{"id":"https://openalex.org/W2149487525","doi":"https://doi.org/10.1109/68.817428","title":"1.58-\u03bcm lattice-matched and strained digital alloy AlGaInAs-InP multiple-quantum-well lasers","display_name":"1.58-\u03bcm lattice-matched and strained digital alloy AlGaInAs-InP multiple-quantum-well lasers","publication_year":2000,"publication_date":"2000-01-01","ids":{"openalex":"https://openalex.org/W2149487525","doi":"https://doi.org/10.1109/68.817428","mag":"2149487525"},"language":"en","primary_location":{"id":"doi:10.1109/68.817428","doi":"https://doi.org/10.1109/68.817428","is_oa":false,"landing_page_url":"https://doi.org/10.1109/68.817428","pdf_url":null,"source":{"id":"https://openalex.org/S27723657","display_name":"IEEE Photonics Technology Letters","issn_l":"1041-1135","issn":["1041-1135","1941-0174"],"is_oa":false,"is_in_doaj":false,"is_core":true,"listed_in":["cwts-core","dongbi-b","jufo-2","norway-2","poland-100","russia-white-list-1"],"host_organization":"https://openalex.org/P4310319808","host_organization_name":"Institute of Electrical and Electronics Engineers","host_organization_lineage":["https://openalex.org/P4310319808"],"host_organization_lineage_names":["Institute of Electrical and Electronics Engineers"],"type":"journal"},"license":null,"license_id":null,"version":"publishedVersion","is_accepted":true,"is_published":true,"raw_source_name":"IEEE Photonics Technology Letters","raw_type":"journal-article"},"volume":null,"type":"article","is_traditional":true,"indexed_in":["crossref"],"open_access":{"is_oa":false,"oa_status":"closed","oa_url":null,"any_repository_has_fulltext":false},"authorships":[{"author_position":"first","author":{"id":"https://openalex.org/A5050503958","display_name":"G.T. Liu","orcid":null,"observed_orcids":[]},"institutions":[{"id":"https://openalex.org/I169521973","display_name":"University of New Mexico","ror":"https://ror.org/05fs6jp91","country_code":"US","type":"education","lineage":["https://openalex.org/I169521973"]}],"countries":["US"],"is_corresponding":false,"raw_author_name":"G.T. Liu","raw_affiliation_strings":["Center of High Technology Materials, University of New Mexico, Albuquerque, NM, USA"],"raw_orcid":null,"affiliations":[{"raw_affiliation_string":"Center of High Technology Materials, University of New Mexico, Albuquerque, NM, USA","institution_ids":["https://openalex.org/I169521973"]}]},{"author_position":"middle","author":{"id":"https://openalex.org/A5039676883","display_name":"A. Stintz","orcid":null,"observed_orcids":[]},"institutions":[{"id":"https://openalex.org/I169521973","display_name":"University of New Mexico","ror":"https://ror.org/05fs6jp91","country_code":"US","type":"education","lineage":["https://openalex.org/I169521973"]}],"countries":["US"],"is_corresponding":false,"raw_author_name":"A. Stintz","raw_affiliation_strings":["Center of High Technology Materials, University of New Mexico, Albuquerque, NM, USA"],"raw_orcid":null,"affiliations":[{"raw_affiliation_string":"Center of High Technology Materials, University of New Mexico, Albuquerque, NM, USA","institution_ids":["https://openalex.org/I169521973"]}]},{"author_position":"middle","author":{"id":"https://openalex.org/A5087690515","display_name":"E.A. Pease","orcid":null,"observed_orcids":[]},"institutions":[{"id":"https://openalex.org/I169521973","display_name":"University of New Mexico","ror":"https://ror.org/05fs6jp91","country_code":"US","type":"education","lineage":["https://openalex.org/I169521973"]}],"countries":["US"],"is_corresponding":false,"raw_author_name":"E.A. Pease","raw_affiliation_strings":["Center of High Technology Materials, University of New Mexico, Albuquerque, NM, USA"],"raw_orcid":null,"affiliations":[{"raw_affiliation_string":"Center of High Technology Materials, University of New Mexico, Albuquerque, NM, USA","institution_ids":["https://openalex.org/I169521973"]}]},{"author_position":"middle","author":{"id":"https://openalex.org/A5111787530","display_name":"Tim C. Newell","orcid":null,"observed_orcids":[]},"institutions":[{"id":"https://openalex.org/I169521973","display_name":"University of New Mexico","ror":"https://ror.org/05fs6jp91","country_code":"US","type":"education","lineage":["https://openalex.org/I169521973"]}],"countries":["US"],"is_corresponding":false,"raw_author_name":"T.C. Newell","raw_affiliation_strings":["Center of High Technology Materials, University of New Mexico, Albuquerque, NM, USA"],"raw_orcid":null,"affiliations":[{"raw_affiliation_string":"Center of High Technology Materials, University of New Mexico, Albuquerque, NM, USA","institution_ids":["https://openalex.org/I169521973"]}]},{"author_position":"middle","author":{"id":"https://openalex.org/A5069324357","display_name":"Kevin J. Malloy","orcid":null,"observed_orcids":[]},"institutions":[{"id":"https://openalex.org/I169521973","display_name":"University of New Mexico","ror":"https://ror.org/05fs6jp91","country_code":"US","type":"education","lineage":["https://openalex.org/I169521973"]}],"countries":["US"],"is_corresponding":false,"raw_author_name":"K.J. Malloy","raw_affiliation_strings":["Center of High Technology Materials, University of New Mexico, Albuquerque, NM, USA"],"raw_orcid":null,"affiliations":[{"raw_affiliation_string":"Center of High Technology Materials, University of New Mexico, Albuquerque, NM, USA","institution_ids":["https://openalex.org/I169521973"]}]},{"author_position":"last","author":{"id":"https://openalex.org/A5113994394","display_name":"L. F. Lester","orcid":null,"observed_orcids":[]},"institutions":[{"id":"https://openalex.org/I169521973","display_name":"University of New Mexico","ror":"https://ror.org/05fs6jp91","country_code":"US","type":"education","lineage":["https://openalex.org/I169521973"]}],"countries":["US"],"is_corresponding":false,"raw_author_name":"L.F. Lester","raw_affiliation_strings":["Center of High Technology Materials, University of New Mexico, Albuquerque, NM, USA"],"raw_orcid":null,"affiliations":[{"raw_affiliation_string":"Center of High Technology Materials, University of New Mexico, Albuquerque, NM, USA","institution_ids":["https://openalex.org/I169521973"]}]}],"institutions":[],"countries_distinct_count":1,"institutions_distinct_count":1,"corresponding_author_ids":[],"corresponding_institution_ids":["https://openalex.org/I169521973"],"apc_list":{"value":2645,"currency":"USD","value_usd":2645},"apc_paid":null,"fwci":4.2261,"has_fulltext":false,"cited_by_count":39,"citation_normalized_percentile":{"value":0.94172707,"is_in_top_1_percent":false,"is_in_top_10_percent":true},"cited_by_percentile_year":{"min":88,"max":97},"biblio":{"volume":"12","issue":"1","first_page":"4","last_page":"6"},"is_retracted":false,"is_paratext":false,"is_xpac":false,"primary_topic":{"id":"https://openalex.org/T11429","display_name":"Semiconductor Lasers and Optical Devices","score":0.6431000232696533,"subfield":{"id":"https://openalex.org/subfields/2208","display_name":"Electrical and Electronic Engineering"},"field":{"id":"https://openalex.org/fields/22","display_name":"Engineering"},"domain":{"id":"https://openalex.org/domains/3","display_name":"Physical Sciences"}},"topics":[{"id":"https://openalex.org/T11429","display_name":"Semiconductor Lasers and Optical Devices","score":0.6431000232696533,"subfield":{"id":"https://openalex.org/subfields/2208","display_name":"Electrical and Electronic Engineering"},"field":{"id":"https://openalex.org/fields/22","display_name":"Engineering"},"domain":{"id":"https://openalex.org/domains/3","display_name":"Physical Sciences"}},{"id":"https://openalex.org/T10022","display_name":"Semiconductor Quantum Structures and Devices","score":0.3366999924182892,"subfield":{"id":"https://openalex.org/subfields/3107","display_name":"Atomic and Molecular Physics, and Optics"},"field":{"id":"https://openalex.org/fields/31","display_name":"Physics and Astronomy"},"domain":{"id":"https://openalex.org/domains/3","display_name":"Physical Sciences"}},{"id":"https://openalex.org/T12309","display_name":"solar cell performance optimization","score":0.01080000028014183,"subfield":{"id":"https://openalex.org/subfields/2208","display_name":"Electrical and Electronic Engineering"},"field":{"id":"https://openalex.org/fields/22","display_name":"Engineering"},"domain":{"id":"https://openalex.org/domains/3","display_name":"Physical Sciences"}}],"keywords":[{"id":"https://openalex.org/keywords/algainas-inp-lasers","display_name":"AlGaInAs/InP lasers","score":0.9070000052452087},{"id":"https://openalex.org/keywords/multiple-quantum-well-lasers","display_name":"multiple quantum well lasers","score":0.7459999918937683},{"id":"https://openalex.org/keywords/lattice-matched-growth","display_name":"lattice-matched growth","score":0.699999988079071},{"id":"https://openalex.org/keywords/strained-quantum-wells","display_name":"strained quantum wells","score":0.8349999785423279},{"id":"https://openalex.org/keywords/threshold-current-density","display_name":"threshold current density","score":0.9440000057220459},{"id":"https://openalex.org/keywords/internal-losses","display_name":"internal losses","score":0.45899999141693115}],"concepts":[{"id":"https://openalex.org/C520434653","wikidata":"https://www.wikidata.org/wiki/Q38867","display_name":"Laser","level":2,"score":0.7452653050422668},{"id":"https://openalex.org/C192562407","wikidata":"https://www.wikidata.org/wiki/Q228736","display_name":"Materials science","level":0,"score":0.7196670770645142},{"id":"https://openalex.org/C2780026712","wikidata":"https://www.wikidata.org/wiki/Q37756","display_name":"Alloy","level":2,"score":0.6934771537780762},{"id":"https://openalex.org/C49040817","wikidata":"https://www.wikidata.org/wiki/Q193091","display_name":"Optoelectronics","level":1,"score":0.678831934928894},{"id":"https://openalex.org/C78434282","wikidata":"https://www.wikidata.org/wiki/Q11656","display_name":"Diode","level":2,"score":0.629889726638794},{"id":"https://openalex.org/C29169072","wikidata":"https://www.wikidata.org/wiki/Q521166","display_name":"Quantum well","level":3,"score":0.5897996425628662},{"id":"https://openalex.org/C3792809","wikidata":"https://www.wikidata.org/wiki/Q898542","display_name":"Molecular beam epitaxy","level":4,"score":0.5756963491439819},{"id":"https://openalex.org/C2781204021","wikidata":"https://www.wikidata.org/wiki/Q6497091","display_name":"Lattice (music)","level":2,"score":0.5387412309646606},{"id":"https://openalex.org/C110738630","wikidata":"https://www.wikidata.org/wiki/Q1135540","display_name":"Epitaxy","level":3,"score":0.46700724959373474},{"id":"https://openalex.org/C121477167","wikidata":"https://www.wikidata.org/wiki/Q17154002","display_name":"Semiconductor laser theory","level":3,"score":0.4143937826156616},{"id":"https://openalex.org/C120665830","wikidata":"https://www.wikidata.org/wiki/Q14620","display_name":"Optics","level":1,"score":0.30814510583877563},{"id":"https://openalex.org/C121332964","wikidata":"https://www.wikidata.org/wiki/Q413","display_name":"Physics","level":0,"score":0.0890296995639801},{"id":"https://openalex.org/C159985019","wikidata":"https://www.wikidata.org/wiki/Q181790","display_name":"Composite material","level":1,"score":0.06427878141403198},{"id":"https://openalex.org/C2779227376","wikidata":"https://www.wikidata.org/wiki/Q6505497","display_name":"Layer (electronics)","level":2,"score":0.0},{"id":"https://openalex.org/C24890656","wikidata":"https://www.wikidata.org/wiki/Q82811","display_name":"Acoustics","level":1,"score":0.0}],"mesh":[],"locations_count":1,"locations":[{"id":"doi:10.1109/68.817428","doi":"https://doi.org/10.1109/68.817428","is_oa":false,"landing_page_url":"https://doi.org/10.1109/68.817428","pdf_url":null,"source":{"id":"https://openalex.org/S27723657","display_name":"IEEE Photonics Technology Letters","issn_l":"1041-1135","issn":["1041-1135","1941-0174"],"is_oa":false,"is_in_doaj":false,"is_core":true,"listed_in":["cwts-core","dongbi-b","jufo-2","norway-2","poland-100","russia-white-list-1"],"host_organization":"https://openalex.org/P4310319808","host_organization_name":"Institute of Electrical and Electronics Engineers","host_organization_lineage":["https://openalex.org/P4310319808"],"host_organization_lineage_names":["Institute of Electrical and Electronics Engineers"],"type":"journal"},"license":null,"license_id":null,"version":"publishedVersion","is_accepted":true,"is_published":true,"raw_source_name":"IEEE Photonics Technology Letters","raw_type":"journal-article"}],"best_oa_location":null,"sustainable_development_goals":[],"study_designs":[],"awards":[],"funders":[{"id":"https://openalex.org/F4320338295","display_name":"Army Research Laboratory","ror":"https://ror.org/011hc8f90"}],"has_content":{"pdf":false,"grobid_xml":false},"content_urls":null,"referenced_works_count":15,"referenced_works":["https://openalex.org/W1972696085","https://openalex.org/W1972841665","https://openalex.org/W1973739658","https://openalex.org/W1980418264","https://openalex.org/W1993069868","https://openalex.org/W1996018200","https://openalex.org/W2026010750","https://openalex.org/W2060242822","https://openalex.org/W2071936053","https://openalex.org/W2072687768","https://openalex.org/W2081091748","https://openalex.org/W2090498600","https://openalex.org/W2090750513","https://openalex.org/W2128322395","https://openalex.org/W2163977385"],"related_works":["https://openalex.org/W1923645293","https://openalex.org/W1955013170","https://openalex.org/W2021387823","https://openalex.org/W2080321946","https://openalex.org/W2105709863","https://openalex.org/W2153378090","https://openalex.org/W2128819038","https://openalex.org/W1562910328","https://openalex.org/W2012305284","https://openalex.org/W2023444862"],"abstract_inverted_index":{"A":[0,24,54],"versatile,":[1],"digital-alloy":[2],"molecular":[3],"beam":[4],"epitaxy":[5],"(MBE)":[6],"technique":[7],"is":[8,45,64,67],"employed":[9],"to":[10,84],"grow":[11],"lattice-matched":[12],"and":[13,73],"strained":[14,41],"AlGaInAs":[15,42,79],"multiple-quantum":[16],"well":[17],"(MQW)":[18],"1.58-\u03bcm":[19],"laser":[20],"diodes":[21],"on":[22],"InP.":[23],"threshold":[25],"current":[26],"density":[27],"as":[28,30,59,61],"low":[29],"510":[31],"A/cm2has":[32],"been":[33],"demonstrated":[34],"for":[35],"broad":[36],"area":[37],"lasers":[38,85],"with":[39],"1%":[40],"MQWs,":[43],"which":[44],"the":[46,71],"best":[47],"MBE":[48],"result":[49],"in":[50],"this":[51],"material":[52],"system.":[53],"single":[55],"facet":[56],"pulsed":[57],"power":[58],"high":[60],"0.56":[62],"W":[63],"obtained.":[65],"It":[66],"also":[68],"found":[69],"that":[70],"efficiency":[72],"internal":[74],"loss":[75],"of":[76],"digital":[77],"alloy":[78],"QW":[80],"devices":[81],"are":[82],"comparable":[83],"grown":[86],"by":[87],"conventional":[88],"MBE.":[89]},"counts_by_year":[{"year":2024,"cited_by_count":1},{"year":2023,"cited_by_count":3},{"year":2022,"cited_by_count":2},{"year":2019,"cited_by_count":2},{"year":2018,"cited_by_count":1},{"year":2017,"cited_by_count":1},{"year":2016,"cited_by_count":1},{"year":2014,"cited_by_count":1},{"year":2013,"cited_by_count":2},{"year":2012,"cited_by_count":4}],"updated_date":"2026-11-07T11:25:07.637180","created_date":"2016-06-24T00:00:00"}