{"id":"https://openalex.org/W2305538522","doi":"https://doi.org/10.2497/jjspm.61.18","title":"Synthesis and Thermoelectric Properties of Carrier-Doped CuFeS2 Sintered Samples","display_name":"Synthesis and Thermoelectric Properties of Carrier-Doped CuFeS2 Sintered Samples","publication_year":2014,"publication_date":"2014-01-01","ids":{"openalex":"https://openalex.org/W2305538522","doi":"https://doi.org/10.2497/jjspm.61.18","mag":"2305538522"},"language":"en","primary_location":{"id":"doi:10.2497/jjspm.61.18","doi":"https://doi.org/10.2497/jjspm.61.18","is_oa":true,"landing_page_url":"https://doi.org/10.2497/jjspm.61.18","pdf_url":"https://www.jstage.jst.go.jp/article/jjspm/61/1/61_18/_pdf","source":{"id":"https://openalex.org/S4210178523","display_name":"Journal of the Japan Society of Powder and Powder Metallurgy","issn_l":"0532-8799","issn":["0532-8799","1880-9014"],"is_oa":true,"is_in_doaj":false,"is_core":true,"listed_in":["cwts-core","poland-20","russia-white-list-4"],"host_organization":null,"host_organization_name":null,"host_organization_lineage":[],"host_organization_lineage_names":[],"type":"journal"},"license":"cc-by-nc-nd","license_id":"https://openalex.org/licenses/cc-by-nc-nd","version":"publishedVersion","is_accepted":true,"is_published":true,"raw_source_name":"Journal of the Japan Society of Powder and Powder Metallurgy","raw_type":"journal-article"},"volume":null,"type":"article","is_traditional":true,"indexed_in":["crossref"],"open_access":{"is_oa":true,"oa_status":"diamond","oa_url":"https://www.jstage.jst.go.jp/article/jjspm/61/1/61_18/_pdf","any_repository_has_fulltext":false},"authorships":[{"author_position":"first","author":{"id":"https://openalex.org/A5040958617","display_name":"Naohito Tsujii","orcid":"https://orcid.org/0000-0002-6181-5911","observed_orcids":["https://orcid.org/0000-0002-6181-5911"]},"institutions":[{"id":"https://openalex.org/I205401836","display_name":"National Institute for Materials Science","ror":"https://ror.org/026v1ze26","country_code":"JP","type":"facility","lineage":["https://openalex.org/I205401836"]}],"countries":["JP"],"is_corresponding":false,"raw_author_name":"Naohito TUJII","raw_affiliation_strings":["\u7269\u8cea\u30fb\u6750\u6599\u7814\u7a76\u6a5f\u69cb"],"raw_orcid":null,"affiliations":[{"raw_affiliation_string":"\u7269\u8cea\u30fb\u6750\u6599\u7814\u7a76\u6a5f\u69cb","institution_ids":["https://openalex.org/I205401836"]}]},{"author_position":"last","author":{"id":"https://openalex.org/A5068864721","display_name":"Takao Mori","orcid":"https://orcid.org/0000-0003-2682-1846","observed_orcids":["https://orcid.org/0000-0003-2682-1846"]},"institutions":[{"id":"https://openalex.org/I205401836","display_name":"National Institute for Materials Science","ror":"https://ror.org/026v1ze26","country_code":"JP","type":"facility","lineage":["https://openalex.org/I205401836"]}],"countries":["JP"],"is_corresponding":false,"raw_author_name":"Takao MORI","raw_affiliation_strings":["\u7269\u8cea\u30fb\u6750\u6599\u7814\u7a76\u6a5f\u69cb"],"raw_orcid":null,"affiliations":[{"raw_affiliation_string":"\u7269\u8cea\u30fb\u6750\u6599\u7814\u7a76\u6a5f\u69cb","institution_ids":["https://openalex.org/I205401836"]}]}],"institutions":[],"countries_distinct_count":1,"institutions_distinct_count":1,"corresponding_author_ids":[],"corresponding_institution_ids":["https://openalex.org/I205401836"],"apc_list":null,"apc_paid":null,"fwci":0.1346,"has_fulltext":true,"cited_by_count":2,"citation_normalized_percentile":{"value":0.42526986,"is_in_top_1_percent":false,"is_in_top_10_percent":false},"cited_by_percentile_year":{"min":89,"max":94},"biblio":{"volume":"61","issue":"1","first_page":"18","last_page":"27"},"is_retracted":false,"is_paratext":false,"is_xpac":false,"primary_topic":{"id":"https://openalex.org/T10440","display_name":"Advanced Thermoelectric Materials and Devices","score":0.9994999766349792,"subfield":{"id":"https://openalex.org/subfields/2505","display_name":"Materials Chemistry"},"field":{"id":"https://openalex.org/fields/25","display_name":"Materials Science"},"domain":{"id":"https://openalex.org/domains/3","display_name":"Physical Sciences"}},"topics":[{"id":"https://openalex.org/T10440","display_name":"Advanced Thermoelectric Materials and Devices","score":0.9994999766349792,"subfield":{"id":"https://openalex.org/subfields/2505","display_name":"Materials Chemistry"},"field":{"id":"https://openalex.org/fields/25","display_name":"Materials Science"},"domain":{"id":"https://openalex.org/domains/3","display_name":"Physical Sciences"}},{"id":"https://openalex.org/T13251","display_name":"Electrical and Thermal Properties of Materials","score":0.0003000000142492354,"subfield":{"id":"https://openalex.org/subfields/2208","display_name":"Electrical and Electronic Engineering"},"field":{"id":"https://openalex.org/fields/22","display_name":"Engineering"},"domain":{"id":"https://openalex.org/domains/3","display_name":"Physical Sciences"}},{"id":"https://openalex.org/T10590","display_name":"Chalcogenide Semiconductor Thin Films","score":0.0,"subfield":{"id":"https://openalex.org/subfields/2208","display_name":"Electrical and Electronic Engineering"},"field":{"id":"https://openalex.org/fields/22","display_name":"Engineering"},"domain":{"id":"https://openalex.org/domains/3","display_name":"Physical Sciences"}}],"keywords":[{"id":"https://openalex.org/keywords/chalcopyrite","display_name":"chalcopyrite","score":0.9789999723434448},{"id":"https://openalex.org/keywords/carrier-doping","display_name":"carrier doping","score":0.8009999990463257},{"id":"https://openalex.org/keywords/thermoelectric-properties","display_name":"thermoelectric properties","score":0.9570000171661377},{"id":"https://openalex.org/keywords/spark-plasma-sintering","display_name":"spark plasma sintering","score":0.9860000014305115},{"id":"https://openalex.org/keywords/solid-state-synthesis","display_name":"solid-state synthesis","score":0.8489999771118164},{"id":"https://openalex.org/keywords/electrical-resistivity","display_name":"electrical resistivity","score":0.8259999752044678},{"id":"https://openalex.org/keywords/seebeck-coefficient","display_name":"Seebeck coefficient","score":0.9549999833106995},{"id":"https://openalex.org/keywords/power-factor","display_name":"power factor","score":0.9670000076293945},{"id":"https://openalex.org/keywords/fe-doping","display_name":"iron doping","score":0.7120000123977661},{"id":"https://openalex.org/keywords/zinc-doping","display_name":"zinc doping","score":0.9990000128746033},{"id":"https://openalex.org/keywords/annealing","display_name":"annealing","score":0.9020000100135803},{"id":"https://openalex.org/keywords/sintered-density","display_name":"sintered density","score":0.6399999856948853}],"concepts":[{"id":"https://openalex.org/C2776014600","wikidata":"https://www.wikidata.org/wiki/Q2307265","display_name":"Spark plasma sintering","level":3,"score":0.9589967727661133},{"id":"https://openalex.org/C192562407","wikidata":"https://www.wikidata.org/wiki/Q228736","display_name":"Materials science","level":0,"score":0.8062441349029541},{"id":"https://openalex.org/C112625512","wikidata":"https://www.wikidata.org/wiki/Q1091448","display_name":"Seebeck coefficient","level":3,"score":0.7848129272460938},{"id":"https://openalex.org/C63024428","wikidata":"https://www.wikidata.org/wiki/Q552456","display_name":"Thermoelectric effect","level":2,"score":0.7416051626205444},{"id":"https://openalex.org/C69990965","wikidata":"https://www.wikidata.org/wiki/Q65402698","display_name":"Electrical resistivity and conductivity","level":2,"score":0.6573852896690369},{"id":"https://openalex.org/C2777855556","wikidata":"https://www.wikidata.org/wiki/Q4339544","display_name":"Annealing (glass)","level":2,"score":0.614939272403717},{"id":"https://openalex.org/C57863236","wikidata":"https://www.wikidata.org/wiki/Q1130571","display_name":"Doping","level":2,"score":0.6128664016723633},{"id":"https://openalex.org/C113196181","wikidata":"https://www.wikidata.org/wiki/Q485223","display_name":"Analytical Chemistry (journal)","level":2,"score":0.5104236006736755},{"id":"https://openalex.org/C207365445","wikidata":"https://www.wikidata.org/wiki/Q15020929","display_name":"Thermoelectric materials","level":3,"score":0.5010685920715332},{"id":"https://openalex.org/C2777581544","wikidata":"https://www.wikidata.org/wiki/Q844613","display_name":"Sintering","level":2,"score":0.46680715680122375},{"id":"https://openalex.org/C109724073","wikidata":"https://www.wikidata.org/wiki/Q1757819","display_name":"Charge-carrier density","level":3,"score":0.4115895926952362},{"id":"https://openalex.org/C191897082","wikidata":"https://www.wikidata.org/wiki/Q11467","display_name":"Metallurgy","level":1,"score":0.2613563537597656},{"id":"https://openalex.org/C97346530","wikidata":"https://www.wikidata.org/wiki/Q487005","display_name":"Thermal conductivity","level":2,"score":0.17803320288658142},{"id":"https://openalex.org/C49040817","wikidata":"https://www.wikidata.org/wiki/Q193091","display_name":"Optoelectronics","level":1,"score":0.16935423016548157},{"id":"https://openalex.org/C159985019","wikidata":"https://www.wikidata.org/wiki/Q181790","display_name":"Composite material","level":1,"score":0.1439422369003296},{"id":"https://openalex.org/C185592680","wikidata":"https://www.wikidata.org/wiki/Q2329","display_name":"Chemistry","level":0,"score":0.09378120303153992},{"id":"https://openalex.org/C97355855","wikidata":"https://www.wikidata.org/wiki/Q11473","display_name":"Thermodynamics","level":1,"score":0.06493270397186279},{"id":"https://openalex.org/C107872376","wikidata":"https://www.wikidata.org/wiki/Q321355","display_name":"Environmental chemistry","level":1,"score":0.053608328104019165},{"id":"https://openalex.org/C127413603","wikidata":"https://www.wikidata.org/wiki/Q11023","display_name":"Engineering","level":0,"score":0.0},{"id":"https://openalex.org/C121332964","wikidata":"https://www.wikidata.org/wiki/Q413","display_name":"Physics","level":0,"score":0.0},{"id":"https://openalex.org/C119599485","wikidata":"https://www.wikidata.org/wiki/Q43035","display_name":"Electrical engineering","level":1,"score":0.0}],"mesh":[],"locations_count":1,"locations":[{"id":"doi:10.2497/jjspm.61.18","doi":"https://doi.org/10.2497/jjspm.61.18","is_oa":true,"landing_page_url":"https://doi.org/10.2497/jjspm.61.18","pdf_url":"https://www.jstage.jst.go.jp/article/jjspm/61/1/61_18/_pdf","source":{"id":"https://openalex.org/S4210178523","display_name":"Journal of the Japan Society of Powder and Powder Metallurgy","issn_l":"0532-8799","issn":["0532-8799","1880-9014"],"is_oa":true,"is_in_doaj":false,"is_core":true,"listed_in":["cwts-core","poland-20","russia-white-list-4"],"host_organization":null,"host_organization_name":null,"host_organization_lineage":[],"host_organization_lineage_names":[],"type":"journal"},"license":"cc-by-nc-nd","license_id":"https://openalex.org/licenses/cc-by-nc-nd","version":"publishedVersion","is_accepted":true,"is_published":true,"raw_source_name":"Journal of the Japan Society of Powder and Powder Metallurgy","raw_type":"journal-article"}],"best_oa_location":{"id":"doi:10.2497/jjspm.61.18","doi":"https://doi.org/10.2497/jjspm.61.18","is_oa":true,"landing_page_url":"https://doi.org/10.2497/jjspm.61.18","pdf_url":"https://www.jstage.jst.go.jp/article/jjspm/61/1/61_18/_pdf","source":{"id":"https://openalex.org/S4210178523","display_name":"Journal of the Japan Society of Powder and Powder Metallurgy","issn_l":"0532-8799","issn":["0532-8799","1880-9014"],"is_oa":true,"is_in_doaj":false,"is_core":true,"listed_in":["cwts-core","poland-20","russia-white-list-4"],"host_organization":null,"host_organization_name":null,"host_organization_lineage":[],"host_organization_lineage_names":[],"type":"journal"},"license":"cc-by-nc-nd","license_id":"https://openalex.org/licenses/cc-by-nc-nd","version":"publishedVersion","is_accepted":true,"is_published":true,"raw_source_name":"Journal of the Japan Society of Powder and Powder Metallurgy","raw_type":"journal-article"},"sustainable_development_goals":[{"score":0.4000000059604645,"display_name":"Affordable and clean energy","id":"https://metadata.un.org/sdg/7"}],"study_designs":[],"awards":[{"id":"https://openalex.org/G8930355973","display_name":"Study of the origin of high thermoelectric performance in compound semiconductors with Fe","funder_award_id":"24550168","funder_id":"https://openalex.org/F4320334764","funder_display_name":"Japan Society for the Promotion of Science"}],"funders":[{"id":"https://openalex.org/F4320334764","display_name":"Japan Society for the Promotion of Science","ror":"https://ror.org/00hhkn466"}],"has_content":{"pdf":true,"grobid_xml":true},"content_urls":{"pdf":"https://content.openalex.org/works/W2305538522.pdf","grobid_xml":"https://content.openalex.org/works/W2305538522.grobid-xml"},"referenced_works_count":12,"referenced_works":["https://openalex.org/W1657961768","https://openalex.org/W1993099590","https://openalex.org/W1998195686","https://openalex.org/W2018403353","https://openalex.org/W2020419536","https://openalex.org/W2021554355","https://openalex.org/W2054628691","https://openalex.org/W2056255485","https://openalex.org/W2066357033","https://openalex.org/W2090143410","https://openalex.org/W2128354108","https://openalex.org/W2171438004"],"related_works":["https://openalex.org/W2609266370","https://openalex.org/W2056447358","https://openalex.org/W2066357033","https://openalex.org/W2313983111","https://openalex.org/W1979322170","https://openalex.org/W2219447770","https://openalex.org/W4404874427","https://openalex.org/W2073228191","https://openalex.org/W2082337874","https://openalex.org/W1975264538"],"abstract_inverted_index":{"Carrier-doped":[0],"CuFeS2":[1,95],"samples":[2,43,96,116],"have":[3,34,117],"been":[4],"synthesized":[5],"by":[6,32,72],"a":[7,35,45,106],"solid-state":[8],"reaction":[9],"(SSR)":[10],"and":[11,17,24,91,114],"the":[12,18,21,25,55,60,65,73,85,101,112,123],"spark-plasma":[13],"sintering":[14],"(SPS)":[15],"methods,":[16],"relation":[19],"between":[20],"synthesis":[22],"conditions":[23],"thermoelectric":[26],"properties":[27],"is":[28,69],"shown.":[29],"Samples":[30],"prepared":[31],"SSR":[33,124],"density":[36,47],"less":[37],"than":[38],"80":[39],"%,":[40],"while":[41],"SPS":[42,66,113],"show":[44],"high":[46],"close":[48],"to":[49,58,100],"100":[50],"%.":[51],"This":[52],"results":[53],"in":[54,64],"great":[56],"improvement":[57],"reduce":[59],"electrical":[61],"resistivity":[62],"(\u03c1)":[63],"samples.":[67,86],"\u03c1":[68],"further":[70],"reduced":[71],"subsequent":[74],"annealing.":[75],"Seebeck":[76],"coefficient":[77],"S":[78,87],"shows":[79],"large":[80],"negative":[81],"values":[82],"for":[83],"all":[84],"of":[88,111,122],"Fe":[89],"\u2013":[90,93],"Zn":[92],"doped":[94],"are":[97],"almost":[98,118],"independent":[99],"sample":[102],"preparation":[103],"methods.":[104],"As":[105],"result,":[107],"power":[108],"factor":[109],"S2/\u03c1":[110],"annealed":[115],"doubled":[119],"from":[120],"that":[121],"samples,":[125],"reaching":[126],"1":[127],"mW/K2m":[128],"at":[129],"400":[130],"K.":[131]},"counts_by_year":[{"year":2025,"cited_by_count":1},{"year":2017,"cited_by_count":1}],"updated_date":"2026-09-29T14:09:16.559479","created_date":"2016-06-24T00:00:00"}