{"id":"https://openalex.org/W2170462010","doi":"https://doi.org/10.1116/1.589351","title":"Improved cold electron emission characteristics of electroluminescent porous silicon diodes","display_name":"Improved cold electron emission characteristics of electroluminescent porous silicon diodes","publication_year":1997,"publication_date":"1997-09-01","ids":{"openalex":"https://openalex.org/W2170462010","doi":"https://doi.org/10.1116/1.589351","mag":"2170462010"},"language":"en","primary_location":{"id":"doi:10.1116/1.589351","doi":"https://doi.org/10.1116/1.589351","is_oa":false,"landing_page_url":"https://doi.org/10.1116/1.589351","pdf_url":null,"source":{"id":"https://openalex.org/S4210169477","display_name":"Journal of Vacuum Science & Technology B Microelectronics and Nanometer Structures Processing Measurement and Phenomena","issn_l":"1071-1023","issn":["1071-1023","1520-8567"],"is_oa":false,"is_in_doaj":false,"is_core":true,"listed_in":["cwts-core","poland-70"],"host_organization":"https://openalex.org/P4310320257","host_organization_name":"American Institute of Physics","host_organization_lineage":["https://openalex.org/P4310320257"],"host_organization_lineage_names":["American Institute of Physics"],"type":"journal"},"license":null,"license_id":null,"version":"publishedVersion","is_accepted":true,"is_published":true,"raw_source_name":"Journal of Vacuum Science & Technology B: Microelectronics and Nanometer Structures Processing, Measurement, and Phenomena","raw_type":"journal-article"},"volume":null,"type":"article","is_traditional":true,"indexed_in":["crossref"],"open_access":{"is_oa":false,"oa_status":"closed","oa_url":null,"any_repository_has_fulltext":false},"authorships":[{"author_position":"first","author":{"id":"https://openalex.org/A5062261283","display_name":"Xia Sheng","orcid":"https://orcid.org/0000-0002-8591-0841","observed_orcids":["https://orcid.org/0000-0002-8591-0841"]},"institutions":[{"id":"https://openalex.org/I92614990","display_name":"Tokyo University of Agriculture and Technology","ror":"https://ror.org/00qg0kr10","country_code":"JP","type":"education","lineage":["https://openalex.org/I92614990"]}],"countries":["JP"],"is_corresponding":false,"raw_author_name":"Xia Sheng","raw_affiliation_strings":["Division of Electronic and Information Engineering, Faculty of Technology, Tokyo University of Agriculture and Technology, Koganei, Tokyo 184, Japan"],"raw_orcid":null,"affiliations":[{"raw_affiliation_string":"Division of Electronic and Information Engineering, Faculty of Technology, Tokyo University of Agriculture and Technology, Koganei, Tokyo 184, Japan","institution_ids":["https://openalex.org/I92614990"]}]},{"author_position":"middle","author":{"id":"https://openalex.org/A5113556070","display_name":"Hideki Koyama","orcid":null,"observed_orcids":[]},"institutions":[{"id":"https://openalex.org/I92614990","display_name":"Tokyo University of Agriculture and Technology","ror":"https://ror.org/00qg0kr10","country_code":"JP","type":"education","lineage":["https://openalex.org/I92614990"]}],"countries":["JP"],"is_corresponding":false,"raw_author_name":"Hideki Koyama","raw_affiliation_strings":["Division of Electronic and Information Engineering, Faculty of Technology, Tokyo University of Agriculture and Technology, Koganei, Tokyo 184, Japan"],"raw_orcid":null,"affiliations":[{"raw_affiliation_string":"Division of Electronic and Information Engineering, Faculty of Technology, Tokyo University of Agriculture and Technology, Koganei, Tokyo 184, Japan","institution_ids":["https://openalex.org/I92614990"]}]},{"author_position":"middle","author":{"id":"https://openalex.org/A5081377650","display_name":"Nobuyoshi Koshida","orcid":"https://orcid.org/0000-0002-2424-0821","observed_orcids":["https://orcid.org/0000-0002-2424-0821"]},"institutions":[{"id":"https://openalex.org/I92614990","display_name":"Tokyo University of Agriculture and Technology","ror":"https://ror.org/00qg0kr10","country_code":"JP","type":"education","lineage":["https://openalex.org/I92614990"]}],"countries":["JP"],"is_corresponding":false,"raw_author_name":"Nobuyoshi Koshida","raw_affiliation_strings":["Division of Electronic and Information Engineering, Faculty of Technology, Tokyo University of Agriculture and Technology, Koganei, Tokyo 184, Japan"],"raw_orcid":null,"affiliations":[{"raw_affiliation_string":"Division of Electronic and Information Engineering, Faculty of Technology, Tokyo University of Agriculture and Technology, Koganei, Tokyo 184, Japan","institution_ids":["https://openalex.org/I92614990"]}]},{"author_position":"middle","author":{"id":"https://openalex.org/A5076477124","display_name":"Shingo Iwasaki","orcid":null,"observed_orcids":[]},"institutions":[{"id":"https://openalex.org/I4210104019","display_name":"Pioneer (Japan)","ror":"https://ror.org/014kzp326","country_code":"JP","type":"company","lineage":["https://openalex.org/I4210104019"]}],"countries":["JP"],"is_corresponding":false,"raw_author_name":"Shingo Iwasaki","raw_affiliation_strings":["Corporate Research and Development Laboratory, Pioneer Electronic Co., Ltd., Tsurugashima, Saitama 350-02, Japan"],"raw_orcid":null,"affiliations":[{"raw_affiliation_string":"Corporate Research and Development Laboratory, Pioneer Electronic Co., Ltd., Tsurugashima, Saitama 350-02, Japan","institution_ids":["https://openalex.org/I4210104019"]}]},{"author_position":"middle","author":{"id":"https://openalex.org/A5077892002","display_name":"Nobuyasu Negishi","orcid":null,"observed_orcids":[]},"institutions":[{"id":"https://openalex.org/I4210104019","display_name":"Pioneer (Japan)","ror":"https://ror.org/014kzp326","country_code":"JP","type":"company","lineage":["https://openalex.org/I4210104019"]}],"countries":["JP"],"is_corresponding":false,"raw_author_name":"Nobuyasu Negishi","raw_affiliation_strings":["Corporate Research and Development Laboratory, Pioneer Electronic Co., Ltd., Tsurugashima, Saitama 350-02, Japan"],"raw_orcid":null,"affiliations":[{"raw_affiliation_string":"Corporate Research and Development Laboratory, Pioneer Electronic Co., Ltd., Tsurugashima, Saitama 350-02, Japan","institution_ids":["https://openalex.org/I4210104019"]}]},{"author_position":"middle","author":{"id":"https://openalex.org/A5054038686","display_name":"Takashi Chuman","orcid":null,"observed_orcids":[]},"institutions":[{"id":"https://openalex.org/I4210104019","display_name":"Pioneer (Japan)","ror":"https://ror.org/014kzp326","country_code":"JP","type":"company","lineage":["https://openalex.org/I4210104019"]}],"countries":["JP"],"is_corresponding":false,"raw_author_name":"Takashi Chuman","raw_affiliation_strings":["Corporate Research and Development Laboratory, Pioneer Electronic Co., Ltd., Tsurugashima, Saitama 350-02, Japan"],"raw_orcid":null,"affiliations":[{"raw_affiliation_string":"Corporate Research and Development Laboratory, Pioneer Electronic Co., Ltd., Tsurugashima, Saitama 350-02, Japan","institution_ids":["https://openalex.org/I4210104019"]}]},{"author_position":"middle","author":{"id":null,"display_name":"Takamasa Yoshikawa","orcid":null,"observed_orcids":[]},"institutions":[{"id":"https://openalex.org/I4210104019","display_name":"Pioneer (Japan)","ror":"https://ror.org/014kzp326","country_code":"JP","type":"company","lineage":["https://openalex.org/I4210104019"]}],"countries":["JP"],"is_corresponding":false,"raw_author_name":"Takamasa Yoshikawa","raw_affiliation_strings":["Corporate Research and Development Laboratory, Pioneer Electronic Co., Ltd., Tsurugashima, Saitama 350-02, Japan"],"raw_orcid":null,"affiliations":[{"raw_affiliation_string":"Corporate Research and Development Laboratory, Pioneer Electronic Co., Ltd., Tsurugashima, Saitama 350-02, Japan","institution_ids":["https://openalex.org/I4210104019"]}]},{"author_position":"last","author":{"id":"https://openalex.org/A5041825481","display_name":"Kiyohide Ogasawara","orcid":null,"observed_orcids":[]},"institutions":[{"id":"https://openalex.org/I4210104019","display_name":"Pioneer (Japan)","ror":"https://ror.org/014kzp326","country_code":"JP","type":"company","lineage":["https://openalex.org/I4210104019"]}],"countries":["JP"],"is_corresponding":false,"raw_author_name":"Kiyohide Ogasawara","raw_affiliation_strings":["Corporate Research and Development Laboratory, Pioneer Electronic Co., Ltd., Tsurugashima, Saitama 350-02, Japan"],"raw_orcid":null,"affiliations":[{"raw_affiliation_string":"Corporate Research and Development Laboratory, Pioneer Electronic Co., Ltd., Tsurugashima, Saitama 350-02, Japan","institution_ids":["https://openalex.org/I4210104019"]}]}],"institutions":[],"countries_distinct_count":1,"institutions_distinct_count":2,"corresponding_author_ids":[],"corresponding_institution_ids":[],"apc_list":null,"apc_paid":null,"fwci":1.5846,"has_fulltext":false,"cited_by_count":16,"citation_normalized_percentile":{"value":0.83127055,"is_in_top_1_percent":false,"is_in_top_10_percent":false},"cited_by_percentile_year":{"min":88,"max":93},"biblio":{"volume":"15","issue":"5","first_page":"1661","last_page":"1665"},"is_retracted":false,"is_paratext":false,"is_xpac":false,"primary_topic":{"id":"https://openalex.org/T11169","display_name":"Silicon Nanostructures and Photoluminescence","score":0.9740999937057495,"subfield":{"id":"https://openalex.org/subfields/2505","display_name":"Materials Chemistry"},"field":{"id":"https://openalex.org/fields/25","display_name":"Materials Science"},"domain":{"id":"https://openalex.org/domains/3","display_name":"Physical Sciences"}},"topics":[{"id":"https://openalex.org/T11169","display_name":"Silicon Nanostructures and Photoluminescence","score":0.9740999937057495,"subfield":{"id":"https://openalex.org/subfields/2505","display_name":"Materials Chemistry"},"field":{"id":"https://openalex.org/fields/25","display_name":"Materials Science"},"domain":{"id":"https://openalex.org/domains/3","display_name":"Physical Sciences"}},{"id":"https://openalex.org/T13418","display_name":"Photocathodes and Microchannel Plates","score":0.021900000050663948,"subfield":{"id":"https://openalex.org/subfields/3105","display_name":"Instrumentation"},"field":{"id":"https://openalex.org/fields/31","display_name":"Physics and Astronomy"},"domain":{"id":"https://openalex.org/domains/3","display_name":"Physical Sciences"}},{"id":"https://openalex.org/T11175","display_name":"Gyrotron and Vacuum Electronics Research","score":0.0003000000142492354,"subfield":{"id":"https://openalex.org/subfields/3107","display_name":"Atomic and Molecular Physics, and Optics"},"field":{"id":"https://openalex.org/fields/31","display_name":"Physics and Astronomy"},"domain":{"id":"https://openalex.org/domains/3","display_name":"Physical Sciences"}}],"keywords":[{"id":"https://openalex.org/keywords/porous-silicon","display_name":"porous silicon","score":0.7590000033378601},{"id":"https://openalex.org/keywords/electroluminescence","display_name":"electroluminescence","score":0.8650000095367432},{"id":"https://openalex.org/keywords/cold-electron-emission","display_name":"cold electron emission","score":0.9490000009536743},{"id":"https://openalex.org/keywords/fowler-nordheim-emission","display_name":"Fowler-Nordheim emission","score":0.7620000243186951},{"id":"https://openalex.org/keywords/rapid-thermal-oxidation","display_name":"rapid thermal oxidation","score":0.8899999856948853},{"id":"https://openalex.org/keywords/emission-current-density","display_name":"emission current density","score":0.5609999895095825},{"id":"https://openalex.org/keywords/emission-efficiency","display_name":"emission efficiency","score":0.7979999780654907},{"id":"https://openalex.org/keywords/gold-contacts","display_name":"gold contacts","score":0.4480000138282776},{"id":"https://openalex.org/keywords/silicon-substrate","display_name":"silicon substrate","score":0.5299999713897705}],"concepts":[{"id":"https://openalex.org/C31625292","wikidata":"https://www.wikidata.org/wiki/Q215803","display_name":"Electroluminescence","level":3,"score":0.8996601104736328},{"id":"https://openalex.org/C192562407","wikidata":"https://www.wikidata.org/wiki/Q228736","display_name":"Materials science","level":0,"score":0.7507832050323486},{"id":"https://openalex.org/C78434282","wikidata":"https://www.wikidata.org/wiki/Q11656","display_name":"Diode","level":2,"score":0.6968225240707397},{"id":"https://openalex.org/C121029787","wikidata":"https://www.wikidata.org/wiki/Q902877","display_name":"Field electron emission","level":3,"score":0.680971622467041},{"id":"https://openalex.org/C2776685891","wikidata":"https://www.wikidata.org/wiki/Q428660","display_name":"Porous silicon","level":3,"score":0.6712393164634705},{"id":"https://openalex.org/C138230450","wikidata":"https://www.wikidata.org/wiki/Q2016597","display_name":"Ohmic contact","level":3,"score":0.6344062089920044},{"id":"https://openalex.org/C49040817","wikidata":"https://www.wikidata.org/wiki/Q193091","display_name":"Optoelectronics","level":1,"score":0.6291595697402954},{"id":"https://openalex.org/C544956773","wikidata":"https://www.wikidata.org/wiki/Q670","display_name":"Silicon","level":2,"score":0.5838115215301514},{"id":"https://openalex.org/C2777289219","wikidata":"https://www.wikidata.org/wiki/Q7632154","display_name":"Substrate (aquarium)","level":2,"score":0.5484576225280762},{"id":"https://openalex.org/C49110097","wikidata":"https://www.wikidata.org/wiki/Q175233","display_name":"Cathode","level":2,"score":0.4960730969905853},{"id":"https://openalex.org/C2779227376","wikidata":"https://www.wikidata.org/wiki/Q6505497","display_name":"Layer (electronics)","level":2,"score":0.4843686521053314},{"id":"https://openalex.org/C20254490","wikidata":"https://www.wikidata.org/wiki/Q719550","display_name":"Biasing","level":3,"score":0.48093360662460327},{"id":"https://openalex.org/C2985930086","wikidata":"https://www.wikidata.org/wiki/Q65037198","display_name":"Light emission","level":2,"score":0.4585651159286499},{"id":"https://openalex.org/C176666156","wikidata":"https://www.wikidata.org/wiki/Q25504","display_name":"Light-emitting diode","level":2,"score":0.45301347970962524},{"id":"https://openalex.org/C147120987","wikidata":"https://www.wikidata.org/wiki/Q2225","display_name":"Electron","level":2,"score":0.44065895676612854},{"id":"https://openalex.org/C165801399","wikidata":"https://www.wikidata.org/wiki/Q25428","display_name":"Voltage","level":2,"score":0.2646504044532776},{"id":"https://openalex.org/C171250308","wikidata":"https://www.wikidata.org/wiki/Q11468","display_name":"Nanotechnology","level":1,"score":0.16308194398880005},{"id":"https://openalex.org/C185592680","wikidata":"https://www.wikidata.org/wiki/Q2329","display_name":"Chemistry","level":0,"score":0.12798067927360535},{"id":"https://openalex.org/C119599485","wikidata":"https://www.wikidata.org/wiki/Q43035","display_name":"Electrical engineering","level":1,"score":0.11672046780586243},{"id":"https://openalex.org/C121332964","wikidata":"https://www.wikidata.org/wiki/Q413","display_name":"Physics","level":0,"score":0.07367518544197083},{"id":"https://openalex.org/C111368507","wikidata":"https://www.wikidata.org/wiki/Q43518","display_name":"Oceanography","level":1,"score":0.0},{"id":"https://openalex.org/C127413603","wikidata":"https://www.wikidata.org/wiki/Q11023","display_name":"Engineering","level":0,"score":0.0},{"id":"https://openalex.org/C147789679","wikidata":"https://www.wikidata.org/wiki/Q11372","display_name":"Physical chemistry","level":1,"score":0.0},{"id":"https://openalex.org/C62520636","wikidata":"https://www.wikidata.org/wiki/Q944","display_name":"Quantum mechanics","level":1,"score":0.0},{"id":"https://openalex.org/C127313418","wikidata":"https://www.wikidata.org/wiki/Q1069","display_name":"Geology","level":0,"score":0.0}],"mesh":[],"locations_count":1,"locations":[{"id":"doi:10.1116/1.589351","doi":"https://doi.org/10.1116/1.589351","is_oa":false,"landing_page_url":"https://doi.org/10.1116/1.589351","pdf_url":null,"source":{"id":"https://openalex.org/S4210169477","display_name":"Journal of Vacuum Science & Technology B Microelectronics and Nanometer Structures Processing Measurement and Phenomena","issn_l":"1071-1023","issn":["1071-1023","1520-8567"],"is_oa":false,"is_in_doaj":false,"is_core":true,"listed_in":["cwts-core","poland-70"],"host_organization":"https://openalex.org/P4310320257","host_organization_name":"American Institute of Physics","host_organization_lineage":["https://openalex.org/P4310320257"],"host_organization_lineage_names":["American Institute of Physics"],"type":"journal"},"license":null,"license_id":null,"version":"publishedVersion","is_accepted":true,"is_published":true,"raw_source_name":"Journal of Vacuum Science & Technology B: Microelectronics and Nanometer Structures Processing, Measurement, and Phenomena","raw_type":"journal-article"}],"best_oa_location":null,"sustainable_development_goals":[],"study_designs":[],"awards":[],"funders":[{"id":"https://openalex.org/F4320325836","display_name":"Tokyo University of Agriculture and Technology","ror":"https://ror.org/00qg0kr10"}],"has_content":{"grobid_xml":false,"pdf":false},"content_urls":null,"referenced_works_count":19,"referenced_works":["https://openalex.org/W1972033875","https://openalex.org/W1978875920","https://openalex.org/W1982426993","https://openalex.org/W1986226876","https://openalex.org/W1992978824","https://openalex.org/W1994466304","https://openalex.org/W2007318638","https://openalex.org/W2023274441","https://openalex.org/W2043366760","https://openalex.org/W2048974729","https://openalex.org/W2066600857","https://openalex.org/W2067174693","https://openalex.org/W2068787064","https://openalex.org/W2084113443","https://openalex.org/W2091998994","https://openalex.org/W2099299692","https://openalex.org/W2111098079","https://openalex.org/W2114908499","https://openalex.org/W2161606023"],"related_works":["https://openalex.org/W2027897019","https://openalex.org/W1986226876","https://openalex.org/W1530760380","https://openalex.org/W2032094768","https://openalex.org/W2314586589","https://openalex.org/W2360952368","https://openalex.org/W2133197419","https://openalex.org/W2062138228","https://openalex.org/W2088167807","https://openalex.org/W3019865921"],"abstract_inverted_index":{"The":[0,14,60,159],"property":[1],"of":[2,19,70,77,102,155,171],"electroluminescent":[3],"porous":[4],"silicon":[5],"(PS)":[6],"diodes":[7,17],"as":[8,56,58],"surface-emitting":[9],"cold":[10,61],"cathodes":[11],"were":[12],"investigated.":[13],"experimental":[15],"PS":[16,72,95,172],"consist":[18],"thin":[20],"Au":[21,41,54],"films,":[22],"PS,":[23],"n+-type":[24],"Si":[25],"substrates,":[26],"and":[27,82,99,115,120,132],"ohmic":[28],"back":[29],"contacts.":[30],"When":[31],"a":[32,108,123],"positive":[33],"bias":[34,152],"voltage":[35,153],"VPS":[36],"is":[37,139,174],"applied":[38],"to":[39,45,178],"the":[40,46,53,71,91,94,100,112,117,146,151,156,164,168,179],"electrode":[42],"with":[43,126],"respect":[44],"substrate,":[47],"electrons":[48],"are":[49,65,105],"uniformly":[50],"emitted":[51],"through":[52],"contact":[55],"well":[57],"photons.":[59],"electron":[62],"emission":[63,113,118,157,160],"characteristics":[64],"presented":[66],"here":[67],"in":[68,93,111,143,150,176],"terms":[69],"layer":[73,96],"thickness":[74,97],"dependence,":[75],"effects":[76],"rapid":[78],"thermal":[79],"oxidation":[80],"(RTO),":[81],"electroluminescence":[83],"(EL)":[84],"characteristics.":[85],"It":[86,138],"was":[87],"demonstrated":[88],"that":[89,116,142],"both":[90],"decrease":[92],"(dPS)":[98],"introduction":[101],"RTO":[103],"treatment":[104],"useful":[106],"for":[107,122],"significant":[109],"improvement":[110],"characteristics,":[114],"current":[119],"efficiency":[121],"RTO-treated":[124],"diode":[125],"dPS=3":[127],"\u03bcm":[128],"reach":[129],"450":[130],"\u03bcA/cm2":[131],"0.2%,":[133],"respectively,":[134],"at":[135],"VPS=27":[136],"V.":[137],"also":[140],"shown":[141],"every":[144],"case,":[145],"Fowler\u2013Nordheim":[147],"scheme":[148],"holds":[149],"dependence":[154],"current.":[158],"mechanism":[161],"based":[162],"on":[163],"high-field":[165],"effect":[166],"near":[167],"outer":[169],"surface":[170],"layer,":[173],"discussed":[175],"relation":[177],"visible":[180],"EL":[181],"emission.":[182]},"counts_by_year":[{"year":2022,"cited_by_count":1},{"year":2018,"cited_by_count":1},{"year":2016,"cited_by_count":1},{"year":2015,"cited_by_count":1},{"year":2014,"cited_by_count":1}],"updated_date":"2026-11-04T10:54:05.112534","created_date":"2016-06-24T00:00:00"}