{"id":"https://openalex.org/W2293340971","doi":"https://doi.org/10.1109/41.19064","title":"Microprocessor testability","display_name":"Microprocessor testability","publication_year":1989,"publication_date":"1989-05-01","ids":{"openalex":"https://openalex.org/W2293340971","doi":"https://doi.org/10.1109/41.19064","mag":"2293340971"},"language":"en","primary_location":{"id":"doi:10.1109/41.19064","doi":"https://doi.org/10.1109/41.19064","is_oa":false,"landing_page_url":"https://doi.org/10.1109/41.19064","pdf_url":null,"source":{"id":"https://openalex.org/S58031724","display_name":"IEEE Transactions on Industrial Electronics","issn_l":"0278-0046","issn":["0278-0046","1557-9948"],"is_oa":false,"is_in_doaj":false,"is_core":true,"listed_in":["cwts-core","dongbi-a","jufo-3","ki-jl-1","norway-2","poland-200","russia-white-list-1","vabb-shw"],"host_organization":"https://openalex.org/P4310319808","host_organization_name":"Institute of Electrical and Electronics Engineers","host_organization_lineage":["https://openalex.org/P4310319808"],"host_organization_lineage_names":["Institute of Electrical and Electronics Engineers"],"type":"journal"},"license":null,"license_id":null,"version":"publishedVersion","is_accepted":true,"is_published":true,"raw_source_name":"IEEE Transactions on Industrial Electronics","raw_type":"journal-article"},"volume":null,"type":"article","is_traditional":true,"indexed_in":["crossref"],"open_access":{"is_oa":false,"oa_status":"closed","oa_url":null,"any_repository_has_fulltext":false},"authorships":[{"author_position":"first","author":{"id":"https://openalex.org/A5076014723","display_name":"H. Troy Nagle","orcid":"https://orcid.org/0000-0003-2323-9818","observed_orcids":["https://orcid.org/0000-0003-2323-9818"]},"institutions":[{"id":"https://openalex.org/I137902535","display_name":"North Carolina State University","ror":"https://ror.org/04tj63d06","country_code":"US","type":"education","lineage":["https://openalex.org/I137902535"]}],"countries":["US"],"is_corresponding":false,"raw_author_name":"H.T. Nagle","raw_affiliation_strings":["Electrical and Computer Engineering Department, North Carolina State University, Raleigh, NC, USA"],"raw_orcid":null,"affiliations":[{"raw_affiliation_string":"Electrical and Computer Engineering Department, North Carolina State University, Raleigh, NC, USA","institution_ids":["https://openalex.org/I137902535"]}]},{"author_position":"middle","author":{"id":"https://openalex.org/A5109219148","display_name":"R.R. Fritzemeier","orcid":null,"observed_orcids":[]},"institutions":[{"id":"https://openalex.org/I4210104735","display_name":"Sandia National Laboratories","ror":"https://ror.org/01apwpt12","country_code":"US","type":"facility","lineage":["https://openalex.org/I1330989302","https://openalex.org/I198811213","https://openalex.org/I4210104735"]}],"countries":["US"],"is_corresponding":false,"raw_author_name":"R.R. Fritzemeier","raw_affiliation_strings":["Semiconductor Components Design Validation Division, Sandia National Laboratories, Albuquerque, NM, USA"],"raw_orcid":null,"affiliations":[{"raw_affiliation_string":"Semiconductor Components Design Validation Division, Sandia National Laboratories, Albuquerque, NM, USA","institution_ids":["https://openalex.org/I4210104735"]}]},{"author_position":"middle","author":{"id":"https://openalex.org/A5050229958","display_name":"J.E. Van Well","orcid":null,"observed_orcids":[]},"institutions":[],"countries":[],"is_corresponding":false,"raw_author_name":"J.E. Van Well","raw_affiliation_strings":["Amdahl Corporation, Sunnyvale, CA, USA"],"raw_orcid":null,"affiliations":[{"raw_affiliation_string":"Amdahl Corporation, Sunnyvale, CA, USA","institution_ids":[]}]},{"author_position":"last","author":{"id":"https://openalex.org/A5032683868","display_name":"Michael G. McNamer","orcid":null,"observed_orcids":[]},"institutions":[{"id":"https://openalex.org/I137902535","display_name":"North Carolina State University","ror":"https://ror.org/04tj63d06","country_code":"US","type":"education","lineage":["https://openalex.org/I137902535"]}],"countries":["US"],"is_corresponding":false,"raw_author_name":"M.G. McNamer","raw_affiliation_strings":["Biomedical Engineering Curriculum, North Carolina State University, Chapel Hill, NC, USA"],"raw_orcid":null,"affiliations":[{"raw_affiliation_string":"Biomedical Engineering Curriculum, North Carolina State University, Chapel Hill, NC, USA","institution_ids":["https://openalex.org/I137902535"]}]}],"institutions":[],"countries_distinct_count":1,"institutions_distinct_count":2,"corresponding_author_ids":[],"corresponding_institution_ids":[],"apc_list":{"value":2645,"currency":"USD","value_usd":2645},"apc_paid":null,"fwci":0.0,"has_fulltext":false,"cited_by_count":5,"citation_normalized_percentile":{"value":0.0,"is_in_top_1_percent":false,"is_in_top_10_percent":false},"cited_by_percentile_year":{"min":88,"max":93},"biblio":{"volume":"36","issue":"2","first_page":"151","last_page":"163"},"is_retracted":false,"is_paratext":false,"is_xpac":false,"primary_topic":{"id":"https://openalex.org/T11032","display_name":"VLSI and Analog Circuit Testing","score":0.9980000257492065,"subfield":{"id":"https://openalex.org/subfields/1708","display_name":"Hardware and Architecture"},"field":{"id":"https://openalex.org/fields/17","display_name":"Computer Science"},"domain":{"id":"https://openalex.org/domains/3","display_name":"Physical Sciences"}},"topics":[{"id":"https://openalex.org/T11032","display_name":"VLSI and Analog Circuit Testing","score":0.9980000257492065,"subfield":{"id":"https://openalex.org/subfields/1708","display_name":"Hardware and Architecture"},"field":{"id":"https://openalex.org/fields/17","display_name":"Computer Science"},"domain":{"id":"https://openalex.org/domains/3","display_name":"Physical Sciences"}},{"id":"https://openalex.org/T10743","display_name":"Software Testing and Debugging Techniques","score":0.0007999999797903001,"subfield":{"id":"https://openalex.org/subfields/1712","display_name":"Software"},"field":{"id":"https://openalex.org/fields/17","display_name":"Computer Science"},"domain":{"id":"https://openalex.org/domains/3","display_name":"Physical Sciences"}},{"id":"https://openalex.org/T13293","display_name":"Engineering and Test Systems","score":0.0003000000142492354,"subfield":{"id":"https://openalex.org/subfields/2207","display_name":"Control and Systems Engineering"},"field":{"id":"https://openalex.org/fields/22","display_name":"Engineering"},"domain":{"id":"https://openalex.org/domains/3","display_name":"Physical Sciences"}}],"keywords":[{"id":"https://openalex.org/keywords/microprocessor-testing","display_name":"microprocessor testing","score":0.9070000052452087},{"id":"https://openalex.org/keywords/design-for-testability","display_name":"design for testability","score":0.824999988079071},{"id":"https://openalex.org/keywords/stuck-at-faults","display_name":"stuck-at faults","score":0.8669999837875366},{"id":"https://openalex.org/keywords/fault-coverage","display_name":"fault coverage","score":0.800000011920929},{"id":"https://openalex.org/keywords/test-set-generation","display_name":"test set generation","score":0.9819999933242798}],"concepts":[{"id":"https://openalex.org/C51234621","wikidata":"https://www.wikidata.org/wiki/Q2149495","display_name":"Testability","level":2,"score":0.9344933032989502},{"id":"https://openalex.org/C2780728072","wikidata":"https://www.wikidata.org/wiki/Q5297","display_name":"Microprocessor","level":2,"score":0.7185565829277039},{"id":"https://openalex.org/C190874656","wikidata":"https://www.wikidata.org/wiki/Q5264347","display_name":"Design for testing","level":3,"score":0.6627201437950134},{"id":"https://openalex.org/C41008148","wikidata":"https://www.wikidata.org/wiki/Q21198","display_name":"Computer science","level":0,"score":0.5904709100723267},{"id":"https://openalex.org/C149635348","wikidata":"https://www.wikidata.org/wiki/Q193040","display_name":"Embedded system","level":1,"score":0.477075457572937},{"id":"https://openalex.org/C200601418","wikidata":"https://www.wikidata.org/wiki/Q2193887","display_name":"Reliability engineering","level":1,"score":0.46631842851638794},{"id":"https://openalex.org/C118524514","wikidata":"https://www.wikidata.org/wiki/Q173212","display_name":"Computer architecture","level":1,"score":0.3742406964302063},{"id":"https://openalex.org/C113775141","wikidata":"https://www.wikidata.org/wiki/Q428691","display_name":"Computer engineering","level":1,"score":0.3402085602283478},{"id":"https://openalex.org/C127413603","wikidata":"https://www.wikidata.org/wiki/Q11023","display_name":"Engineering","level":0,"score":0.2874215841293335}],"mesh":[],"locations_count":1,"locations":[{"id":"doi:10.1109/41.19064","doi":"https://doi.org/10.1109/41.19064","is_oa":false,"landing_page_url":"https://doi.org/10.1109/41.19064","pdf_url":null,"source":{"id":"https://openalex.org/S58031724","display_name":"IEEE Transactions on Industrial Electronics","issn_l":"0278-0046","issn":["0278-0046","1557-9948"],"is_oa":false,"is_in_doaj":false,"is_core":true,"listed_in":["cwts-core","dongbi-a","jufo-3","ki-jl-1","norway-2","poland-200","russia-white-list-1","vabb-shw"],"host_organization":"https://openalex.org/P4310319808","host_organization_name":"Institute of Electrical and Electronics Engineers","host_organization_lineage":["https://openalex.org/P4310319808"],"host_organization_lineage_names":["Institute of Electrical and Electronics Engineers"],"type":"journal"},"license":null,"license_id":null,"version":"publishedVersion","is_accepted":true,"is_published":true,"raw_source_name":"IEEE Transactions on Industrial Electronics","raw_type":"journal-article"}],"best_oa_location":null,"sustainable_development_goals":[],"study_designs":[],"awards":[],"funders":[{"id":"https://openalex.org/F4320310013","display_name":"North Carolina State University","ror":"https://ror.org/04tj63d06"},{"id":"https://openalex.org/F4320338291","display_name":"Sandia National Laboratories","ror":"https://ror.org/01apwpt12"}],"has_content":{"pdf":false,"grobid_xml":false},"content_urls":null,"referenced_works_count":37,"referenced_works":["https://openalex.org/W7487116","https://openalex.org/W27422859","https://openalex.org/W47097343","https://openalex.org/W113576643","https://openalex.org/W145344984","https://openalex.org/W264810652","https://openalex.org/W1772932304","https://openalex.org/W1823755974","https://openalex.org/W1968782742","https://openalex.org/W1988793232","https://openalex.org/W1992659053","https://openalex.org/W1995831222","https://openalex.org/W1997593029","https://openalex.org/W2017656663","https://openalex.org/W2029707600","https://openalex.org/W2044076967","https://openalex.org/W2049802847","https://openalex.org/W2052426900","https://openalex.org/W2074636664","https://openalex.org/W2082928040","https://openalex.org/W2093079979","https://openalex.org/W2098076619","https://openalex.org/W2098516903","https://openalex.org/W2104974933","https://openalex.org/W2109208936","https://openalex.org/W2111156521","https://openalex.org/W2113587191","https://openalex.org/W2120655532","https://openalex.org/W2147185787","https://openalex.org/W2155014331","https://openalex.org/W2155298777","https://openalex.org/W2159081664","https://openalex.org/W4234357545","https://openalex.org/W6601106375","https://openalex.org/W6604632480","https://openalex.org/W6605912232","https://openalex.org/W6609744999"],"related_works":["https://openalex.org/W2007723424","https://openalex.org/W1823755974","https://openalex.org/W2033027938","https://openalex.org/W4239955307","https://openalex.org/W2155173634","https://openalex.org/W1839177332","https://openalex.org/W2145224123","https://openalex.org/W226651243","https://openalex.org/W1948594016","https://openalex.org/W2555527769"],"abstract_inverted_index":{"As":[0],"the":[1,27,62,68,79,84],"level":[2,28],"of":[3,29,43,71,83,87,89],"microprocessor":[4],"complexity":[5],"increases":[6],"to":[7,21,26,38],"several":[8],"hundred":[9],"thousand":[10],"transistors":[11],"for":[12,57,65,97,100],"a":[13],"single-chip":[14],"machine,":[15],"it":[16],"is":[17,94],"becoming":[18],"very":[19],"difficult":[20],"test":[22,73],"commercially":[23,91],"available":[24,92],"designs":[25],"fault":[30],"coverage":[31,42],"desired":[32],"by":[33,78],"some":[34,88],"customers.":[35],"In":[36],"order":[37],"achieve":[39],"near":[40],"100-percent":[41],"single":[44],"stuck-at":[45],"faults,":[46],"future":[47],"microprocessors":[48,93,102],"must":[49],"be":[50],"designed":[51],"with":[52],"special":[53],"testing":[54,63],"features":[55,86,99],"(designed":[56],"testability).":[58],"The":[59],"authors":[60],"describe":[61],"problem":[64],"microprocessors,":[66],"including":[67],"various":[69],"methods":[70],"generating":[72],"sets":[74],"and":[75],"their":[76],"application":[77],"user.":[80],"A":[81],"survey":[82],"testability":[85,98],"today's":[90],"presented.":[95],"Suggestions":[96],"future-generation":[101],"are":[103],"also":[104],"discussed.>":[105]},"counts_by_year":[{"year":2020,"cited_by_count":1}],"updated_date":"2026-11-04T10:54:05.112534","created_date":"2016-06-24T00:00:00"}