{"id":"https://openalex.org/W2295295089","doi":"https://doi.org/10.1109/test.1995.529821","title":"Visualizing quality","display_name":"Visualizing quality","publication_year":2002,"publication_date":"2002-11-19","ids":{"openalex":"https://openalex.org/W2295295089","doi":"https://doi.org/10.1109/test.1995.529821","mag":"2295295089"},"language":"en","primary_location":{"id":"doi:10.1109/test.1995.529821","doi":"https://doi.org/10.1109/test.1995.529821","is_oa":false,"landing_page_url":"https://doi.org/10.1109/test.1995.529821","pdf_url":null,"source":{"id":"https://openalex.org/S4210209697","display_name":"IEEE International Test Conference (ITC)","issn_l":"1089-3539","issn":["1089-3539","2378-2250"],"is_oa":false,"is_in_doaj":false,"is_core":true,"listed_in":["cwts-core"],"host_organization":"https://openalex.org/P4310319808","host_organization_name":"Institute of Electrical and Electronics Engineers","host_organization_lineage":["https://openalex.org/P4310319808"],"host_organization_lineage_names":["Institute of Electrical and Electronics Engineers"],"type":"conference"},"license":null,"license_id":null,"version":"publishedVersion","is_accepted":true,"is_published":true,"raw_source_name":"Proceedings of 1995 IEEE International Test Conference (ITC)","raw_type":"proceedings-article"},"volume":null,"type":"conference-paper","is_traditional":true,"indexed_in":["crossref"],"open_access":{"is_oa":false,"oa_status":"closed","oa_url":null,"any_repository_has_fulltext":false},"authorships":[{"author_position":"first","author":{"id":"https://openalex.org/A5053602421","display_name":"S. Max","orcid":null,"observed_orcids":[]},"institutions":[],"countries":[],"is_corresponding":true,"raw_author_name":"S. Max","raw_affiliation_strings":["LTX Corp., Westwood, MA, USA"],"raw_orcid":null,"affiliations":[{"raw_affiliation_string":"LTX Corp., Westwood, MA, USA","institution_ids":[]}]}],"institutions":[],"countries_distinct_count":0,"institutions_distinct_count":0,"corresponding_author_ids":["https://openalex.org/A5053602421"],"corresponding_institution_ids":[],"apc_list":null,"apc_paid":null,"fwci":0.3397,"has_fulltext":false,"cited_by_count":1,"citation_normalized_percentile":{"value":0.58776513,"is_in_top_1_percent":false,"is_in_top_10_percent":false},"cited_by_percentile_year":null,"biblio":{"volume":null,"issue":null,"first_page":"87","last_page":"96"},"is_retracted":false,"is_paratext":false,"is_xpac":false,"primary_topic":{"id":"https://openalex.org/T13293","display_name":"Engineering and Test Systems","score":0.10189999639987946,"subfield":{"id":"https://openalex.org/subfields/2207","display_name":"Control and Systems Engineering"},"field":{"id":"https://openalex.org/fields/22","display_name":"Engineering"},"domain":{"id":"https://openalex.org/domains/3","display_name":"Physical Sciences"}},"topics":[{"id":"https://openalex.org/T13293","display_name":"Engineering and Test Systems","score":0.10189999639987946,"subfield":{"id":"https://openalex.org/subfields/2207","display_name":"Control and Systems Engineering"},"field":{"id":"https://openalex.org/fields/22","display_name":"Engineering"},"domain":{"id":"https://openalex.org/domains/3","display_name":"Physical Sciences"}},{"id":"https://openalex.org/T10799","display_name":"Data Visualization and Analytics","score":0.09849999845027924,"subfield":{"id":"https://openalex.org/subfields/1704","display_name":"Computer Graphics and Computer-Aided Design"},"field":{"id":"https://openalex.org/fields/17","display_name":"Computer Science"},"domain":{"id":"https://openalex.org/domains/3","display_name":"Physical Sciences"}},{"id":"https://openalex.org/T13681","display_name":"Engineering and Information Technology","score":0.08399999886751175,"subfield":{"id":"https://openalex.org/subfields/1712","display_name":"Software"},"field":{"id":"https://openalex.org/fields/17","display_name":"Computer Science"},"domain":{"id":"https://openalex.org/domains/3","display_name":"Physical Sciences"}}],"keywords":[{"id":"https://openalex.org/keywords/automatic-test-equipment","display_name":"automatic test equipment","score":0.9269999861717224},{"id":"https://openalex.org/keywords/instrument-stability","display_name":"instrument stability","score":0.6230000257492065},{"id":"https://openalex.org/keywords/visualization-algorithms","display_name":"visualization algorithms","score":0.6570000052452087}],"concepts":[{"id":"https://openalex.org/C153876917","wikidata":"https://www.wikidata.org/wiki/Q899704","display_name":"Traceability","level":2,"score":0.8066738843917847},{"id":"https://openalex.org/C36464697","wikidata":"https://www.wikidata.org/wiki/Q451553","display_name":"Visualization","level":2,"score":0.7626273036003113},{"id":"https://openalex.org/C41008148","wikidata":"https://www.wikidata.org/wiki/Q21198","display_name":"Computer science","level":0,"score":0.740263819694519},{"id":"https://openalex.org/C2779530757","wikidata":"https://www.wikidata.org/wiki/Q1207505","display_name":"Quality (philosophy)","level":2,"score":0.6109404563903809},{"id":"https://openalex.org/C172367668","wikidata":"https://www.wikidata.org/wiki/Q6504956","display_name":"Data visualization","level":3,"score":0.41267046332359314},{"id":"https://openalex.org/C115903868","wikidata":"https://www.wikidata.org/wiki/Q80993","display_name":"Software engineering","level":1,"score":0.3058532178401947},{"id":"https://openalex.org/C124101348","wikidata":"https://www.wikidata.org/wiki/Q172491","display_name":"Data mining","level":1,"score":0.2813587784767151},{"id":"https://openalex.org/C111472728","wikidata":"https://www.wikidata.org/wiki/Q9471","display_name":"Epistemology","level":1,"score":0.0},{"id":"https://openalex.org/C138885662","wikidata":"https://www.wikidata.org/wiki/Q5891","display_name":"Philosophy","level":0,"score":0.0}],"mesh":[],"locations_count":1,"locations":[{"id":"doi:10.1109/test.1995.529821","doi":"https://doi.org/10.1109/test.1995.529821","is_oa":false,"landing_page_url":"https://doi.org/10.1109/test.1995.529821","pdf_url":null,"source":{"id":"https://openalex.org/S4210209697","display_name":"IEEE International Test Conference (ITC)","issn_l":"1089-3539","issn":["1089-3539","2378-2250"],"is_oa":false,"is_in_doaj":false,"is_core":true,"listed_in":["cwts-core"],"host_organization":"https://openalex.org/P4310319808","host_organization_name":"Institute of Electrical and Electronics Engineers","host_organization_lineage":["https://openalex.org/P4310319808"],"host_organization_lineage_names":["Institute of Electrical and Electronics Engineers"],"type":"conference"},"license":null,"license_id":null,"version":"publishedVersion","is_accepted":true,"is_published":true,"raw_source_name":"Proceedings of 1995 IEEE International Test Conference (ITC)","raw_type":"proceedings-article"}],"best_oa_location":null,"sustainable_development_goals":[],"study_designs":[],"awards":[],"funders":[],"has_content":{"pdf":false,"grobid_xml":false},"content_urls":null,"referenced_works_count":2,"referenced_works":["https://openalex.org/W1637060110","https://openalex.org/W1836296491"],"related_works":["https://openalex.org/W1836296491","https://openalex.org/W2051503284","https://openalex.org/W4233585906","https://openalex.org/W2153502724","https://openalex.org/W2927335857","https://openalex.org/W2678111477","https://openalex.org/W1862228663","https://openalex.org/W2184118045","https://openalex.org/W7016159873","https://openalex.org/W2537725302"],"abstract_inverted_index":{"ATE":[0],"systems":[1],"have":[2],"many":[3,6],"instruments":[4],"with":[5],"ranges.":[7],"System":[8],"quality":[9],"is":[10,29],"difficult":[11],"to":[12],"manage.":[13],"Two":[14],"visualization":[15],"algorithms":[16],"for":[17],"viewing":[18],"system":[19],"instrument":[20],"stabilities":[21],"are":[22,33],"described.":[23,34],"A":[24],"previously":[25],"derived":[26],"traceability":[27],"algorithm":[28],"enhanced.":[30],"Typical":[31],"results":[32]},"counts_by_year":[],"updated_date":"2026-10-26T11:51:55.731654","created_date":"2016-06-24T00:00:00"}