{"id":"https://openalex.org/W2160154742","doi":"https://doi.org/10.1109/cpem.2008.4574961","title":"Calibration of the step response of a 70 GHz sampling oscilloscope using a novel optoelectronic technique","display_name":"Calibration of the step response of a 70 GHz sampling oscilloscope using a novel optoelectronic technique","publication_year":2008,"publication_date":"2008-06-01","ids":{"openalex":"https://openalex.org/W2160154742","doi":"https://doi.org/10.1109/cpem.2008.4574961","mag":"2160154742"},"language":"en","primary_location":{"id":"doi:10.1109/cpem.2008.4574961","doi":"https://doi.org/10.1109/cpem.2008.4574961","is_oa":false,"landing_page_url":"https://doi.org/10.1109/cpem.2008.4574961","pdf_url":null,"source":{"id":"https://openalex.org/S4306418090","display_name":"Conference on Precision Electromagnetic Measurements","issn_l":null,"issn":null,"is_oa":false,"is_in_doaj":false,"is_core":false,"listed_in":[],"host_organization":null,"host_organization_name":null,"host_organization_lineage":[],"host_organization_lineage_names":[],"type":"conference"},"license":null,"license_id":null,"version":"publishedVersion","is_accepted":true,"is_published":true,"raw_source_name":"2008 Conference on Precision Electromagnetic Measurements Digest","raw_type":"proceedings-article"},"volume":null,"type":"conference-paper","indexed_in":["crossref"],"open_access":{"is_oa":false,"oa_status":"closed","oa_url":null,"any_repository_has_fulltext":false},"authorships":[{"author_position":"first","author":{"id":"https://openalex.org/A5019883244","display_name":"Mark Bieler","orcid":"https://orcid.org/0000-0002-5706-5417","observed_orcids":["https://orcid.org/0000-0002-5706-5417"]},"institutions":[{"id":"https://openalex.org/I1285933455","display_name":"Physikalisch-Technische Bundesanstalt","ror":"https://ror.org/05r3f7h03","country_code":"DE","type":"government","lineage":["https://openalex.org/I1285933455","https://openalex.org/I4210136623"]}],"countries":["DE"],"is_corresponding":false,"raw_author_name":"M. Bieler","raw_affiliation_strings":["Physikalisch-Technisch Bundesanstalt, Brunswick, Germany"],"raw_orcid":null,"affiliations":[{"raw_affiliation_string":"Physikalisch-Technisch Bundesanstalt, Brunswick, Germany","institution_ids":["https://openalex.org/I1285933455"]}]},{"author_position":"middle","author":{"id":"https://openalex.org/A5061136250","display_name":"Meinhard Spitzer","orcid":null,"observed_orcids":[]},"institutions":[{"id":"https://openalex.org/I1285933455","display_name":"Physikalisch-Technische Bundesanstalt","ror":"https://ror.org/05r3f7h03","country_code":"DE","type":"government","lineage":["https://openalex.org/I1285933455","https://openalex.org/I4210136623"]}],"countries":["DE"],"is_corresponding":false,"raw_author_name":"M. Spitzer","raw_affiliation_strings":["Physikalisch-Technisch Bundesanstalt, Brunswick, Germany"],"raw_orcid":null,"affiliations":[{"raw_affiliation_string":"Physikalisch-Technisch Bundesanstalt, Brunswick, Germany","institution_ids":["https://openalex.org/I1285933455"]}]},{"author_position":"middle","author":{"id":"https://openalex.org/A5110198577","display_name":"G. Hein","orcid":null,"observed_orcids":[]},"institutions":[{"id":"https://openalex.org/I1285933455","display_name":"Physikalisch-Technische Bundesanstalt","ror":"https://ror.org/05r3f7h03","country_code":"DE","type":"government","lineage":["https://openalex.org/I1285933455","https://openalex.org/I4210136623"]}],"countries":["DE"],"is_corresponding":false,"raw_author_name":"G. Hein","raw_affiliation_strings":["Physikalisch-Technisch Bundesanstalt, Brunswick, Germany"],"raw_orcid":null,"affiliations":[{"raw_affiliation_string":"Physikalisch-Technisch Bundesanstalt, Brunswick, Germany","institution_ids":["https://openalex.org/I1285933455"]}]},{"author_position":"middle","author":{"id":"https://openalex.org/A5078486757","display_name":"K. Pierz","orcid":"https://orcid.org/0000-0001-6400-1799","observed_orcids":["https://orcid.org/0000-0001-6400-1799"]},"institutions":[{"id":"https://openalex.org/I1285933455","display_name":"Physikalisch-Technische Bundesanstalt","ror":"https://ror.org/05r3f7h03","country_code":"DE","type":"government","lineage":["https://openalex.org/I1285933455","https://openalex.org/I4210136623"]}],"countries":["DE"],"is_corresponding":false,"raw_author_name":"K. Pierz","raw_affiliation_strings":["Physikalisch-Technisch Bundesanstalt, Brunswick, Germany"],"raw_orcid":null,"affiliations":[{"raw_affiliation_string":"Physikalisch-Technisch Bundesanstalt, Brunswick, Germany","institution_ids":["https://openalex.org/I1285933455"]}]},{"author_position":"last","author":{"id":"https://openalex.org/A5045189729","display_name":"U. Siegner","orcid":null,"observed_orcids":[]},"institutions":[{"id":"https://openalex.org/I1285933455","display_name":"Physikalisch-Technische Bundesanstalt","ror":"https://ror.org/05r3f7h03","country_code":"DE","type":"government","lineage":["https://openalex.org/I1285933455","https://openalex.org/I4210136623"]}],"countries":["DE"],"is_corresponding":false,"raw_author_name":"U. Siegner","raw_affiliation_strings":["Physikalisch-Technisch Bundesanstalt, Brunswick, Germany"],"raw_orcid":null,"affiliations":[{"raw_affiliation_string":"Physikalisch-Technisch Bundesanstalt, Brunswick, Germany","institution_ids":["https://openalex.org/I1285933455"]}]}],"institutions":[],"countries_distinct_count":1,"institutions_distinct_count":1,"corresponding_author_ids":[],"corresponding_institution_ids":["https://openalex.org/I1285933455"],"apc_list":null,"apc_paid":null,"fwci":0.474,"has_fulltext":false,"cited_by_count":1,"citation_normalized_percentile":{"value":0.6228202,"is_in_top_1_percent":false,"is_in_top_10_percent":false},"cited_by_percentile_year":null,"biblio":{"volume":null,"issue":null,"first_page":"678","last_page":"679"},"is_retracted":false,"is_paratext":false,"is_xpac":false,"primary_topic":{"id":"https://openalex.org/T12300","display_name":"Advanced Electrical Measurement Techniques","score":0.9477999806404114,"subfield":{"id":"https://openalex.org/subfields/2208","display_name":"Electrical and Electronic Engineering"},"field":{"id":"https://openalex.org/fields/22","display_name":"Engineering"},"domain":{"id":"https://openalex.org/domains/3","display_name":"Physical Sciences"}},"topics":[{"id":"https://openalex.org/T12300","display_name":"Advanced Electrical Measurement Techniques","score":0.9477999806404114,"subfield":{"id":"https://openalex.org/subfields/2208","display_name":"Electrical and Electronic Engineering"},"field":{"id":"https://openalex.org/fields/22","display_name":"Engineering"},"domain":{"id":"https://openalex.org/domains/3","display_name":"Physical Sciences"}},{"id":"https://openalex.org/T14257","display_name":"Advanced Measurement and Detection Methods","score":0.007799999788403511,"subfield":{"id":"https://openalex.org/subfields/2208","display_name":"Electrical and Electronic Engineering"},"field":{"id":"https://openalex.org/fields/22","display_name":"Engineering"},"domain":{"id":"https://openalex.org/domains/3","display_name":"Physical Sciences"}},{"id":"https://openalex.org/T12019","display_name":"Calibration and Measurement Techniques","score":0.007600000128149986,"subfield":{"id":"https://openalex.org/subfields/2202","display_name":"Aerospace Engineering"},"field":{"id":"https://openalex.org/fields/22","display_name":"Engineering"},"domain":{"id":"https://openalex.org/domains/3","display_name":"Physical Sciences"}}],"keywords":[{"id":"https://openalex.org/keywords/sampling-oscilloscope","display_name":"sampling oscilloscope","score":0.843999981880188},{"id":"https://openalex.org/keywords/step-response","display_name":"step response","score":0.8640000224113464},{"id":"https://openalex.org/keywords/calibration","display_name":"calibration","score":0.7689999938011169},{"id":"https://openalex.org/keywords/rise-time","display_name":"rise time","score":0.8479999899864197},{"id":"https://openalex.org/keywords/measurement-uncertainty","display_name":"measurement uncertainty","score":0.8700000047683716},{"id":"https://openalex.org/keywords/monte-carlo-simulation","display_name":"Monte Carlo simulation","score":0.875},{"id":"https://openalex.org/keywords/70-ghz","display_name":"70 GHz","score":0.7990000247955322},{"id":"https://openalex.org/keywords/ultrafast-measurement","display_name":"ultrafast measurement","score":0.699999988079071}],"concepts":[{"id":"https://openalex.org/C184026988","wikidata":"https://www.wikidata.org/wiki/Q174320","display_name":"Oscilloscope","level":3,"score":0.9723837375640869},{"id":"https://openalex.org/C165838908","wikidata":"https://www.wikidata.org/wiki/Q736777","display_name":"Calibration","level":2,"score":0.7873481512069702},{"id":"https://openalex.org/C140779682","wikidata":"https://www.wikidata.org/wiki/Q210868","display_name":"Sampling (signal processing)","level":3,"score":0.696682870388031},{"id":"https://openalex.org/C19499675","wikidata":"https://www.wikidata.org/wiki/Q232207","display_name":"Monte Carlo method","level":2,"score":0.6411562561988831},{"id":"https://openalex.org/C41008148","wikidata":"https://www.wikidata.org/wiki/Q21198","display_name":"Computer science","level":0,"score":0.5596362352371216},{"id":"https://openalex.org/C178596936","wikidata":"https://www.wikidata.org/wiki/Q844471","display_name":"Ultrashort pulse","level":3,"score":0.4959505498409271},{"id":"https://openalex.org/C2780841128","wikidata":"https://www.wikidata.org/wiki/Q5073781","display_name":"Characterization (materials science)","level":2,"score":0.4650840163230896},{"id":"https://openalex.org/C8590192","wikidata":"https://www.wikidata.org/wiki/Q1054694","display_name":"Frequency response","level":2,"score":0.4533604085445404},{"id":"https://openalex.org/C19012869","wikidata":"https://www.wikidata.org/wiki/Q578372","display_name":"Response time","level":2,"score":0.44101792573928833},{"id":"https://openalex.org/C49040817","wikidata":"https://www.wikidata.org/wiki/Q193091","display_name":"Optoelectronics","level":1,"score":0.4327786862850189},{"id":"https://openalex.org/C24326235","wikidata":"https://www.wikidata.org/wiki/Q126095","display_name":"Electronic engineering","level":1,"score":0.4168770909309387},{"id":"https://openalex.org/C120665830","wikidata":"https://www.wikidata.org/wiki/Q14620","display_name":"Optics","level":1,"score":0.354002445936203},{"id":"https://openalex.org/C192562407","wikidata":"https://www.wikidata.org/wiki/Q228736","display_name":"Materials science","level":0,"score":0.334945410490036},{"id":"https://openalex.org/C121332964","wikidata":"https://www.wikidata.org/wiki/Q413","display_name":"Physics","level":0,"score":0.2708872854709625},{"id":"https://openalex.org/C119599485","wikidata":"https://www.wikidata.org/wiki/Q43035","display_name":"Electrical engineering","level":1,"score":0.18739771842956543},{"id":"https://openalex.org/C127413603","wikidata":"https://www.wikidata.org/wiki/Q11023","display_name":"Engineering","level":0,"score":0.14415094256401062},{"id":"https://openalex.org/C33923547","wikidata":"https://www.wikidata.org/wiki/Q395","display_name":"Mathematics","level":0,"score":0.12106156349182129},{"id":"https://openalex.org/C76155785","wikidata":"https://www.wikidata.org/wiki/Q418","display_name":"Telecommunications","level":1,"score":0.0984838604927063},{"id":"https://openalex.org/C94915269","wikidata":"https://www.wikidata.org/wiki/Q1834857","display_name":"Detector","level":2,"score":0.07496446371078491},{"id":"https://openalex.org/C520434653","wikidata":"https://www.wikidata.org/wiki/Q38867","display_name":"Laser","level":2,"score":0.06880408525466919},{"id":"https://openalex.org/C105795698","wikidata":"https://www.wikidata.org/wiki/Q12483","display_name":"Statistics","level":1,"score":0.06300532817840576},{"id":"https://openalex.org/C62520636","wikidata":"https://www.wikidata.org/wiki/Q944","display_name":"Quantum mechanics","level":1,"score":0.0},{"id":"https://openalex.org/C121684516","wikidata":"https://www.wikidata.org/wiki/Q7600677","display_name":"Computer graphics (images)","level":1,"score":0.0}],"mesh":[],"locations_count":1,"locations":[{"id":"doi:10.1109/cpem.2008.4574961","doi":"https://doi.org/10.1109/cpem.2008.4574961","is_oa":false,"landing_page_url":"https://doi.org/10.1109/cpem.2008.4574961","pdf_url":null,"source":{"id":"https://openalex.org/S4306418090","display_name":"Conference on Precision Electromagnetic Measurements","issn_l":null,"issn":null,"is_oa":false,"is_in_doaj":false,"is_core":false,"listed_in":[],"host_organization":null,"host_organization_name":null,"host_organization_lineage":[],"host_organization_lineage_names":[],"type":"conference"},"license":null,"license_id":null,"version":"publishedVersion","is_accepted":true,"is_published":true,"raw_source_name":"2008 Conference on Precision Electromagnetic Measurements Digest","raw_type":"proceedings-article"}],"best_oa_location":null,"sustainable_development_goals":[],"study_designs":[],"awards":[],"funders":[],"has_content":{"pdf":false,"grobid_xml":false},"content_urls":null,"referenced_works_count":5,"referenced_works":["https://openalex.org/W2061712628","https://openalex.org/W2081291511","https://openalex.org/W2089727449","https://openalex.org/W2094732579","https://openalex.org/W2142772043"],"related_works":["https://openalex.org/W2160153147","https://openalex.org/W2024456181","https://openalex.org/W2358058531","https://openalex.org/W2082264006","https://openalex.org/W2216040455","https://openalex.org/W2142772043","https://openalex.org/W2081291511","https://openalex.org/W2122256498","https://openalex.org/W2002108615","https://openalex.org/W2115016316"],"abstract_inverted_index":{"We":[0],"introduce":[1],"a":[2,28,48],"novel":[3],"optoelectronic":[4],"technique":[5],"for":[6],"the":[7,10,21,41,44],"characterization":[8],"of":[9,14,20,43],"full":[11],"step":[12,22,45],"response":[13,23,46],"ultrafast":[15],"sampling":[16],"oscilloscopes.":[17],"The":[18,31],"uncertainty":[19,51],"measurement":[24],"is":[25],"derived":[26],"from":[27],"Monte-Carlo":[29],"analysis.":[30],"enhanced":[32],"experimental":[33],"and":[34],"theoretical":[35],"method":[36],"allows":[37],"us":[38],"to":[39,54],"specify":[40],"rise-time":[42],"with":[47],"considerably":[49],"reduced":[50],"as":[52],"compared":[53],"our":[55],"previous":[56],"calibration":[57],"technique.":[58]},"counts_by_year":[],"updated_date":"2026-10-06T10:28:23.643775","created_date":"2016-06-24T00:00:00"}