{"id":"https://openalex.org/W2255603813","doi":null,"title":"Timing-Arc Based Signal Integrity Analysis with Equivalent Current Model","display_name":"Timing-Arc Based Signal Integrity Analysis with Equivalent Current Model","publication_year":2004,"publication_date":"2004-10-01","ids":{"openalex":"https://openalex.org/W2255603813","mag":"2255603813"},"language":"en","primary_location":{"id":"mag:2255603813","doi":null,"is_oa":false,"landing_page_url":"http://www.dbpia.co.kr/Journal/ArticleDetail/NODE01810769","pdf_url":null,"source":{"id":"https://openalex.org/S4306514487","display_name":"\ub300\ud55c\uc804\uc790\uacf5\ud559\ud68c ISOCC","issn_l":null,"issn":null,"is_oa":false,"is_in_doaj":false,"is_core":false,"listed_in":[],"host_organization":null,"host_organization_name":null,"host_organization_lineage":[],"host_organization_lineage_names":[],"type":"journal"},"license":null,"license_id":null,"version":null,"is_accepted":false,"is_published":false,"raw_source_name":"\ub300\ud55c\uc804\uc790\uacf5\ud559\ud68c ISOCC","raw_type":null},"volume":null,"type":"article","is_traditional":true,"indexed_in":[],"open_access":{"is_oa":false,"oa_status":"closed","oa_url":null,"any_repository_has_fulltext":false},"authorships":[{"author_position":"first","author":{"id":"https://openalex.org/A5100379038","display_name":"Taehoon Kim","orcid":"https://orcid.org/0000-0002-9222-6677","observed_orcids":["https://orcid.org/0000-0002-9222-6677"]},"institutions":[],"countries":[],"is_corresponding":false,"raw_author_name":"Taehoon Kim","raw_affiliation_strings":[],"raw_orcid":"https://orcid.org/0000-0002-9222-6677","affiliations":[]},{"author_position":"middle","author":{"id":"https://openalex.org/A5008656841","display_name":"Changbum Im","orcid":null,"observed_orcids":[]},"institutions":[],"countries":[],"is_corresponding":false,"raw_author_name":"Changbum Im","raw_affiliation_strings":[],"raw_orcid":null,"affiliations":[]},{"author_position":"middle","author":{"id":"https://openalex.org/A5086796585","display_name":"Youngdoo Choi","orcid":"https://orcid.org/0000-0003-3501-3058","observed_orcids":["https://orcid.org/0000-0003-3501-3058"]},"institutions":[],"countries":[],"is_corresponding":false,"raw_author_name":"Young-Doo Choi","raw_affiliation_strings":[],"raw_orcid":"https://orcid.org/0000-0003-3501-3058","affiliations":[]},{"author_position":"last","author":{"id":"https://openalex.org/A5041931143","display_name":"Seongkwan Hong","orcid":null,"observed_orcids":[]},"institutions":[],"countries":[],"is_corresponding":false,"raw_author_name":"Seongkwan Hong","raw_affiliation_strings":[],"raw_orcid":null,"affiliations":[]}],"institutions":[],"countries_distinct_count":0,"institutions_distinct_count":0,"corresponding_author_ids":[],"corresponding_institution_ids":[],"apc_list":null,"apc_paid":null,"fwci":0.0,"has_fulltext":false,"cited_by_count":0,"citation_normalized_percentile":{"value":0.0,"is_in_top_1_percent":false,"is_in_top_10_percent":false},"cited_by_percentile_year":null,"biblio":{"volume":null,"issue":null,"first_page":"278","last_page":"281"},"is_retracted":false,"is_paratext":false,"is_xpac":false,"primary_topic":{"id":"https://openalex.org/T10363","display_name":"Low-power high-performance VLSI design","score":0.6122999787330627,"subfield":{"id":"https://openalex.org/subfields/2208","display_name":"Electrical and Electronic Engineering"},"field":{"id":"https://openalex.org/fields/22","display_name":"Engineering"},"domain":{"id":"https://openalex.org/domains/3","display_name":"Physical Sciences"}},"topics":[{"id":"https://openalex.org/T10363","display_name":"Low-power high-performance VLSI design","score":0.6122999787330627,"subfield":{"id":"https://openalex.org/subfields/2208","display_name":"Electrical and Electronic Engineering"},"field":{"id":"https://openalex.org/fields/22","display_name":"Engineering"},"domain":{"id":"https://openalex.org/domains/3","display_name":"Physical Sciences"}},{"id":"https://openalex.org/T11032","display_name":"VLSI and Analog Circuit Testing","score":0.0860000029206276,"subfield":{"id":"https://openalex.org/subfields/1708","display_name":"Hardware and Architecture"},"field":{"id":"https://openalex.org/fields/17","display_name":"Computer Science"},"domain":{"id":"https://openalex.org/domains/3","display_name":"Physical Sciences"}},{"id":"https://openalex.org/T11522","display_name":"VLSI and FPGA Design Techniques","score":0.04479999840259552,"subfield":{"id":"https://openalex.org/subfields/2208","display_name":"Electrical and Electronic Engineering"},"field":{"id":"https://openalex.org/fields/22","display_name":"Engineering"},"domain":{"id":"https://openalex.org/domains/3","display_name":"Physical Sciences"}}],"keywords":[{"id":"https://openalex.org/keywords/signal-integrity","display_name":"signal integrity","score":0.9869999885559082},{"id":"https://openalex.org/keywords/interconnect-analysis","display_name":"interconnect analysis","score":0.5450000166893005},{"id":"https://openalex.org/keywords/power-distribution-networks","display_name":"power distribution networks","score":0.41200000047683716},{"id":"https://openalex.org/keywords/crosstalk","display_name":"crosstalk","score":0.5080000162124634}],"concepts":[{"id":"https://openalex.org/C148043351","wikidata":"https://www.wikidata.org/wiki/Q4456944","display_name":"Current (fluid)","level":2,"score":0.5709327459335327},{"id":"https://openalex.org/C41008148","wikidata":"https://www.wikidata.org/wiki/Q21198","display_name":"Computer science","level":0,"score":0.4204283356666565},{"id":"https://openalex.org/C149782125","wikidata":"https://www.wikidata.org/wiki/Q160039","display_name":"Econometrics","level":1,"score":0.41973644495010376},{"id":"https://openalex.org/C33923547","wikidata":"https://www.wikidata.org/wiki/Q395","display_name":"Mathematics","level":0,"score":0.24166256189346313},{"id":"https://openalex.org/C127413603","wikidata":"https://www.wikidata.org/wiki/Q11023","display_name":"Engineering","level":0,"score":0.17764779925346375},{"id":"https://openalex.org/C119599485","wikidata":"https://www.wikidata.org/wiki/Q43035","display_name":"Electrical engineering","level":1,"score":0.1248207688331604}],"mesh":[],"locations_count":1,"locations":[{"id":"mag:2255603813","doi":null,"is_oa":false,"landing_page_url":"http://www.dbpia.co.kr/Journal/ArticleDetail/NODE01810769","pdf_url":null,"source":{"id":"https://openalex.org/S4306514487","display_name":"\ub300\ud55c\uc804\uc790\uacf5\ud559\ud68c ISOCC","issn_l":null,"issn":null,"is_oa":false,"is_in_doaj":false,"is_core":false,"listed_in":[],"host_organization":null,"host_organization_name":null,"host_organization_lineage":[],"host_organization_lineage_names":[],"type":"journal"},"license":null,"license_id":null,"version":null,"is_accepted":false,"is_published":false,"raw_source_name":"\ub300\ud55c\uc804\uc790\uacf5\ud559\ud68c ISOCC","raw_type":null}],"best_oa_location":null,"sustainable_development_goals":[],"study_designs":[],"awards":[],"funders":[],"has_content":{"grobid_xml":false,"pdf":false},"content_urls":null,"referenced_works_count":2,"referenced_works":["https://openalex.org/W2214216863","https://openalex.org/W2272946066"],"related_works":["https://openalex.org/W7095634288","https://openalex.org/W2276975914","https://openalex.org/W4405270689","https://openalex.org/W4298358594","https://openalex.org/W2122914538","https://openalex.org/W2966735123","https://openalex.org/W2362360960","https://openalex.org/W7006381931","https://openalex.org/W7028377104","https://openalex.org/W2340735926"],"abstract_inverted_index":null,"counts_by_year":[],"updated_date":"2026-10-01T08:54:57.152042","created_date":"2016-06-24T00:00:00"}