{"id":"https://openalex.org/W2289611716","doi":"https://doi.org/10.14723/tmrsj.40.383","title":"Effect of composition on the properties of bismuth telluride thin films produced by galvanostatic electrodeposition","display_name":"Effect of composition on the properties of bismuth telluride thin films produced by galvanostatic electrodeposition","publication_year":2015,"publication_date":"2015-01-01","ids":{"openalex":"https://openalex.org/W2289611716","doi":"https://doi.org/10.14723/tmrsj.40.383","mag":"2289611716"},"language":"en","primary_location":{"id":"doi:10.14723/tmrsj.40.383","doi":"https://doi.org/10.14723/tmrsj.40.383","is_oa":true,"landing_page_url":"https://doi.org/10.14723/tmrsj.40.383","pdf_url":"https://www.jstage.jst.go.jp/article/tmrsj/40/4/40_383/_pdf","source":{"id":"https://openalex.org/S2765035252","display_name":"Transactions of the Materials Research Society of Japan","issn_l":"1382-3469","issn":["1382-3469","2188-1650"],"is_oa":false,"is_in_doaj":false,"is_core":true,"listed_in":["cwts-core"],"host_organization":"https://openalex.org/P4327988827","host_organization_name":"Materials Research Society of Japan","host_organization_lineage":["https://openalex.org/P4327988827"],"host_organization_lineage_names":["Materials Research Society of Japan"],"type":"journal"},"license":null,"license_id":null,"version":"publishedVersion","is_accepted":true,"is_published":true,"raw_source_name":"Transactions of the Materials Research Society of Japan","raw_type":"journal-article"},"volume":null,"type":"article","is_traditional":true,"indexed_in":["crossref"],"open_access":{"is_oa":true,"oa_status":"bronze","oa_url":"https://www.jstage.jst.go.jp/article/tmrsj/40/4/40_383/_pdf","any_repository_has_fulltext":false},"authorships":[{"author_position":"first","author":{"id":null,"display_name":"Ken Matsuoka","orcid":null,"observed_orcids":[]},"institutions":[{"id":"https://openalex.org/I1314466530","display_name":"Tokai University","ror":"https://ror.org/01p7qe739","country_code":"JP","type":"education","lineage":["https://openalex.org/I1314466530"]}],"countries":["JP"],"is_corresponding":false,"raw_author_name":"Ken Matsuoka","raw_affiliation_strings":["Department of Materials Science, Tokai University"],"raw_orcid":null,"affiliations":[{"raw_affiliation_string":"Department of Materials Science, Tokai University","institution_ids":["https://openalex.org/I1314466530"]}]},{"author_position":"middle","author":{"id":"https://openalex.org/A5069459951","display_name":"Mitsuaki Okuhata","orcid":null,"observed_orcids":[]},"institutions":[{"id":"https://openalex.org/I1314466530","display_name":"Tokai University","ror":"https://ror.org/01p7qe739","country_code":"JP","type":"education","lineage":["https://openalex.org/I1314466530"]}],"countries":["JP"],"is_corresponding":false,"raw_author_name":"Mitsuaki Okuhata","raw_affiliation_strings":["Department of Materials Science, Tokai University"],"raw_orcid":null,"affiliations":[{"raw_affiliation_string":"Department of Materials Science, Tokai University","institution_ids":["https://openalex.org/I1314466530"]}]},{"author_position":"middle","author":{"id":"https://openalex.org/A5056114352","display_name":"Naoki Hatsuta","orcid":null,"observed_orcids":[]},"institutions":[{"id":"https://openalex.org/I1314466530","display_name":"Tokai University","ror":"https://ror.org/01p7qe739","country_code":"JP","type":"education","lineage":["https://openalex.org/I1314466530"]}],"countries":["JP"],"is_corresponding":false,"raw_author_name":"Naoki Hatsuta","raw_affiliation_strings":["Department of Materials Science, Tokai University"],"raw_orcid":null,"affiliations":[{"raw_affiliation_string":"Department of Materials Science, Tokai University","institution_ids":["https://openalex.org/I1314466530"]}]},{"author_position":"last","author":{"id":"https://openalex.org/A5043751841","display_name":"Masayuki Takashiri","orcid":"https://orcid.org/0000-0001-7041-6595","observed_orcids":["https://orcid.org/0000-0001-7041-6595"]},"institutions":[{"id":"https://openalex.org/I1314466530","display_name":"Tokai University","ror":"https://ror.org/01p7qe739","country_code":"JP","type":"education","lineage":["https://openalex.org/I1314466530"]}],"countries":["JP"],"is_corresponding":false,"raw_author_name":"Masayuki Takashiri","raw_affiliation_strings":["Department of Materials Science, Tokai University"],"raw_orcid":null,"affiliations":[{"raw_affiliation_string":"Department of Materials Science, Tokai University","institution_ids":["https://openalex.org/I1314466530"]}]}],"institutions":[],"countries_distinct_count":1,"institutions_distinct_count":1,"corresponding_author_ids":[],"corresponding_institution_ids":["https://openalex.org/I1314466530"],"apc_list":null,"apc_paid":null,"fwci":1.0406,"has_fulltext":true,"cited_by_count":20,"citation_normalized_percentile":{"value":0.71509481,"is_in_top_1_percent":false,"is_in_top_10_percent":false},"cited_by_percentile_year":{"min":88,"max":98},"biblio":{"volume":"40","issue":"4","first_page":"383","last_page":"387"},"is_retracted":false,"is_paratext":false,"is_xpac":false,"primary_topic":{"id":"https://openalex.org/T10440","display_name":"Advanced Thermoelectric Materials and Devices","score":0.9994999766349792,"subfield":{"id":"https://openalex.org/subfields/2505","display_name":"Materials Chemistry"},"field":{"id":"https://openalex.org/fields/25","display_name":"Materials Science"},"domain":{"id":"https://openalex.org/domains/3","display_name":"Physical Sciences"}},"topics":[{"id":"https://openalex.org/T10440","display_name":"Advanced Thermoelectric Materials and Devices","score":0.9994999766349792,"subfield":{"id":"https://openalex.org/subfields/2505","display_name":"Materials Chemistry"},"field":{"id":"https://openalex.org/fields/25","display_name":"Materials Science"},"domain":{"id":"https://openalex.org/domains/3","display_name":"Physical Sciences"}},{"id":"https://openalex.org/T10590","display_name":"Chalcogenide Semiconductor Thin Films","score":0.00039999998989515007,"subfield":{"id":"https://openalex.org/subfields/2208","display_name":"Electrical and Electronic Engineering"},"field":{"id":"https://openalex.org/fields/22","display_name":"Engineering"},"domain":{"id":"https://openalex.org/domains/3","display_name":"Physical Sciences"}},{"id":"https://openalex.org/T13251","display_name":"Electrical and Thermal Properties of Materials","score":0.0,"subfield":{"id":"https://openalex.org/subfields/2208","display_name":"Electrical and Electronic Engineering"},"field":{"id":"https://openalex.org/fields/22","display_name":"Engineering"},"domain":{"id":"https://openalex.org/domains/3","display_name":"Physical Sciences"}}],"keywords":[{"id":"https://openalex.org/keywords/bismuth-telluride","display_name":"Bi2Te3","score":0.9129999876022339},{"id":"https://openalex.org/keywords/bi2te3-thin-films","display_name":"Bi2Te3 thin films","score":0.8989999890327454},{"id":"https://openalex.org/keywords/galvanostatic-electrodeposition","display_name":"galvanostatic deposition","score":0.9449999928474426},{"id":"https://openalex.org/keywords/thermoelectric-properties","display_name":"thermoelectric properties","score":0.9430000185966492},{"id":"https://openalex.org/keywords/seebeck-coefficient","display_name":"Seebeck coefficient","score":0.9750000238418579},{"id":"https://openalex.org/keywords/electrical-conductivity","display_name":"electrical conductivity","score":0.7540000081062317},{"id":"https://openalex.org/keywords/surface-morphology","display_name":"surface morphology","score":0.7310000061988831},{"id":"https://openalex.org/keywords/rhombohedral-phase","display_name":"rhombohedral phase","score":0.8479999899864197},{"id":"https://openalex.org/keywords/n-type-and-p-type-semiconductors","display_name":"n-type and p-type semiconductors","score":0.9430000185966492},{"id":"https://openalex.org/keywords/nickel-substrate","display_name":"nickel substrate","score":0.6299999952316284},{"id":"https://openalex.org/keywords/hydrochloric-acid-electrolyte","display_name":"hydrochloric acid electrolyte","score":0.8830000162124634}],"concepts":[{"id":"https://openalex.org/C19067145","wikidata":"https://www.wikidata.org/wiki/Q1137203","display_name":"Thin film","level":2,"score":0.8046755790710449},{"id":"https://openalex.org/C2777038907","wikidata":"https://www.wikidata.org/wiki/Q415256","display_name":"Bismuth telluride","level":4,"score":0.7747962474822998},{"id":"https://openalex.org/C192562407","wikidata":"https://www.wikidata.org/wiki/Q228736","display_name":"Materials science","level":0,"score":0.7253322005271912},{"id":"https://openalex.org/C112625512","wikidata":"https://www.wikidata.org/wiki/Q1091448","display_name":"Seebeck coefficient","level":3,"score":0.6815332174301147},{"id":"https://openalex.org/C137637335","wikidata":"https://www.wikidata.org/wiki/Q899604","display_name":"Crystallite","level":2,"score":0.5419337153434753},{"id":"https://openalex.org/C68801617","wikidata":"https://www.wikidata.org/wiki/Q162908","display_name":"Electrolyte","level":3,"score":0.5392543077468872},{"id":"https://openalex.org/C63024428","wikidata":"https://www.wikidata.org/wiki/Q552456","display_name":"Thermoelectric effect","level":2,"score":0.5181204676628113},{"id":"https://openalex.org/C533668322","wikidata":"https://www.wikidata.org/wiki/Q942","display_name":"Bismuth","level":2,"score":0.4606625437736511},{"id":"https://openalex.org/C113196181","wikidata":"https://www.wikidata.org/wiki/Q485223","display_name":"Analytical Chemistry (journal)","level":2,"score":0.3931012749671936},{"id":"https://openalex.org/C42360764","wikidata":"https://www.wikidata.org/wiki/Q83588","display_name":"Chemical engineering","level":1,"score":0.3415805697441101},{"id":"https://openalex.org/C191897082","wikidata":"https://www.wikidata.org/wiki/Q11467","display_name":"Metallurgy","level":1,"score":0.21426290273666382},{"id":"https://openalex.org/C159985019","wikidata":"https://www.wikidata.org/wiki/Q181790","display_name":"Composite material","level":1,"score":0.16628992557525635},{"id":"https://openalex.org/C185592680","wikidata":"https://www.wikidata.org/wiki/Q2329","display_name":"Chemistry","level":0,"score":0.15783077478408813},{"id":"https://openalex.org/C171250308","wikidata":"https://www.wikidata.org/wiki/Q11468","display_name":"Nanotechnology","level":1,"score":0.1547318994998932},{"id":"https://openalex.org/C17525397","wikidata":"https://www.wikidata.org/wiki/Q176140","display_name":"Electrode","level":2,"score":0.15418711304664612},{"id":"https://openalex.org/C147789679","wikidata":"https://www.wikidata.org/wiki/Q11372","display_name":"Physical chemistry","level":1,"score":0.06190001964569092},{"id":"https://openalex.org/C178790620","wikidata":"https://www.wikidata.org/wiki/Q11351","display_name":"Organic chemistry","level":1,"score":0.06053340435028076},{"id":"https://openalex.org/C97346530","wikidata":"https://www.wikidata.org/wiki/Q487005","display_name":"Thermal conductivity","level":2,"score":0.0},{"id":"https://openalex.org/C121332964","wikidata":"https://www.wikidata.org/wiki/Q413","display_name":"Physics","level":0,"score":0.0},{"id":"https://openalex.org/C97355855","wikidata":"https://www.wikidata.org/wiki/Q11473","display_name":"Thermodynamics","level":1,"score":0.0},{"id":"https://openalex.org/C127413603","wikidata":"https://www.wikidata.org/wiki/Q11023","display_name":"Engineering","level":0,"score":0.0}],"mesh":[],"locations_count":1,"locations":[{"id":"doi:10.14723/tmrsj.40.383","doi":"https://doi.org/10.14723/tmrsj.40.383","is_oa":true,"landing_page_url":"https://doi.org/10.14723/tmrsj.40.383","pdf_url":"https://www.jstage.jst.go.jp/article/tmrsj/40/4/40_383/_pdf","source":{"id":"https://openalex.org/S2765035252","display_name":"Transactions of the Materials Research Society of Japan","issn_l":"1382-3469","issn":["1382-3469","2188-1650"],"is_oa":false,"is_in_doaj":false,"is_core":true,"listed_in":["cwts-core"],"host_organization":"https://openalex.org/P4327988827","host_organization_name":"Materials Research Society of Japan","host_organization_lineage":["https://openalex.org/P4327988827"],"host_organization_lineage_names":["Materials Research Society of Japan"],"type":"journal"},"license":null,"license_id":null,"version":"publishedVersion","is_accepted":true,"is_published":true,"raw_source_name":"Transactions of the Materials Research Society of Japan","raw_type":"journal-article"}],"best_oa_location":{"id":"doi:10.14723/tmrsj.40.383","doi":"https://doi.org/10.14723/tmrsj.40.383","is_oa":true,"landing_page_url":"https://doi.org/10.14723/tmrsj.40.383","pdf_url":"https://www.jstage.jst.go.jp/article/tmrsj/40/4/40_383/_pdf","source":{"id":"https://openalex.org/S2765035252","display_name":"Transactions of the Materials Research Society of Japan","issn_l":"1382-3469","issn":["1382-3469","2188-1650"],"is_oa":false,"is_in_doaj":false,"is_core":true,"listed_in":["cwts-core"],"host_organization":"https://openalex.org/P4327988827","host_organization_name":"Materials Research Society of Japan","host_organization_lineage":["https://openalex.org/P4327988827"],"host_organization_lineage_names":["Materials Research Society of Japan"],"type":"journal"},"license":null,"license_id":null,"version":"publishedVersion","is_accepted":true,"is_published":true,"raw_source_name":"Transactions of the Materials Research Society of Japan","raw_type":"journal-article"},"sustainable_development_goals":[{"id":"https://metadata.un.org/sdg/7","display_name":"Affordable and clean energy","score":0.75}],"study_designs":[],"awards":[],"funders":[],"has_content":{"pdf":true,"grobid_xml":true},"content_urls":{"pdf":"https://content.openalex.org/works/W2289611716.pdf","grobid_xml":"https://content.openalex.org/works/W2289611716.grobid-xml"},"referenced_works_count":25,"referenced_works":["https://openalex.org/W389868541","https://openalex.org/W1491391791","https://openalex.org/W1997431411","https://openalex.org/W2001307454","https://openalex.org/W2007678322","https://openalex.org/W2017144272","https://openalex.org/W2020516788","https://openalex.org/W2036496306","https://openalex.org/W2040054771","https://openalex.org/W2041532378","https://openalex.org/W2043577151","https://openalex.org/W2049310165","https://openalex.org/W2052419065","https://openalex.org/W2054540944","https://openalex.org/W2061194007","https://openalex.org/W2068326806","https://openalex.org/W2080928454","https://openalex.org/W2087776094","https://openalex.org/W2127116702","https://openalex.org/W2128401319","https://openalex.org/W2141662240","https://openalex.org/W2151592156","https://openalex.org/W2171114089","https://openalex.org/W2485560134","https://openalex.org/W2710101706"],"related_works":["https://openalex.org/W2079526384","https://openalex.org/W2710101706","https://openalex.org/W2040886960","https://openalex.org/W2319453664","https://openalex.org/W2093537086","https://openalex.org/W2613800882","https://openalex.org/W2078531847","https://openalex.org/W2080802737","https://openalex.org/W2025727002","https://openalex.org/W1539971220"],"abstract_inverted_index":{"Bismuth":[0],"telluride":[1],"thin":[2,27,40,68,84,95,114],"films":[3,28,41,69,96,115],"were":[4,29],"prepared":[5],"on":[6,32],"nickel":[7],"plate":[8],"by":[9,76,101,138],"galvanostatic":[10],"electrodeposition":[11],"from":[12],"hydrochloric":[13],"acid-based":[14],"electrolyte.":[15,38,131],"It":[16],"was":[17,74],"found":[18],"that":[19,80],"the":[20,26,33,37,55,58,67,82,103,107,113,125,130,140,144,146],"structural":[21],"and":[22,79,106,119],"thermoelectric":[23,161],"properties":[24],"of":[25,57,61,66,81,93,112,124,127,143],"strongly":[30],"dependent":[31],"Te":[34,44,104,128,141],"content":[35,105,142],"in":[36,48,122,129],"All":[39],"with":[42,70],"various":[43],"contents":[45],"exhibited":[46,116],"peaks":[47],"their":[49],"X-ray":[50],"diffraction":[51],"patterns":[52],"corresponding":[53],"to":[54,98,152],"reflections":[56],"rhombohedral":[59],"phase":[60],"Bi2Te3.":[62],"The":[63,90,109],"surface":[64],"morphology":[65],"nearly":[71],"stoichiometric":[72],"composition":[73,148],"formed":[75],"dendritic":[77],"crystallites,":[78],"Te-rich":[83],"film":[85],"revealed":[86],"a":[87],"granular":[88],"structure.":[89],"electrical":[91],"conductivity":[92],"these":[94],"seemed":[97],"be":[99,150],"influenced":[100],"both":[102,117],"morphology.":[108],"Seebeck":[110],"coefficient":[111],"negative":[118],"positive":[120],"values":[121],"dependence":[123],"quantity":[126],"This":[132],"behavior":[133],"is":[134],"advantageous":[135],"because":[136],"only":[137],"changing":[139],"electrolyte,":[145],"material":[147],"can":[149],"manipulated":[151],"yield":[153],"either":[154],"p-type":[155],"or":[156],"n-type":[157],"semiconductors":[158],"suitable":[159],"for":[160],"devices.":[162]},"counts_by_year":[{"year":2025,"cited_by_count":1},{"year":2023,"cited_by_count":2},{"year":2021,"cited_by_count":3},{"year":2020,"cited_by_count":3},{"year":2019,"cited_by_count":2},{"year":2018,"cited_by_count":5},{"year":2017,"cited_by_count":1},{"year":2016,"cited_by_count":3}],"updated_date":"2026-09-27T08:07:27.782135","created_date":"2016-06-24T00:00:00"}