author":{"id":"https://openalex.org/A5000048040","display_name":"Nate\u00e9 Johnson","orcid":null,"observed_orcids":[]},"institutions":[{"id":"https://openalex.org/I79272384","display_name":"University of Maryland, Baltimore County","ror":"https://ror.org/02qskvh78","country_code":"US","type":"education","lineage":["https://openalex.org/I79272384"]}],"countries":["US"],"is_corresponding":false,"raw_author_name":"Natee Johnson","raw_affiliation_strings":["Mechanical Engineering, University of Maryland, Baltimore County, Baltimore, MD, USA"],"raw_orcid":null,"affiliations":[{"raw_affiliation_string":"Mechanical Engineering, University of Maryland, Baltimore County, Baltimore, MD, USA","institution_ids":["https://openalex.org/I79272384"]}]},{"author_position":"middle","author":{"id":"https://openalex.org/A5020057896","display_name":"Ruth Choa","orcid":"https://orcid.org/0000-0002-4798-7565","observed_orcids":["https://orcid.org/0000-0002-4798-7565"]},"institutions":[{"id":"https://openalex.org/I136199984","display_name":"Harvard University","ror":"https://ror.org/03vek6s52","country_code":"US","type":"education","lineage":["https://openalex.org/I136199984"]}],"countries":["US"],"is_corresponding":false,"raw_author_name":"Ruth Choa","raw_affiliation_strings":["School of Engineering and Applied Science, Harvard University, Cambridge, MA, USA"],"raw_orcid":null,"affiliations":[{"raw_affiliation_string":"School of Engineering and Applied Science, Harvard University, Cambridge, MA, USA","institution_ids":["https://openalex.org/I136199984"]}]},{"author_position":"middle","author":{"id":"https://openalex.org/A5003821225","display_name":"Liwei Cheng","orcid":"https://orcid.org/0000-0001-8243-4088","observed_orcids":["https://orcid.org/0000-0001-8243-4088"]},"institutions":[{"id":"https://openalex.org/I79272384","display_name":"University of Maryland, Baltimore County","ror":"https://ror.org/02qskvh78","country_code":"US","type":"education","lineage":["https://openalex.org/I79272384"]}],"countries":["US"],"is_corresponding":false,"raw_author_name":"Liwei Cheng","raw_affiliation_strings":["Computer Science and Electrical Engineering, University of Maryland, Baltimore County, Baltimore, MD, USA"],"raw_orcid":null,"affiliations":[{"raw_affiliation_string":"Computer Science and Electrical Engineering, University of Maryland, Baltimore County, Baltimore, MD, USA","institution_ids":["https://openalex.org/I79272384"]}]},{"author_position":"last","author":{"id":"https://openalex.org/A5074026920","display_name":"Fow\u2010Sen Choa","orcid":"https://orcid.org/0000-0001-9613-6110","observed_orcids":["https://orcid.org/0000-0001-9613-6110"]},"institutions":[{"id":"https://openalex.org/I79272384","display_name":"University of Maryland, Baltimore County","ror":"https://ror.org/02qskvh78","country_code":"US","type":"education","lineage":["https://openalex.org/I79272384"]}],"countries":["US"],"is_corresponding":false,"raw_author_name":"Fow-Sen Choa","raw_affiliation_strings":["Computer Science and Electrical Engineering, University of Maryland, Baltimore County, Baltimore, MD, USA"],"raw_orcid":null,"affiliations":[{"raw_affiliation_string":"Computer Science and Electrical Engineering, University of Maryland, Baltimore County, Baltimore, MD, USA","institution_ids":["https://openalex.org/I79272384"]}]}],"institutions":[],"countries_distinct_count":1,"institutions_distinct_count":2,"corresponding_author_ids":[],"corresponding_institution_ids":[],"apc_list":null,"apc_paid":null,"fwci":0.0,"has_fulltext":false,"cited_by_count":0,"citation_normalized_percentile":{"value":0.25874824,"is_in_top_1_percent":false,"is_in_top_10_percent":false},"cited_by_percentile_year":null,"biblio":{"volume":"1318","issue":null,"first_page":null,"last_page":null},"is_retracted":false,"is_paratext":false,"is_xpac":false,"primary_topic":{"id":"https://openalex.org/T11637","display_name":"Advanced Semiconductor Detectors and Materials","score":0.76419997215271,"subfield":{"id":"https://openalex.org/subfields/2208","display_name":"Electrical and Electronic Engineering"},"field":{"id":"https://openalex.org/fields/22","display_name":"Engineering"},"domain":{"id":"https://openalex.org/domains/3","display_name":"Physical Sciences"}},"topics":[{"id":"https://openalex.org/T11637","display_name":"Advanced Semiconductor Detectors and Materials","score":0.76419997215271,"subfield":{"id":"https://openalex.org/subfields/2208","display_name":"Electrical and Electronic Engineering"},"field":{"id":"https://openalex.org/fields/22","display_name":"Engineering"},"domain":{"id":"https://openalex.org/domains/3","display_name":"Physical Sciences"}},{"id":"https://openalex.org/T10022","display_name":"Semiconductor Quantum Structures and Devices","score":0.09149999916553497,"subfield":{"id":"https://openalex.org/subfields/3107","display_name":"Atomic and Molecular Physics, and Optics"},"field":{"id":"https://openalex.org/fields/31","display_name":"Physics and Astronomy"},"domain":{"id":"https://openalex.org/domains/3","display_name":"Physical Sciences"}},{"id":"https://openalex.org/T12613","display_name":"X-ray Diffraction in Crystallography","score":0.027799999341368675,"subfield":{"id":"https://openalex.org/subfields/2505","display_name":"Materials Chemistry"},"field":{"id":"https://openalex.org/fields/25","display_name":"Materials Science"},"domain":{"id":"https://openalex.org/domains/3","display_name":"Physical Sciences"}}],"keywords":[{"id":"https://openalex.org/keywords/strained-layer-superlattices","display_name":"strained-layer superlattices","score":0.8899999856948853},{"id":"https://openalex.org/keywords/quantum-cascade-laser","display_name":"quantum cascade lasers","score":0.9100000262260437},{"id":"https://openalex.org/keywords/ingaas-inalas-superlattice","display_name":"InGaAs/InAlAs superlattice","score":0.8230000138282776},{"id":"https://openalex.org/keywords/inas-gasb-superlattices","display_name":"InAs/GaSb superlattice","score":0.9750000238418579},{"id":"https://openalex.org/keywords/epitaxial-quality","display_name":"epitaxial quality","score":0.7350000143051147},{"id":"https://openalex.org/keywords/x-ray-diffraction-pattern-analysis","display_name":"X-ray diffraction pattern analysis","score":0.652999997138977},{"id":"https://openalex.org/keywords/lattice-relaxation","display_name":"lattice relaxation","score":0.6330000162124634},{"id":"https://openalex.org/keywords/x-ray-diffraction-simulation","display_name":"X-ray diffraction simulation","score":0.6669999957084656}],"concepts":[{"id":"https://openalex.org/C105382558","wikidata":"https://www.wikidata.org/wiki/Q332431","display_name":"Superlattice","level":2,"score":0.9482182264328003},{"id":"https://openalex.org/C192562407","wikidata":"https://www.wikidata.org/wiki/Q228736","display_name":"Materials science","level":0,"score":0.7928900718688965},{"id":"https://openalex.org/C49040817","wikidata":"https://www.wikidata.org/wiki/Q193091","display_name":"Optoelectronics","level":1,"score":0.5959806442260742},{"id":"https://openalex.org/C160671074","wikidata":"https://www.wikidata.org/wiki/Q267131","display_name":"Wafer","level":2,"score":0.5922625064849854},{"id":"https://openalex.org/C110738630","wikidata":"https://www.wikidata.org/wiki/Q1135540","display_name":"Epitaxy","level":3,"score":0.5405122637748718},{"id":"https://openalex.org/C136525101","wikidata":"https://www.wikidata.org/wiki/Q5428139","display_name":"Fabrication","level":3,"score":0.5154427289962769},{"id":"https://openalex.org/C207114421","wikidata":"https://www.wikidata.org/wiki/Q133900","display_name":"Diffraction","level":2,"score":0.48319923877716064},{"id":"https://openalex.org/C6518042","wikidata":"https://www.wikidata.org/wiki/Q175646","display_name":"Scanning tunneling microscope","level":2,"score":0.41227272152900696},{"id":"https://openalex.org/C120665830","wikidata":"https://www.wikidata.org/wiki/Q14620","display_name":"Optics","level":1,"score":0.3271852731704712},{"id":"https://openalex.org/C171250308","wikidata":"https://www.wikidata.org/wiki/Q11468","display_name":"Nanotechnology","level":1,"score":0.24483823776245117},{"id":"https://openalex.org/C2779227376","wikidata":"https://www.wikidata.org/wiki/Q6505497","display_name":"Layer (electronics)","level":2,"score":0.22022563219070435},{"id":"https://openalex.org/C121332964","wikidata":"https://www.wikidata.org/wiki/Q413","display_name":"Physics","level":0,"score":0.06352812051773071},{"id":"https://openalex.org/C204787440","wikidata":"https://www.wikidata.org/wiki/Q188504","display_name":"Alternative medicine","level":2,"score":0.0},{"id":"https://openalex.org/C71924100","wikidata":"https://www.wikidata.org/wiki/Q11190","display_name":"Medicine","level":0,"score":0.0},{"id":"https://openalex.org/C142724271","wikidata":"https://www.wikidata.org/wiki/Q7208","display_name":"Pathology","level":1,"score":0.0}],"mesh":[],"locations_count":1,"locations":[{"id":"doi:10.1557/opl.2011.624","doi":"https://doi.org/10.1557/opl.2011.624","is_oa":false,"landing_page_url":"https://doi.org/10.1557/opl.2011.624","pdf_url":null,"source":{"id":"https://openalex.org/S2530005873","display_name":"MRS Proceedings","issn_l":"0272-9172","issn":["0272-9172","1946-4274"],"is_oa":false,"is_in_doaj":false,"is_core":true,"listed_in":["cwts-core","jufo-1","norway-1"],"host_organization":"https://openalex.org/P4310311721","host_organization_name":"Cambridge University Press","host_organization_lineage":["https://openalex.org/P4310311721","https://openalex.org/P4310311702"],"host_organization_lineage_names":["Cambridge University Press","University of Cambridge"],"type":"journal"},"license":null,"license_id":null,"version":"publishedVersion","is_accepted":true,"is_published":true,"raw_source_name":"MRS Proceedings","raw_type":"journal-article"}],"best_oa_location":null,"sustainable_development_goals":[],"sustainable_development_goals_aurora":[],"study_designs":[],"awards":[],"funders":[],"has_content":{"pdf":false,"grobid_xml":false},"content_urls":null,"referenced_works_count":2,"referenced_works":["https://openalex.org/W584990496","https://openalex.org/W1600796735"],"related_works":["https://openalex.org/W2026628379","https://openalex.org/W1984860738","https://openalex.org/W2405895097","https://openalex.org/W2168586217","https://openalex.org/W2792721407","https://openalex.org/W279396859","https://openalex.org/W1965686274","https://openalex.org/W2012557245","https://openalex.org/W1990495318","https://openalex.org/W2034592733"],"abstract_inverted_index":null,"counts_by_year":[],"updated_date":"2026-06-19T15:47:20.252518","created_date":"2025-10-10T00:00:00"}