{"id":"https://openalex.org/W2155102497","doi":"https://doi.org/10.1109/crmico.2008.4676551","title":"Substrate batch effect on GaAs MESFET characteristics under ultra-short pulses exposure","display_name":"Substrate batch effect on GaAs MESFET characteristics under ultra-short pulses exposure","publication_year":2008,"publication_date":"2008-09-01","ids":{"openalex":"https://openalex.org/W2155102497","doi":"https://doi.org/10.1109/crmico.2008.4676551","mag":"2155102497"},"language":"en","primary_location":{"id":"doi:10.1109/crmico.2008.4676551","doi":"https://doi.org/10.1109/crmico.2008.4676551","is_oa":false,"landing_page_url":"https://doi.org/10.1109/crmico.2008.4676551","pdf_url":null,"source":{"id":"https://openalex.org/S4306419974","display_name":"International Crimean Conference Microwave and Telecommunication Technology","issn_l":null,"issn":null,"is_oa":false,"is_in_doaj":false,"is_core":false,"listed_in":[],"host_organization":null,"host_organization_name":null,"host_organization_lineage":[],"host_organization_lineage_names":[],"type":"conference"},"license":null,"license_id":null,"version":"publishedVersion","is_accepted":true,"is_published":true,"raw_source_name":"2008 18th International Crimean Conference - Microwave & Telecommunication Technology","raw_type":"proceedings-article"},"volume":null,"type":"conference-paper","is_traditional":true,"indexed_in":["crossref"],"open_access":{"is_oa":false,"oa_status":"closed","oa_url":null,"any_repository_has_fulltext":false},"authorships":[{"author_position":"first","author":{"id":"https://openalex.org/A5045291873","display_name":"Anatoly M. Bobreshov","orcid":"https://orcid.org/0000-0002-5429-3780","observed_orcids":["https://orcid.org/0000-0002-5429-3780"]},"institutions":[{"id":"https://openalex.org/I71305448","display_name":"Voronezh State University","ror":"https://ror.org/0543j5e78","country_code":"RU","type":"education","lineage":["https://openalex.org/I71305448"]}],"countries":["RU"],"is_corresponding":false,"raw_author_name":"A. M. Bobreshov","raw_affiliation_strings":["Voronezh State University, Voronezh, Russia"],"raw_orcid":null,"affiliations":[{"raw_affiliation_string":"Voronezh State University, Voronezh, Russia","institution_ids":["https://openalex.org/I71305448"]}]},{"author_position":"middle","author":{"id":"https://openalex.org/A5009913637","display_name":"I.S. Korovchenko","orcid":null,"observed_orcids":[]},"institutions":[{"id":"https://openalex.org/I4210106257","display_name":"Voronezh State Technical University","ror":"https://ror.org/01m20f643","country_code":"RU","type":"education","lineage":["https://openalex.org/I4210106257"]},{"id":"https://openalex.org/I71305448","display_name":"Voronezh State University","ror":"https://ror.org/0543j5e78","country_code":"RU","type":"education","lineage":["https://openalex.org/I71305448"]}],"countries":["RU"],"is_corresponding":false,"raw_author_name":"I. S. Korovchenko","raw_affiliation_strings":["Voronezh State Technical University, Voronezh, Russia","Voronezh State University, Voronezh, Russia"],"raw_orcid":null,"affiliations":[{"raw_affiliation_string":"Voronezh State Technical University, Voronezh, Russia","institution_ids":["https://openalex.org/I4210106257"]},{"raw_affiliation_string":"Voronezh State University, Voronezh, Russia","institution_ids":["https://openalex.org/I71305448"]}]},{"author_position":"middle","author":{"id":"https://openalex.org/A5088840896","display_name":"V. A. Stepkin","orcid":"https://orcid.org/0000-0002-3616-3974","observed_orcids":["https://orcid.org/0000-0002-3616-3974"]},"institutions":[{"id":"https://openalex.org/I4210106257","display_name":"Voronezh State Technical University","ror":"https://ror.org/01m20f643","country_code":"RU","type":"education","lineage":["https://openalex.org/I4210106257"]},{"id":"https://openalex.org/I71305448","display_name":"Voronezh State University","ror":"https://ror.org/0543j5e78","country_code":"RU","type":"education","lineage":["https://openalex.org/I71305448"]}],"countries":["RU"],"is_corresponding":false,"raw_author_name":"V. A. Stepkin","raw_affiliation_strings":["Voronezh State Technical University, Voronezh, Russia","Voronezh State University, Voronezh, Russia"],"raw_orcid":null,"affiliations":[{"raw_affiliation_string":"Voronezh State Technical University, Voronezh, Russia","institution_ids":["https://openalex.org/I4210106257"]},{"raw_affiliation_string":"Voronezh State University, Voronezh, Russia","institution_ids":["https://openalex.org/I71305448"]}]},{"author_position":"last","author":{"id":"https://openalex.org/A5009075955","display_name":"Grigory Konstantinovich Uskov","orcid":"https://orcid.org/0000-0001-8250-2511","observed_orcids":["https://orcid.org/0000-0001-8250-2511"]},"institutions":[{"id":"https://openalex.org/I4210106257","display_name":"Voronezh State Technical University","ror":"https://ror.org/01m20f643","country_code":"RU","type":"education","lineage":["https://openalex.org/I4210106257"]},{"id":"https://openalex.org/I71305448","display_name":"Voronezh State University","ror":"https://ror.org/0543j5e78","country_code":"RU","type":"education","lineage":["https://openalex.org/I71305448"]}],"countries":["RU"],"is_corresponding":false,"raw_author_name":"G. K. Uskov","raw_affiliation_strings":["Voronezh State Technical University, Voronezh, Russia","Voronezh State University, Voronezh, Russia"],"raw_orcid":null,"affiliations":[{"raw_affiliation_string":"Voronezh State Technical University, Voronezh, Russia","institution_ids":["https://openalex.org/I4210106257"]},{"raw_affiliation_string":"Voronezh State University, Voronezh, Russia","institution_ids":["https://openalex.org/I71305448"]}]}],"institutions":[],"countries_distinct_count":1,"institutions_distinct_count":2,"corresponding_author_ids":[],"corresponding_institution_ids":[],"apc_list":null,"apc_paid":null,"fwci":0.0,"has_fulltext":false,"cited_by_count":0,"citation_normalized_percentile":{"value":0.0,"is_in_top_1_percent":false,"is_in_top_10_percent":false},"cited_by_percentile_year":null,"biblio":{"volume":"27","issue":null,"first_page":"672","last_page":"673"},"is_retracted":false,"is_paratext":false,"is_xpac":false,"primary_topic":{"id":"https://openalex.org/T11853","display_name":"Semiconductor materials and interfaces","score":0.2354000061750412,"subfield":{"id":"https://openalex.org/subfields/2504","display_name":"Electronic, Optical and Magnetic Materials"},"field":{"id":"https://openalex.org/fields/25","display_name":"Materials Science"},"domain":{"id":"https://openalex.org/domains/3","display_name":"Physical Sciences"}},"topics":[{"id":"https://openalex.org/T11853","display_name":"Semiconductor materials and interfaces","score":0.2354000061750412,"subfield":{"id":"https://openalex.org/subfields/2504","display_name":"Electronic, Optical and Magnetic Materials"},"field":{"id":"https://openalex.org/fields/25","display_name":"Materials Science"},"domain":{"id":"https://openalex.org/domains/3","display_name":"Physical Sciences"}},{"id":"https://openalex.org/T11920","display_name":"Pulsed Power Technology Applications","score":0.16869999468326569,"subfield":{"id":"https://openalex.org/subfields/2208","display_name":"Electrical and Electronic Engineering"},"field":{"id":"https://openalex.org/fields/22","display_name":"Engineering"},"domain":{"id":"https://openalex.org/domains/3","display_name":"Physical Sciences"}},{"id":"https://openalex.org/T10558","display_name":"Advancements in Semiconductor Devices and Circuit Design","score":0.08910000324249268,"subfield":{"id":"https://openalex.org/subfields/2208","display_name":"Electrical and Electronic Engineering"},"field":{"id":"https://openalex.org/fields/22","display_name":"Engineering"},"domain":{"id":"https://openalex.org/domains/3","display_name":"Physical Sciences"}}],"keywords":[{"id":"https://openalex.org/keywords/gaas-mesfet","display_name":"GaAs MESFET","score":0.9940000176429749},{"id":"https://openalex.org/keywords/device-characteristics","display_name":"device characteristics","score":0.6079999804496765},{"id":"https://openalex.org/keywords/gallium-arsenide","display_name":"GaAs","score":0.6060000061988831},{"id":"https://openalex.org/keywords/semiconductor-device-reliability","display_name":"semiconductor device reliability","score":0.4230000078678131}],"concepts":[{"id":"https://openalex.org/C134123091","wikidata":"https://www.wikidata.org/wiki/Q1837339","display_name":"MESFET","level":5,"score":0.9696614742279053},{"id":"https://openalex.org/C2777289219","wikidata":"https://www.wikidata.org/wiki/Q7632154","display_name":"Substrate (aquarium)","level":2,"score":0.7493685483932495},{"id":"https://openalex.org/C192562407","wikidata":"https://www.wikidata.org/wiki/Q228736","display_name":"Materials science","level":0,"score":0.6738482713699341},{"id":"https://openalex.org/C49040817","wikidata":"https://www.wikidata.org/wiki/Q193091","display_name":"Optoelectronics","level":1,"score":0.6575368642807007},{"id":"https://openalex.org/C510052550","wikidata":"https://www.wikidata.org/wiki/Q422819","display_name":"Gallium arsenide","level":2,"score":0.5569364428520203},{"id":"https://openalex.org/C24326235","wikidata":"https://www.wikidata.org/wiki/Q126095","display_name":"Electronic engineering","level":1,"score":0.32690107822418213},{"id":"https://openalex.org/C119599485","wikidata":"https://www.wikidata.org/wiki/Q43035","display_name":"Electrical engineering","level":1,"score":0.21051469445228577},{"id":"https://openalex.org/C145598152","wikidata":"https://www.wikidata.org/wiki/Q176097","display_name":"Field-effect transistor","level":4,"score":0.15373718738555908},{"id":"https://openalex.org/C165801399","wikidata":"https://www.wikidata.org/wiki/Q25428","display_name":"Voltage","level":2,"score":0.1142168641090393},{"id":"https://openalex.org/C172385210","wikidata":"https://www.wikidata.org/wiki/Q5339","display_name":"Transistor","level":3,"score":0.10306334495544434},{"id":"https://openalex.org/C127413603","wikidata":"https://www.wikidata.org/wiki/Q11023","display_name":"Engineering","level":0,"score":0.10225585103034973},{"id":"https://openalex.org/C127313418","wikidata":"https://www.wikidata.org/wiki/Q1069","display_name":"Geology","level":0,"score":0.0},{"id":"https://openalex.org/C111368507","wikidata":"https://www.wikidata.org/wiki/Q43518","display_name":"Oceanography","level":1,"score":0.0}],"mesh":[],"locations_count":1,"locations":[{"id":"doi:10.1109/crmico.2008.4676551","doi":"https://doi.org/10.1109/crmico.2008.4676551","is_oa":false,"landing_page_url":"https://doi.org/10.1109/crmico.2008.4676551","pdf_url":null,"source":{"id":"https://openalex.org/S4306419974","display_name":"International Crimean Conference Microwave and Telecommunication Technology","issn_l":null,"issn":null,"is_oa":false,"is_in_doaj":false,"is_core":false,"listed_in":[],"host_organization":null,"host_organization_name":null,"host_organization_lineage":[],"host_organization_lineage_names":[],"type":"conference"},"license":null,"license_id":null,"version":"publishedVersion","is_accepted":true,"is_published":true,"raw_source_name":"2008 18th International Crimean Conference - Microwave & Telecommunication Technology","raw_type":"proceedings-article"}],"best_oa_location":null,"sustainable_development_goals":[],"study_designs":[],"awards":[],"funders":[],"has_content":{"pdf":false,"grobid_xml":false},"content_urls":null,"referenced_works_count":1,"referenced_works":["https://openalex.org/W2072852548"],"related_works":["https://openalex.org/W2159289244","https://openalex.org/W2474995451","https://openalex.org/W4244409803","https://openalex.org/W4251525316","https://openalex.org/W3142844660","https://openalex.org/W1629943240","https://openalex.org/W4233159704","https://openalex.org/W3139887973","https://openalex.org/W2573813541","https://openalex.org/W2624690148"],"abstract_inverted_index":{"Experimental":[0],"investigation":[1],"of":[2,10],"GaAs":[3],"MESFET":[4],"substrate":[5],"batch":[6],"effect":[7,18],"on":[8],"characteristics":[9],"ultra-short":[11],"pulses":[12],"exposure":[13],"was":[14,19],"carried":[15],"out.":[16],"This":[17],"developed":[20],"and":[21],"described.":[22]},"counts_by_year":[],"updated_date":"2026-10-26T11:51:55.731654","created_date":"2016-06-24T00:00:00"}