{"id":"https://openalex.org/W2299656978","doi":"https://doi.org/10.1007/s13391-016-5387-8","title":"Investing the effectiveness of retention performance in a non-volatile floating gate memory device with a core-shell structure of CdSe nanoparticles","display_name":"Investing the effectiveness of retention performance in a non-volatile floating gate memory device with a core-shell structure of CdSe nanoparticles","publication_year":2016,"publication_date":"2016-03-01","ids":{"openalex":"https://openalex.org/W2299656978","doi":"https://doi.org/10.1007/s13391-016-5387-8","mag":"2299656978"},"language":"en","primary_location":{"id":"doi:10.1007/s13391-016-5387-8","doi":"https://doi.org/10.1007/s13391-016-5387-8","is_oa":false,"landing_page_url":"https://doi.org/10.1007/s13391-016-5387-8","pdf_url":null,"source":{"id":"https://openalex.org/S177378842","display_name":"Electronic Materials Letters","issn_l":"1738-8090","issn":["1738-8090","2093-6788"],"is_oa":false,"is_in_doaj":false,"is_core":true,"listed_in":["cwts-core","dongbi-c","jufo-1","kci-registered","poland-100","russia-white-list-2"],"host_organization":"https://openalex.org/P4310319900","host_organization_name":"Springer Science+Business Media","host_organization_lineage":["https://openalex.org/P4310319900","https://openalex.org/P4310319965"],"host_organization_lineage_names":["Springer Science+Business Media","Springer Nature"],"type":"journal"},"license":null,"license_id":null,"version":"publishedVersion","is_accepted":true,"is_published":true,"raw_source_name":"Electronic Materials Letters","raw_type":"journal-article"},"volume":null,"type":"article","is_traditional":true,"indexed_in":["crossref"],"open_access":{"is_oa":false,"oa_status":"closed","oa_url":null,"any_repository_has_fulltext":false},"authorships":[{"author_position":"first","author":{"id":"https://openalex.org/A5100422973","display_name":"Donghoon Lee","orcid":"https://orcid.org/0000-0003-0453-6059","observed_orcids":["https://orcid.org/0000-0003-0453-6059","https://orcid.org/0009-0004-0911-7114"]},"institutions":[{"id":"https://openalex.org/I848706","display_name":"Sungkyunkwan University","ror":"https://ror.org/04q78tk20","country_code":"KR","type":"education","lineage":["https://openalex.org/I848706"]}],"countries":["KR"],"is_corresponding":false,"raw_author_name":"Dong-Hoon Lee","raw_affiliation_strings":["School of Electronic and Electrical Engineering, Sungkyunkwan University, Suwon, 440-746, Korea"],"raw_orcid":null,"affiliations":[{"raw_affiliation_string":"School of Electronic and Electrical Engineering, Sungkyunkwan University, Suwon, 440-746, Korea","institution_ids":["https://openalex.org/I848706"]}]},{"author_position":"middle","author":{"id":"https://openalex.org/A5100451362","display_name":"Jungmin Kim","orcid":"https://orcid.org/0000-0002-5993-0988","observed_orcids":["https://orcid.org/0000-0002-5993-0988"]},"institutions":[{"id":"https://openalex.org/I2250650973","display_name":"Samsung (South Korea)","ror":"https://ror.org/04w3jy968","country_code":"KR","type":"company","lineage":["https://openalex.org/I2250650973"]}],"countries":["KR"],"is_corresponding":false,"raw_author_name":"Jung-Min Kim","raw_affiliation_strings":["Materials & Devices Lab., Corporate R&D Institute, Samsung Electro-Mechanics Co. Ltd., Suwon, 443-743, Korea"],"raw_orcid":null,"affiliations":[{"raw_affiliation_string":"Materials & Devices Lab., Corporate R&D Institute, Samsung Electro-Mechanics Co. Ltd., Suwon, 443-743, Korea","institution_ids":["https://openalex.org/I2250650973"]}]},{"author_position":"middle","author":{"id":"https://openalex.org/A5111770950","display_name":"Ki-Tae Lim","orcid":null,"observed_orcids":[]},"institutions":[{"id":"https://openalex.org/I848706","display_name":"Sungkyunkwan University","ror":"https://ror.org/04q78tk20","country_code":"KR","type":"education","lineage":["https://openalex.org/I848706"]}],"countries":["KR"],"is_corresponding":false,"raw_author_name":"Ki-Tae Lim","raw_affiliation_strings":["School of Electronic and Electrical Engineering, Sungkyunkwan University, Suwon, 440-746, Korea"],"raw_orcid":null,"affiliations":[{"raw_affiliation_string":"School of Electronic and Electrical Engineering, Sungkyunkwan University, Suwon, 440-746, Korea","institution_ids":["https://openalex.org/I848706"]}]},{"author_position":"middle","author":{"id":"https://openalex.org/A5007025920","display_name":"Hyeong Jun Cho","orcid":"https://orcid.org/0000-0001-6347-245X","observed_orcids":["https://orcid.org/0000-0001-6347-245X"]},"institutions":[{"id":"https://openalex.org/I848706","display_name":"Sungkyunkwan University","ror":"https://ror.org/04q78tk20","country_code":"KR","type":"education","lineage":["https://openalex.org/I848706"]}],"countries":["KR"],"is_corresponding":false,"raw_author_name":"Hyeong Jun Cho","raw_affiliation_strings":["School of Electronic and Electrical Engineering, Sungkyunkwan University, Suwon, 440-746, Korea"],"raw_orcid":null,"affiliations":[{"raw_affiliation_string":"School of Electronic and Electrical Engineering, Sungkyunkwan University, Suwon, 440-746, Korea","institution_ids":["https://openalex.org/I848706"]}]},{"author_position":"middle","author":{"id":"https://openalex.org/A5028655577","display_name":"Jin Ho Bang","orcid":"https://orcid.org/0000-0002-6717-3454","observed_orcids":["https://orcid.org/0000-0002-6717-3454"]},"institutions":[{"id":"https://openalex.org/I4575257","display_name":"Hanyang University","ror":"https://ror.org/046865y68","country_code":"KR","type":"education","lineage":["https://openalex.org/I4575257"]}],"countries":["KR"],"is_corresponding":false,"raw_author_name":"Jin Ho Bang","raw_affiliation_strings":["Department of Chemistry and Applied Chemistry, Hanyang University, Ansan, 426-791, Korea"],"raw_orcid":null,"affiliations":[{"raw_affiliation_string":"Department of Chemistry and Applied Chemistry, Hanyang University, Ansan, 426-791, Korea","institution_ids":["https://openalex.org/I4575257"]}]},{"author_position":"last","author":{"id":"https://openalex.org/A5045293337","display_name":"Yong\u2010Sang Kim","orcid":"https://orcid.org/0000-0003-2986-2686","observed_orcids":["https://orcid.org/0000-0003-2986-2686"]},"institutions":[{"id":"https://openalex.org/I848706","display_name":"Sungkyunkwan University","ror":"https://ror.org/04q78tk20","country_code":"KR","type":"education","lineage":["https://openalex.org/I848706"]}],"countries":["KR"],"is_corresponding":true,"raw_author_name":"Yong-Sang Kim","raw_affiliation_strings":["School of Electronic and Electrical Engineering, Sungkyunkwan University, Suwon, 440-746, Korea"],"raw_orcid":null,"affiliations":[{"raw_affiliation_string":"School of Electronic and Electrical Engineering, Sungkyunkwan University, Suwon, 440-746, Korea","institution_ids":["https://openalex.org/I848706"]}]}],"institutions":[],"countries_distinct_count":1,"institutions_distinct_count":3,"corresponding_author_ids":["https://openalex.org/A5045293337"],"corresponding_institution_ids":["https://openalex.org/I848706"],"apc_list":{"value":3490,"currency":"USD","value_usd":3490},"apc_paid":null,"fwci":0.5771,"has_fulltext":false,"cited_by_count":5,"citation_normalized_percentile":{"value":0.69094326,"is_in_top_1_percent":false,"is_in_top_10_percent":false},"cited_by_percentile_year":{"min":88,"max":96},"biblio":{"volume":"12","issue":"2","first_page":"276","last_page":"280"},"is_retracted":false,"is_paratext":false,"is_xpac":false,"primary_topic":{"id":"https://openalex.org/T10502","display_name":"Advanced Memory and Neural Computing","score":0.8939999938011169,"subfield":{"id":"https://openalex.org/subfields/2208","display_name":"Electrical and Electronic Engineering"},"field":{"id":"https://openalex.org/fields/22","display_name":"Engineering"},"domain":{"id":"https://openalex.org/domains/3","display_name":"Physical Sciences"}},"topics":[{"id":"https://openalex.org/T10502","display_name":"Advanced Memory and Neural Computing","score":0.8939999938011169,"subfield":{"id":"https://openalex.org/subfields/2208","display_name":"Electrical and Electronic Engineering"},"field":{"id":"https://openalex.org/fields/22","display_name":"Engineering"},"domain":{"id":"https://openalex.org/domains/3","display_name":"Physical Sciences"}},{"id":"https://openalex.org/T10045","display_name":"Organic Electronics and Photovoltaics","score":0.06019999831914902,"subfield":{"id":"https://openalex.org/subfields/2208","display_name":"Electrical and Electronic Engineering"},"field":{"id":"https://openalex.org/fields/22","display_name":"Engineering"},"domain":{"id":"https://openalex.org/domains/3","display_name":"Physical Sciences"}},{"id":"https://openalex.org/T10472","display_name":"Semiconductor materials and devices","score":0.009700000286102295,"subfield":{"id":"https://openalex.org/subfields/2208","display_name":"Electrical and Electronic Engineering"},"field":{"id":"https://openalex.org/fields/22","display_name":"Engineering"},"domain":{"id":"https://openalex.org/domains/3","display_name":"Physical Sciences"}}],"keywords":[{"id":"https://openalex.org/keywords/retention-time","display_name":"retention time","score":0.7799999713897705},{"id":"https://openalex.org/keywords/cdse-nanoparticles","display_name":"CdSe nanoparticles","score":0.9750000238418579},{"id":"https://openalex.org/keywords/core-shell-nanoparticles","display_name":"core-shell nanoparticles","score":0.9010000228881836},{"id":"https://openalex.org/keywords/pmma","display_name":"PMMA","score":0.5839999914169312},{"id":"https://openalex.org/keywords/pentacene","display_name":"pentacene","score":0.8399999737739563},{"id":"https://openalex.org/keywords/hole-trapping","display_name":"hole trapping","score":0.7110000252723694},{"id":"https://openalex.org/keywords/capacitance-voltage-hysteresis","display_name":"capacitance-voltage hysteresis","score":0.8930000066757202},{"id":"https://openalex.org/keywords/memory-window","display_name":"memory window","score":0.8119999766349792},{"id":"https://openalex.org/keywords/retention-mechanism","display_name":"retention mechanism","score":0.7860000133514404},{"id":"https://openalex.org/keywords/band-structure","display_name":"electronic band structure","score":0.8109999895095825}],"concepts":[{"id":"https://openalex.org/C192562407","wikidata":"https://www.wikidata.org/wiki/Q228736","display_name":"Materials science","level":0,"score":0.8526002168655396},{"id":"https://openalex.org/C155672457","wikidata":"https://www.wikidata.org/wiki/Q61231","display_name":"Nanoparticle","level":2,"score":0.6898459792137146},{"id":"https://openalex.org/C3020018676","wikidata":"https://www.wikidata.org/wiki/Q170050","display_name":"Retention time","level":2,"score":0.6105666160583496},{"id":"https://openalex.org/C2164484","wikidata":"https://www.wikidata.org/wiki/Q5170150","display_name":"Core (optical fiber)","level":2,"score":0.5859042406082153},{"id":"https://openalex.org/C2777924906","wikidata":"https://www.wikidata.org/wiki/Q34168","display_name":"Trapping","level":2,"score":0.5616630911827087},{"id":"https://openalex.org/C171250308","wikidata":"https://www.wikidata.org/wiki/Q11468","display_name":"Nanotechnology","level":1,"score":0.5426225662231445},{"id":"https://openalex.org/C49040817","wikidata":"https://www.wikidata.org/wiki/Q193091","display_name":"Optoelectronics","level":1,"score":0.526612401008606},{"id":"https://openalex.org/C177950962","wikidata":"https://www.wikidata.org/wiki/Q10997658","display_name":"Non-volatile memory","level":2,"score":0.5068121552467346},{"id":"https://openalex.org/C30066665","wikidata":"https://www.wikidata.org/wiki/Q164399","display_name":"Capacitance","level":3,"score":0.49425840377807617},{"id":"https://openalex.org/C2780866740","wikidata":"https://www.wikidata.org/wiki/Q5227345","display_name":"Data retention","level":2,"score":0.45117583870887756},{"id":"https://openalex.org/C159985019","wikidata":"https://www.wikidata.org/wiki/Q181790","display_name":"Composite material","level":1,"score":0.15617716312408447},{"id":"https://openalex.org/C17525397","wikidata":"https://www.wikidata.org/wiki/Q176140","display_name":"Electrode","level":2,"score":0.12289300560951233},{"id":"https://openalex.org/C43617362","wikidata":"https://www.wikidata.org/wiki/Q170050","display_name":"Chromatography","level":1,"score":0.07301855087280273},{"id":"https://openalex.org/C185592680","wikidata":"https://www.wikidata.org/wiki/Q2329","display_name":"Chemistry","level":0,"score":0.0},{"id":"https://openalex.org/C147789679","wikidata":"https://www.wikidata.org/wiki/Q11372","display_name":"Physical chemistry","level":1,"score":0.0},{"id":"https://openalex.org/C86803240","wikidata":"https://www.wikidata.org/wiki/Q420","display_name":"Biology","level":0,"score":0.0},{"id":"https://openalex.org/C18903297","wikidata":"https://www.wikidata.org/wiki/Q7150","display_name":"Ecology","level":1,"score":0.0}],"mesh":[],"locations_count":1,"locations":[{"id":"doi:10.1007/s13391-016-5387-8","doi":"https://doi.org/10.1007/s13391-016-5387-8","is_oa":false,"landing_page_url":"https://doi.org/10.1007/s13391-016-5387-8","pdf_url":null,"source":{"id":"https://openalex.org/S177378842","display_name":"Electronic Materials Letters","issn_l":"1738-8090","issn":["1738-8090","2093-6788"],"is_oa":false,"is_in_doaj":false,"is_core":true,"listed_in":["cwts-core","dongbi-c","jufo-1","kci-registered","poland-100","russia-white-list-2"],"host_organization":"https://openalex.org/P4310319900","host_organization_name":"Springer Science+Business Media","host_organization_lineage":["https://openalex.org/P4310319900","https://openalex.org/P4310319965"],"host_organization_lineage_names":["Springer Science+Business Media","Springer Nature"],"type":"journal"},"license":null,"license_id":null,"version":"publishedVersion","is_accepted":true,"is_published":true,"raw_source_name":"Electronic Materials Letters","raw_type":"journal-article"}],"best_oa_location":null,"sustainable_development_goals":[],"study_designs":[],"awards":[],"funders":[],"has_content":{"grobid_xml":false,"pdf":false},"content_urls":null,"referenced_works_count":23,"referenced_works":["https://openalex.org/W1953945846","https://openalex.org/W1967620314","https://openalex.org/W1987227087","https://openalex.org/W1987664266","https://openalex.org/W1999570051","https://openalex.org/W2001336892","https://openalex.org/W2001992992","https://openalex.org/W2009929455","https://openalex.org/W2021122851","https://openalex.org/W2027695714","https://openalex.org/W2057189697","https://openalex.org/W2063567393","https://openalex.org/W2070336550","https://openalex.org/W2071937170","https://openalex.org/W2078683880","https://openalex.org/W2088313320","https://openalex.org/W2106816296","https://openalex.org/W2128029930","https://openalex.org/W2132321654","https://openalex.org/W2132555393","https://openalex.org/W2151835073","https://openalex.org/W2156254084","https://openalex.org/W4237036272"],"related_works":["https://openalex.org/W2043349303","https://openalex.org/W2020504039","https://openalex.org/W2345314411","https://openalex.org/W2052431498","https://openalex.org/W2045224175","https://openalex.org/W2000470004","https://openalex.org/W2327846990","https://openalex.org/W2902197272","https://openalex.org/W1966944439","https://openalex.org/W2737141309"],"abstract_inverted_index":null,"counts_by_year":[{"year":2021,"cited_by_count":1},{"year":2018,"cited_by_count":1},{"year":2017,"cited_by_count":2},{"year":2016,"cited_by_count":1}],"updated_date":"2026-10-17T09:40:24.721904","created_date":"2016-06-24T00:00:00"}