{"id":"https://openalex.org/W2171908682","doi":"https://doi.org/10.1109/test.1995.529895","title":"An experimental chip to evaluate test techniques experiment results","display_name":"An experimental chip to evaluate test techniques experiment results","publication_year":2002,"publication_date":"2002-11-19","ids":{"openalex":"https://openalex.org/W2171908682","doi":"https://doi.org/10.1109/test.1995.529895","mag":"2171908682"},"language":"en","primary_location":{"id":"doi:10.1109/test.1995.529895","doi":"https://doi.org/10.1109/test.1995.529895","is_oa":false,"landing_page_url":"https://doi.org/10.1109/test.1995.529895","pdf_url":null,"source":{"id":"https://openalex.org/S4210209697","display_name":"Proceedings/Proceedings - International Test Conference","issn_l":"1089-3539","issn":["1089-3539","2378-2250"],"is_oa":false,"is_in_doaj":false,"is_core":true,"listed_in":["cwts-core"],"host_organization":"https://openalex.org/P4310319808","host_organization_name":"Institute of Electrical and Electronics Engineers","host_organization_lineage":["https://openalex.org/P4310319808"],"host_organization_lineage_names":["Institute of Electrical and Electronics Engineers"],"type":"conference"},"license":null,"license_id":null,"version":"publishedVersion","is_accepted":true,"is_published":true,"raw_source_name":"Proceedings of 1995 IEEE International Test Conference (ITC)","raw_type":"proceedings-article"},"volume":null,"type":"conference-paper","indexed_in":["crossref"],"open_access":{"is_oa":false,"oa_status":"closed","oa_url":null,"any_repository_has_fulltext":false},"authorships":[{"author_position":"first","author":{"id":"https://openalex.org/A5066062277","display_name":"Siyad Ma","orcid":null,"observed_orcids":[]},"institutions":[{"id":"https://openalex.org/I4210137977","display_name":"Advanced Micro Devices (United States)","ror":"https://ror.org/04kd6c783","country_code":"US","type":"company","lineage":["https://openalex.org/I4210137977"]}],"countries":["US"],"is_corresponding":false,"raw_author_name":"S.C. Ma","raw_affiliation_strings":["Advanced Micro Devices, Inc., Sunnyvale, CA, USA"],"raw_orcid":null,"affiliations":[{"raw_affiliation_string":"Advanced Micro Devices, Inc., Sunnyvale, CA, USA","institution_ids":["https://openalex.org/I4210137977"]}]},{"author_position":"middle","author":{"id":"https://openalex.org/A5008021474","display_name":"Piero Franco","orcid":null,"observed_orcids":[]},"institutions":[{"id":"https://openalex.org/I4210088951","display_name":"Synopsys (United States)","ror":"https://ror.org/013by2m91","country_code":"US","type":"company","lineage":["https://openalex.org/I4210088951"]}],"countries":["US"],"is_corresponding":false,"raw_author_name":"P. Franco","raw_affiliation_strings":["Synopsys, Inc., Mountain View, CA, USA"],"raw_orcid":null,"affiliations":[{"raw_affiliation_string":"Synopsys, Inc., Mountain View, CA, USA","institution_ids":["https://openalex.org/I4210088951"]}]},{"author_position":"last","author":{"id":"https://openalex.org/A5054077540","display_name":"Edward J. McCluskey","orcid":null,"observed_orcids":[]},"institutions":[{"id":"https://openalex.org/I97018004","display_name":"Stanford University","ror":"https://ror.org/00f54p054","country_code":"US","type":"education","lineage":["https://openalex.org/I97018004"]}],"countries":["US"],"is_corresponding":false,"raw_author_name":"E.J. McCluskey","raw_affiliation_strings":["Center for Reliable Computing, University of Stanford, Stanford, CA, USA"],"raw_orcid":null,"affiliations":[{"raw_affiliation_string":"Center for Reliable Computing, University of Stanford, Stanford, CA, USA","institution_ids":["https://openalex.org/I97018004"]}]}],"institutions":[],"countries_distinct_count":1,"institutions_distinct_count":3,"corresponding_author_ids":[],"corresponding_institution_ids":[],"apc_list":null,"apc_paid":null,"fwci":20.1079,"has_fulltext":false,"cited_by_count":274,"citation_normalized_percentile":{"value":0.99785684,"is_in_top_1_percent":true,"is_in_top_10_percent":true},"cited_by_percentile_year":{"min":90,"max":99},"biblio":{"volume":null,"issue":null,"first_page":"663","last_page":"672"},"is_retracted":false,"is_paratext":false,"is_xpac":false,"primary_topic":{"id":"https://openalex.org/T11032","display_name":"VLSI and Analog Circuit Testing","score":0.9980000257492065,"subfield":{"id":"https://openalex.org/subfields/1708","display_name":"Hardware and Architecture"},"field":{"id":"https://openalex.org/fields/17","display_name":"Computer Science"},"domain":{"id":"https://openalex.org/domains/3","display_name":"Physical Sciences"}},"topics":[{"id":"https://openalex.org/T11032","display_name":"VLSI and Analog Circuit Testing","score":0.9980000257492065,"subfield":{"id":"https://openalex.org/subfields/1708","display_name":"Hardware and Architecture"},"field":{"id":"https://openalex.org/fields/17","display_name":"Computer Science"},"domain":{"id":"https://openalex.org/domains/3","display_name":"Physical Sciences"}},{"id":"https://openalex.org/T14117","display_name":"Integrated Circuits and Semiconductor Failure Analysis","score":0.0010000000474974513,"subfield":{"id":"https://openalex.org/subfields/2208","display_name":"Electrical and Electronic Engineering"},"field":{"id":"https://openalex.org/fields/22","display_name":"Engineering"},"domain":{"id":"https://openalex.org/domains/3","display_name":"Physical Sciences"}},{"id":"https://openalex.org/T10743","display_name":"Software Testing and Debugging Techniques","score":0.00019999999494757503,"subfield":{"id":"https://openalex.org/subfields/1712","display_name":"Software"},"field":{"id":"https://openalex.org/fields/17","display_name":"Computer Science"},"domain":{"id":"https://openalex.org/domains/3","display_name":"Physical Sciences"}}],"keywords":[{"id":"https://openalex.org/keywords/test-chip","display_name":"test chip","score":0.5720000267028809},{"id":"https://openalex.org/keywords/test-set-evaluation","display_name":"test set evaluation","score":0.6389999985694885},{"id":"https://openalex.org/keywords/voltage-testing","display_name":"voltage testing","score":0.8560000061988831},{"id":"https://openalex.org/keywords/iddq-testing","display_name":"IDDQ testing","score":0.7940000295639038},{"id":"https://openalex.org/keywords/delay-testing","display_name":"delay testing","score":0.8009999990463257},{"id":"https://openalex.org/keywords/crosscheck","display_name":"CrossCheck","score":0.5189999938011169},{"id":"https://openalex.org/keywords/test-speed","display_name":"test speed","score":0.35499998927116394},{"id":"https://openalex.org/keywords/integrated-circuit-testing","display_name":"integrated circuit testing","score":0.4440000057220459}],"concepts":[{"id":"https://openalex.org/C206678392","wikidata":"https://www.wikidata.org/wiki/Q5987815","display_name":"Iddq testing","level":3,"score":0.9661071300506592},{"id":"https://openalex.org/C165005293","wikidata":"https://www.wikidata.org/wiki/Q1074500","display_name":"Chip","level":2,"score":0.6114324927330017},{"id":"https://openalex.org/C41008148","wikidata":"https://www.wikidata.org/wiki/Q21198","display_name":"Computer science","level":0,"score":0.5491259098052979},{"id":"https://openalex.org/C2777267654","wikidata":"https://www.wikidata.org/wiki/Q3519023","display_name":"Test (biology)","level":2,"score":0.5237688422203064},{"id":"https://openalex.org/C165801399","wikidata":"https://www.wikidata.org/wiki/Q25428","display_name":"Voltage","level":2,"score":0.5170788764953613},{"id":"https://openalex.org/C17626397","wikidata":"https://www.wikidata.org/wiki/Q837455","display_name":"Automatic test pattern generation","level":3,"score":0.5150268077850342},{"id":"https://openalex.org/C132519959","wikidata":"https://www.wikidata.org/wiki/Q3077373","display_name":"Test method","level":2,"score":0.5142097473144531},{"id":"https://openalex.org/C200601418","wikidata":"https://www.wikidata.org/wiki/Q2193887","display_name":"Reliability engineering","level":1,"score":0.46646109223365784},{"id":"https://openalex.org/C24326235","wikidata":"https://www.wikidata.org/wiki/Q126095","display_name":"Electronic engineering","level":1,"score":0.39049604535102844},{"id":"https://openalex.org/C9390403","wikidata":"https://www.wikidata.org/wiki/Q3966","display_name":"Computer hardware","level":1,"score":0.3408603072166443},{"id":"https://openalex.org/C149635348","wikidata":"https://www.wikidata.org/wiki/Q193040","display_name":"Embedded system","level":1,"score":0.33255505561828613},{"id":"https://openalex.org/C134146338","wikidata":"https://www.wikidata.org/wiki/Q1815901","display_name":"Electronic circuit","level":2,"score":0.26825445890426636},{"id":"https://openalex.org/C127413603","wikidata":"https://www.wikidata.org/wiki/Q11023","display_name":"Engineering","level":0,"score":0.24866169691085815},{"id":"https://openalex.org/C46362747","wikidata":"https://www.wikidata.org/wiki/Q173431","display_name":"CMOS","level":2,"score":0.23602473735809326},{"id":"https://openalex.org/C119599485","wikidata":"https://www.wikidata.org/wiki/Q43035","display_name":"Electrical engineering","level":1,"score":0.1779061257839203},{"id":"https://openalex.org/C33923547","wikidata":"https://www.wikidata.org/wiki/Q395","display_name":"Mathematics","level":0,"score":0.08672183752059937},{"id":"https://openalex.org/C105795698","wikidata":"https://www.wikidata.org/wiki/Q12483","display_name":"Statistics","level":1,"score":0.07442981004714966},{"id":"https://openalex.org/C86803240","wikidata":"https://www.wikidata.org/wiki/Q420","display_name":"Biology","level":0,"score":0.0},{"id":"https://openalex.org/C151730666","wikidata":"https://www.wikidata.org/wiki/Q7205","display_name":"Paleontology","level":1,"score":0.0},{"id":"https://openalex.org/C76155785","wikidata":"https://www.wikidata.org/wiki/Q418","display_name":"Telecommunications","level":1,"score":0.0}],"mesh":[],"locations_count":1,"locations":[{"id":"doi:10.1109/test.1995.529895","doi":"https://doi.org/10.1109/test.1995.529895","is_oa":false,"landing_page_url":"https://doi.org/10.1109/test.1995.529895","pdf_url":null,"source":{"id":"https://openalex.org/S4210209697","display_name":"Proceedings/Proceedings - International Test Conference","issn_l":"1089-3539","issn":["1089-3539","2378-2250"],"is_oa":false,"is_in_doaj":false,"is_core":true,"listed_in":["cwts-core"],"host_organization":"https://openalex.org/P4310319808","host_organization_name":"Institute of Electrical and Electronics Engineers","host_organization_lineage":["https://openalex.org/P4310319808"],"host_organization_lineage_names":["Institute of Electrical and Electronics Engineers"],"type":"conference"},"license":null,"license_id":null,"version":"publishedVersion","is_accepted":true,"is_published":true,"raw_source_name":"Proceedings of 1995 IEEE International Test Conference (ITC)","raw_type":"proceedings-article"}],"best_oa_location":null,"sustainable_development_goals":[],"sustainable_development_goals_aurora":[{"display_name":"Affordable and clean energy","score":0.49000000953674316,"id":"https://metadata.un.org/sdg/7"}],"study_designs":[],"awards":[],"funders":[],"has_content":{"grobid_xml":false,"pdf":false},"content_urls":null,"referenced_works_count":8,"referenced_works":["https://openalex.org/W119829542","https://openalex.org/W2100827158","https://openalex.org/W2103937473","https://openalex.org/W2133288230","https://openalex.org/W2134142685","https://openalex.org/W2137045371","https://openalex.org/W2147458209","https://openalex.org/W2152870025"],"related_works":["https://openalex.org/W2082374775","https://openalex.org/W2538904067","https://openalex.org/W1549680942","https://openalex.org/W1927497520","https://openalex.org/W2041955361","https://openalex.org/W112366330","https://openalex.org/W2356698984","https://openalex.org/W2187825401","https://openalex.org/W4230966676","https://openalex.org/W2156661581"],"abstract_inverted_index":{"This":[0],"paper":[1],"describes":[2],"the":[3,12,33],"testing":[4],"of":[5,14,35],"a":[6],"chip":[7],"especially":[8],"designed":[9],"to":[10,46],"facilitate":[11],"evaluation":[13],"various":[15],"test":[16,23,26],"techniques":[17],"for":[18,51],"combinational":[19],"circuitry.":[20],"The":[21],"different":[22],"sets":[24],"and":[25,55],"conditions":[27],"are":[28,58],"described.":[29],"Several":[30],"tables":[31],"show":[32],"results":[34],"voltage":[36],"tests":[37,57],"applied,":[38],"either":[39],"at":[40],"rated":[41],"speed":[42],"or":[43],"2/3":[44],"speed,":[45],"each":[47],"defective":[48],"CUT.":[49],"Data":[50],"CrossCheck,":[52],"Very-Low-Voltage,":[53],"IDDQ":[54],"delay":[56],"also":[59],"given.":[60]},"counts_by_year":[{"year":2025,"cited_by_count":1},{"year":2024,"cited_by_count":2},{"year":2023,"cited_by_count":2},{"year":2022,"cited_by_count":4},{"year":2021,"cited_by_count":3},{"year":2020,"cited_by_count":3},{"year":2019,"cited_by_count":4},{"year":2018,"cited_by_count":3},{"year":2017,"cited_by_count":7},{"year":2016,"cited_by_count":5},{"year":2015,"cited_by_count":4},{"year":2014,"cited_by_count":3},{"year":2013,"cited_by_count":4},{"year":2012,"cited_by_count":5}],"updated_date":"2026-10-14T16:39:01.820549","created_date":"2025-10-10T00:00:00"}