{"id":"https://openalex.org/W2162398720","doi":null,"title":"On-line junction temperature measurement of IGBTs based on temperature sensitive electrical parameters","display_name":"On-line junction temperature measurement of IGBTs based on temperature sensitive electrical parameters","publication_year":2009,"publication_date":"2009-01-01","ids":{"openalex":"https://openalex.org/W2162398720","mag":"2162398720"},"language":"en","primary_location":{"id":"mag:3139781080","doi":null,"is_oa":false,"landing_page_url":"http://yadda.icm.edu.pl/yadda/element/bwmeta1.element.ieee-000005278815","pdf_url":null,"source":{"id":"https://openalex.org/S4306418342","display_name":"European Conference on Power Electronics and Applications","issn_l":null,"issn":null,"is_oa":false,"is_in_doaj":false,"is_core":false,"listed_in":[],"host_organization":null,"host_organization_name":null,"host_organization_lineage":[],"host_organization_lineage_names":[],"type":"conference"},"license":null,"license_id":null,"version":null,"is_accepted":false,"is_published":false,"raw_source_name":"European Conference on Power Electronics and Applications","raw_type":null},"volume":null,"type":"conference-paper","is_traditional":true,"indexed_in":[],"open_access":{"is_oa":false,"oa_status":"closed","oa_url":null,"any_repository_has_fulltext":false},"authorships":[{"author_position":"first","author":{"id":null,"display_name":"Harald K\u00fchn","orcid":"https://orcid.org/0009-0008-9749-8330","observed_orcids":["https://orcid.org/0009-0008-9749-8330"]},"institutions":[{"id":"https://openalex.org/I114112103","display_name":"Leibniz University Hannover","ror":"https://ror.org/0304hq317","country_code":"DE","type":"education","lineage":["https://openalex.org/I114112103"]}],"countries":["DE"],"is_corresponding":false,"raw_author_name":"Harald K\u00fchn","raw_affiliation_strings":["Institute for Drive Systems and Power Electronics (IAL) \u00bf Leibniz Universit\u00e4t Hannover, Welfengarten 1, 30167 Hannover, Germany"],"raw_orcid":"https://orcid.org/0009-0008-9749-8330","affiliations":[{"raw_affiliation_string":"Institute for Drive Systems and Power Electronics (IAL) \u00bf Leibniz Universit\u00e4t Hannover, Welfengarten 1, 30167 Hannover, Germany","institution_ids":["https://openalex.org/I114112103"]}]},{"author_position":"last","author":{"id":"https://openalex.org/A5089838275","display_name":"Axel Mertens","orcid":"https://orcid.org/0000-0003-4894-357X","observed_orcids":["https://orcid.org/0000-0003-4894-357X","https://orcid.org/0000-0002-4598-8265"]},"institutions":[{"id":"https://openalex.org/I114112103","display_name":"Leibniz University Hannover","ror":"https://ror.org/0304hq317","country_code":"DE","type":"education","lineage":["https://openalex.org/I114112103"]}],"countries":["DE"],"is_corresponding":false,"raw_author_name":"Axel Mertens","raw_affiliation_strings":["Institute for Drive Systems and Power Electronics (IAL) \u00bf Leibniz Universit\u00e4t Hannover, Welfengarten 1, 30167 Hannover, Germany"],"raw_orcid":null,"affiliations":[{"raw_affiliation_string":"Institute for Drive Systems and Power Electronics (IAL) \u00bf Leibniz Universit\u00e4t Hannover, Welfengarten 1, 30167 Hannover, Germany","institution_ids":["https://openalex.org/I114112103"]}]}],"institutions":[],"countries_distinct_count":1,"institutions_distinct_count":1,"corresponding_author_ids":[],"corresponding_institution_ids":["https://openalex.org/I114112103"],"apc_list":null,"apc_paid":null,"fwci":3.2757,"has_fulltext":false,"cited_by_count":127,"citation_normalized_percentile":{"value":0.91902578,"is_in_top_1_percent":false,"is_in_top_10_percent":true},"cited_by_percentile_year":{"min":88,"max":100},"biblio":{"volume":null,"issue":null,"first_page":"1","last_page":"10"},"is_retracted":false,"is_paratext":false,"is_xpac":false,"primary_topic":{"id":"https://openalex.org/T10361","display_name":"Silicon Carbide Semiconductor Technologies","score":0.9994999766349792,"subfield":{"id":"https://openalex.org/subfields/2208","display_name":"Electrical and Electronic Engineering"},"field":{"id":"https://openalex.org/fields/22","display_name":"Engineering"},"domain":{"id":"https://openalex.org/domains/3","display_name":"Physical Sciences"}},"topics":[{"id":"https://openalex.org/T10361","display_name":"Silicon Carbide Semiconductor Technologies","score":0.9994999766349792,"subfield":{"id":"https://openalex.org/subfields/2208","display_name":"Electrical and Electronic Engineering"},"field":{"id":"https://openalex.org/fields/22","display_name":"Engineering"},"domain":{"id":"https://openalex.org/domains/3","display_name":"Physical Sciences"}},{"id":"https://openalex.org/T10228","display_name":"Multilevel Inverters and Converters","score":9.999999747378752e-05,"subfield":{"id":"https://openalex.org/subfields/2208","display_name":"Electrical and Electronic Engineering"},"field":{"id":"https://openalex.org/fields/22","display_name":"Engineering"},"domain":{"id":"https://openalex.org/domains/3","display_name":"Physical Sciences"}},{"id":"https://openalex.org/T12804","display_name":"Thermal Analysis in Power Transmission","score":0.0,"subfield":{"id":"https://openalex.org/subfields/2208","display_name":"Electrical and Electronic Engineering"},"field":{"id":"https://openalex.org/fields/22","display_name":"Engineering"},"domain":{"id":"https://openalex.org/domains/3","display_name":"Physical Sciences"}}],"keywords":[{"id":"https://openalex.org/keywords/igbt","display_name":"IGBT","score":0.9599999785423279},{"id":"https://openalex.org/keywords/junction-temperature-measurement","display_name":"junction temperature measurement","score":0.8289999961853027},{"id":"https://openalex.org/keywords/temperature-sensitive-electrical-parameters","display_name":"temperature-sensitive electrical parameters","score":0.9860000014305115},{"id":"https://openalex.org/keywords/switching-transients","display_name":"switching transients","score":0.8629999756813049},{"id":"https://openalex.org/keywords/collector-current","display_name":"collector current","score":0.8920000195503235},{"id":"https://openalex.org/keywords/collector-emitter-voltage","display_name":"collector-emitter voltage","score":0.9869999885559082}],"concepts":[{"id":"https://openalex.org/C167781694","wikidata":"https://www.wikidata.org/wiki/Q6311800","display_name":"Junction temperature","level":3,"score":0.8573577404022217},{"id":"https://openalex.org/C72293138","wikidata":"https://www.wikidata.org/wiki/Q909741","display_name":"Temperature measurement","level":2,"score":0.7497225999832153},{"id":"https://openalex.org/C46918542","wikidata":"https://www.wikidata.org/wiki/Q1648344","display_name":"Common emitter","level":2,"score":0.7480143308639526},{"id":"https://openalex.org/C28285623","wikidata":"https://www.wikidata.org/wiki/Q176110","display_name":"Insulated-gate bipolar transistor","level":3,"score":0.7440344095230103},{"id":"https://openalex.org/C192562407","wikidata":"https://www.wikidata.org/wiki/Q228736","display_name":"Materials science","level":0,"score":0.6858956217765808},{"id":"https://openalex.org/C197424946","wikidata":"https://www.wikidata.org/wiki/Q1165717","display_name":"Waveform","level":3,"score":0.6691005229949951},{"id":"https://openalex.org/C165801399","wikidata":"https://www.wikidata.org/wiki/Q25428","display_name":"Voltage","level":2,"score":0.6556771397590637},{"id":"https://openalex.org/C198352243","wikidata":"https://www.wikidata.org/wiki/Q37105","display_name":"Line (geometry)","level":2,"score":0.5229700207710266},{"id":"https://openalex.org/C49040817","wikidata":"https://www.wikidata.org/wiki/Q193091","display_name":"Optoelectronics","level":1,"score":0.49841976165771484},{"id":"https://openalex.org/C119599485","wikidata":"https://www.wikidata.org/wiki/Q43035","display_name":"Electrical engineering","level":1,"score":0.47774165868759155},{"id":"https://openalex.org/C2985831756","wikidata":"https://www.wikidata.org/wiki/Q107291880","display_name":"Maximum temperature","level":2,"score":0.45676612854003906},{"id":"https://openalex.org/C204530211","wikidata":"https://www.wikidata.org/wiki/Q752823","display_name":"Thermal","level":2,"score":0.18571937084197998},{"id":"https://openalex.org/C127413603","wikidata":"https://www.wikidata.org/wiki/Q11023","display_name":"Engineering","level":0,"score":0.17232578992843628},{"id":"https://openalex.org/C121332964","wikidata":"https://www.wikidata.org/wiki/Q413","display_name":"Physics","level":0,"score":0.13952285051345825},{"id":"https://openalex.org/C153294291","wikidata":"https://www.wikidata.org/wiki/Q25261","display_name":"Meteorology","level":1,"score":0.0},{"id":"https://openalex.org/C62520636","wikidata":"https://www.wikidata.org/wiki/Q944","display_name":"Quantum mechanics","level":1,"score":0.0},{"id":"https://openalex.org/C97355855","wikidata":"https://www.wikidata.org/wiki/Q11473","display_name":"Thermodynamics","level":1,"score":0.0},{"id":"https://openalex.org/C2524010","wikidata":"https://www.wikidata.org/wiki/Q8087","display_name":"Geometry","level":1,"score":0.0},{"id":"https://openalex.org/C33923547","wikidata":"https://www.wikidata.org/wiki/Q395","display_name":"Mathematics","level":0,"score":0.0}],"mesh":[],"locations_count":2,"locations":[{"id":"mag:3139781080","doi":null,"is_oa":false,"landing_page_url":"http://yadda.icm.edu.pl/yadda/element/bwmeta1.element.ieee-000005278815","pdf_url":null,"source":{"id":"https://openalex.org/S4306418342","display_name":"European Conference on Power Electronics and Applications","issn_l":null,"issn":null,"is_oa":false,"is_in_doaj":false,"is_core":false,"listed_in":[],"host_organization":null,"host_organization_name":null,"host_organization_lineage":[],"host_organization_lineage_names":[],"type":"conference"},"license":null,"license_id":null,"version":null,"is_accepted":false,"is_published":false,"raw_source_name":"European Conference on Power Electronics and Applications","raw_type":null},{"id":"mag:2162398720","doi":null,"is_oa":false,"landing_page_url":"https://ieeexplore.ieee.org/abstract/document/5278815","pdf_url":null,"source":{"id":"https://openalex.org/S4306418342","display_name":"European Conference on Power Electronics and Applications","issn_l":null,"issn":null,"is_oa":false,"is_in_doaj":false,"is_core":false,"listed_in":[],"host_organization":null,"host_organization_name":null,"host_organization_lineage":[],"host_organization_lineage_names":[],"type":"conference"},"license":null,"license_id":null,"version":null,"is_accepted":false,"is_published":false,"raw_source_name":"European Conference on Power Electronics and Applications","raw_type":null}],"best_oa_location":null,"sustainable_development_goals":[],"study_designs":[],"awards":[],"funders":[],"has_content":{"pdf":false,"grobid_xml":false},"content_urls":null,"referenced_works_count":12,"referenced_works":["https://openalex.org/W1984928169","https://openalex.org/W2052573926","https://openalex.org/W2073013684","https://openalex.org/W2073386831","https://openalex.org/W2100897679","https://openalex.org/W2147390919","https://openalex.org/W2150002902","https://openalex.org/W2158262971","https://openalex.org/W2165479900","https://openalex.org/W2166691323","https://openalex.org/W2539911309","https://openalex.org/W2887658473"],"related_works":["https://openalex.org/W4387763149","https://openalex.org/W2952153532","https://openalex.org/W2588872949","https://openalex.org/W2075089645","https://openalex.org/W2058049784","https://openalex.org/W2898944671","https://openalex.org/W2065270482","https://openalex.org/W2051845716","https://openalex.org/W2769043636","https://openalex.org/W1977775545"],"abstract_inverted_index":{"This":[0],"paper":[1],"deals":[2],"with":[3,49,58],"a":[4,64],"method":[5],"to":[6,22,42],"derive":[7],"the":[8,15,25,28,32,38,43,51,54,67,70,79,83],"junction":[9],"temperature":[10,68,74,81],"of":[11,53,82],"an":[12],"IGBT":[13],"while":[14],"device":[16,84],"is":[17,63],"in":[18],"operation.":[19],"In":[20],"order":[21],"achieve":[23],"this":[24],"gate-emitter":[26],"voltage,":[27],"collector":[29],"current":[30],"and":[31,69],"collector-emitter":[33],"voltage":[34],"are":[35],"digitized":[36],"on":[37],"driver":[39],"board.":[40],"Due":[41],"fact":[44],"that":[45],"material":[46],"parameters":[47,77],"vary":[48,57],"temperature,":[50,59],"waveforms":[52],"switching":[55,71],"transients":[56],"too.":[60],"Thus,":[61],"there":[62],"correlation":[65],"between":[66],"waveforms.":[72],"Evaluating":[73],"sensitive":[75],"electrical":[76],"(TSEP),":[78],"working":[80],"can":[85],"be":[86],"estimated.":[87]},"counts_by_year":[{"year":2025,"cited_by_count":2},{"year":2024,"cited_by_count":5},{"year":2023,"cited_by_count":7},{"year":2022,"cited_by_count":8},{"year":2021,"cited_by_count":17},{"year":2020,"cited_by_count":13},{"year":2019,"cited_by_count":6},{"year":2018,"cited_by_count":15},{"year":2017,"cited_by_count":14},{"year":2016,"cited_by_count":9},{"year":2015,"cited_by_count":8},{"year":2014,"cited_by_count":12},{"year":2013,"cited_by_count":4},{"year":2012,"cited_by_count":1}],"updated_date":"2026-11-04T10:54:05.112534","created_date":"2016-06-24T00:00:00"}