{"id":"https://openalex.org/W2168683051","doi":"https://doi.org/10.1002/(sici)1098-1098(1998)9:2/3<132::aid-ima10>3.0.co;2-z","title":"Iterative algorithm for discrete tomography","display_name":"Iterative algorithm for discrete tomography","publication_year":1998,"publication_date":"1998-01-01","ids":{"openalex":"https://openalex.org/W2168683051","doi":"https://doi.org/10.1002/(sici)1098-1098(1998)9:2/3<132::aid-ima10>3.0.co;2-z","mag":"2168683051"},"language":"en","primary_location":{"id":"doi:10.1002/(sici)1098-1098(1998)9:2/3<132::aid-ima10>3.0.co;2-z","doi":"https://doi.org/10.1002/(sici)1098-1098(1998)9:2/3<132::aid-ima10>3.0.co;2-z","is_oa":false,"landing_page_url":"https://doi.org/10.1002/(sici)1098-1098(1998)9:2/3<132::aid-ima10>3.0.co;2-z","pdf_url":null,"source":{"id":"https://openalex.org/S15952048","display_name":"International Journal of Imaging Systems and Technology","issn_l":"0899-9457","issn":["0899-9457","1098-1098"],"is_oa":false,"is_in_doaj":false,"is_core":true,"listed_in":["anvur-scientific","cwts-core","dongbi-c","jufo-1","ki-jl-1","norway-1","poland-70","russia-white-list-2"],"host_organization":"https://openalex.org/P4310320595","host_organization_name":"Wiley","host_organization_lineage":["https://openalex.org/P4310320595"],"host_organization_lineage_names":["Wiley"],"type":"journal"},"license":null,"license_id":null,"version":"publishedVersion","is_accepted":true,"is_published":true,"raw_source_name":"International Journal of Imaging Systems and Technology","raw_type":"journal-article"},"volume":null,"type":"article","indexed_in":["crossref"],"open_access":{"is_oa":false,"oa_status":"closed","oa_url":null,"any_repository_has_fulltext":false},"authorships":[{"author_position":"first","author":{"id":"https://openalex.org/A5049853015","display_name":"Sarah Patch","orcid":"https://orcid.org/0000-0003-0969-3328","observed_orcids":["https://orcid.org/0000-0003-0969-3328"]},"institutions":[{"id":"https://openalex.org/I1332737386","display_name":"General Electric (United States)","ror":"https://ror.org/013msgt25","country_code":"US","type":"company","lineage":["https://openalex.org/I1332737386"]}],"countries":["US"],"is_corresponding":true,"raw_author_name":"S. K. Patch","raw_affiliation_strings":["Industrial Electronics Laboratory, General Electric Corporate Research and Development, Niskayuna, NY"],"raw_orcid":null,"affiliations":[{"raw_affiliation_string":"Industrial Electronics Laboratory, General Electric Corporate Research and Development, Niskayuna, NY","institution_ids":["https://openalex.org/I1332737386"]}]}],"institutions":[],"countries_distinct_count":1,"institutions_distinct_count":1,"corresponding_author_ids":["https://openalex.org/A5049853015"],"corresponding_institution_ids":["https://openalex.org/I1332737386"],"apc_list":{"value":3800,"currency":"USD","value_usd":3800},"apc_paid":null,"fwci":1.12,"has_fulltext":false,"cited_by_count":3,"citation_normalized_percentile":{"value":0.78717949,"is_in_top_1_percent":false,"is_in_top_10_percent":false},"cited_by_percentile_year":null,"biblio":{"volume":"9","issue":"2-3","first_page":"132","last_page":"134"},"is_retracted":false,"is_paratext":false,"is_xpac":false,"primary_topic":{"id":"https://openalex.org/T10857","display_name":"Advanced Electron Microscopy Techniques and Applications","score":0.9301999807357788,"subfield":{"id":"https://openalex.org/subfields/1315","display_name":"Structural Biology"},"field":{"id":"https://openalex.org/fields/13","display_name":"Biochemistry, Genetics and Molecular Biology"},"domain":{"id":"https://openalex.org/domains/1","display_name":"Life Sciences"}},"topics":[{"id":"https://openalex.org/T10857","display_name":"Advanced Electron Microscopy Techniques and Applications","score":0.9301999807357788,"subfield":{"id":"https://openalex.org/subfields/1315","display_name":"Structural Biology"},"field":{"id":"https://openalex.org/fields/13","display_name":"Biochemistry, Genetics and Molecular Biology"},"domain":{"id":"https://openalex.org/domains/1","display_name":"Life Sciences"}},{"id":"https://openalex.org/T12923","display_name":"Digital Image Processing Techniques","score":0.03020000085234642,"subfield":{"id":"https://openalex.org/subfields/1707","display_name":"Computer Vision and Pattern Recognition"},"field":{"id":"https://openalex.org/fields/17","display_name":"Computer Science"},"domain":{"id":"https://openalex.org/domains/3","display_name":"Physical Sciences"}},{"id":"https://openalex.org/T11205","display_name":"Numerical methods in inverse problems","score":0.018400000408291817,"subfield":{"id":"https://openalex.org/subfields/2610","display_name":"Mathematical Physics"},"field":{"id":"https://openalex.org/fields/26","display_name":"Mathematics"},"domain":{"id":"https://openalex.org/domains/3","display_name":"Physical Sciences"}}],"keywords":[{"id":"https://openalex.org/keywords/discrete-tomography","display_name":"discrete tomography","score":0.9919999837875366},{"id":"https://openalex.org/keywords/iterative-reconstruction","display_name":"iterative reconstruction","score":0.7870000004768372},{"id":"https://openalex.org/keywords/electron-microscopy-of-crystals","display_name":"electron microscopy of crystals","score":0.7960000038146973},{"id":"https://openalex.org/keywords/underdetermined-inverse-problems","display_name":"underdetermined inverse problems","score":0.7480000257492065},{"id":"https://openalex.org/keywords/two-view-reconstruction","display_name":"two-view reconstruction","score":0.6340000033378601}],"concepts":[{"id":"https://openalex.org/C179690561","wikidata":"https://www.wikidata.org/wiki/Q4316110","display_name":"Underdetermined system","level":2,"score":0.7995223999023438},{"id":"https://openalex.org/C163716698","wikidata":"https://www.wikidata.org/wiki/Q841267","display_name":"Tomography","level":2,"score":0.6687845587730408},{"id":"https://openalex.org/C11413529","wikidata":"https://www.wikidata.org/wiki/Q8366","display_name":"Algorithm","level":1,"score":0.5816962122917175},{"id":"https://openalex.org/C41008148","wikidata":"https://www.wikidata.org/wiki/Q21198","display_name":"Computer science","level":0,"score":0.5688527822494507},{"id":"https://openalex.org/C2778701210","wikidata":"https://www.wikidata.org/wiki/Q28130034","display_name":"Constructive","level":3,"score":0.5646951794624329},{"id":"https://openalex.org/C97742081","wikidata":"https://www.wikidata.org/wiki/Q7820109","display_name":"Tomographic reconstruction","level":3,"score":0.5316294431686401},{"id":"https://openalex.org/C75806775","wikidata":"https://www.wikidata.org/wiki/Q5358194","display_name":"Electron tomography","level":4,"score":0.5000455379486084},{"id":"https://openalex.org/C544519230","wikidata":"https://www.wikidata.org/wiki/Q32566","display_name":"Computed tomography","level":2,"score":0.48322543501853943},{"id":"https://openalex.org/C141379421","wikidata":"https://www.wikidata.org/wiki/Q6094427","display_name":"Iterative reconstruction","level":2,"score":0.318448930978775},{"id":"https://openalex.org/C154945302","wikidata":"https://www.wikidata.org/wiki/Q11660","display_name":"Artificial intelligence","level":1,"score":0.22330892086029053},{"id":"https://openalex.org/C121332964","wikidata":"https://www.wikidata.org/wiki/Q413","display_name":"Physics","level":0,"score":0.14896079897880554},{"id":"https://openalex.org/C120665830","wikidata":"https://www.wikidata.org/wiki/Q14620","display_name":"Optics","level":1,"score":0.1261734962463379},{"id":"https://openalex.org/C93877712","wikidata":"https://www.wikidata.org/wiki/Q132560","display_name":"Electron microscope","level":2,"score":0.08670741319656372},{"id":"https://openalex.org/C71924100","wikidata":"https://www.wikidata.org/wiki/Q11190","display_name":"Medicine","level":0,"score":0.0681661069393158},{"id":"https://openalex.org/C111919701","wikidata":"https://www.wikidata.org/wiki/Q9135","display_name":"Operating system","level":1,"score":0.0},{"id":"https://openalex.org/C193016168","wikidata":"https://www.wikidata.org/wiki/Q874835","display_name":"Scanning transmission electron microscopy","level":3,"score":0.0},{"id":"https://openalex.org/C98045186","wikidata":"https://www.wikidata.org/wiki/Q205663","display_name":"Process (computing)","level":2,"score":0.0},{"id":"https://openalex.org/C126838900","wikidata":"https://www.wikidata.org/wiki/Q77604","display_name":"Radiology","level":1,"score":0.0}],"mesh":[],"locations_count":2,"locations":[{"id":"doi:10.1002/(sici)1098-1098(1998)9:2/3<132::aid-ima10>3.0.co;2-z","doi":"https://doi.org/10.1002/(sici)1098-1098(1998)9:2/3<132::aid-ima10>3.0.co;2-z","is_oa":false,"landing_page_url":"https://doi.org/10.1002/(sici)1098-1098(1998)9:2/3<132::aid-ima10>3.0.co;2-z","pdf_url":null,"source":{"id":"https://openalex.org/S15952048","display_name":"International Journal of Imaging Systems and Technology","issn_l":"0899-9457","issn":["0899-9457","1098-1098"],"is_oa":false,"is_in_doaj":false,"is_core":true,"listed_in":["anvur-scientific","cwts-core","dongbi-c","jufo-1","ki-jl-1","norway-1","poland-70","russia-white-list-2"],"host_organization":"https://openalex.org/P4310320595","host_organization_name":"Wiley","host_organization_lineage":["https://openalex.org/P4310320595"],"host_organization_lineage_names":["Wiley"],"type":"journal"},"license":null,"license_id":null,"version":"publishedVersion","is_accepted":true,"is_published":true,"raw_source_name":"International Journal of Imaging Systems and Technology","raw_type":"journal-article"},{"id":"doi:10.1002/(sici)1098-1098(1998)9:2/3<132::aid-ima10>3.3.co;2-i","doi":"https://doi.org/10.1002/(sici)1098-1098(1998)9:2/3<132::aid-ima10>3.3.co;2-i","is_oa":false,"landing_page_url":"https://doi.org/10.1002/(sici)1098-1098(1998)9:2/3<132::aid-ima10>3.3.co;2-i","pdf_url":null,"source":{"id":"https://openalex.org/S15952048","display_name":"International Journal of Imaging Systems and Technology","issn_l":"0899-9457","issn":["0899-9457","1098-1098"],"is_oa":false,"is_in_doaj":false,"is_core":true,"listed_in":["anvur-scientific","cwts-core","dongbi-c","jufo-1","ki-jl-1","norway-1","poland-70","russia-white-list-2"],"host_organization":"https://openalex.org/P4310320595","host_organization_name":"Wiley","host_organization_lineage":["https://openalex.org/P4310320595"],"host_organization_lineage_names":["Wiley"],"type":"journal"},"license":null,"license_id":null,"version":"publishedVersion","is_accepted":true,"is_published":true,"raw_source_name":"International Journal of Imaging Systems and Technology","raw_type":"journal-article"}],"best_oa_location":null,"sustainable_development_goals":[],"sustainable_development_goals_aurora":[],"study_designs":[],"awards":[],"funders":[],"has_content":{"pdf":false,"grobid_xml":false},"content_urls":null,"referenced_works_count":0,"referenced_works":[],"related_works":["https://openalex.org/W99220572","https://openalex.org/W1551425123","https://openalex.org/W2105302414","https://openalex.org/W104963041","https://openalex.org/W7099428733","https://openalex.org/W2587816877","https://openalex.org/W617403369","https://openalex.org/W2095619462","https://openalex.org/W1980617746","https://openalex.org/W6888880727"],"abstract_inverted_index":{"The":[0],"general":[1],"limited-angle":[2],"problem":[3],"is":[4,14,21],"underdetermined":[5],"in":[6],"discrete":[7,43],"tomography.":[8],"However,":[9],"electron":[10],"microscopy":[11],"of":[12],"crystals":[13],"a":[15,28],"much":[16],"more":[17],"specific":[18],"problem,":[19],"and":[20],"subject":[22],"to":[23,48],"stringent":[24],"mathematical":[25],"conditions.":[26],"Using":[27],"constructive":[29],"argument,":[30],"we":[31],"show":[32],"that":[33],"under":[34],"these":[35],"physically":[36],"reasonable":[37],"conditions,":[38],"data":[39],"from":[40],"only":[41],"two":[42],"tomographic":[44],"views":[45],"are":[46],"required":[47],"reconstruct":[49],"the":[50],"lattice.":[51],"\u00a9":[52],"1998":[53,66],"John":[54],"Wiley":[55],"&":[56],"Sons,":[57],"Inc.":[58],"Int":[59],"J":[60],"Imaging":[61],"Syst":[62],"Technol,":[63],"9,":[64],"132\u2013134,":[65]},"counts_by_year":[],"updated_date":"2026-10-12T09:40:04.860316","created_date":"2016-06-24T00:00:00"}