{"id":"https://openalex.org/W21989384","doi":null,"title":"Surveillance of Reflectivity for a Conductor Shield Based on Temperature and Frequency","display_name":"Surveillance of Reflectivity for a Conductor Shield Based on Temperature and Frequency","publication_year":2013,"publication_date":"2013-01-01","ids":{"openalex":"https://openalex.org/W21989384","mag":"21989384"},"language":"en","primary_location":{"id":"mag:21989384","doi":null,"is_oa":false,"landing_page_url":"http://article.sapub.org/pdf/10.5923.j.ijea.20130301.01.pdf","pdf_url":null,"source":{"id":"https://openalex.org/S4210201871","display_name":"International journal of electromagnetics and applications","issn_l":"2168-5045","issn":["2168-5045","2168-5037"],"is_oa":false,"is_in_doaj":false,"is_core":true,"listed_in":["cwts-core"],"host_organization":null,"host_organization_name":null,"host_organization_lineage":[],"host_organization_lineage_names":[],"type":"journal"},"license":null,"license_id":null,"version":null,"is_accepted":false,"is_published":false,"raw_source_name":"International journal of electromagnetics and applications","raw_type":null},"volume":null,"type":"article","is_traditional":true,"indexed_in":[],"open_access":{"is_oa":false,"oa_status":"closed","oa_url":null,"any_repository_has_fulltext":false},"authorships":[{"author_position":"first","author":{"id":"https://openalex.org/A5081747627","display_name":"Srinu Budumuru","orcid":"https://orcid.org/0000-0003-2875-6347","observed_orcids":["https://orcid.org/0000-0003-2875-6347"]},"institutions":[],"countries":[],"is_corresponding":false,"raw_author_name":"Srinu Budumuru","raw_affiliation_strings":[],"raw_orcid":"https://orcid.org/0000-0003-2875-6347","affiliations":[]},{"author_position":"middle","author":{"id":"https://openalex.org/A5113929295","display_name":"C. Dharma Raj","orcid":null,"observed_orcids":[]},"institutions":[],"countries":[],"is_corresponding":false,"raw_author_name":"C. Dharma Raj","raw_affiliation_strings":[],"raw_orcid":null,"affiliations":[]},{"author_position":"last","author":{"id":"https://openalex.org/A5033768131","display_name":"P. V. Y. Jayasree","orcid":"https://orcid.org/0000-0002-9576-637X","observed_orcids":["https://orcid.org/0000-0002-9576-637X"]},"institutions":[],"countries":[],"is_corresponding":false,"raw_author_name":"P. V. Y. Jayasree","raw_affiliation_strings":[],"raw_orcid":null,"affiliations":[]}],"institutions":[],"countries_distinct_count":0,"institutions_distinct_count":0,"corresponding_author_ids":[],"corresponding_institution_ids":[],"apc_list":null,"apc_paid":null,"fwci":0.0,"has_fulltext":false,"cited_by_count":0,"citation_normalized_percentile":{"value":0.00116465,"is_in_top_1_percent":false,"is_in_top_10_percent":false},"cited_by_percentile_year":null,"biblio":{"volume":"3","issue":"1","first_page":"1","last_page":"8"},"is_retracted":false,"is_paratext":false,"is_xpac":false,"primary_topic":{"id":"https://openalex.org/T11224","display_name":"Electromagnetic wave absorption materials","score":0.8773999810218811,"subfield":{"id":"https://openalex.org/subfields/2504","display_name":"Electronic, Optical and Magnetic Materials"},"field":{"id":"https://openalex.org/fields/25","display_name":"Materials Science"},"domain":{"id":"https://openalex.org/domains/3","display_name":"Physical Sciences"}},"topics":[{"id":"https://openalex.org/T11224","display_name":"Electromagnetic wave absorption materials","score":0.8773999810218811,"subfield":{"id":"https://openalex.org/subfields/2504","display_name":"Electronic, Optical and Magnetic Materials"},"field":{"id":"https://openalex.org/fields/25","display_name":"Materials Science"},"domain":{"id":"https://openalex.org/domains/3","display_name":"Physical Sciences"}},{"id":"https://openalex.org/T11851","display_name":"Electromagnetic Compatibility and Measurements","score":0.10029999911785126,"subfield":{"id":"https://openalex.org/subfields/2208","display_name":"Electrical and Electronic Engineering"},"field":{"id":"https://openalex.org/fields/22","display_name":"Engineering"},"domain":{"id":"https://openalex.org/domains/3","display_name":"Physical Sciences"}},{"id":"https://openalex.org/T11444","display_name":"Electromagnetic Compatibility and Noise Suppression","score":0.010499999858438969,"subfield":{"id":"https://openalex.org/subfields/2208","display_name":"Electrical and Electronic Engineering"},"field":{"id":"https://openalex.org/fields/22","display_name":"Engineering"},"domain":{"id":"https://openalex.org/domains/3","display_name":"Physical Sciences"}}],"keywords":[{"id":"https://openalex.org/keywords/electromagnetic-shielding","display_name":"electromagnetic interference shielding","score":0.8149999976158142},{"id":"https://openalex.org/keywords/reflectivity","display_name":"reflectivity","score":0.7639999985694885},{"id":"https://openalex.org/keywords/electromagnetic-interference","display_name":"electromagnetic interference","score":0.7210000157356262},{"id":"https://openalex.org/keywords/electromagnetic-compatibility","display_name":"electromagnetic compatibility","score":0.9490000009536743},{"id":"https://openalex.org/keywords/temperature-dependence","display_name":"temperature dependence","score":0.847000002861023},{"id":"https://openalex.org/keywords/frequency-dependence","display_name":"frequency dependence","score":0.7680000066757202},{"id":"https://openalex.org/keywords/conductivity","display_name":"conductivity","score":0.5839999914169312},{"id":"https://openalex.org/keywords/100-mhz","display_name":"100 MHz","score":0.7850000262260437}],"concepts":[{"id":"https://openalex.org/C2265751","wikidata":"https://www.wikidata.org/wiki/Q332007","display_name":"Electromagnetic shielding","level":2,"score":0.8657490611076355},{"id":"https://openalex.org/C202374169","wikidata":"https://www.wikidata.org/wiki/Q124291","display_name":"Electrical conductor","level":2,"score":0.8560032248497009},{"id":"https://openalex.org/C34800285","wikidata":"https://www.wikidata.org/wiki/Q5159395","display_name":"Conductor","level":2,"score":0.7985630035400391},{"id":"https://openalex.org/C138081364","wikidata":"https://www.wikidata.org/wiki/Q852013","display_name":"Shield","level":2,"score":0.6688352823257446},{"id":"https://openalex.org/C192562407","wikidata":"https://www.wikidata.org/wiki/Q228736","display_name":"Materials science","level":0,"score":0.6476961374282837},{"id":"https://openalex.org/C184892835","wikidata":"https://www.wikidata.org/wiki/Q1474513","display_name":"Electromagnetic interference","level":2,"score":0.5665115714073181},{"id":"https://openalex.org/C125470083","wikidata":"https://www.wikidata.org/wiki/Q747288","display_name":"Electromagnetic compatibility","level":2,"score":0.5136699080467224},{"id":"https://openalex.org/C120665830","wikidata":"https://www.wikidata.org/wiki/Q14620","display_name":"Optics","level":1,"score":0.4203316569328308},{"id":"https://openalex.org/C49040817","wikidata":"https://www.wikidata.org/wiki/Q193091","display_name":"Optoelectronics","level":1,"score":0.35277557373046875},{"id":"https://openalex.org/C119599485","wikidata":"https://www.wikidata.org/wiki/Q43035","display_name":"Electrical engineering","level":1,"score":0.2540239691734314},{"id":"https://openalex.org/C159985019","wikidata":"https://www.wikidata.org/wiki/Q181790","display_name":"Composite material","level":1,"score":0.2524743974208832},{"id":"https://openalex.org/C121332964","wikidata":"https://www.wikidata.org/wiki/Q413","display_name":"Physics","level":0,"score":0.12268456816673279},{"id":"https://openalex.org/C127313418","wikidata":"https://www.wikidata.org/wiki/Q1069","display_name":"Geology","level":0,"score":0.11385667324066162},{"id":"https://openalex.org/C127413603","wikidata":"https://www.wikidata.org/wiki/Q11023","display_name":"Engineering","level":0,"score":0.09866005182266235},{"id":"https://openalex.org/C5900021","wikidata":"https://www.wikidata.org/wiki/Q163082","display_name":"Petrology","level":1,"score":0.0}],"mesh":[],"locations_count":1,"locations":[{"id":"mag:21989384","doi":null,"is_oa":false,"landing_page_url":"http://article.sapub.org/pdf/10.5923.j.ijea.20130301.01.pdf","pdf_url":null,"source":{"id":"https://openalex.org/S4210201871","display_name":"International journal of electromagnetics and applications","issn_l":"2168-5045","issn":["2168-5045","2168-5037"],"is_oa":false,"is_in_doaj":false,"is_core":true,"listed_in":["cwts-core"],"host_organization":null,"host_organization_name":null,"host_organization_lineage":[],"host_organization_lineage_names":[],"type":"journal"},"license":null,"license_id":null,"version":null,"is_accepted":false,"is_published":false,"raw_source_name":"International journal of electromagnetics and applications","raw_type":null}],"best_oa_location":null,"sustainable_development_goals":[],"study_designs":[],"awards":[],"funders":[],"has_content":{"pdf":false,"grobid_xml":false},"content_urls":null,"referenced_works_count":8,"referenced_works":["https://openalex.org/W574795654","https://openalex.org/W1974646138","https://openalex.org/W2104752971","https://openalex.org/W2119496065","https://openalex.org/W2124245573","https://openalex.org/W2125551127","https://openalex.org/W2602214487","https://openalex.org/W2894705485"],"related_works":["https://openalex.org/W2919574455","https://openalex.org/W2996903469","https://openalex.org/W4200574272","https://openalex.org/W4288343220","https://openalex.org/W2092282982","https://openalex.org/W4412646616","https://openalex.org/W4410940817","https://openalex.org/W2932427956","https://openalex.org/W4313679296","https://openalex.org/W7220940283"],"abstract_inverted_index":{"The":[0,56,86,125,165,185,194,228,237],"reflection":[1],"loss":[2],"of":[3,17,30,52,77,89,98,127,140,149,159,172,187,196,218],"an":[4],"electromagnetic":[5,118],"wave":[6],"fro":[7,34],"m":[8,35],"a":[9,102,173],"material":[10,92,161,175,190,220],"is":[11],"important":[12],"parameter":[13],"in":[14,50,96,224],"the":[15,23,31,36,60,78,83,90,134,138,141,144,147,150,156,160,179,188,212,215,219,248],"design":[16],"electro":[18,53,61,65,113],"magnetic":[19,54,62,66,114],"shielding":[20,81,87,249],"techniques.":[21],"May":[22],"designed":[24],"circuit":[25,43],"can":[26,93,120,131,152,162,167,208,221,231],"show":[27],"inefficiency":[28],"because":[29],"radiation":[32],"interference":[33,63],"external":[37],"sources.":[38],"To":[39],"construct":[40],"proper":[41],"electronic":[42],"p":[44],"recautions":[45],"has":[46],"to":[47,58,178],"be":[48,94,121,168,209,222,232],"taken":[49],"terms":[51,97],"interferences.":[55],"techniques":[57],"overcome":[59],"are":[64,109],"co":[67,242],"mpatib":[68],"ility.":[69],"In":[70],"this":[71],"paper":[72],"mainly":[73],"discussed":[74],"about":[75],"one":[76],"compatibility":[79],"techniques,":[80],"by":[82,154,241],"conductive":[84,91,106,129,174,189,201],"materials.":[85],"ability":[88],"analyzed":[95],"reflect":[99,157,216],"ivity":[100,158,217],"for":[101,112,170,247],"single":[103],"shield":[104],"ing":[105],"material.":[107,250],"Conductors":[108],"best":[110,229],"reflectors":[111],"waves,":[115],"when":[116],"ever":[117],"waves":[119],"incident":[122],"on":[123,133,137],"it.":[124],"reflectivity":[126,171,197,230],"these":[128],"materials":[130,202],"depends":[132],"temperature.":[135,236],"Based":[136],"properties":[139],"conductor":[142,151],"as":[143],"temperature":[145,180,213],"changes":[146],"conductivity":[148],"changes,":[153],"it":[155],"also":[163,239],"changes.":[164],"analysis":[166,238],"made":[169],"with":[176],"respective":[177],"at":[181,203,234,244],"particu":[182],"lar":[183],"frequency.":[184],"thickness":[186],"not":[191],"considered":[192],"here.":[193],"variation":[195],"fo":[198],"r":[199],"different":[200,245],"100":[204],"M":[205],"Hz":[206],"frequency":[207],"analyzed.":[210],"As":[211],"increases":[214],"decreases":[223],"s":[225],"mall":[226],"percent.":[227],"achieved":[233],"low":[235],"carried":[240],"mparing":[243],"frequencies":[246]},"counts_by_year":[],"updated_date":"2026-11-12T12:28:57.059296","created_date":"2016-06-24T00:00:00"}