{"id":"https://openalex.org/W2188902302","doi":"https://doi.org/10.1109/redw.2015.7336723","title":"Neutron, 64 MeV Proton, Thermal Neutron and Alpha Single-Event Upset Characterization of Xilinx 20nm UltraScale Kintex FPGA","display_name":"Neutron, 64 MeV Proton, Thermal Neutron and Alpha Single-Event Upset Characterization of Xilinx 20nm UltraScale Kintex FPGA","publication_year":2015,"publication_date":"2015-07-01","ids":{"openalex":"https://openalex.org/W2188902302","doi":"https://doi.org/10.1109/redw.2015.7336723","mag":"2188902302"},"language":"en","primary_location":{"id":"doi:10.1109/redw.2015.7336723","doi":"https://doi.org/10.1109/redw.2015.7336723","is_oa":false,"landing_page_url":"https://doi.org/10.1109/redw.2015.7336723","pdf_url":null,"source":{"id":"https://openalex.org/S7407087333","display_name":"IEEE Radiation Effects Data Workshop (REDW)","issn_l":null,"issn":null,"is_oa":false,"is_in_doaj":false,"is_core":false,"listed_in":[],"host_organization":null,"host_organization_name":null,"host_organization_lineage":[],"host_organization_lineage_names":[],"type":"conference"},"license":null,"license_id":null,"version":"publishedVersion","is_accepted":true,"is_published":true,"raw_source_name":"2015 IEEE Radiation Effects Data Workshop (REDW)","raw_type":"proceedings-article"},"volume":null,"type":"conference-paper","is_traditional":true,"indexed_in":["crossref"],"open_access":{"is_oa":false,"oa_status":"closed","oa_url":null,"any_repository_has_fulltext":false},"authorships":[{"author_position":"first","author":{"id":"https://openalex.org/A5081461796","display_name":"Pierre Maillard","orcid":"https://orcid.org/0000-0002-0919-9592","observed_orcids":["https://orcid.org/0000-0002-0919-9592"]},"institutions":[{"id":"https://openalex.org/I155284866","display_name":"Maharishi Markandeshwar University, Mullana","ror":"https://ror.org/013qfkw58","country_code":"IN","type":"education","lineage":["https://openalex.org/I155284866"]}],"countries":["IN"],"is_corresponding":false,"raw_author_name":"Pierre Maillard","raw_affiliation_strings":["Department of Computer Science & Engineering, M. M. University, Ambala, India"],"raw_orcid":null,"affiliations":[{"raw_affiliation_string":"Department of Computer Science & Engineering, M. M. University, Ambala, India","institution_ids":["https://openalex.org/I155284866"]}]},{"author_position":"middle","author":{"id":"https://openalex.org/A5102867053","display_name":"Michael J. Hart","orcid":"https://orcid.org/0000-0002-4423-7662","observed_orcids":["https://orcid.org/0000-0002-4423-7662"]},"institutions":[{"id":"https://openalex.org/I155284866","display_name":"Maharishi Markandeshwar University, Mullana","ror":"https://ror.org/013qfkw58","country_code":"IN","type":"education","lineage":["https://openalex.org/I155284866"]}],"countries":["IN"],"is_corresponding":false,"raw_author_name":"Michael Hart","raw_affiliation_strings":["Department of Computer Science & Engineering, M. M. University, Ambala, India"],"raw_orcid":null,"affiliations":[{"raw_affiliation_string":"Department of Computer Science & Engineering, M. M. University, Ambala, India","institution_ids":["https://openalex.org/I155284866"]}]},{"author_position":"middle","author":{"id":null,"display_name":"Jeff Barton","orcid":null,"observed_orcids":[]},"institutions":[{"id":"https://openalex.org/I155284866","display_name":"Maharishi Markandeshwar University, Mullana","ror":"https://ror.org/013qfkw58","country_code":"IN","type":"education","lineage":["https://openalex.org/I155284866"]}],"countries":["IN"],"is_corresponding":false,"raw_author_name":"Jeff Barton","raw_affiliation_strings":["Department of Computer Science & Engineering, M. M. University, Ambala, India"],"raw_orcid":null,"affiliations":[{"raw_affiliation_string":"Department of Computer Science & Engineering, M. M. University, Ambala, India","institution_ids":["https://openalex.org/I155284866"]}]},{"author_position":"middle","author":{"id":"https://openalex.org/A5080859198","display_name":"Praful Jain","orcid":null,"observed_orcids":[]},"institutions":[{"id":"https://openalex.org/I32923980","display_name":"Xilinx (United States)","ror":"https://ror.org/01rb7bk56","country_code":"US","type":"company","lineage":["https://openalex.org/I32923980"]}],"countries":["US"],"is_corresponding":false,"raw_author_name":"Praful Jain","raw_affiliation_strings":["Xilinx Inc, San Jose, CA, US"],"raw_orcid":null,"affiliations":[{"raw_affiliation_string":"Xilinx Inc, San Jose, CA, US","institution_ids":["https://openalex.org/I32923980"]}]},{"author_position":"last","author":{"id":"https://openalex.org/A5027118984","display_name":"James Karp","orcid":"https://orcid.org/0000-0001-5712-0036","observed_orcids":["https://orcid.org/0000-0001-5712-0036"]},"institutions":[{"id":"https://openalex.org/I32923980","display_name":"Xilinx (United States)","ror":"https://ror.org/01rb7bk56","country_code":"US","type":"company","lineage":["https://openalex.org/I32923980"]}],"countries":["US"],"is_corresponding":false,"raw_author_name":"James Karp","raw_affiliation_strings":["Xilinx Inc, San Jose, CA, US"],"raw_orcid":null,"affiliations":[{"raw_affiliation_string":"Xilinx Inc, San Jose, CA, US","institution_ids":["https://openalex.org/I32923980"]}]}],"institutions":[],"countries_distinct_count":2,"institutions_distinct_count":2,"corresponding_author_ids":[],"corresponding_institution_ids":[],"apc_list":null,"apc_paid":null,"fwci":4.5795,"has_fulltext":false,"cited_by_count":36,"citation_normalized_percentile":{"value":0.96265064,"is_in_top_1_percent":false,"is_in_top_10_percent":true},"cited_by_percentile_year":{"min":88,"max":99},"biblio":{"volume":null,"issue":null,"first_page":"1","last_page":"5"},"is_retracted":false,"is_paratext":false,"is_xpac":false,"primary_topic":{"id":"https://openalex.org/T11005","display_name":"Radiation Effects in Electronics","score":0.9994999766349792,"subfield":{"id":"https://openalex.org/subfields/2208","display_name":"Electrical and Electronic Engineering"},"field":{"id":"https://openalex.org/fields/22","display_name":"Engineering"},"domain":{"id":"https://openalex.org/domains/3","display_name":"Physical Sciences"}},"topics":[{"id":"https://openalex.org/T11005","display_name":"Radiation Effects in Electronics","score":0.9994999766349792,"subfield":{"id":"https://openalex.org/subfields/2208","display_name":"Electrical and Electronic Engineering"},"field":{"id":"https://openalex.org/fields/22","display_name":"Engineering"},"domain":{"id":"https://openalex.org/domains/3","display_name":"Physical Sciences"}},{"id":"https://openalex.org/T11044","display_name":"Particle Detector Development and Performance","score":0.0,"subfield":{"id":"https://openalex.org/subfields/3106","display_name":"Nuclear and High Energy Physics"},"field":{"id":"https://openalex.org/fields/31","display_name":"Physics and Astronomy"},"domain":{"id":"https://openalex.org/domains/3","display_name":"Physical Sciences"}},{"id":"https://openalex.org/T12122","display_name":"Physical Unclonable Functions (PUFs) and Hardware Security","score":0.0,"subfield":{"id":"https://openalex.org/subfields/1708","display_name":"Hardware and Architecture"},"field":{"id":"https://openalex.org/fields/17","display_name":"Computer Science"},"domain":{"id":"https://openalex.org/domains/3","display_name":"Physical Sciences"}}],"keywords":[{"id":"https://openalex.org/keywords/single-event-upset","display_name":"single event upset","score":0.9950000047683716},{"id":"https://openalex.org/keywords/multi-bit-upsets","display_name":"multi-bit upsets","score":0.8090000152587891},{"id":"https://openalex.org/keywords/neutron-irradiation","display_name":"neutron irradiation","score":0.7570000290870667},{"id":"https://openalex.org/keywords/thermal-neutron-irradiation","display_name":"thermal neutron irradiation","score":0.9900000095367432},{"id":"https://openalex.org/keywords/alpha-particle-irradiation","display_name":"alpha particle irradiation","score":0.8980000019073486},{"id":"https://openalex.org/keywords/space-radiation-effects","display_name":"space radiation effects","score":0.718999981880188},{"id":"https://openalex.org/keywords/radiation-hardness","display_name":"radioresistance","score":0.4399999976158142}],"concepts":[{"id":"https://openalex.org/C2780073065","wikidata":"https://www.wikidata.org/wiki/Q1476733","display_name":"Single event upset","level":3,"score":0.6544119715690613},{"id":"https://openalex.org/C42935608","wikidata":"https://www.wikidata.org/wiki/Q190411","display_name":"Field-programmable gate array","level":2,"score":0.6456884741783142},{"id":"https://openalex.org/C152568617","wikidata":"https://www.wikidata.org/wiki/Q2348","display_name":"Neutron","level":2,"score":0.6120139360427856},{"id":"https://openalex.org/C2778002589","wikidata":"https://www.wikidata.org/wiki/Q2406791","display_name":"Upset","level":2,"score":0.5696195363998413},{"id":"https://openalex.org/C54516573","wikidata":"https://www.wikidata.org/wiki/Q2294","display_name":"Proton","level":2,"score":0.5134668946266174},{"id":"https://openalex.org/C185544564","wikidata":"https://www.wikidata.org/wiki/Q81197","display_name":"Nuclear physics","level":1,"score":0.4499536156654358},{"id":"https://openalex.org/C2779662365","wikidata":"https://www.wikidata.org/wiki/Q5416694","display_name":"Event (particle physics)","level":2,"score":0.4420667290687561},{"id":"https://openalex.org/C64943373","wikidata":"https://www.wikidata.org/wiki/Q2651003","display_name":"Alpha (finance)","level":4,"score":0.42900413274765015},{"id":"https://openalex.org/C2780841128","wikidata":"https://www.wikidata.org/wiki/Q5073781","display_name":"Characterization (materials science)","level":2,"score":0.4117039144039154},{"id":"https://openalex.org/C116915560","wikidata":"https://www.wikidata.org/wiki/Q83504","display_name":"Nuclear engineering","level":1,"score":0.37898552417755127},{"id":"https://openalex.org/C41008148","wikidata":"https://www.wikidata.org/wiki/Q21198","display_name":"Computer science","level":0,"score":0.37520378828048706},{"id":"https://openalex.org/C121332964","wikidata":"https://www.wikidata.org/wiki/Q413","display_name":"Physics","level":0,"score":0.3394424021244049},{"id":"https://openalex.org/C127413603","wikidata":"https://www.wikidata.org/wiki/Q11023","display_name":"Engineering","level":0,"score":0.12951210141181946},{"id":"https://openalex.org/C149635348","wikidata":"https://www.wikidata.org/wiki/Q193040","display_name":"Embedded system","level":1,"score":0.1265367865562439},{"id":"https://openalex.org/C9390403","wikidata":"https://www.wikidata.org/wiki/Q3966","display_name":"Computer hardware","level":1,"score":0.09878227114677429},{"id":"https://openalex.org/C120665830","wikidata":"https://www.wikidata.org/wiki/Q14620","display_name":"Optics","level":1,"score":0.08051827549934387},{"id":"https://openalex.org/C68043766","wikidata":"https://www.wikidata.org/wiki/Q267416","display_name":"Static random-access memory","level":2,"score":0.077403724193573},{"id":"https://openalex.org/C49453240","wikidata":"https://www.wikidata.org/wiki/Q1592163","display_name":"Construct validity","level":3,"score":0.0},{"id":"https://openalex.org/C159110408","wikidata":"https://www.wikidata.org/wiki/Q121176","display_name":"Nursing","level":1,"score":0.0},{"id":"https://openalex.org/C78519656","wikidata":"https://www.wikidata.org/wiki/Q101333","display_name":"Mechanical engineering","level":1,"score":0.0},{"id":"https://openalex.org/C62520636","wikidata":"https://www.wikidata.org/wiki/Q944","display_name":"Quantum mechanics","level":1,"score":0.0},{"id":"https://openalex.org/C2775944032","wikidata":"https://www.wikidata.org/wiki/Q22907659","display_name":"Patient satisfaction","level":2,"score":0.0},{"id":"https://openalex.org/C71924100","wikidata":"https://www.wikidata.org/wiki/Q11190","display_name":"Medicine","level":0,"score":0.0}],"mesh":[],"locations_count":1,"locations":[{"id":"doi:10.1109/redw.2015.7336723","doi":"https://doi.org/10.1109/redw.2015.7336723","is_oa":false,"landing_page_url":"https://doi.org/10.1109/redw.2015.7336723","pdf_url":null,"source":{"id":"https://openalex.org/S7407087333","display_name":"IEEE Radiation Effects Data Workshop (REDW)","issn_l":null,"issn":null,"is_oa":false,"is_in_doaj":false,"is_core":false,"listed_in":[],"host_organization":null,"host_organization_name":null,"host_organization_lineage":[],"host_organization_lineage_names":[],"type":"conference"},"license":null,"license_id":null,"version":"publishedVersion","is_accepted":true,"is_published":true,"raw_source_name":"2015 IEEE Radiation Effects Data Workshop (REDW)","raw_type":"proceedings-article"}],"best_oa_location":null,"sustainable_development_goals":[],"study_designs":[],"awards":[],"funders":[],"has_content":{"pdf":false,"grobid_xml":false},"content_urls":null,"referenced_works_count":5,"referenced_works":["https://openalex.org/W1784594876","https://openalex.org/W2007565138","https://openalex.org/W2033522216","https://openalex.org/W2052153312","https://openalex.org/W2270454042"],"related_works":["https://openalex.org/W2771049336","https://openalex.org/W2183587862","https://openalex.org/W4241075081","https://openalex.org/W2991568227","https://openalex.org/W2906063286","https://openalex.org/W2002137790","https://openalex.org/W2991274060","https://openalex.org/W2768293222","https://openalex.org/W3198395271","https://openalex.org/W3010422317"],"abstract_inverted_index":{"The":[0],"single-event":[1],"response":[2],"of":[3],"Xilinx":[4],"20nm":[5],"UltraScale":[6],"Kintex":[7],"FPGA":[8],"is":[9],"characterized":[10],"using":[11],"neutron,":[12],"64":[13],"MeV":[14],"proton,":[15],"thermal":[16],"neutron":[17],"and":[18,25],"alpha":[19],"foil":[20],"irradiation":[21],"sources.":[22],"Single-event":[23],"upset":[24,27],"multi-bits":[26],"results":[28],"are":[29],"presented.":[30]},"counts_by_year":[{"year":2024,"cited_by_count":4},{"year":2023,"cited_by_count":1},{"year":2022,"cited_by_count":4},{"year":2021,"cited_by_count":3},{"year":2020,"cited_by_count":8},{"year":2019,"cited_by_count":5},{"year":2018,"cited_by_count":6},{"year":2017,"cited_by_count":2},{"year":2016,"cited_by_count":3}],"updated_date":"2026-10-05T09:50:58.205359","created_date":"2016-06-24T00:00:00"}