{"id":"https://openalex.org/W2318855604","doi":"https://doi.org/10.1557/opl.2013.478","title":"Electronic Transport and Doping Effects in Reduced Graphene Oxide Measured by Scanning Probe Microscopy","display_name":"Electronic Transport and Doping Effects in Reduced Graphene Oxide Measured by Scanning Probe Microscopy","publication_year":2013,"publication_date":"2013-01-01","ids":{"openalex":"https://openalex.org/W2318855604","doi":"https://doi.org/10.1557/opl.2013.478","mag":"2318855604"},"language":"en","primary_location":{"id":"doi:10.1557/opl.2013.478","doi":"https://doi.org/10.1557/opl.2013.478","is_oa":false,"landing_page_url":"https://doi.org/10.1557/opl.2013.478","pdf_url":null,"source":{"id":"https://openalex.org/S2530005873","display_name":"MRS Proceedings","issn_l":"0272-9172","issn":["0272-9172","1946-4274"],"is_oa":false,"is_in_doaj":false,"is_core":true,"listed_in":["cwts-core","jufo-1","norway-1"],"host_organization":"https://openalex.org/P4310311721","host_organization_name":"Cambridge University Press","host_organization_lineage":["https://openalex.org/P4310311721","https://openalex.org/P4310311702"],"host_organization_lineage_names":["Cambridge University Press","University of Cambridge"],"type":"journal"},"license":null,"license_id":null,"version":"publishedVersion","is_accepted":true,"is_published":true,"raw_source_name":"MRS Proceedings","raw_type":"journal-article"},"volume":null,"type":"article","indexed_in":["crossref"],"open_access":{"is_oa":false,"oa_status":"closed","oa_url":null,"any_repository_has_fulltext":false},"authorships":[{"author_position":"first","author":{"id":"https://openalex.org/A5010753454","display_name":"Christopher E. Kehayias","orcid":"https://orcid.org/0009-0009-1513-681X","observed_orcids":["https://orcid.org/0009-0009-1513-681X"]},"institutions":[{"id":"https://openalex.org/I121934306","display_name":"Tufts University","ror":"https://ror.org/05wvpxv85","country_code":"US","type":"education","lineage":["https://openalex.org/I121934306"]}],"countries":["US"],"is_corresponding":false,"raw_author_name":"Christopher E. Kehayias","raw_affiliation_strings":["Department of Physics and Astronomy and Center for Nanoscopic Physics, Tufts University, 4 Colby Street, 02155, Medford, MA, USA"],"raw_orcid":null,"affiliations":[{"raw_affiliation_string":"Department of Physics and Astronomy and Center for Nanoscopic Physics, Tufts University, 4 Colby Street, 02155, Medford, MA, USA","institution_ids":["https://openalex.org/I121934306"]}]},{"author_position":"middle","author":{"id":"https://openalex.org/A5084731713","display_name":"Samuel MacNaughton","orcid":null,"observed_orcids":[]},"institutions":[{"id":"https://openalex.org/I121934306","display_name":"Tufts University","ror":"https://ror.org/05wvpxv85","country_code":"US","type":"education","lineage":["https://openalex.org/I121934306"]}],"countries":["US"],"is_corresponding":false,"raw_author_name":"Samuel MacNaughton","raw_affiliation_strings":["Department of Electrical and Computer Engineering, Tufts University, 161 College Avenue, 02155, Medford, MA, USA"],"raw_orcid":null,"affiliations":[{"raw_affiliation_string":"Department of Electrical and Computer Engineering, Tufts University, 161 College Avenue, 02155, Medford, MA, USA","institution_ids":["https://openalex.org/I121934306"]}]},{"author_position":"middle","author":{"id":"https://openalex.org/A5088891429","display_name":"Sameer Sonkusale","orcid":"https://orcid.org/0000-0003-3579-910X","observed_orcids":["https://orcid.org/0000-0003-3579-910X"]},"institutions":[{"id":"https://openalex.org/I121934306","display_name":"Tufts University","ror":"https://ror.org/05wvpxv85","country_code":"US","type":"education","lineage":["https://openalex.org/I121934306"]}],"countries":["US"],"is_corresponding":false,"raw_author_name":"Sameer Sonkusale","raw_affiliation_strings":["Department of Electrical and Computer Engineering, Tufts University, 161 College Avenue, 02155, Medford, MA, USA"],"raw_orcid":null,"affiliations":[{"raw_affiliation_string":"Department of Electrical and Computer Engineering, Tufts University, 161 College Avenue, 02155, Medford, MA, USA","institution_ids":["https://openalex.org/I121934306"]}]},{"author_position":"last","author":{"id":"https://openalex.org/A5012511525","display_name":"Cristian Staii","orcid":"https://orcid.org/0000-0002-9771-8400","observed_orcids":["https://orcid.org/0000-0002-9771-8400"]},"institutions":[{"id":"https://openalex.org/I121934306","display_name":"Tufts University","ror":"https://ror.org/05wvpxv85","country_code":"US","type":"education","lineage":["https://openalex.org/I121934306"]}],"countries":["US"],"is_corresponding":false,"raw_author_name":"Cristian Staii","raw_affiliation_strings":["Department of Physics and Astronomy and Center for Nanoscopic Physics, Tufts University, 4 Colby Street, 02155, Medford, MA, USA"],"raw_orcid":null,"affiliations":[{"raw_affiliation_string":"Department of Physics and Astronomy and Center for Nanoscopic Physics, Tufts University, 4 Colby Street, 02155, Medford, MA, USA","institution_ids":["https://openalex.org/I121934306"]}]}],"institutions":[],"countries_distinct_count":1,"institutions_distinct_count":1,"corresponding_author_ids":[],"corresponding_institution_ids":["https://openalex.org/I121934306"],"apc_list":null,"apc_paid":null,"fwci":0.1503,"has_fulltext":false,"cited_by_count":1,"citation_normalized_percentile":{"value":0.50691258,"is_in_top_1_percent":false,"is_in_top_10_percent":false},"cited_by_percentile_year":{"min":89,"max":94},"biblio":{"volume":"1505","issue":null,"first_page":null,"last_page":null},"is_retracted":false,"is_paratext":false,"is_xpac":false,"primary_topic":{"id":"https://openalex.org/T10083","display_name":"Graphene research and applications","score":0.9218999743461609,"subfield":{"id":"https://openalex.org/subfields/2505","display_name":"Materials Chemistry"},"field":{"id":"https://openalex.org/fields/25","display_name":"Materials Science"},"domain":{"id":"https://openalex.org/domains/3","display_name":"Physical Sciences"}},"topics":[{"id":"https://openalex.org/T10083","display_name":"Graphene research and applications","score":0.9218999743461609,"subfield":{"id":"https://openalex.org/subfields/2505","display_name":"Materials Chemistry"},"field":{"id":"https://openalex.org/fields/25","display_name":"Materials Science"},"domain":{"id":"https://openalex.org/domains/3","display_name":"Physical Sciences"}},{"id":"https://openalex.org/T10461","display_name":"Gas Sensing Nanomaterials and Sensors","score":0.02800000086426735,"subfield":{"id":"https://openalex.org/subfields/2208","display_name":"Electrical and Electronic Engineering"},"field":{"id":"https://openalex.org/fields/22","display_name":"Engineering"},"domain":{"id":"https://openalex.org/domains/3","display_name":"Physical Sciences"}},{"id":"https://openalex.org/T10212","display_name":"Electrochemical sensors and biosensors","score":0.023499999195337296,"subfield":{"id":"https://openalex.org/subfields/2208","display_name":"Electrical and Electronic Engineering"},"field":{"id":"https://openalex.org/fields/22","display_name":"Engineering"},"domain":{"id":"https://openalex.org/domains/3","display_name":"Physical Sciences"}}],"keywords":[{"id":"https://openalex.org/keywords/reduced-graphene-oxide","display_name":"reduced graphene oxide","score":1.0},{"id":"https://openalex.org/keywords/doping","display_name":"doping","score":0.7739999890327454},{"id":"https://openalex.org/keywords/nanosensors","display_name":"nanosensors","score":0.722000002861023},{"id":"https://openalex.org/keywords/kelvin-probe-force-microscopy","display_name":"Kelvin probe force microscopy","score":0.9160000085830688},{"id":"https://openalex.org/keywords/dielectrophoretic-assembly","display_name":"dielectrophoretic assembly","score":0.9279999732971191},{"id":"https://openalex.org/keywords/interdigitated-electrodes","display_name":"interdigitated electrodes","score":0.9070000052452087},{"id":"https://openalex.org/keywords/organic-dopants","display_name":"organic dopants","score":0.6930000185966492},{"id":"https://openalex.org/keywords/charge-transfer","display_name":"charge transfer","score":0.7120000123977661},{"id":"https://openalex.org/keywords/oxygen-containing-functional-groups","display_name":"oxygen-containing functional groups","score":0.7960000038146973},{"id":"https://openalex.org/keywords/charge-distribution","display_name":"charge distribution","score":0.5230000019073486}],"concepts":[{"id":"https://openalex.org/C192562407","wikidata":"https://www.wikidata.org/wiki/Q228736","display_name":"Materials science","level":0,"score":0.8372372388839722},{"id":"https://openalex.org/C30080830","wikidata":"https://www.wikidata.org/wiki/Q169917","display_name":"Graphene","level":2,"score":0.7953951358795166},{"id":"https://openalex.org/C191952053","wikidata":"https://www.wikidata.org/wiki/Q15119237","display_name":"Dopant","level":3,"score":0.7231848239898682},{"id":"https://openalex.org/C57863236","wikidata":"https://www.wikidata.org/wiki/Q1130571","display_name":"Doping","level":2,"score":0.6432923078536987},{"id":"https://openalex.org/C36628996","wikidata":"https://www.wikidata.org/wiki/Q907287","display_name":"Scanning probe microscopy","level":2,"score":0.6414788961410522},{"id":"https://openalex.org/C2779851234","wikidata":"https://www.wikidata.org/wiki/Q50690","display_name":"Oxide","level":2,"score":0.5712878108024597},{"id":"https://openalex.org/C171250308","wikidata":"https://www.wikidata.org/wiki/Q11468","display_name":"Nanotechnology","level":1,"score":0.5597988963127136},{"id":"https://openalex.org/C83898325","wikidata":"https://www.wikidata.org/wiki/Q1324110","display_name":"Kelvin probe force microscope","level":3,"score":0.5531453490257263},{"id":"https://openalex.org/C99752389","wikidata":"https://www.wikidata.org/wiki/Q9337610","display_name":"Scanning capacitance microscopy","level":4,"score":0.47997403144836426},{"id":"https://openalex.org/C160671074","wikidata":"https://www.wikidata.org/wiki/Q267131","display_name":"Wafer","level":2,"score":0.4621357023715973},{"id":"https://openalex.org/C2777194046","wikidata":"https://www.wikidata.org/wiki/Q25303756","display_name":"Chemiresistor","level":2,"score":0.4387880265712738},{"id":"https://openalex.org/C147080431","wikidata":"https://www.wikidata.org/wiki/Q1074953","display_name":"Microscopy","level":2,"score":0.4176428020000458},{"id":"https://openalex.org/C49040817","wikidata":"https://www.wikidata.org/wiki/Q193091","display_name":"Optoelectronics","level":1,"score":0.40597301721572876},{"id":"https://openalex.org/C113196181","wikidata":"https://www.wikidata.org/wiki/Q485223","display_name":"Analytical Chemistry (journal)","level":2,"score":0.3246825337409973},{"id":"https://openalex.org/C26771246","wikidata":"https://www.wikidata.org/wiki/Q321095","display_name":"Scanning electron microscope","level":2,"score":0.298462837934494},{"id":"https://openalex.org/C187921700","wikidata":"https://www.wikidata.org/wiki/Q7430074","display_name":"Scanning confocal electron microscopy","level":3,"score":0.11982542276382446},{"id":"https://openalex.org/C185592680","wikidata":"https://www.wikidata.org/wiki/Q2329","display_name":"Chemistry","level":0,"score":0.08927035331726074},{"id":"https://openalex.org/C120665830","wikidata":"https://www.wikidata.org/wiki/Q14620","display_name":"Optics","level":1,"score":0.0886448323726654},{"id":"https://openalex.org/C102951782","wikidata":"https://www.wikidata.org/wiki/Q49295","display_name":"Atomic force microscopy","level":2,"score":0.0726521909236908},{"id":"https://openalex.org/C43617362","wikidata":"https://www.wikidata.org/wiki/Q170050","display_name":"Chromatography","level":1,"score":0.0},{"id":"https://openalex.org/C121332964","wikidata":"https://www.wikidata.org/wiki/Q413","display_name":"Physics","level":0,"score":0.0},{"id":"https://openalex.org/C159985019","wikidata":"https://www.wikidata.org/wiki/Q181790","display_name":"Composite material","level":1,"score":0.0},{"id":"https://openalex.org/C191897082","wikidata":"https://www.wikidata.org/wiki/Q11467","display_name":"Metallurgy","level":1,"score":0.0}],"mesh":[],"locations_count":1,"locations":[{"id":"doi:10.1557/opl.2013.478","doi":"https://doi.org/10.1557/opl.2013.478","is_oa":false,"landing_page_url":"https://doi.org/10.1557/opl.2013.478","pdf_url":null,"source":{"id":"https://openalex.org/S2530005873","display_name":"MRS Proceedings","issn_l":"0272-9172","issn":["0272-9172","1946-4274"],"is_oa":false,"is_in_doaj":false,"is_core":true,"listed_in":["cwts-core","jufo-1","norway-1"],"host_organization":"https://openalex.org/P4310311721","host_organization_name":"Cambridge University Press","host_organization_lineage":["https://openalex.org/P4310311721","https://openalex.org/P4310311702"],"host_organization_lineage_names":["Cambridge University Press","University of Cambridge"],"type":"journal"},"license":null,"license_id":null,"version":"publishedVersion","is_accepted":true,"is_published":true,"raw_source_name":"MRS Proceedings","raw_type":"journal-article"}],"best_oa_location":null,"sustainable_development_goals":[],"study_designs":[],"awards":[],"funders":[],"has_content":{"grobid_xml":false,"pdf":false},"content_urls":null,"referenced_works_count":10,"referenced_works":["https://openalex.org/W323741638","https://openalex.org/W1985470610","https://openalex.org/W1990580417","https://openalex.org/W2015019112","https://openalex.org/W2114569196","https://openalex.org/W2125284466","https://openalex.org/W2133020370","https://openalex.org/W2154133049","https://openalex.org/W3100025636","https://openalex.org/W3104248709"],"related_works":["https://openalex.org/W2002574431","https://openalex.org/W4414623233","https://openalex.org/W4224092107","https://openalex.org/W7021277116","https://openalex.org/W6908329492","https://openalex.org/W2596812390","https://openalex.org/W2075902303","https://openalex.org/W2755445926","https://openalex.org/W3217401353","https://openalex.org/W4396680653"],"abstract_inverted_index":null,"counts_by_year":[{"year":2014,"cited_by_count":1}],"updated_date":"2026-09-20T07:33:13.661266","created_date":"2016-06-24T00:00:00"}