{"id":"https://openalex.org/W2153885196","doi":"https://doi.org/10.1149/2.0071410ssl","title":"Electrochemical Metallization and Trapping/Detrapping Resistive Switching Mechanism in Al/VOx/Cu RRAM","display_name":"Electrochemical Metallization and Trapping/Detrapping Resistive Switching Mechanism in Al/VOx/Cu RRAM","publication_year":2014,"publication_date":"2014-08-12","ids":{"openalex":"https://openalex.org/W2153885196","doi":"https://doi.org/10.1149/2.0071410ssl","mag":"2153885196"},"language":"en","primary_location":{"id":"doi:10.1149/2.0071410ssl","doi":"https://doi.org/10.1149/2.0071410ssl","is_oa":true,"landing_page_url":"https://doi.org/10.1149/2.0071410ssl","pdf_url":"https://iopscience.iop.org/article/10.1149/2.0071410ssl/pdf","source":{"id":"https://openalex.org/S2492252179","display_name":"ECS Solid State Letters","issn_l":"2162-8742","issn":["2162-8742","2162-8750"],"is_oa":false,"is_in_doaj":false,"is_core":true,"listed_in":["cwts-core"],"host_organization":"https://openalex.org/P4310320195","host_organization_name":"Electrochemical Society","host_organization_lineage":["https://openalex.org/P4310320195"],"host_organization_lineage_names":["Electrochemical Society"],"type":"journal"},"license":null,"license_id":null,"version":"publishedVersion","is_accepted":true,"is_published":true,"raw_source_name":"ECS Solid State Letters","raw_type":"journal-article"},"volume":null,"type":"article","indexed_in":["crossref"],"open_access":{"is_oa":true,"oa_status":"bronze","oa_url":"https://iopscience.iop.org/article/10.1149/2.0071410ssl/pdf","any_repository_has_fulltext":false},"authorships":[{"author_position":"first","author":{"id":"https://openalex.org/A5022615506","display_name":"Kai Zhang","orcid":"https://orcid.org/0000-0002-6687-4558","observed_orcids":["https://orcid.org/0000-0002-6687-4558"]},"institutions":[{"id":"https://openalex.org/I136765683","display_name":"Tianjin University of Technology","ror":"https://ror.org/00zbe0w13","country_code":"CN","type":"education","lineage":["https://openalex.org/I136765683"]},{"id":"https://openalex.org/I4392738099","display_name":"Stanford SystemX Alliance","ror":"https://ror.org/0551gkb08","country_code":null,"type":"facility","lineage":["https://openalex.org/I4392738099","https://openalex.org/I97018004"]},{"id":"https://openalex.org/I97018004","display_name":"Stanford University","ror":"https://ror.org/00f54p054","country_code":"US","type":"education","lineage":["https://openalex.org/I97018004"]}],"countries":["CN","US"],"is_corresponding":false,"raw_author_name":"K. Zhang","raw_affiliation_strings":["Department of Electrical Engineering and Center for Integrated Systems, Stanford University, Stanford, California 94305, USA","School of Electronics Information Engineering, Tianjin Key Laboratory of Film Electronic & Communication Devices, Tianjin University of Technology, Tianjin, 300384, People's Republic of China"],"raw_orcid":null,"affiliations":[{"raw_affiliation_string":"Department of Electrical Engineering and Center for Integrated Systems, Stanford University, Stanford, California 94305, USA","institution_ids":["https://openalex.org/I4392738099","https://openalex.org/I97018004"]},{"raw_affiliation_string":"School of Electronics Information Engineering, Tianjin Key Laboratory of Film Electronic & Communication Devices, Tianjin University of Technology, Tianjin, 300384, People's Republic of China","institution_ids":["https://openalex.org/I136765683"]}]},{"author_position":"middle","author":{"id":"https://openalex.org/A5111348808","display_name":"Kaitao Sun","orcid":null,"observed_orcids":[]},"institutions":[{"id":"https://openalex.org/I136765683","display_name":"Tianjin University of Technology","ror":"https://ror.org/00zbe0w13","country_code":"CN","type":"education","lineage":["https://openalex.org/I136765683"]}],"countries":["CN"],"is_corresponding":false,"raw_author_name":"K. Sun","raw_affiliation_strings":["School of Electronics Information Engineering, Tianjin Key Laboratory of Film Electronic & Communication Devices, Tianjin University of Technology, Tianjin, 300384, People's Republic of China"],"raw_orcid":null,"affiliations":[{"raw_affiliation_string":"School of Electronics Information Engineering, Tianjin Key Laboratory of Film Electronic & Communication Devices, Tianjin University of Technology, Tianjin, 300384, People's Republic of China","institution_ids":["https://openalex.org/I136765683"]}]},{"author_position":"middle","author":{"id":"https://openalex.org/A5008356065","display_name":"Fang Wang","orcid":"https://orcid.org/0000-0001-9262-5750","observed_orcids":["https://orcid.org/0000-0001-9262-5750"]},"institutions":[{"id":"https://openalex.org/I136765683","display_name":"Tianjin University of Technology","ror":"https://ror.org/00zbe0w13","country_code":"CN","type":"education","lineage":["https://openalex.org/I136765683"]}],"countries":["CN"],"is_corresponding":false,"raw_author_name":"F. Wang","raw_affiliation_strings":["School of Electronics Information Engineering, Tianjin Key Laboratory of Film Electronic & Communication Devices, Tianjin University of Technology, Tianjin, 300384, People's Republic of China"],"raw_orcid":null,"affiliations":[{"raw_affiliation_string":"School of Electronics Information Engineering, Tianjin Key Laboratory of Film Electronic & Communication Devices, Tianjin University of Technology, Tianjin, 300384, People's Republic of China","institution_ids":["https://openalex.org/I136765683"]}]},{"author_position":"middle","author":{"id":"https://openalex.org/A5000024258","display_name":"Yanchun Han","orcid":"https://orcid.org/0000-0002-9901-5995","observed_orcids":["https://orcid.org/0000-0002-9901-5995","https://orcid.org/0000-0002-6990-8469"]},"institutions":[{"id":"https://openalex.org/I136765683","display_name":"Tianjin University of Technology","ror":"https://ror.org/00zbe0w13","country_code":"CN","type":"education","lineage":["https://openalex.org/I136765683"]}],"countries":["CN"],"is_corresponding":false,"raw_author_name":"Y. Han","raw_affiliation_strings":["School of Electronics Information Engineering, Tianjin Key Laboratory of Film Electronic & Communication Devices, Tianjin University of Technology, Tianjin, 300384, People's Republic of China"],"raw_orcid":null,"affiliations":[{"raw_affiliation_string":"School of Electronics Information Engineering, Tianjin Key Laboratory of Film Electronic & Communication Devices, Tianjin University of Technology, Tianjin, 300384, People's Republic of China","institution_ids":["https://openalex.org/I136765683"]}]},{"author_position":"middle","author":{"id":"https://openalex.org/A5101723758","display_name":"Zizhen Jiang","orcid":"https://orcid.org/0000-0003-2595-9456","observed_orcids":["https://orcid.org/0000-0003-2595-9456"]},"institutions":[{"id":"https://openalex.org/I4392738099","display_name":"Stanford SystemX Alliance","ror":"https://ror.org/0551gkb08","country_code":null,"type":"facility","lineage":["https://openalex.org/I4392738099","https://openalex.org/I97018004"]},{"id":"https://openalex.org/I97018004","display_name":"Stanford University","ror":"https://ror.org/00f54p054","country_code":"US","type":"education","lineage":["https://openalex.org/I97018004"]}],"countries":["US"],"is_corresponding":false,"raw_author_name":"Z. Jiang","raw_affiliation_strings":["Department of Electrical Engineering and Center for Integrated Systems, Stanford University, Stanford, California 94305, USA"],"raw_orcid":null,"affiliations":[{"raw_affiliation_string":"Department of Electrical Engineering and Center for Integrated Systems, Stanford University, Stanford, California 94305, USA","institution_ids":["https://openalex.org/I4392738099","https://openalex.org/I97018004"]}]},{"author_position":"middle","author":{"id":null,"display_name":"B. Wang","orcid":null,"observed_orcids":[]},"institutions":[{"id":"https://openalex.org/I136765683","display_name":"Tianjin University of Technology","ror":"https://ror.org/00zbe0w13","country_code":"CN","type":"education","lineage":["https://openalex.org/I136765683"]}],"countries":["CN"],"is_corresponding":false,"raw_author_name":"B. Wang","raw_affiliation_strings":["School of Electronics Information Engineering, Tianjin Key Laboratory of Film Electronic & Communication Devices, Tianjin University of Technology, Tianjin, 300384, People's Republic of China"],"raw_orcid":null,"affiliations":[{"raw_affiliation_string":"School of Electronics Information Engineering, Tianjin Key Laboratory of Film Electronic & Communication Devices, Tianjin University of Technology, Tianjin, 300384, People's Republic of China","institution_ids":["https://openalex.org/I136765683"]}]},{"author_position":"middle","author":{"id":"https://openalex.org/A5003408131","display_name":"Kai Liu","orcid":"https://orcid.org/0000-0001-9521-3292","observed_orcids":["https://orcid.org/0000-0001-9521-3292"]},"institutions":[{"id":"https://openalex.org/I139264467","display_name":"Seoul National University","ror":"https://ror.org/04h9pn542","country_code":"KR","type":"education","lineage":["https://openalex.org/I139264467"]}],"countries":["KR"],"is_corresponding":false,"raw_author_name":"K. Liu","raw_affiliation_strings":["Department of Material Science & Engineering, Seoul National University, Seoul 151-742, Korea"],"raw_orcid":null,"affiliations":[{"raw_affiliation_string":"Department of Material Science & Engineering, Seoul National University, Seoul 151-742, Korea","institution_ids":["https://openalex.org/I139264467"]}]},{"author_position":"last","author":{"id":"https://openalex.org/A5059975258","display_name":"H.\u2010S. Philip Wong","orcid":"https://orcid.org/0000-0002-0096-1472","observed_orcids":["https://orcid.org/0000-0002-0096-1472"]},"institutions":[{"id":"https://openalex.org/I4392738099","display_name":"Stanford SystemX Alliance","ror":"https://ror.org/0551gkb08","country_code":null,"type":"facility","lineage":["https://openalex.org/I4392738099","https://openalex.org/I97018004"]},{"id":"https://openalex.org/I97018004","display_name":"Stanford University","ror":"https://ror.org/00f54p054","country_code":"US","type":"education","lineage":["https://openalex.org/I97018004"]}],"countries":["US"],"is_corresponding":false,"raw_author_name":"H. S. P. Wong","raw_affiliation_strings":["Department of Electrical Engineering and Center for Integrated Systems, Stanford University, Stanford, California 94305, USA"],"raw_orcid":null,"affiliations":[{"raw_affiliation_string":"Department of Electrical Engineering and Center for Integrated Systems, Stanford University, Stanford, California 94305, USA","institution_ids":["https://openalex.org/I4392738099","https://openalex.org/I97018004"]}]}],"institutions":[],"countries_distinct_count":3,"institutions_distinct_count":4,"corresponding_author_ids":[],"corresponding_institution_ids":[],"apc_list":null,"apc_paid":null,"fwci":0.8837,"has_fulltext":true,"cited_by_count":13,"citation_normalized_percentile":{"value":0.78178393,"is_in_top_1_percent":false,"is_in_top_10_percent":false},"cited_by_percentile_year":{"min":89,"max":97},"biblio":{"volume":"3","issue":"10","first_page":"Q63","last_page":"Q66"},"is_retracted":false,"is_paratext":false,"is_xpac":false,"primary_topic":{"id":"https://openalex.org/T10502","display_name":"Advanced Memory and Neural Computing","score":0.9994999766349792,"subfield":{"id":"https://openalex.org/subfields/2208","display_name":"Electrical and Electronic Engineering"},"field":{"id":"https://openalex.org/fields/22","display_name":"Engineering"},"domain":{"id":"https://openalex.org/domains/3","display_name":"Physical Sciences"}},"topics":[{"id":"https://openalex.org/T10502","display_name":"Advanced Memory and Neural Computing","score":0.9994999766349792,"subfield":{"id":"https://openalex.org/subfields/2208","display_name":"Electrical and Electronic Engineering"},"field":{"id":"https://openalex.org/fields/22","display_name":"Engineering"},"domain":{"id":"https://openalex.org/domains/3","display_name":"Physical Sciences"}},{"id":"https://openalex.org/T12808","display_name":"Ferroelectric and Negative Capacitance Devices","score":0.00019999999494757503,"subfield":{"id":"https://openalex.org/subfields/2208","display_name":"Electrical and Electronic Engineering"},"field":{"id":"https://openalex.org/fields/22","display_name":"Engineering"},"domain":{"id":"https://openalex.org/domains/3","display_name":"Physical Sciences"}},{"id":"https://openalex.org/T11315","display_name":"Phase-change materials and chalcogenides","score":9.999999747378752e-05,"subfield":{"id":"https://openalex.org/subfields/2505","display_name":"Materials Chemistry"},"field":{"id":"https://openalex.org/fields/25","display_name":"Materials Science"},"domain":{"id":"https://openalex.org/domains/3","display_name":"Physical Sciences"}}],"keywords":[{"id":"https://openalex.org/keywords/resistive-random-access-memory","display_name":"resistive random access memory","score":0.9710000157356262},{"id":"https://openalex.org/keywords/resistive-switching-mechanism","display_name":"resistive switching mechanism","score":0.8259999752044678},{"id":"https://openalex.org/keywords/vanadium-oxide","display_name":"vanadium oxide","score":0.7250000238418579},{"id":"https://openalex.org/keywords/electrochemical-metallization","display_name":"electrochemical metallization","score":0.8460000157356262},{"id":"https://openalex.org/keywords/trapping-and-detrapping","display_name":"trapping and detrapping","score":0.6779999732971191},{"id":"https://openalex.org/keywords/schottky-contacts","display_name":"Schottky contacts","score":0.8600000143051147},{"id":"https://openalex.org/keywords/conductive-atomic-force-microscopy","display_name":"conductive atomic force microscopy","score":0.7829999923706055},{"id":"https://openalex.org/keywords/temperature-dependence-of-resistance","display_name":"temperature dependence of resistance","score":0.6579999923706055}],"concepts":[{"id":"https://openalex.org/C182019814","wikidata":"https://www.wikidata.org/wiki/Q1143830","display_name":"Resistive random-access memory","level":3,"score":0.8551666140556335},{"id":"https://openalex.org/C192562407","wikidata":"https://www.wikidata.org/wiki/Q228736","display_name":"Materials science","level":0,"score":0.7811102867126465},{"id":"https://openalex.org/C2777924906","wikidata":"https://www.wikidata.org/wiki/Q34168","display_name":"Trapping","level":2,"score":0.7729031443595886},{"id":"https://openalex.org/C50942859","wikidata":"https://www.wikidata.org/wiki/Q4967193","display_name":"Rectification","level":3,"score":0.698958694934845},{"id":"https://openalex.org/C6899612","wikidata":"https://www.wikidata.org/wiki/Q852911","display_name":"Resistive touchscreen","level":2,"score":0.6535171866416931},{"id":"https://openalex.org/C202374169","wikidata":"https://www.wikidata.org/wiki/Q124291","display_name":"Electrical conductor","level":2,"score":0.5621086359024048},{"id":"https://openalex.org/C49040817","wikidata":"https://www.wikidata.org/wiki/Q193091","display_name":"Optoelectronics","level":1,"score":0.535031259059906},{"id":"https://openalex.org/C89611455","wikidata":"https://www.wikidata.org/wiki/Q6804646","display_name":"Mechanism (biology)","level":2,"score":0.41310185194015503},{"id":"https://openalex.org/C171250308","wikidata":"https://www.wikidata.org/wiki/Q11468","display_name":"Nanotechnology","level":1,"score":0.3999001979827881},{"id":"https://openalex.org/C17525397","wikidata":"https://www.wikidata.org/wiki/Q176140","display_name":"Electrode","level":2,"score":0.38225382566452026},{"id":"https://openalex.org/C159985019","wikidata":"https://www.wikidata.org/wiki/Q181790","display_name":"Composite material","level":1,"score":0.18715575337409973},{"id":"https://openalex.org/C119599485","wikidata":"https://www.wikidata.org/wiki/Q43035","display_name":"Electrical engineering","level":1,"score":0.12950292229652405},{"id":"https://openalex.org/C185592680","wikidata":"https://www.wikidata.org/wiki/Q2329","display_name":"Chemistry","level":0,"score":0.12595313787460327},{"id":"https://openalex.org/C165801399","wikidata":"https://www.wikidata.org/wiki/Q25428","display_name":"Voltage","level":2,"score":0.06925427913665771},{"id":"https://openalex.org/C147789679","wikidata":"https://www.wikidata.org/wiki/Q11372","display_name":"Physical chemistry","level":1,"score":0.0},{"id":"https://openalex.org/C111472728","wikidata":"https://www.wikidata.org/wiki/Q9471","display_name":"Epistemology","level":1,"score":0.0},{"id":"https://openalex.org/C18903297","wikidata":"https://www.wikidata.org/wiki/Q7150","display_name":"Ecology","level":1,"score":0.0},{"id":"https://openalex.org/C127413603","wikidata":"https://www.wikidata.org/wiki/Q11023","display_name":"Engineering","level":0,"score":0.0},{"id":"https://openalex.org/C86803240","wikidata":"https://www.wikidata.org/wiki/Q420","display_name":"Biology","level":0,"score":0.0},{"id":"https://openalex.org/C138885662","wikidata":"https://www.wikidata.org/wiki/Q5891","display_name":"Philosophy","level":0,"score":0.0}],"mesh":[],"locations_count":1,"locations":[{"id":"doi:10.1149/2.0071410ssl","doi":"https://doi.org/10.1149/2.0071410ssl","is_oa":true,"landing_page_url":"https://doi.org/10.1149/2.0071410ssl","pdf_url":"https://iopscience.iop.org/article/10.1149/2.0071410ssl/pdf","source":{"id":"https://openalex.org/S2492252179","display_name":"ECS Solid State Letters","issn_l":"2162-8742","issn":["2162-8742","2162-8750"],"is_oa":false,"is_in_doaj":false,"is_core":true,"listed_in":["cwts-core"],"host_organization":"https://openalex.org/P4310320195","host_organization_name":"Electrochemical Society","host_organization_lineage":["https://openalex.org/P4310320195"],"host_organization_lineage_names":["Electrochemical Society"],"type":"journal"},"license":null,"license_id":null,"version":"publishedVersion","is_accepted":true,"is_published":true,"raw_source_name":"ECS Solid State Letters","raw_type":"journal-article"}],"best_oa_location":{"id":"doi:10.1149/2.0071410ssl","doi":"https://doi.org/10.1149/2.0071410ssl","is_oa":true,"landing_page_url":"https://doi.org/10.1149/2.0071410ssl","pdf_url":"https://iopscience.iop.org/article/10.1149/2.0071410ssl/pdf","source":{"id":"https://openalex.org/S2492252179","display_name":"ECS Solid State Letters","issn_l":"2162-8742","issn":["2162-8742","2162-8750"],"is_oa":false,"is_in_doaj":false,"is_core":true,"listed_in":["cwts-core"],"host_organization":"https://openalex.org/P4310320195","host_organization_name":"Electrochemical Society","host_organization_lineage":["https://openalex.org/P4310320195"],"host_organization_lineage_names":["Electrochemical Society"],"type":"journal"},"license":null,"license_id":null,"version":"publishedVersion","is_accepted":true,"is_published":true,"raw_source_name":"ECS Solid State Letters","raw_type":"journal-article"},"sustainable_development_goals":[],"sustainable_development_goals_aurora":[],"study_designs":[],"awards":[{"id":"https://openalex.org/G1165046264","display_name":null,"funder_award_id":"14JCQNJC00800","funder_id":"https://openalex.org/F4320323993","funder_display_name":"Natural Science Foundation of Tianjin City"},{"id":"https://openalex.org/G1704137926","display_name":null,"funder_award_id":"NCET-11-","funder_id":"https://openalex.org/F4320334924","funder_display_name":"Program for New Century Excellent Talents in University"},{"id":"https://openalex.org/G226631651","display_name":null,"funder_award_id":"NCET-11-1064","funder_id":"https://openalex.org/F4320334924","funder_display_name":"Program for New Century Excellent Talents in University"},{"id":"https://openalex.org/G2775642429","display_name":null,"funder_award_id":"20100703","funder_id":"https://openalex.org/F4320323993","funder_display_name":"Natural Science Foundation of Tianjin City"},{"id":"https://openalex.org/G4552255000","display_name":null,"funder_award_id":"61274113","funder_id":"https://openalex.org/F4320321001","funder_display_name":"National Natural Science Foundation of China"},{"id":"https://openalex.org/G5282266605","display_name":null,"funder_award_id":"13JCYBJC15700","funder_id":"https://openalex.org/F4320323993","funder_display_name":"Natural Science Foundation of Tianjin City"},{"id":"https://openalex.org/G6258893751","display_name":null,"funder_award_id":"13JCZDJC26100","funder_id":"https://openalex.org/F4320323993","funder_display_name":"Natural Science Foundation of Tianjin City"},{"id":"https://openalex.org/G8603919622","display_name":null,"funder_award_id":"61274113","funder_id":"https://openalex.org/F4320323993","funder_display_name":"Natural Science Foundation of Tianjin City"},{"id":"https://openalex.org/G894070757","display_name":null,"funder_award_id":"11204212","funder_id":"https://openalex.org/F4320321001","funder_display_name":"National Natural Science Foundation of China"}],"funders":[{"id":"https://openalex.org/F4320321001","display_name":"National Natural Science Foundation of China","ror":"https://ror.org/01h0zpd94"},{"id":"https://openalex.org/F4320323993","display_name":"Natural Science Foundation of Tianjin City","ror":null},{"id":"https://openalex.org/F4320334924","display_name":"Program for New Century Excellent Talents in University","ror":"https://ror.org/01mv9t934"}],"has_content":{"pdf":true,"grobid_xml":true},"content_urls":{"pdf":"https://content.openalex.org/works/W2153885196.pdf","grobid_xml":"https://content.openalex.org/works/W2153885196.grobid-xml"},"referenced_works_count":1,"referenced_works":["https://openalex.org/W1501310587"],"related_works":["https://openalex.org/W2355499516","https://openalex.org/W2545245183","https://openalex.org/W2054635671","https://openalex.org/W2017425642","https://openalex.org/W2350916061","https://openalex.org/W3210974833","https://openalex.org/W1970117475","https://openalex.org/W2599000612","https://openalex.org/W2199653281","https://openalex.org/W2018855351"],"abstract_inverted_index":{"We":[0],"investigated":[1],"resistive":[2,18,67,81,88],"switching":[3,82,89],"mechanism":[4],"in":[5,38,96],"Al/VO":[6,55],"x":[7,40,56,98,100],"/Cu":[8,101],"RRAM":[9],"structure.":[10],"The":[11],"temperature":[12],"dependence":[13],"of":[14,33,65,93],"resistance":[15],"on":[16,85],"low":[17],"state":[19,68],"(LRS)":[20],"and":[21,31,50,62,74],"conductive":[22,35],"atomic":[23],"force":[24],"microscopy":[25],"(CAFM)":[26],"measurement":[27],"confirmed":[28],"the":[29,86],"formation":[30],"rupture":[32],"Cu":[34],"filaments":[36],"(Cu-CF)":[37],"VO":[39],"dielectric.":[41],"Cu-CF":[42,75],"was":[43],"formed":[44],"after":[45],"a":[46],"trapping":[47],"process":[48],"(HRS\u2192LRS)":[49],"ruptured":[51],"at":[52],"Schottky":[53],"junction":[54],"interface":[57],"(LRS\u2192HRS)":[58],"judged":[59],"by":[60],"rectification":[61],"C-V":[63],"characteristics":[64],"high":[66],"(HRS).":[69],"A":[70],"model":[71],"combining":[72],"trapping/detrapping":[73],"formation/rupture":[76],"is":[77,103],"proposed":[78],"to":[79],"describe":[80],"mechanism.":[83],"Based":[84],"combined":[87],"mechanism,":[90],"an":[91],"application":[92],"multi-level":[94],"states":[95],"Al/AlO":[97],"/VO":[99],"device":[102],"achieved":[104],"successfully.":[105]},"counts_by_year":[{"year":2026,"cited_by_count":2},{"year":2025,"cited_by_count":1},{"year":2024,"cited_by_count":1},{"year":2023,"cited_by_count":1},{"year":2021,"cited_by_count":2},{"year":2018,"cited_by_count":1},{"year":2017,"cited_by_count":2},{"year":2015,"cited_by_count":3}],"updated_date":"2026-09-27T08:07:27.782135","created_date":"2025-10-10T00:00:00"}