{"id":"https://openalex.org/W2169969099","doi":"https://doi.org/10.1109/ceidp.1990.201373","title":"New water tree monitoring technique","display_name":"New water tree monitoring technique","publication_year":2002,"publication_date":"2002-12-04","ids":{"openalex":"https://openalex.org/W2169969099","doi":"https://doi.org/10.1109/ceidp.1990.201373","mag":"2169969099"},"language":"en","primary_location":{"id":"doi:10.1109/ceidp.1990.201373","doi":"https://doi.org/10.1109/ceidp.1990.201373","is_oa":false,"landing_page_url":"https://doi.org/10.1109/ceidp.1990.201373","pdf_url":null,"source":{"id":"https://openalex.org/S4363608173","display_name":"IEEE Conference on Electrical Insulation and Dielectric Phenomena (CEIDP)","issn_l":null,"issn":null,"is_oa":false,"is_in_doaj":false,"is_core":false,"listed_in":[],"host_organization":null,"host_organization_name":null,"host_organization_lineage":[],"host_organization_lineage_names":[],"type":"conference"},"license":null,"license_id":null,"version":"publishedVersion","is_accepted":true,"is_published":true,"raw_source_name":"Annual Conference on Electrical Insulation and Dielectric Phenomena","raw_type":"proceedings-article"},"volume":null,"type":"conference-paper","is_traditional":true,"indexed_in":["crossref"],"open_access":{"is_oa":false,"oa_status":"closed","oa_url":null,"any_repository_has_fulltext":false},"authorships":[{"author_position":"first","author":{"id":"https://openalex.org/A5113672501","display_name":"M.O. Pace","orcid":null,"observed_orcids":[]},"institutions":[{"id":"https://openalex.org/I75027704","display_name":"University of Tennessee at Knoxville","ror":"https://ror.org/020f3ap87","country_code":"US","type":"education","lineage":["https://openalex.org/I75027704"]}],"countries":["US"],"is_corresponding":false,"raw_author_name":"M.O. Pace","raw_affiliation_strings":["University of Tennessee, USA"],"raw_orcid":null,"affiliations":[{"raw_affiliation_string":"University of Tennessee, USA","institution_ids":["https://openalex.org/I75027704"]}]},{"author_position":"middle","author":{"id":"https://openalex.org/A5113637696","display_name":"Fred Dyer","orcid":null,"observed_orcids":[]},"institutions":[{"id":"https://openalex.org/I75027704","display_name":"University of Tennessee at Knoxville","ror":"https://ror.org/020f3ap87","country_code":"US","type":"education","lineage":["https://openalex.org/I75027704"]}],"countries":["US"],"is_corresponding":false,"raw_author_name":"F.F. Dyer","raw_affiliation_strings":["University of Tennessee, USA"],"raw_orcid":null,"affiliations":[{"raw_affiliation_string":"University of Tennessee, USA","institution_ids":["https://openalex.org/I75027704"]}]},{"author_position":"middle","author":{"id":"https://openalex.org/A5103363178","display_name":"T.V. Blalock","orcid":null,"observed_orcids":[]},"institutions":[{"id":"https://openalex.org/I75027704","display_name":"University of Tennessee at Knoxville","ror":"https://ror.org/020f3ap87","country_code":"US","type":"education","lineage":["https://openalex.org/I75027704"]}],"countries":["US"],"is_corresponding":false,"raw_author_name":"T.V. Blalock","raw_affiliation_strings":["University of Tennessee, USA"],"raw_orcid":null,"affiliations":[{"raw_affiliation_string":"University of Tennessee, USA","institution_ids":["https://openalex.org/I75027704"]}]},{"author_position":"middle","author":{"id":"https://openalex.org/A5040279354","display_name":"Bede Williams","orcid":null,"observed_orcids":[]},"institutions":[{"id":"https://openalex.org/I75027704","display_name":"University of Tennessee at Knoxville","ror":"https://ror.org/020f3ap87","country_code":"US","type":"education","lineage":["https://openalex.org/I75027704"]}],"countries":["US"],"is_corresponding":false,"raw_author_name":"B.E. Williams","raw_affiliation_strings":["University of Tennessee, USA"],"raw_orcid":null,"affiliations":[{"raw_affiliation_string":"University of Tennessee, USA","institution_ids":["https://openalex.org/I75027704"]}]},{"author_position":"middle","author":{"id":"https://openalex.org/A5000390044","display_name":"S.W. Milam","orcid":null,"observed_orcids":[]},"institutions":[{"id":"https://openalex.org/I75027704","display_name":"University of Tennessee at Knoxville","ror":"https://ror.org/020f3ap87","country_code":"US","type":"education","lineage":["https://openalex.org/I75027704"]}],"countries":["US"],"is_corresponding":false,"raw_author_name":"S.W. Milam","raw_affiliation_strings":["University of Tennessee, USA"],"raw_orcid":null,"affiliations":[{"raw_affiliation_string":"University of Tennessee, USA","institution_ids":["https://openalex.org/I75027704"]}]},{"author_position":"middle","author":{"id":"https://openalex.org/A5113695787","display_name":"I. Alexeff","orcid":null,"observed_orcids":[]},"institutions":[{"id":"https://openalex.org/I75027704","display_name":"University of Tennessee at Knoxville","ror":"https://ror.org/020f3ap87","country_code":"US","type":"education","lineage":["https://openalex.org/I75027704"]}],"countries":["US"],"is_corresponding":false,"raw_author_name":"I. Alexeff","raw_affiliation_strings":["University of Tennessee, USA"],"raw_orcid":null,"affiliations":[{"raw_affiliation_string":"University of Tennessee, USA","institution_ids":["https://openalex.org/I75027704"]}]},{"author_position":"last","author":{"id":"https://openalex.org/A5038819821","display_name":"T.J. Rodenbaugh","orcid":null,"observed_orcids":[]},"institutions":[{"id":"https://openalex.org/I1335486098","display_name":"Electric Power Research Institute","ror":"https://ror.org/02dqztz06","country_code":"US","type":"nonprofit","lineage":["https://openalex.org/I1335486098"]}],"countries":["US"],"is_corresponding":false,"raw_author_name":"T.J. Rodenbaugh","raw_affiliation_strings":["Electric Power Research Institute, USA"],"raw_orcid":null,"affiliations":[{"raw_affiliation_string":"Electric Power Research Institute, USA","institution_ids":["https://openalex.org/I1335486098"]}]}],"institutions":[],"countries_distinct_count":1,"institutions_distinct_count":2,"corresponding_author_ids":[],"corresponding_institution_ids":[],"apc_list":null,"apc_paid":null,"fwci":0.7509,"has_fulltext":false,"cited_by_count":5,"citation_normalized_percentile":{"value":0.71306354,"is_in_top_1_percent":false,"is_in_top_10_percent":false},"cited_by_percentile_year":null,"biblio":{"volume":null,"issue":null,"first_page":"391","last_page":"397"},"is_retracted":false,"is_paratext":false,"is_xpac":false,"primary_topic":{"id":"https://openalex.org/T10511","display_name":"High voltage insulation and dielectric phenomena","score":0.9984999895095825,"subfield":{"id":"https://openalex.org/subfields/2208","display_name":"Electrical and Electronic Engineering"},"field":{"id":"https://openalex.org/fields/22","display_name":"Engineering"},"domain":{"id":"https://openalex.org/domains/3","display_name":"Physical Sciences"}},"topics":[{"id":"https://openalex.org/T10511","display_name":"High voltage insulation and dielectric phenomena","score":0.9984999895095825,"subfield":{"id":"https://openalex.org/subfields/2208","display_name":"Electrical and Electronic Engineering"},"field":{"id":"https://openalex.org/fields/22","display_name":"Engineering"},"domain":{"id":"https://openalex.org/domains/3","display_name":"Physical Sciences"}},{"id":"https://openalex.org/T12737","display_name":"Electrical Fault Detection and Protection","score":0.0003000000142492354,"subfield":{"id":"https://openalex.org/subfields/2208","display_name":"Electrical and Electronic Engineering"},"field":{"id":"https://openalex.org/fields/22","display_name":"Engineering"},"domain":{"id":"https://openalex.org/domains/3","display_name":"Physical Sciences"}},{"id":"https://openalex.org/T14311","display_name":"Electrical and Electromagnetic Research","score":0.00019999999494757503,"subfield":{"id":"https://openalex.org/subfields/2208","display_name":"Electrical and Electronic Engineering"},"field":{"id":"https://openalex.org/fields/22","display_name":"Engineering"},"domain":{"id":"https://openalex.org/domains/3","display_name":"Physical Sciences"}}],"keywords":[{"id":"https://openalex.org/keywords/water-treeing","display_name":"water trees","score":0.8859999775886536},{"id":"https://openalex.org/keywords/polyethylene-insulation","display_name":"polyethylene insulation","score":0.7990000247955322},{"id":"https://openalex.org/keywords/image-currents","display_name":"image currents","score":0.9150000214576721},{"id":"https://openalex.org/keywords/dielectric-breakdown","display_name":"dielectric breakdown","score":0.5929999947547913},{"id":"https://openalex.org/keywords/test-cell-design","display_name":"test cell design","score":0.6489999890327454}],"concepts":[{"id":"https://openalex.org/C175395656","wikidata":"https://www.wikidata.org/wiki/Q4384289","display_name":"Electrical treeing","level":4,"score":0.9370777606964111},{"id":"https://openalex.org/C118530786","wikidata":"https://www.wikidata.org/wiki/Q1134732","display_name":"Instrumentation (computer programming)","level":2,"score":0.6287115216255188},{"id":"https://openalex.org/C17525397","wikidata":"https://www.wikidata.org/wiki/Q176140","display_name":"Electrode","level":2,"score":0.5911173820495605},{"id":"https://openalex.org/C133386390","wikidata":"https://www.wikidata.org/wiki/Q184996","display_name":"Dielectric","level":2,"score":0.49036097526550293},{"id":"https://openalex.org/C192562407","wikidata":"https://www.wikidata.org/wiki/Q228736","display_name":"Materials science","level":0,"score":0.46891555190086365},{"id":"https://openalex.org/C104114177","wikidata":"https://www.wikidata.org/wiki/Q79782","display_name":"Motion (physics)","level":2,"score":0.46636614203453064},{"id":"https://openalex.org/C113174947","wikidata":"https://www.wikidata.org/wiki/Q2859736","display_name":"Tree (set theory)","level":2,"score":0.4513961672782898},{"id":"https://openalex.org/C24890656","wikidata":"https://www.wikidata.org/wiki/Q82811","display_name":"Acoustics","level":1,"score":0.3865329921245575},{"id":"https://openalex.org/C165801399","wikidata":"https://www.wikidata.org/wiki/Q25428","display_name":"Voltage","level":2,"score":0.3625805377960205},{"id":"https://openalex.org/C119599485","wikidata":"https://www.wikidata.org/wiki/Q43035","display_name":"Electrical engineering","level":1,"score":0.34662166237831116},{"id":"https://openalex.org/C78519656","wikidata":"https://www.wikidata.org/wiki/Q101333","display_name":"Mechanical engineering","level":1,"score":0.32424670457839966},{"id":"https://openalex.org/C41008148","wikidata":"https://www.wikidata.org/wiki/Q21198","display_name":"Computer science","level":0,"score":0.3197031319141388},{"id":"https://openalex.org/C49040817","wikidata":"https://www.wikidata.org/wiki/Q193091","display_name":"Optoelectronics","level":1,"score":0.2581323981285095},{"id":"https://openalex.org/C121332964","wikidata":"https://www.wikidata.org/wiki/Q413","display_name":"Physics","level":0,"score":0.18968182802200317},{"id":"https://openalex.org/C154945302","wikidata":"https://www.wikidata.org/wiki/Q11660","display_name":"Artificial intelligence","level":1,"score":0.1781439185142517},{"id":"https://openalex.org/C127413603","wikidata":"https://www.wikidata.org/wiki/Q11023","display_name":"Engineering","level":0,"score":0.17609205842018127},{"id":"https://openalex.org/C130143024","wikidata":"https://www.wikidata.org/wiki/Q1929972","display_name":"Partial discharge","level":3,"score":0.1635633409023285},{"id":"https://openalex.org/C33923547","wikidata":"https://www.wikidata.org/wiki/Q395","display_name":"Mathematics","level":0,"score":0.0918588936328888},{"id":"https://openalex.org/C111919701","wikidata":"https://www.wikidata.org/wiki/Q9135","display_name":"Operating system","level":1,"score":0.0},{"id":"https://openalex.org/C62520636","wikidata":"https://www.wikidata.org/wiki/Q944","display_name":"Quantum mechanics","level":1,"score":0.0},{"id":"https://openalex.org/C134306372","wikidata":"https://www.wikidata.org/wiki/Q7754","display_name":"Mathematical analysis","level":1,"score":0.0}],"mesh":[],"locations_count":1,"locations":[{"id":"doi:10.1109/ceidp.1990.201373","doi":"https://doi.org/10.1109/ceidp.1990.201373","is_oa":false,"landing_page_url":"https://doi.org/10.1109/ceidp.1990.201373","pdf_url":null,"source":{"id":"https://openalex.org/S4363608173","display_name":"IEEE Conference on Electrical Insulation and Dielectric Phenomena (CEIDP)","issn_l":null,"issn":null,"is_oa":false,"is_in_doaj":false,"is_core":false,"listed_in":[],"host_organization":null,"host_organization_name":null,"host_organization_lineage":[],"host_organization_lineage_names":[],"type":"conference"},"license":null,"license_id":null,"version":"publishedVersion","is_accepted":true,"is_published":true,"raw_source_name":"Annual Conference on Electrical Insulation and Dielectric Phenomena","raw_type":"proceedings-article"}],"best_oa_location":null,"sustainable_development_goals":[],"study_designs":[],"awards":[],"funders":[],"has_content":{"pdf":false,"grobid_xml":false},"content_urls":null,"referenced_works_count":10,"referenced_works":["https://openalex.org/W1492873178","https://openalex.org/W1620205143","https://openalex.org/W1620870747","https://openalex.org/W1840594952","https://openalex.org/W1964926647","https://openalex.org/W2008222717","https://openalex.org/W2022373787","https://openalex.org/W2088579854","https://openalex.org/W2125986154","https://openalex.org/W2154643116"],"related_works":["https://openalex.org/W2526284533","https://openalex.org/W1826620900","https://openalex.org/W1596687510","https://openalex.org/W1969195110","https://openalex.org/W2106351496","https://openalex.org/W2148374527","https://openalex.org/W2554788058","https://openalex.org/W2132119811","https://openalex.org/W2150243855","https://openalex.org/W2119380033"],"abstract_inverted_index":{"The":[0,35],"design":[1,85],"philosophy":[2],"is":[3,23,38,133],"given":[4],"for":[5,17,30],"producing":[6],"image":[7,48],"currents":[8,49],"depicting":[9],"water":[10,13,18,110,144,157],"motion":[11,57,107,155],"during":[12],"treeing.":[14],"A":[15],"diagnostic":[16],"treeing":[19],"in":[20,33,50,70,74,99,128],"polyethylene":[21],"(PE)":[22],"being":[24],"developed":[25],"from":[26,141,153],"a":[27,41],"successful":[28],"one":[29,63],"prebreakdown":[31],"studies":[32],"liquids.":[34],"basic":[36],"technique":[37],"to":[39,59,76,106],"stress":[40],"dielectric":[42],"between":[43],"two":[44],"electrodes":[45],"and":[46,86,90,92],"observe":[47],"the":[51,66,71,77,100,109,129,138,142,147,150,154,159],"ground":[52],"electrode.":[53],"Direct":[54],"measurement":[55],"of":[56,121,149,156],"appears":[58],"be":[60,104],"feasible":[61],"if":[62,137],"looks":[64],"at":[65,146],"changes":[67],"that":[68,102],"occur":[69],"measuring":[72],"instrumentation":[73],"response":[75],"transport.":[78],"Presented":[79],"are":[80],"results":[81],"on":[82,96],"test":[83],"cell":[84],"setup,":[87],"detection":[88],"electronics":[89],"circuitry,":[91],"some":[93,125],"preliminary":[94],"tests":[95,114],"detected":[97],"pulses":[98,139],"equipment":[101],"might":[103],"attributable":[105],"inside":[108],"tree.":[111],"Preliminary":[112],"DC":[113],"produced":[115,127],"observable":[116],"pulses,":[117],"but":[118],"subsequent":[119],"examination":[120],"these":[122],"samples":[123],"revealed":[124],"cracks":[126],"needle-printing":[130],"process.":[131],"It":[132],"not":[134],"yet":[135],"known":[136],"were":[140],"actual":[143],"tree":[145],"end":[148],"crack":[151],"or":[152],"within":[158],"crack.>":[160]},"counts_by_year":[],"updated_date":"2026-10-26T11:51:55.731654","created_date":"2016-06-24T00:00:00"}