{"id":"https://openalex.org/W2163109448","doi":"https://doi.org/10.1007/978-3-642-82724-2_33","title":"Secondary Ion Mass Spectrometer with Liquid Metal Field Ion Source and Quadrupole Mass Analyzer","display_name":"Secondary Ion Mass Spectrometer with Liquid Metal Field Ion Source and Quadrupole Mass Analyzer","publication_year":1986,"publication_date":"1986-01-01","ids":{"openalex":"https://openalex.org/W2163109448","doi":"https://doi.org/10.1007/978-3-642-82724-2_33","mag":"2163109448"},"language":"en","primary_location":{"id":"doi:10.1007/978-3-642-82724-2_33","doi":"https://doi.org/10.1007/978-3-642-82724-2_33","is_oa":false,"landing_page_url":"https://doi.org/10.1007/978-3-642-82724-2_33","pdf_url":null,"source":{"id":"https://openalex.org/S2764984375","display_name":"Springer series in chemical physics","issn_l":"0172-6218","issn":["0172-6218","2364-9003"],"is_oa":false,"is_in_doaj":false,"is_core":true,"listed_in":["cwts-core","norway-1","poland-20"],"host_organization":"https://openalex.org/P4310319900","host_organization_name":"Springer Science+Business Media","host_organization_lineage":["https://openalex.org/P4310319900","https://openalex.org/P4310319965"],"host_organization_lineage_names":["Springer Science+Business Media","Springer Nature"],"type":"book series"},"license":null,"license_id":null,"version":"publishedVersion","is_accepted":true,"is_published":true,"raw_source_name":"Springer Series in Chemical Physics","raw_type":"book-chapter"},"volume":{"id":"https://openalex.org/W2497945102","display_name":"Secondary Ion Mass Spectrometry SIMS V"},"type":"book-chapter","is_traditional":true,"indexed_in":["crossref"],"open_access":{"is_oa":false,"oa_status":"closed","oa_url":null,"any_repository_has_fulltext":false},"authorships":[{"author_position":"first","author":{"id":"https://openalex.org/A5088622057","display_name":"Juergen M. Schroeer","orcid":null,"observed_orcids":[]},"institutions":[{"id":"https://openalex.org/I47301684","display_name":"Illinois State University","ror":"https://ror.org/050kcr883","country_code":"US","type":"education","lineage":["https://openalex.org/I47301684"]}],"countries":["US"],"is_corresponding":false,"raw_author_name":"J. M. Schroeer","raw_affiliation_strings":["Department of Physics, Illinois State University, Normal, IL, 61761, USA"],"raw_orcid":null,"affiliations":[{"raw_affiliation_string":"Department of Physics, Illinois State University, Normal, IL, 61761, USA","institution_ids":["https://openalex.org/I47301684"]}]},{"author_position":"last","author":{"id":"https://openalex.org/A5013547802","display_name":"J. Puretz","orcid":null,"observed_orcids":[]},"institutions":[],"countries":[],"is_corresponding":false,"raw_author_name":"J. Puretz","raw_affiliation_strings":["Oregon Graduate Center, 19600 N.W. von Neumann Rd., Beaverton, OR, 97006, USA"],"raw_orcid":null,"affiliations":[{"raw_affiliation_string":"Oregon Graduate Center, 19600 N.W. von Neumann Rd., Beaverton, OR, 97006, USA","institution_ids":[]}]}],"institutions":[],"countries_distinct_count":1,"institutions_distinct_count":1,"corresponding_author_ids":[],"corresponding_institution_ids":[],"apc_list":null,"apc_paid":null,"fwci":0.0,"has_fulltext":false,"cited_by_count":0,"citation_normalized_percentile":{"value":0.0,"is_in_top_1_percent":false,"is_in_top_10_percent":false},"cited_by_percentile_year":null,"biblio":{"volume":null,"issue":null,"first_page":"142","last_page":"145"},"is_retracted":false,"is_paratext":false,"is_xpac":false,"primary_topic":{"id":"https://openalex.org/T12166","display_name":"Ion-surface interactions and analysis","score":0.8241999745368958,"subfield":{"id":"https://openalex.org/subfields/2508","display_name":"Surfaces, Coatings and Films"},"field":{"id":"https://openalex.org/fields/25","display_name":"Materials Science"},"domain":{"id":"https://openalex.org/domains/3","display_name":"Physical Sciences"}},"topics":[{"id":"https://openalex.org/T12166","display_name":"Ion-surface interactions and analysis","score":0.8241999745368958,"subfield":{"id":"https://openalex.org/subfields/2508","display_name":"Surfaces, Coatings and Films"},"field":{"id":"https://openalex.org/fields/25","display_name":"Materials Science"},"domain":{"id":"https://openalex.org/domains/3","display_name":"Physical Sciences"}},{"id":"https://openalex.org/T10683","display_name":"Mass Spectrometry Techniques and Applications","score":0.13289999961853027,"subfield":{"id":"https://openalex.org/subfields/1607","display_name":"Spectroscopy"},"field":{"id":"https://openalex.org/fields/16","display_name":"Chemistry"},"domain":{"id":"https://openalex.org/domains/3","display_name":"Physical Sciences"}},{"id":"https://openalex.org/T13552","display_name":"Advanced Materials Characterization Techniques","score":0.02250000089406967,"subfield":{"id":"https://openalex.org/subfields/2500","display_name":"General Materials Science"},"field":{"id":"https://openalex.org/fields/25","display_name":"Materials Science"},"domain":{"id":"https://openalex.org/domains/3","display_name":"Physical Sciences"}}],"keywords":[{"id":"https://openalex.org/keywords/secondary-ion-mass-spectrometry","display_name":"secondary ion mass spectrometry","score":0.9259999990463257},{"id":"https://openalex.org/keywords/quadrupole-mass-analyzer","display_name":"quadrupole mass analyzer","score":0.9779999852180481},{"id":"https://openalex.org/keywords/ultra-high-vacuum-instrumentation","display_name":"ultra-high vacuum instrumentation","score":0.949999988079071}],"concepts":[{"id":"https://openalex.org/C103232671","wikidata":"https://www.wikidata.org/wiki/Q874519","display_name":"Quadrupole mass analyzer","level":3,"score":0.8080556392669678},{"id":"https://openalex.org/C710854","wikidata":"https://www.wikidata.org/wiki/Q5953256","display_name":"Hybrid mass spectrometer","level":5,"score":0.7520145177841187},{"id":"https://openalex.org/C162356407","wikidata":"https://www.wikidata.org/wiki/Q180809","display_name":"Mass spectrometry","level":2,"score":0.6881966590881348},{"id":"https://openalex.org/C158007255","wikidata":"https://www.wikidata.org/wiki/Q1055222","display_name":"Spectrum analyzer","level":2,"score":0.6545711159706116},{"id":"https://openalex.org/C145148216","wikidata":"https://www.wikidata.org/wiki/Q36496","display_name":"Ion","level":2,"score":0.6397002339363098},{"id":"https://openalex.org/C172493649","wikidata":"https://www.wikidata.org/wiki/Q7843529","display_name":"Triple quadrupole mass spectrometer","level":5,"score":0.6019546389579773},{"id":"https://openalex.org/C39984356","wikidata":"https://www.wikidata.org/wiki/Q2121987","display_name":"Quadrupole","level":2,"score":0.5892490148544312},{"id":"https://openalex.org/C188224857","wikidata":"https://www.wikidata.org/wiki/Q905291","display_name":"Ion source","level":3,"score":0.5562178492546082},{"id":"https://openalex.org/C192562407","wikidata":"https://www.wikidata.org/wiki/Q228736","display_name":"Materials science","level":0,"score":0.4935387372970581},{"id":"https://openalex.org/C77671233","wikidata":"https://www.wikidata.org/wiki/Q556046","display_name":"Secondary ion mass spectrometry","level":3,"score":0.44164854288101196},{"id":"https://openalex.org/C33390570","wikidata":"https://www.wikidata.org/wiki/Q188463","display_name":"Spectrometer","level":2,"score":0.42853161692619324},{"id":"https://openalex.org/C184779094","wikidata":"https://www.wikidata.org/wiki/Q26383","display_name":"Atomic physics","level":1,"score":0.420392781496048},{"id":"https://openalex.org/C187529661","wikidata":"https://www.wikidata.org/wiki/Q3943651","display_name":"Static secondary-ion mass spectrometry","level":4,"score":0.4101862907409668},{"id":"https://openalex.org/C113196181","wikidata":"https://www.wikidata.org/wiki/Q485223","display_name":"Analytical Chemistry (journal)","level":2,"score":0.3921838402748108},{"id":"https://openalex.org/C71043704","wikidata":"https://www.wikidata.org/wiki/Q17144692","display_name":"Selected reaction monitoring","level":4,"score":0.3016892075538635},{"id":"https://openalex.org/C121332964","wikidata":"https://www.wikidata.org/wiki/Q413","display_name":"Physics","level":0,"score":0.2884790599346161},{"id":"https://openalex.org/C185592680","wikidata":"https://www.wikidata.org/wiki/Q2329","display_name":"Chemistry","level":0,"score":0.21849459409713745},{"id":"https://openalex.org/C120665830","wikidata":"https://www.wikidata.org/wiki/Q14620","display_name":"Optics","level":1,"score":0.1944877803325653},{"id":"https://openalex.org/C31827203","wikidata":"https://www.wikidata.org/wiki/Q874296","display_name":"Tandem mass spectrometry","level":3,"score":0.07285445928573608},{"id":"https://openalex.org/C62520636","wikidata":"https://www.wikidata.org/wiki/Q944","display_name":"Quantum mechanics","level":1,"score":0.0},{"id":"https://openalex.org/C43617362","wikidata":"https://www.wikidata.org/wiki/Q170050","display_name":"Chromatography","level":1,"score":0.0}],"mesh":[],"locations_count":1,"locations":[{"id":"doi:10.1007/978-3-642-82724-2_33","doi":"https://doi.org/10.1007/978-3-642-82724-2_33","is_oa":false,"landing_page_url":"https://doi.org/10.1007/978-3-642-82724-2_33","pdf_url":null,"source":{"id":"https://openalex.org/S2764984375","display_name":"Springer series in chemical physics","issn_l":"0172-6218","issn":["0172-6218","2364-9003"],"is_oa":false,"is_in_doaj":false,"is_core":true,"listed_in":["cwts-core","norway-1","poland-20"],"host_organization":"https://openalex.org/P4310319900","host_organization_name":"Springer Science+Business Media","host_organization_lineage":["https://openalex.org/P4310319900","https://openalex.org/P4310319965"],"host_organization_lineage_names":["Springer Science+Business Media","Springer Nature"],"type":"book series"},"license":null,"license_id":null,"version":"publishedVersion","is_accepted":true,"is_published":true,"raw_source_name":"Springer Series in Chemical Physics","raw_type":"book-chapter"}],"best_oa_location":null,"sustainable_development_goals":[],"study_designs":[],"awards":[],"funders":[],"has_content":{"grobid_xml":false,"pdf":false},"content_urls":null,"referenced_works_count":4,"referenced_works":["https://openalex.org/W2057071648","https://openalex.org/W2062686538","https://openalex.org/W2084344501","https://openalex.org/W2087637420"],"related_works":["https://openalex.org/W2014146573","https://openalex.org/W2017622094","https://openalex.org/W6996275752","https://openalex.org/W4294557052","https://openalex.org/W2418033181","https://openalex.org/W2589521932","https://openalex.org/W1978153702","https://openalex.org/W2045733164","https://openalex.org/W2619216649","https://openalex.org/W39903623"],"abstract_inverted_index":null,"counts_by_year":[],"updated_date":"2026-10-10T09:11:00.788812","created_date":"2016-06-24T00:00:00"}