{"id":"https://openalex.org/W2210035573","doi":null,"title":"Path Planning of Automated Optical Inspection Machines for PCB Assembly Systems","display_name":"Path Planning of Automated Optical Inspection Machines for PCB Assembly Systems","publication_year":2006,"publication_date":"2006-02-01","ids":{"openalex":"https://openalex.org/W2210035573","mag":"2210035573"},"language":"en","primary_location":{"id":"mag:2210035573","doi":null,"is_oa":false,"landing_page_url":"http://www.ijcas.com/admin/paper/files/IJCAS_v4_n1_pp.96-104.pdf","pdf_url":null,"source":{"id":"https://openalex.org/S4398839","display_name":"International Journal of Control Automation and Systems","issn_l":"1598-6446","issn":["1598-6446","2005-4092"],"is_oa":false,"is_in_doaj":false,"is_core":true,"listed_in":["cwts-core","dongbi-d","jufo-1","kci-registered","norway-1","poland-100","russia-white-list-1"],"host_organization":"https://openalex.org/P4310319900","host_organization_name":"Springer Science+Business Media","host_organization_lineage":["https://openalex.org/P4310319900","https://openalex.org/P4310319965"],"host_organization_lineage_names":["Springer Science+Business Media","Springer Nature"],"type":"journal"},"license":null,"license_id":null,"version":null,"is_accepted":false,"is_published":false,"raw_source_name":"International Journal of Control Automation and Systems","raw_type":null},"volume":null,"type":"article","indexed_in":[],"open_access":{"is_oa":false,"oa_status":"closed","oa_url":null,"any_repository_has_fulltext":false},"authorships":[{"author_position":"first","author":{"id":"https://openalex.org/A5046715205","display_name":"Tae-Hyoung Park","orcid":"https://orcid.org/0000-0002-3695-344X","observed_orcids":["https://orcid.org/0000-0002-3695-344X"]},"institutions":[],"countries":[],"is_corresponding":false,"raw_author_name":"Tae-Hyoung Park","raw_affiliation_strings":[],"raw_orcid":null,"affiliations":[]},{"author_position":"middle","author":{"id":"https://openalex.org/A5013949668","display_name":"Hwa Jung Kim","orcid":"https://orcid.org/0000-0003-1916-7014","observed_orcids":["https://orcid.org/0000-0003-1916-7014"]},"institutions":[],"countries":[],"is_corresponding":false,"raw_author_name":"Hwa Jung Kim","raw_affiliation_strings":[],"raw_orcid":"https://orcid.org/0000-0003-1916-7014","affiliations":[]},{"author_position":"last","author":{"id":"https://openalex.org/A5083210688","display_name":"Nam Kim","orcid":"https://orcid.org/0000-0001-8109-2055","observed_orcids":["https://orcid.org/0000-0001-8109-2055"]},"institutions":[],"countries":[],"is_corresponding":false,"raw_author_name":"Nam Kim","raw_affiliation_strings":[],"raw_orcid":"https://orcid.org/0000-0001-8109-2055","affiliations":[]}],"institutions":[],"countries_distinct_count":0,"institutions_distinct_count":0,"corresponding_author_ids":[],"corresponding_institution_ids":[],"apc_list":null,"apc_paid":null,"fwci":3.5399,"has_fulltext":false,"cited_by_count":21,"citation_normalized_percentile":{"value":0.93129195,"is_in_top_1_percent":false,"is_in_top_10_percent":true},"cited_by_percentile_year":{"min":89,"max":97},"biblio":{"volume":"4","issue":"1","first_page":"96","last_page":"104"},"is_retracted":false,"is_paratext":false,"is_xpac":false,"primary_topic":{"id":"https://openalex.org/T10586","display_name":"Robotic Path Planning Algorithms","score":0.7856000065803528,"subfield":{"id":"https://openalex.org/subfields/1707","display_name":"Computer Vision and Pattern Recognition"},"field":{"id":"https://openalex.org/fields/17","display_name":"Computer Science"},"domain":{"id":"https://openalex.org/domains/3","display_name":"Physical Sciences"}},"topics":[{"id":"https://openalex.org/T10586","display_name":"Robotic Path Planning Algorithms","score":0.7856000065803528,"subfield":{"id":"https://openalex.org/subfields/1707","display_name":"Computer Vision and Pattern Recognition"},"field":{"id":"https://openalex.org/fields/17","display_name":"Computer Science"},"domain":{"id":"https://openalex.org/domains/3","display_name":"Physical Sciences"}},{"id":"https://openalex.org/T12111","display_name":"Industrial Vision Systems and Defect Detection","score":0.09130000323057175,"subfield":{"id":"https://openalex.org/subfields/2209","display_name":"Industrial and Manufacturing Engineering"},"field":{"id":"https://openalex.org/fields/22","display_name":"Engineering"},"domain":{"id":"https://openalex.org/domains/3","display_name":"Physical Sciences"}},{"id":"https://openalex.org/T11159","display_name":"Manufacturing Process and Optimization","score":0.0348999984562397,"subfield":{"id":"https://openalex.org/subfields/2209","display_name":"Industrial and Manufacturing Engineering"},"field":{"id":"https://openalex.org/fields/22","display_name":"Engineering"},"domain":{"id":"https://openalex.org/domains/3","display_name":"Physical Sciences"}}],"keywords":[{"id":"https://openalex.org/keywords/path-planning","display_name":"path planning","score":0.9409999847412109},{"id":"https://openalex.org/keywords/automated-optical-inspection","display_name":"automated optical inspection","score":0.9829999804496765},{"id":"https://openalex.org/keywords/printed-circuit-board-assembly","display_name":"printed circuit board assembly","score":0.7099999785423279},{"id":"https://openalex.org/keywords/inspection-equipment","display_name":"inspection equipment","score":0.4620000123977661},{"id":"https://openalex.org/keywords/machine-vision","display_name":"machine vision","score":0.3540000021457672},{"id":"https://openalex.org/keywords/printed-circuit-board-inspection","display_name":"printed circuit board inspection","score":0.5199999809265137}],"concepts":[{"id":"https://openalex.org/C164830781","wikidata":"https://www.wikidata.org/wiki/Q787330","display_name":"Automated optical inspection","level":2,"score":0.7010794878005981},{"id":"https://openalex.org/C120793396","wikidata":"https://www.wikidata.org/wiki/Q173350","display_name":"Printed circuit board","level":2,"score":0.6878511905670166},{"id":"https://openalex.org/C2777735758","wikidata":"https://www.wikidata.org/wiki/Q817765","display_name":"Path (computing)","level":2,"score":0.6086049675941467},{"id":"https://openalex.org/C28704281","wikidata":"https://www.wikidata.org/wiki/Q180165","display_name":"Mechatronics","level":2,"score":0.6003158092498779},{"id":"https://openalex.org/C41008148","wikidata":"https://www.wikidata.org/wiki/Q21198","display_name":"Computer science","level":0,"score":0.5771656036376953},{"id":"https://openalex.org/C34413123","wikidata":"https://www.wikidata.org/wiki/Q170978","display_name":"Robotics","level":3,"score":0.5377289056777954},{"id":"https://openalex.org/C2778112365","wikidata":"https://www.wikidata.org/wiki/Q3511065","display_name":"Sequence (biology)","level":2,"score":0.5342686772346497},{"id":"https://openalex.org/C154945302","wikidata":"https://www.wikidata.org/wiki/Q11660","display_name":"Artificial intelligence","level":1,"score":0.5003323554992676},{"id":"https://openalex.org/C81074085","wikidata":"https://www.wikidata.org/wiki/Q366872","display_name":"Motion planning","level":3,"score":0.4877792000770569},{"id":"https://openalex.org/C8880873","wikidata":"https://www.wikidata.org/wiki/Q187787","display_name":"Genetic algorithm","level":2,"score":0.4613371789455414},{"id":"https://openalex.org/C146920229","wikidata":"https://www.wikidata.org/wiki/Q2278114","display_name":"Automated X-ray inspection","level":4,"score":0.41236305236816406},{"id":"https://openalex.org/C127413603","wikidata":"https://www.wikidata.org/wiki/Q11023","display_name":"Engineering","level":0,"score":0.33135294914245605},{"id":"https://openalex.org/C119857082","wikidata":"https://www.wikidata.org/wiki/Q2539","display_name":"Machine learning","level":1,"score":0.23360559344291687},{"id":"https://openalex.org/C90509273","wikidata":"https://www.wikidata.org/wiki/Q11012","display_name":"Robot","level":2,"score":0.19005796313285828},{"id":"https://openalex.org/C9417928","wikidata":"https://www.wikidata.org/wiki/Q1070689","display_name":"Image processing","level":3,"score":0.17897185683250427},{"id":"https://openalex.org/C115961682","wikidata":"https://www.wikidata.org/wiki/Q860623","display_name":"Image (mathematics)","level":2,"score":0.15236759185791016},{"id":"https://openalex.org/C111919701","wikidata":"https://www.wikidata.org/wiki/Q9135","display_name":"Operating system","level":1,"score":0.0},{"id":"https://openalex.org/C54355233","wikidata":"https://www.wikidata.org/wiki/Q7162","display_name":"Genetics","level":1,"score":0.0},{"id":"https://openalex.org/C86803240","wikidata":"https://www.wikidata.org/wiki/Q420","display_name":"Biology","level":0,"score":0.0},{"id":"https://openalex.org/C199360897","wikidata":"https://www.wikidata.org/wiki/Q9143","display_name":"Programming language","level":1,"score":0.0}],"mesh":[],"locations_count":1,"locations":[{"id":"mag:2210035573","doi":null,"is_oa":false,"landing_page_url":"http://www.ijcas.com/admin/paper/files/IJCAS_v4_n1_pp.96-104.pdf","pdf_url":null,"source":{"id":"https://openalex.org/S4398839","display_name":"International Journal of Control Automation and Systems","issn_l":"1598-6446","issn":["1598-6446","2005-4092"],"is_oa":false,"is_in_doaj":false,"is_core":true,"listed_in":["cwts-core","dongbi-d","jufo-1","kci-registered","norway-1","poland-100","russia-white-list-1"],"host_organization":"https://openalex.org/P4310319900","host_organization_name":"Springer Science+Business Media","host_organization_lineage":["https://openalex.org/P4310319900","https://openalex.org/P4310319965"],"host_organization_lineage_names":["Springer Science+Business Media","Springer Nature"],"type":"journal"},"license":null,"license_id":null,"version":null,"is_accepted":false,"is_published":false,"raw_source_name":"International Journal of Control Automation and Systems","raw_type":null}],"best_oa_location":null,"sustainable_development_goals":[{"score":0.6773999929428101,"display_name":"Industry, innovation and infrastructure","id":"https://metadata.un.org/sdg/9"}],"sustainable_development_goals_aurora":[],"study_designs":[],"awards":[],"funders":[],"has_content":{"grobid_xml":false,"pdf":false},"content_urls":null,"referenced_works_count":16,"referenced_works":["https://openalex.org/W1717440967","https://openalex.org/W1981388088","https://openalex.org/W1992419399","https://openalex.org/W2004056068","https://openalex.org/W2004313226","https://openalex.org/W2037455079","https://openalex.org/W2040929534","https://openalex.org/W2116141862","https://openalex.org/W2133907157","https://openalex.org/W2142168233","https://openalex.org/W2142183404","https://openalex.org/W2142661676","https://openalex.org/W2161160262","https://openalex.org/W2165616866","https://openalex.org/W2575493008","https://openalex.org/W2612166593"],"related_works":["https://openalex.org/W2013811164","https://openalex.org/W3024744541","https://openalex.org/W7095092079","https://openalex.org/W2162089720","https://openalex.org/W2331818408","https://openalex.org/W2074220104","https://openalex.org/W4239954986","https://openalex.org/W7220746441","https://openalex.org/W2801875496","https://openalex.org/W2269700287"],"abstract_inverted_index":null,"counts_by_year":[{"year":2025,"cited_by_count":1},{"year":2021,"cited_by_count":3},{"year":2020,"cited_by_count":2},{"year":2015,"cited_by_count":3},{"year":2012,"cited_by_count":1}],"updated_date":"2026-10-16T09:59:22.235173","created_date":"2016-06-24T00:00:00"}